1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes in accordance with NOR 5962-R158-93. 93-05-11 K. A. Cottongim B Added case outline Z. Redrew entire document. 95-06-15 K. A. Cottongim C Add device type 02, Radiation Hardness Assurance (RHA) requirements and class K devices. Correct para
2、graphs 4.2.a.2 and 4.3.3.b.2 from TCto TA. Table I, change VINconditions from “16 , 28, and 40 V dc“ to “16 V dc to 40 V dc“. Figure 1, case outline X, change dimensions D maximum from 1.455“ to 1.460“ and E maximum from 1.125“ to 1.130“. Update entire document. 04-08-31 Raymond Monnin D Add paragra
3、ph 1.5 and note 2. Table I, added note for enhanced low dose rate effects. Paragraph 4.3.5.a, correct paragraph to add component tested dose rate. Table I; change the maximum limit for the input current test (IIN) device type 02 from 50 mA to 55 mA. -sld 06-12-27 Raymond Monnin E Update Table I to i
4、nclude RHA level “P“. Update table in paragraph 4.3.5 to include RHA level “P “. Update bulletin page to include RHA level “P“ part numbers. gc 07-05-31 Robert M. Heber F Added footnote 1 to table II, under group C end-point electricals. Updated drawing paragraphs. -sld 09-08-03 Charles F. Saffle RE
5、V SHEET REV SHEET REV STATUS REV F F F F F F F F F F F F F OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 PMIC N/A PREPARED BY Steve L. Duncan DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil STANDARD MICROCIRCUIT DRAWING CHECKED BY Michael Jones THIS DRAWING IS AVAILAB
6、LE FOR USE BY ALL DEPARTMENTS APPROVED BY Alan Barone MICROCIRCUIT, HYBRID, LINEAR, 12-VOLT, SINGLE CHANNEL, DC-DC CONVERTER AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 92-08-18 AMSC N/A REVISION LEVEL F SIZE A CAGE CODE 67268 5962-91664 SHEET 1 OF 13 DSCC FORM 2233 APR 97 5962-E
7、402-09Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91664 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents f
8、ive product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN.
9、 The PIN shall be as shown in the following example: 5962 - 91664 01 H X X Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA
10、) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit fun
11、ction 01 MHF+2812S/883, MHF+2812SF/883 DC-DC converter, 15 W, 12 V output 02 SMHF2812S, SMHF2812SF DC-DC converter, 15 W, 12 V output 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requiremen
12、ts of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space app
13、lications. H Standard military quality class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible
14、 limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements
15、 of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the m
16、anufacturers internal, QML certified flow. This product may have a limited temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91664 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REV
17、ISION LEVEL F SHEET 3 DSCC FORM 2234 APR 97 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 8 Dual-in-line Z See figure 1 8 Flange mount 1.2.5 Lead finish. The lead finish shall
18、be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Input voltage range -0.5 V dc to +50 V dc Power dissipation (PD): Device type 01 6 W Device type 02 (non-RHA) . 8 W Device type 02 (RHA levels P, L and R) 9.5 W Output power . 15.30 W Lead soldering temperature (10 seconds) . +300C S
19、torage temperature range -65C to +150C 1.4 Recommended operating conditions. Input voltage range +16 V dc to +40 V dc Case operating temperature range (TC) -55C to +125C 1.5 Radiation features. Maximum total dose available (dose rate = 9 rad(Si)/s): Device type 02 (RHA levels P, L and R) 100 krad (S
20、i) 2/ 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or con
21、tract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-
22、HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
23、1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ These parts may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects. Radia
24、tion end-point limits for the noted parameters are guaranteed only for the conditions as specified in MIL-STD-883, method 1019, condition C, tested at 9 rad(Si)/s. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5
25、962-91664 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 4 DSCC FORM 2234 APR 97 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document,
