1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes in accordance with NOR 5962-R116-96. 96-04-22 K. A. Cottongim B Correct drawing title. Add Vendor CAGE S7631. Update drawing requirements to MIL-PRF-38534. 01-04-13 Raymond Monnin C Rewrite paragraphs 4.2.a.2. and 4.3.3.b.2 to add TC. 04-
2、06-18 Raymond Monnin D Update drawing paragraphs. -sld 12-02-06 Charles F. Saffle REV SHEET REV SHEET REV STATUS REV D D D D D D D D D D D OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 PMIC N/A PREPARED BY Steve L. Duncan DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil/ S
3、TANDARD MICROCIRCUIT DRAWING CHECKED BY Michael C. Jones THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Kendall A. Cottongim MICROCIRCUIT, HYBRID, LINEAR, 90-VOLT, SYNCHRO TO DIGITAL CONVERTER AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 93-01-19 AMSC N/A REVISIO
4、N LEVEL D SIZE A CAGE CODE 67268 5962-92051 SHEET 1 OF 11 DSCC FORM 2233 APR 97 5962-E156-12 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92051 DLA LAND AND MARTIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL
5、 D SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a cho
6、ice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 - 92051 01 H X X Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see
7、1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) ide
8、ntify the circuit function as follows: Device type Generic number Circuit function Frequency Accuracy 1 LSB BIT/VEL 01 SDC-14602-112 14-bit, 90 V S/D converter 400 Hz 4 min VEL 02 SDC-14602T-112 14-bit, 90 V S/D converter 400 Hz 4 min BIT 03 SDC-14604-112 14-bit, 90 V S/D converter 60 Hz 4 min VEL 0
9、4 SDC-14604T-112 14-bit, 90 V S/D converter 60 Hz 4 min BIT 05 SDC-14607-112 16-bit, 90 V S/D converter 400 Hz 4 min VEL 06 SDC-14607T-112 16-bit, 90 V S/D converter 400 Hz 4 min BIT 07 SDC-14609-112 16-bit, 90 V S/D converter 60 Hz 4 min VEL 08 SDC-14609T-112 16-bit, 90 V S/D converter 60 Hz 4 min
10、BIT 09 SDC-14607-114 16-bit, 90 V S/D converter 400 Hz 2 min VEL 10 SDC-14607T -114 16-bit, 90 V S/D converter 400 Hz 2 min BIT 11 SDC-14609-114 16-bit, 90 V S/D converter 60 Hz 2 min VEL 12 SDC-14609T-114 16-bit, 90 V S/D converter 60 Hz 2 min BIT 1.2.3 Device class designator. This device class de
11、signator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class
12、Device performance documentation K Highest reliability class available. This level is intended for use in space applications. H Standard military quality class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of th
13、e standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C, and D). E Desig
14、nates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken wil
15、l not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a limited temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from
16、IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92051 DLA LAND AND MARTIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 3 DSCC FORM 2234 APR 97 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package s
17、tyle X See figure 1 28 Dual-in-line 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Positive supply voltage (VCC) . +7.0 V dc Negative supply voltage (VEE) -7.0 V dc Reference input voltage . 130 V rms Digital input voltage range . -0.3 V d
18、c to +7.0 V dc Power dissipation, TA= +125 C (PD) . 350 mW Thermal resistance junction-to-case (qJC) 8.0 C/W Thermal resistance junction-to-ambient (qJA) . 20 C/W Storage temperature range -65 C to +150 C Lead temperature (soldering, 10 seconds) +300 C 1.4 Recommended operating conditions. Positive
19、supply voltage (VCC) . +4.75 V dc to +5.25 V dc Negative supply voltage (VEE) -4.75 V dc to -5.25 V dc Reference input voltage range . 10 V rms to 130 V rms Reference input carrier frequency range: Device types 01, 02, 05, 06, 09, and 10 . 360 Hz to 5000 Hz Device types 03, 04, 07, 08, 11, and 12 .
20、47 Hz to 1000 Hz Signal input voltage range . 81 V rms to 99 V rms Ambient operating temperature range (TA) -55 C to +125 C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent
21、specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATIONS MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microc
22、ircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quick
23、search/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this doc
24、ument, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability.Provided by IHSNo
25、t for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92051 DLA LAND AND MARTIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requir
26、ements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 shall include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class. The manuf
27、acturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the ap
28、plicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections.
