1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Table I, add Reference input voltage range, VIN1test, correct conditions for ICCand IEE. Add note to figure 2. Update drawing requirements to MIL-PRF-38534. 01-06-14 Raymond Monnin B Rewrite paragraphs 4.2.a.2. and 4.3.3.b.2 to add TC. 04-06-18 R
2、aymond Monnin C Updated drawing paragraphs. -sld 12-02-06 Charles F. Saffle THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHEET REV SHEET REV STATUS REV C C C C C C C C C C C OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 PMIC N/A PREPARED BY Steve L. Duncan DLA LAND AND MARITIME COLUMBUS
3、, OHIO 43218-3990 http:/www.landandmaritime.dla.mil/ STANDARD MICROCIRCUIT DRAWING CHECKED BY Michael C. Jones THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Gregory A. Lude MICROCIRCUIT, HYBRID, LINEAR, 11.8-VOLT SYNCHRO AND RESOLVER TO DIGITAL CONVERTER AND AGENCIES OF THE DEPART
4、MENT OF DEFENSE DRAWING APPROVAL DATE 92-05-22 AMSC N/A REVISION LEVEL C SIZE A CAGE CODE 67268 5962-92053 SHEET 1 OF 11 DSCC FORM 2233 APR 97 5962-E158-12 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-9205
5、3 DLA LAND AND MARITME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected
6、 in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 - 92053 01 H X X Federal RHA Device Device Case Lead stock class designator type class outline finish
7、designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates
8、 a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function Frequency Accuracy 1 LSB BIT/VEL 01 SDC-14610II-112 14-bit, 11.8 V S/D converter 400 Hz 4 min VEL 02 SDC-14610IIT-112 14-bit, 11.8 V S/D converter 400 Hz
9、4 min BIT 03 SDC-14611II-112 14-bit, 11.8 V R/D converter 400 Hz 4 min VEL 04 SDC-14611IIT-112 14-bit, 11.8 V R/D converter 400 Hz 4 min BIT 05 SDC-14615II-112 16-bit, 11.8 V S/D converter 400 Hz 4 min VEL 06 SDC-14615IIT-112 16-bit, 11.8 V S/D converter 400 Hz 4 min BIT 07 SDC-14616II-112 16-bit, 1
10、1.8 V R/D converter 400 Hz 4 min VEL 08 SDC-14616IIT-112 16-bit, 11.8 V R/D converter 400 Hz 4 min BIT 09 SDC-14615II-114 16-bit, 11.8 V S/D converter 400 Hz 2 min VEL 10 SDC-14615IIT -114 16-bit, 11.8 V S/D converter 400 Hz 2 min BIT 11 SDC-14616II-114 16-bit, 11.8 V R/D converter 400 Hz 2 min VEL
11、12 SDC-14616IIT-114 16-bit, 11.8 V R/D converter 400 Hz 2 min BIT 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualifi
12、cation (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space applications. H Standard military quality class level. This level is in
13、tended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, an
14、d the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C, and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device
15、acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a
16、limited temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92053 DLA LAND AND MARITME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 3 DSCC FORM 2234 APR 97 1.2.4 Case outline(s). The case o
17、utline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 36 Dual-in-line 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Positive supply voltage (VCC) . +7.0 V
18、dc Negative supply voltage (VEE) -7.0 V dc Reference input voltage . 35 V rms Digital input voltage range . -0.3 V dc to +7.0 V dc Power dissipation, TA= +125 C (PD) . 550 mW Thermal resistance junction-to-case (qJC) 8.0 C/W Thermal resistance junction-to-ambient (qJA) . 20 C/W Storage temperature r
19、ange -65 C to +150 C Lead temperature (soldering, 10 seconds) +300 C 1.4 Recommended operating conditions. Positive supply voltage (VCC) . +4.75 V dc to +5.25 V dc Negative supply voltage (VEE) -4.75 V dc to -5.25 V dc Reference input voltage range . 2.0 V rms to 35 V rms Reference input carrier fre
20、quency range 360 Hz to 5000 Hz Signal input voltage range . 10.62 V rms to 12.98 V rms Ambient operating temperature range (TA) -55 C to +125 C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this dr
21、awing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATIONS MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Me
22、thod Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assis
23、t.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence.
