1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Drawing updated to reflect current requirements. -ro 01-09-10 R. MONNIN B Drawing updated as part of 5 year review. -rrp 07-05-15 ROBERT M. HEBER REV SHET REV SHET REV STATUS REV B B B B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12
2、PMIC N/A PREPARED BY MARCIA B. KELLEHER DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY CHARLES E. BESORE COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY MICHAEL A. FRYE MICROCIRCUIT, LINEAR, CMOS, FIXED / ADJU
3、STABLE, LOW POWER, STEP-UP SWITCHING REGULATOR, MONOLITHIC SILICON AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 92-11-19 AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 67268 5962-92141 SHEET 1 OF 12 DSCC FORM 2233 APR 97 5962-E307-06 Provided by IHSNot for ResaleNo reproduction or net
4、working permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92141 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reli
5、ability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN. 1.2 PIN. The P
6、IN is as shown in the following example: 5962 - 92141 01 M P X Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2)Device class designatorCase outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA mark
7、ed devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device
8、 type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 MAX631A Fixed, +5 V / adjustable output low power step-up switching regulator 02 MAX631B Fixed, +5 V / adjustable output low power step-up switching regulator 03 MAX632A Fixed, +12 V
9、 / adjustable output low power step-up switching regulator 04 MAX632B Fixed, +12 V / adjustable output low power step-up switching regulator 05 MAX633A Fixed, +15 V / adjustable output low power step-up switching regulator 06 MAX633B Fixed, +15 V / adjustable output low power step-up switching regul
10、ator 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in acco
11、rdance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style P GDIP1-T8 or CDIP2-T8 8 Dual-in-line 1.2.5 Lead fi
12、nish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92141 DEFENSE SUPPLY CENTER C
13、OLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ 2/ Output voltage (VOUT) 18.0 V dc Output voltage (LX, LBO) 18.0 V dc Input voltage (LBI, VFB) -0.3 V to (+VOUT+ 0.3 V) Output current (LX) 450 mA peak Output current (LBO) 50 mA Power d
14、issipation (PD): Up to +70C . 640 mW Derate above +70C 8 mW/C Junction temperature (TJ) . +150C Storage temperature range . -65C to +150C Lead temperature (soldering, 10 seconds) +300C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Thermal resistance, junction-to-ambient (JA) 125C/W 1.
15、4 Recommended operating conditions. Input voltage range (VIN) 2.4 V dc to 16.5 V dc Output voltage range (VOUT) 2.4 V dc to 16.5 V dc Ambient operating temperature range (TA) . -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification,
16、standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specificatio
17、n for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies
18、 of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this
19、 drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. _ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device.
20、Extended operation at the maximum levels may degrade performance and affect reliability. 2/ TA= +25C, unless otherwise specified. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92141 DEFENSE SUPPLY CENTER CO
21、LUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Mana
22、gement (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construc
23、tion, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein. 3
24、.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Block diagram. The block diagram shall be as specified on figure 2. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performa
25、nce characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgr
26、oup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking
27、 the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark
28、. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be re
29、quired from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The c
30、ertificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, append
31、ix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device c
32、lass M. For device class M, notification to DSCC-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DSCC, DSCCs agent, and the acquiring activity
33、 retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in micro
34、circuit group number 76 (see MIL-PRF-38535, appendix A).Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92141 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 5 DSCC FORM 2234 A
35、PR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions VIN= 3.0 V -55C TA +125C Group A subgroups Device type Limits 1/ Unit unless otherwise specified Min Max Start-up voltage VSUVoltage at VOUT1 01 1.5 V 2,3 2.0 Supply current 2/ ISLXoff 1,2,3 01,02 0.4 mA 03,04 2.0 05,06 2.
36、5 Reference voltage VREF1 All 1.24 1.38 V 2,3 1.20 1.42 Output voltage 2/ VOUTNo load, VFB= GND 1,2,3 01 4.75 5.25 V 02 4.5 5.5 03 11.4 12.6 04 10.8 13.2 05 14.25 15.75 06 13.5 16.5 Line regulation 3/ VRLINE3 V VIN 6 V, 1,2,3 All 0.2 %VOUTR3 = 816 k, R4 = 100 k Load regulation 3/ VRLOADVIN= 6 V, IOU
37、T= 1 mA, 20 mA, 1,2,3 All 1.0 %VOUTR3 = 816 k, R4 = 100 k Oscillator duty 2/ cycle ODCTA= +25C 1 All 40 60 % On resistance, LXRONIX= 100 mA, VOUT= 5.0 V, 1 All 12 TA= +25C Low battery input bias current ILBITA= +25C 1 All 10 nA Leakage current, LXILXVLX= 16.5 V 1 All 1.0 A 2,3 100 See footnotes at e
38、nd of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92141 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance chara
39、cteristics - Continued. Test Symbol Conditions VIN= 3.0 V -55C TA +125C Group A subgroups Device type Limits 1/ Unit unless otherwise specified Min Max Low battery input threshold voltage VLBITA= +25C 1 All 1.18 1.44 V Low battery output current ILBOVLBO= +0.4 V, VLBI= +1.18 V 1,2,3 All 500 A Oscill
40、ator 2/ frequency fOTA= +25C 1 01 40 50 kHz 02 35 60 03 45.5 56 04 40 65 05 45.5 56 06 40 65 VFBinput bias current IFBTA= +25C 1 All 10 nA Diode forward voltage VFTA= +25C, IF= 100 mA 1 All 1.0 V On resistance, CP RCPONVOUT= 5.0 V, IOUT= 10 mA, 1 All 140 TA= +25C Low battery output leakage current I
41、LBOLVLBI= +1.44 V, 1,2,3 All 3.0 A VLBO= +16.5 V 1/ The algebraic convention, whereby the most negative value is a minimum and the most positive a maximum, is used in this table. Negative current shall be defined as conventional current flow out of a device terminal. 2/ S1 set to B and S2 open provi
42、des a nominal output voltage of 5 volts for device types 01 and 02, 12 volts for device types 03 and 04 and 15 volts for device types 05 and 06. See figure 3. 3/ R3 and R4 give a nominal output voltage of 12 volts with S1 set to A and S2 closed. See figure 3. Provided by IHSNot for ResaleNo reproduc
43、tion or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92141 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 Device types All Case outline P Terminal number Terminal symbol 1 LBI 2 LBO 3 GND 4 LX5 VO
44、UT6 CP 7 VFB8 COMP FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92141 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 8 DSCC FORM 2234 APR 97
45、 FIGURE 2. Block diagram. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92141 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 9 DSCC FORM 2234 APR 97 FIGURE 3. Test circuit.P
46、rovided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92141 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 10 DSCC FORM 2234 APR 97 4. VERIFICATION 4.1 Sampling and inspection. For d
47、evice classes Q and V, sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. For device class M, sampling a
48、nd inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted on all devices prior to qualification and technology conformance inspection. For device class M, screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to qualit
