1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes in accordance with NOR 5962-R174-95. 95-07-28 Kendall A. Cottongim B Update drawing reflect current requirements. -sld 02-08-28 Raymond Monnin C Correct paragraphs 4.2.a.2. and 4.3.3.b.2. -gz 07-03-01 Joseph Rodenbeck D Table II, add note
2、 to Group C end-point test parameters. Paragraphs 4.2.a.2 and 4.3.3.b.2, reinstate original paragraphs. Update boilerplate paragraphs. -gz 11-11-10 Charles F. Saffle REV SHEET REV SHEET REV STATUS REV D D D D D D D D D D OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 PMIC N/A PREPARED BY Gary Zahn DLA LAND AN
3、D MARITIME STANDARD MICROCIRCUIT DRAWING CHECKED BY Michael C. Jones COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Kendall A. Cottongim MICROCIRCUIT, HYBRID, LINEAR, 15-VOLT, SINGLE CHANNEL, DC/DC CONVERTER AND AGENCIES O
4、F THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 94-02-16 AMSC N/A REVISION LEVEL D SIZE A CAGE CODE 67268 5962-92113 SHEET 1 OF 10 DSCC FORM 2233 APR 97 5962-E066-12Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE
5、A 5962-92113 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and a
6、re reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 - 92113 01 H Z X Federal RHA Device Device Case Lead stock class designator type class out
7、line finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (
8、-) indicates a non-RHA device. 1.2.2 Device type. The device type identify the circuit function as follows: Device type Generic number Circuit function 01 AHV2815SF/CH DC/DC converter, 15 W, 15 V output 1.2.3 Device class designator. This device class designator shall be a single letter identifying
9、the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest rel
10、iability class available. This level is intended for use in space applications. H Standard military quality class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level
11、uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C, and D). E Designates devices which are based upon one of the
12、other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D M
13、anufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a limited temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5
14、962-92113 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 3 DSCC FORM 2234 APR 97 1.2.4 Case outline. The case outline are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style Z See figure 1 10 Flange mount 1.2.5 Lead fini
15、sh. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Input voltage range -0.5 V dc to +50 V dc (continuous), 80 V (100 ms) Power dissipation (PD) . 10 W Lead temperature (soldering, 10 seconds) +300C Storage temperature range -65C to +150C 1.4 Recommended oper
16、ating conditions. Input voltage range +16 V dc to +40 V dc Output power 2/ 15 W Case operating temperature range (TC) -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the
17、 extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard
18、 Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mi
19、l/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in t
20、his document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF
21、-38534 may include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements
22、 as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device.
23、Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Derate output power linearly above case temperature +125C to 0 at +135C. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A
24、5962-92113 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 4 DSCC FORM 2234 APR 97 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline. The case outline shall
25、 be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.2.3 Block diagram. The block diagram shall be as specified on figure 3. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the elect
26、rical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in ta
27、ble I. 3.5 Marking of devices. Marking of devices shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38
28、534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for t
29、hose which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DLA Land and Maritime-VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a man
30、ufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DLA Land and Maritime-VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance a
31、s required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. T