26、 however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 may in
27、clude the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined i
28、n MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions s
29、hall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.3 Electrical performance characteristics. Unless otherwise spe
30、cified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each su
31、bgroup are defined in table I. 3.5 Marking of Device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performanc
32、e requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameter
33、s manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DSCC-VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required
34、 from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as requ
35、ired in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The mod
36、ification in the QM plan shall not affect the form, fit, or function as described herein. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91664 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISIO
37、N LEVEL F SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ 2/ -55C TC +125C VIN= 28 V dc 0.5 V Group A subgroups Device types Limits Unit no external sync, CL= 0 unless otherwise specified Min Max Output voltage VOUTIOUT= 1.25 A dc 1 01,02 11.8
38、8 12.12 V dc 2,3 11.76 12.24 P, L, R 1,2,3 02 11.28 12.72 Output current IOUTVIN= 16 V dc to 40 V dc 1,2,3 01, 02 1250 mA P, L, R 1,2,3 02 1250 VOUTripple voltage VRIPIOUT= 1.25 A, B.W. = 10 kHz to 2 MHz 1 01 80 mVp-p 02 150 2,3 01 120 02 200 P, L, R 1,2,3 02 400 VOUTline regulation VRLINEVIN=16 V d
39、c to 40 V dc, IOUT= 1.25 A 1,2,3 01 50 mV 02 100 P, L, R 1,2,3 02 200 VOUTload regulation VRLOADIOUT= 0 to 1.25 A 1,2,3 01,02 50 mV P, L, R 1,2,3 02 100 Input current IINIOUT= 0 A, Inhibit (pin 1) = 0 V dc 1,2,3 01,02 12 mA P, L, R 1,2,3 02 15 IOUT= 0 A, Inhibit (pin 1) = open 1,2,3 01 02 50 55 P, L
40、, R 1,2,3 02 75 IINripple current IRIPIOUT= 1.25 A, B.W. = 10 kHz to 10 MHz 1 01,02 80 mAp-p 2,3 01,02 120 P, L, R 1,2,3 02 150 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-9
41、1664 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions 1/ 2/ -55C TC +125C VIN= 28 V dc 0.5 V Group A subgroups Device types Limits Unit no external sync, CL= 0 u
42、nless otherwise specified Min Max Efficiency Eff IOUT= 1.25 A 1 01 78 % 02 76 2,3 01 74 02 72 P, L, R 1,2,3 02 68 Isolation ISO Input to output or any pin to case (except pin 6) at 500 V dc, 1 01,02 100 M TC= +25C P, L, R 1 02 100 Short circuit PDShort circuit 1,2,3 01 6 W power dissipation PD= PIN-
43、 total POUT1,2,3 02 8 P, L, R 1,2,3 02 9.5 Switching frequency FSIOUT= 1.25 A 4 01,02 500 600 kHz 5,6 01,02 480 620 P, L, R 4,5,6 02 400 750 External sync range 3/ FSYNCIOUT= 1.25 A, TTL level to pin 5 4,5,6 01,02 500 600 kHz P, L, R 4,5,6 02 500 600 VOUTstep load transient 4/ VTLOAD50% load to/from
44、 100% load 4,5,6 01 -500 +500 mV pk 4,5,6 02 -700 +700 P, L, R 4,5,6 02 -1000 +1000 VOUTstep load transient recovery 4/ 5/ 6/ TTLOAD50% load to/from 100% load 4,5,6 01 0.8 ms 02 1.0 P, L, R 4,5,6 02 2.0 VOUTstep line transient 5/ 7/ VTLINEInput step 16 V dc to/from 40 V dc, IOUT= 1.25 A 4,5,6 01,02
45、-800 +800 mV pk P, L, R 4,5,6 02 -1500 +1500 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91664 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEE
46、T 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions 1/ 2/ -55C TC +125C VIN= 28 V dc 0.5 V Group A subgroups Device types Limits Unit no external sync, CL= 0 unless otherwise specified Min Max VOUTstep line transient recovery 5/ 6/ TTLINEInpu
47、t step 16 V dc to/from 40 V dc, IOUT= 1.25 A 4,5,6 01,02 1.2 ms P, L, R 4,5,6 02 2.4 Start up overshoot 5/ VtonOSIOUT = 1.25 A, VIN= 0 to 28 V dc 4,5,6 01,02 1200 mV pk P, L, R 4,5,6 02 1600 Start up delay 8/ TonDIOUT = 1.25 A, VIN= 0 to 28 V dc 4,5,6 01,02 25 ms P, L, R 4,5,6 02 100 Load fault reco
48、very 5/ 6/ TrLFIOUT = 1.25 A 4,5,6 01,02 30 ms P, L, R 4,5,6 02 100 Capacitive load 5/ 9/ CLNo effect on dc performance, TC= +25C 4 01,02 100 F P, L, R 4 02 100 1/ Post irradiation testing shall be in accordance with 4.3.5 herein. 2/ These parts may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects. Radiation end-point limits for the noted parameters are guaranteed only for the conditions as specified in MIL-STD-88
