1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes in accordance with NOR 5962-R081-92. 93-02-11 K. A. Cottongim B Changes in accordance with NOR 5962-R156-93. 93-05-11 K. A. Cottongim C Added case outline Z. Redrew entire document. 95-06-15 K. A. Cottongim D Changes to table I, VOTLINE.
2、97-07-15 K. A. Cottongim E Added RadHard and Class K devices. Added RadHard requirements. Redrew entire document. -sld 97-10-29 K. A. Cottongim F Table I; Changed the max limit for the output ripple voltage test (VRIP) for device type 02 from 80 mVp-p to 175 mVp-p. -sld 98-02-02 K. A. Cottongim G Ch
3、anges to table I to standardize test nomenclature and conditions. 00-06-26 Raymond Monnin H Table I; Change maximum TTloadvalue for device type 01 from 1.2 ms to 0.300 ms. gc 03-10-02 Raymond Monnin J Correct case outline X. For symbol D change max value from 1.455 to 1.460 and for symbol E change m
4、ax value from 1.125 to 1.130. Update drawing to reflect current requirements. gc 04-08-23 Raymond Monnin K Add paragraph 1.5 and note 2. Table I, added note for enhanced low dose rate effects. Paragraph 4.3.5.a, correct paragraph to add component tested dose rate. Update Table I to include RHA level
5、 “P“. Update table in paragraph 4.3.5 to include RHA level “P “. Update bulletin page to include RHA level “P“ part numbers. gc 07-05-31 Robert M. Heber REV SHEET REV SHEET REV STATUS REV K K K K K K K K K K K K K OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 PMIC N/A PREPARED BY Steve Duncan DEFENS
6、E SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Michael C. Jones POST OFFICE BOX 3990 COLUMBUS, OHIO 43216-5000 THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Gregory A. Lude MICROCIRCUIT, HYBRID, LINEAR, 15-VOLT, SINGLE CHANNEL, DC-DC CONVERTER AND AGENCIES OF TH
7、E DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 92-08-20 AMSC N/A REVISION LEVEL K SIZE A CAGE CODE 67268 5962-91601 SHEET 1 OF 13 DSCC FORM 2233 APR 97 5962-E432-07Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 59
8、62-91601 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL K SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available
9、and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 - 91601 01 H X X Federal RHA Device Device Case Lead stock class designator type clas
10、s outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A d
11、ash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 MHF+2815S/883, MHF+2815SF/883 DC-DC converter, 15 W, 15 V output 02 SMHF2815S, SMHF2815SF DC-DC converter, 15 W, 15 V output 1.2.3 Dev
12、ice class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assu
13、rance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space applications. H Standard military quality class level. This level is intended for use in applications where non-space high reliability devices are
14、 required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance i
15、nspections (Group A, B, C and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed
16、to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a limited temperature range. Provided by IHSNot for ResaleNo reproduction or n
17、etworking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91601 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL K SHEET 3 DSCC FORM 2234 APR 97 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outlin
18、e letter Descriptive designator Terminals Package style X See figure 1 8 Dual-in-line Z See figure 1 8 Flange mount 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Input voltage range -0.5 V dc to +50 V dc Power dissipation (PD): Device typ
19、e 01 6 W Device type 02 (non-RHA) 8 W Device type 02 (RHA levels P, L and R). 9.5 W Output power . 15.45 W Lead soldering temperature (10 seconds) +300C Storage temperature range -65C to +150C 1.4 Recommended operating conditions. Input voltage range +16 V dc to +40 V dc Case operating temperature r
20、ange (TC). -55C to +125C 1.5 Radiation features. Maximum total dose available (dose rate = 9 rad(Si)/s): Device type 02 (RHA levels P, L and R) 100 krad (Si) 2/ 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form
21、a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-S
22、TD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online
23、 at http:/assist.daps.dla.mil/quicksearch/ or www.dodssp.daps.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) _ 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the maxim
24、um levels may degrade performance and affect reliability. 2/ These parts may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects. Radiation end-point limits for the noted parameters are guaranteed only for the conditions as specified in MIL-STD-883, metho