32、he modification in the QM plan shall not affect the form, fit, or function as described herein. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test c
33、ircuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DLA Land and Maritime-VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accor
34、dance with the intent specified in method 1015 of MIL-STD-883. (2) TCas specified in accordance with table I of method 1015 of MIL-STD-883. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optiona
35、l at the discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92113 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrica
36、l performance characteristics. Test Symbol Conditions -55C TC+125C VIN= 28 V dc 5%, CL= 0 unless otherwise specified Group A subgroups Device type Limits Unit Min Max Output voltage VOUTIOUT= 0 1 01 14.85 15.15 V 2,3 14.70 15.30 Output adjust 1/ VOAPin 3 shorted to pin 4 1,2,3 01 6 10 % Output curre
37、nt 2/ IOUTVIN= 16, 28, and 40 V dc 1,2,3 01 0.0 1000 mA Output ripple voltage 3/ VRIPVIN= 16, 28, and 40 V dc, B.W. = 20 Hz to 2 MHz 1,2,3 01 60 mV p-p Line regulation VRLINEVIN= 16, 28, and 40 V dc, IOUT= 0, 500, and 1000 mA 1 01 35 mV 2,3 75 Load regulation VRLOADVIN= 16, 28, and 40 V dc, IOUT= 0,
38、 500, and 1000 mA 1,2,3 01 150 mV Input current IINIOUT= 0, inhibit (pin 2) tied to input return (pin 10) 1,2,3 01 18 mA IOUT= 0, inhibit (pin 2) = open 50 Input ripple current 3/ IRIPIOUT= 1000 mA, B.W. = 20 Hz to 2 MHz 1,2,3 01 50 mA p-p Efficiency EFFIOUT= 1000 mA 1 01 72 % 2,3 66 Isolation ISO I
39、nput to output or any pin to case (except pin 8) at 500 V dc, TC= +25C 1 01 100 M Capacitive load 4/ 5/ CLNo effect on dc performance, TC= +25C 4 01 200 F Power dissipation load fault PDOverload, TC= +25C 6/ 1 01 10 W Short circuit 1,2,3 10 Switching frequency FSIOUT= 1000 mA 4,5,6 01 450 550 kHz Ou
40、tput response to step transient load changes 7/ VOTLOAD50 percent load to/from 100 percent load 4 01 -300 +300 mV pk 5,6 -450 +450 No load to/from 50 percent load 4,5,6 01 -750 +750 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license fr
41、om IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92113 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions -55C TC+125C VIN= 28 V dc 5%, CL= 0 unless otherwise specified
42、 Group A subgroups Device type Limits Unit Min Max Recovery time, step transient load changes 7/ 8/ TTLOAD50 percent load to/from 100 percent load 4,5,6 01 70 s No load to 50 percent load 4,5,6 1500 50 percent load to no load 4,5,6 5 ms Output response transient to step line changes 5/ 9/ VOTLINE In
43、put step 16 V to 40 V dc 4,5,6 01 500 mV pk Input step 40 V to 16 V dc 4,5,6 -1500 Recovery time transient step line changes 5/ 8/ 9/ TTLINE Input step 16 V to 40 V dc 4,5,6 01 800 s Input step 40 V to 16 V dc 4,5,6 800 Turn on overshoot VTonOSIOUT= 0 and 1000 mA 4,5,6 01 750 mV pk Turn on delay 10/
44、 TonDIOUT= 0 and 1000 mA 4,5,6 01 10 ms Load fault recovery 5/ TrLF4,5,6 01 10 ms 1/ The output voltage of this device can be adjusted upward by connecting pin 3 and pin 4 as follows: Output Adjustment Resistor Values Resistance, Pin 3 to 4 Output Voltage increase, % 0 390 k +1% 145 k +2% 63 k +3% 2
45、2 k +4% 0 +5% 2/ Parameter guaranteed by line and load regulation tests. 3/ Bandwidth guaranteed by design. Tested for 20 kHz to 2 MHz. 4/ Capacitive load may be any value from 0 to the maximum limit without compromising dc performance. A capacitive load in excess of the maximum limit will not distu
46、rb loop stability but may interfere with the operation of the load fault detection circuitry, appearing as a short circuit during turn-on. 5/ Parameter shall be tested as part of design characterization and after design or process changes. Thereafter, parameters shall be guaranteed to the limits spe
47、cified in table I. 6/ An overload is that condition with a load in excess of the rated load but less than that necessary to trigger the short circuit protection and is the condition of maximum power dissipation. 7/ Load step transition time between 2 and 10 microseconds. 8/ Recovery time is measured
48、 from the initiation of the transient to where VOUThas returned to within 1 percent of VOUT at 50 percent load. 9/ Input step transition time between 2 and 10 microseconds. 10/ Turn on delay time measurement is for either a step application of power at the input or the removal of a ground signal from the inhibit pin (pin 2) while power is applied to the input. Provided by IHSNot for ResaleNo reproduction or networking permitt