29、 The terminal connections shall be as specified on figure 2. 3.2.3 Block diagram. The block diagram shall be as specified on figure 3. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply
30、 over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) shall be in accordance
31、with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the e
32、lectrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under d
33、ocument revision level control by the manufacturer and be made available to the preparing activity (DLA Land and Maritime -VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of complia
34、nce (original copy) submitted to DLA Land and Maritime -VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcir
35、cuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or funct
36、ion as described herein. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision
37、level control and shall be made available to either DLA Land and Maritime -VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TAo
38、r TCas specified in accordance with table I of method 1015 of MIL-STD-883. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. Provided by IHSNot for R
39、esaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92051 DLA LAND AND MARTIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55 C TA +12
40、5 C VCC= +5 V dc, VEE= -5 V dc unless otherwise specified Group A subgroups Device type Limits Unit Min Max Resolution 1/ RES 7,8A,8B 01-04 14 Bits 05-12 16 Output accuracy 2/ AOUT 7,8A,8B 01-04 -4 +4 LSB 05-08 -13 +13 09-12 -7 +7 Accuracy repeatability 2/ 3/ AR 7,8A,8B All -1.0 +1.0 LSB Reference i
41、nput voltage range 3/ VIN14,5,6 All 10 130 V rms Reference input impedance 3/ ZIN1Single ended 4,5,6 All 270 kW Differential 540 Reference input common mode range 3/ VCM14,5,6 All -200 +200 V pk Signal input common mode range 3/ VCM24,5,6 All -180 +180 V pk Signal input impedance 3/ ZIN2 Line-to-lin
42、e 4,5,6 All 123 kW Line-to-ground 80 Digital output low voltage VOLIOL= -1.6 mA 1,2,3 All 0.4 V Digital output high voltage VOHIOH= 0.4 mA 1,2,3 All 2.8 V Output leakage current 3/ IOZ1,2,3 All -40 +40 mA Digital input high voltage 1/ VIHDigital inputs INH, EL, and EM. VIN= 2.0 V 1,2,3 All pass/ fai
43、l See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92051 DLA LAND AND MARTIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical perform
44、ance characteristics - Continued. Test Symbol Conditions -55 C TA +125 C VCC= +5 V dc, VEE= -5 V dc unless otherwise specified Group A subgroups Device type Limits Unit Min Max Digital input low voltage 1/ VILDigital inputs INH, EL, and EM. VIN= 0.8 V 1,2,3 All pass/ fail Digital input current 1/ II
45、NInternal pull-up 4,5,6 All 10 mA Inhibit voltage 1/ VINHNo digital angles change while INH is logic 0 and analog input is rotating 7,8A,8B All 0.8 V Enable voltage 1/ VEEM controls output bits 1 through 8 and EL controls output bits 9 through 14 for device types 01through 04 and bits 9 through 16 f
46、or device types 05 through 12. 7,8A,8B All 0.8 V Disable voltage 1/ (high impedance) VDEM controls output bits 1 through 8 and EL controls output bits 9 through 14 for device types 01through 04 and bits 9 through 16 for device types 05 through 12. 7,8A,8B All 2.0 V Positive supply voltage ICCVCC= +5
47、.25 V 1,2,3 All +17 mA Negative supply voltage IEEVEE= -5.25 V 1,2,3 All -17 mA Analog velocity output voltage VOUT4/ 7,8A,8B All 3.24 4.00 V Bandwidth 1/ BW 7,8A,8B 01,02, 05,06, 09,10 72 134 Hz 03,04, 07,08, 11,12 10 20 1/ These parameters are tested on a go-no-go basis only or in conjunction with
48、 other measured parameters and are not directly testable. 2/ Output accuracy is measured at angles from 0 , to 180 , in 15 increments, and at 225 , 270 , and 315 . 3/ Parameters shall be tested as part of device initial characterization and after design and process changes. Parameter shall be guaranteed to the limits specified in table I for all lots not specifically tested. 4/ Analog output voltage is tested at 8 revolutions per second (rps) for device types 01 and 02, 1 rps for device types 03 and