25、d 1019, condition C, tested at 9 rad(Si)/s. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91601 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL K SHEET 4 DSCC FORM 2234 APR 97 2.2 Or
26、der of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1
27、Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 shall include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or
28、 as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not a
29、ffect the form, fit, or function of the device for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance wi
30、th 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full sp
31、ecified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-3853
32、4. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test da
33、ta (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision
34、level control by the manufacturer and be made available to the preparing activity (DSCC-VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DS
35、CC-VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1
36、Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. Provided by IHSNot for Resal
37、eNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91601 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL K SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ 2/
38、55C TC +125C VIN= 28 V dc 0.5 V Group A subgroups Device types Limits Unit no external sync, CL= 0 unless otherwise specified Min Max 1 14.85 15.15 IOUT= 1.0 A dc 2,3 01,02 14.70 15.30 Output voltage VOUTP, L, R 1,2,3 02 14.10 15.90 V dc VIN= 16 V dc to 40 V dc 1,2,3 01, 02 1000 Output current IOUT
39、P, L, R 1,2,3 02 1000 mA 01 80 1 02 175 01 120 IOUT= 1.0 A BW = 10 kHz to 2 MHz 2,3 02 260 VOUTripple voltage VRIPP, L, R 1,2,3 02 520 mVp-p 01 50 VIN=16 V dc to 40 V dc IOUT= 1.0 A 1,2,3 02 100 VOUTline regulation VRLINEP, L, R 1,2,3 02 200 mV IOUT= 0 to 1.0 A 1,2,3 01,02 50 VOUTload regulation VRL
40、OADP, L, R 1,2,3 02 100 mV IOUT= 0 A, Inhibit (pin 1) = 0 V dc 1,2,3 01,02 12 P, L, R 1,2,3 02 15 IOUT= 0 A, Inhibit (pin 1) = open 1, 2, 3 01,02 62 Input current IINP, L, R 1,2,3 02 100 mA 1 01,02 80 IOUT= 1.0 A, BW = 10 kHz to 10 MHz 2,3 01,02 120 IINripple current IRIPP, L, R 1,2,3 02 150 mAp-p S
41、ee footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91601 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL K SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical
42、performance characteristics - Continued. Test Symbol Conditions 1/ 2/ -55C TC +125C VIN= 28 V dc 0.5 V Group A subgroups Device types Limits Unit no external sync, CL= 0 unless otherwise specified Min Max Efficiency Eff IOUT= 1.0 A 1 01,02 78 % 2,3 01,02 74 P, L, R 1,2,3 02 70 Isolation ISO Input to
43、 output or any pin to case (except pin 6) at 500V dc, 1 01,02 100 M TC= +25C P, L, R 1 02 100 Short circuit PDShort circuit 1,2,3 01 6 W power dissipation, PD= PIN- total POUT1,2,3 02 8 P, L, R 1,2,3 02 9.5 4 01,02 500 600 Switching frequency FSIOUT= 1.0 A 5,6 01,02 480 620 kHz P, L, R 4,5,6 02 400
44、750 External sync range 3/ FSYNCIOUT= 1.0 A, TTL level to pin 5 4,5,6 01,02 500 600 kHz P, L, R 4,5,6 02 500 600 4,5,6 01 -600 +600 VOUTstep load transient 4/ VTLOAD50% load to/from 100% load 4,5,6 02 -800 +800 mV pk P, L, R 4,5,6 02 -1200 +1200 VOUTstep load transient recovery 4/ 5/ 6/ TTLOAD50% lo
45、ad to/from 100% load 4,5,6 01 0.300 ms 02 1.2 P, L, R 4,5,6 02 2.4 VOUTstep line transient 5/ 7/ VTLINEInput step 16 V dc to/from 40 V dc, IOUT= 1.0 A 4,5,6 01,02 -800 +800 mV pk P, L, R 4,5,6 02 -1500 +1500 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking pe
46、rmitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91601 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL K SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions 1/ 2/ -55C TC +125C VIN= 28
47、 V dc 0.5 V Group A subgroups Device types Limits Unit no external sync, CL= 0 unless otherwise specified Min Max VOUTstep line transient recovery 5/ 6/ TTLINEInput step 16 V dc to/from 40 V dc, IOUT= 1.0 A 4,5,6 01,02 1.2 ms P, L, R 4,5,6 02 2.4 Start up overshoot 5/ VtonOSIOUT = 1.0 A, VIN= 0 to 2
48、8 V dc 4,5,6 01,02 1500 mV pk P, L, R 4,5,6 02 2000 Start up delay 8/ TonDIOUT = 1.0 A, VIN= 0 to 28 V dc 4,5,6 01,02 25 ms P, L, R 4,5,6 02 100 Load fault recovery 5/ TrLFIOUT = 1.0 A 4,5,6 01,02 30 ms P, L, R 4,5,6 02 100 Capacitive load 5/ 9/ CLNo effect on dc performance, TC= +25C 4 01,02 100 F P, L, R 4 02 100 1/ Post irradiation testing shall be in accordance with 4.3.5 herein. 2/ These parts may be dose rate sensitive in a space environment and