24、 Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliabili
25、ty.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92053 DLA LAND AND MARITME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual ite
26、m performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 shall include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable dev
27、ice class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of t
28、he device for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 T
29、erminal connections. The terminal connections shall be as specified on figure 2. 3.2.3 Block diagram. The block diagram shall be as specified on figure 3. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in tab
30、le I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) sha
31、ll be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein
32、shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall b
33、e maintained under document revision level control by the manufacturer and be made available to the preparing activity (DLA Land and Maritime -VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The ce
34、rtificate of compliance (original copy) submitted to DLA Land and Maritime -VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with
35、each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the
36、 form, fit, or function as described herein. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer unde
37、r document revision level control and shall be made available to either DLA Land and Maritime -VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of
38、MIL-STD-883. (2) TAor TCas specified in accordance with table I of method 1015 of MIL-STD-883. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. Prov
39、ided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92053 DLA LAND AND MARITME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Con
40、ditions -55 C TA +125 C VCC= +5 V dc, VEE= -5 V dc unless otherwise specified Group A subgroups Device type Limits Unit Min Max Resolution 1/ RES 7,8A,8B 01-04 14 Bits 05-12 16 Output accuracy 2/ AOUT 7,8A,8B 01-04 -4 +4 LSB 05-08 -13 +13 09-12 -7 +7 Accuracy repeatability 2/ 3/ AR 7,8A,8B All -1.0
41、+1.0 LSB Reference input voltage range 3/ VIN14,5,6 All 2.0 35 V rms Reference input impedance 3/ ZIN1Single ended 4,5,6 All 60 kW Differential 120 Reference input common mode range 3/ VCM14,5,6 All -50 +50 V pk Signal input common mode range 3/ VCM24,5,6 All -30 +30 V pk Signal input impedance 3/ Z
42、IN2 Line-to-line 4,5,6 01,02, 05,06, 09,10 52 kW Line-to-ground 34 Single ended 03,04,07,08, 11,12 70 Differential 140 Digital output low voltage 1/ VOLIOL= -1.6 mA 1,2,3 All 0.4 V Digital output high voltage 1/ VOHIOH= 0.4 mA 1,2,3 All 2.8 V Output leakage current 3/ IOZ1,2,3 All -60 +60 mA See foo
43、tnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92053 DLA LAND AND MARITME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance char
44、acteristics - Continued. Test Symbol Conditions -55 C TA +125 C VCC= +5 V dc, VEE= -5 V dc unless otherwise specified Group A subgroups Device type Limits Unit Min Max Digital input high voltage 1/ VIHDigital inputs INH, EL, and EM. VIN= 2.0 V 1,2,3 All pass/ fail Digital input low voltage 1/ VILDig
45、ital inputs INH, EL, and EM. VIN= 0.8 V 1,2,3 All pass/ fail Digital input current 1/ IINInternal pull-up 4,5,6 All -10 mA Inhibit voltage 1/ VINHNo digital angles change while INH is logic 0 and analog input is rotating 7,8A,8B All 0.8 V Enable voltage 1/ VEEM controls output bits 1 through 8 and E
46、L controls output bits 9 through 14 for device types 01 through 04, and bits 9 through 16 for device types 05 through 12. 7,8A,8B All 0.8 V Disable voltage 1/ (high impedance) VDEM controls output bits 1 through 8 and EL controls output bits 9 through 14 for device types 01 through 04, and bits 9 th
47、rough 16 for device types 05 through 12. 7,8A,8B All 2.0 V Positive supply voltage ICCVCC= +5.25 V 1,2,3 All +51 mA Negative supply voltage IEEVEE= -5.25 V 1,2,3 All -51 mA Analog velocity output voltage VOUT4/ 7,8A,8B All 3.24 4.00 V Bandwidth 1/ BW 7,8A,8B All 72 134 Hz 1/ These parameters are tes
48、ted on a go-no-go basis only or in conjunction with other measured parameters and are not directly testable. 2/ Output accuracy is measured at angles from 0 , to 180 , in 15 increments, and at 225 , 270 , and 315 . 3/ Parameters shall be tested as part of device initial characterization and after design and process changes. Parameter shall be guaranteed to the limits specified in table I for all lots not specifically tested. 4/ Analog output voltage is tested at 8 revolutions per second (rps) for device ty
