1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Figure 2, changes to the following dimensions: A, add minimum limit of 0.510“; B, change maximum limit of 0.915“ to 0.780“ and add minimum limit of 0.760“; C, change maximum limit of 0.358“ to 0.250“ and add minimum limit of 0.220“; E, add minimu
2、m limit of 0.080“; H, change to 1.187“ BSC; and J, change to 0.593“ BSC. Update drawing requirements to MIL-PRF-38534. 01-03-13 Raymond Monnin B Add device type 02. Correct paragraphs 4.2.a.2 and 4.3.3.b.2 to allow either TCor TA. 04-05-28 Raymond Monnin C Add device type 03 and case outlines Y and
3、Z. 05-12-15 Raymond Monnin D Table I, slew rate for device type 03, tighten the minimum limit from 1.0 V/s to 6 V/s. Table I, add positive and negative current limit tests for device type 03. 4.2.a.2, correct the reference to table I of method 1015. 4.3.3.b.2, correct the reference to table I of met
4、hod 1005. -gz 10-09-08 Charles F. Saffle E Table I, Quiescent current, device types 02 and 03, change limits for subgroups 2 and 3 from 40 and 20 mA to 46 and 23 mA. Table II, add note to Group C end-point test parameters. -gz 11-08-09 Charles F. Saffle F Add device type 04. 1.2.2, Device type 03, C
5、ircuit function, add “(selected current limit)”. -gz 11-11-01 Charles F. Saffle THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHEET REV SHEET REV STATUS REV F F F F F F F F F F F F OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 PMIC N/A PREPARED BY Gary Zahn DLA LAND AND MARITIME STAND
6、ARD MICROCIRCUIT DRAWING CHECKED BY Michael C. Jones COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Kendall A. Cottongim MICROCIRCUIT, HYBRID, LINEAR, HIGH POWER, DUAL AND SINGLE, OPERATIONAL AMPLIFIER AND AGENCIES OF THE
7、DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 94-11-15 AMSC N/A REVISION LEVEL F SIZE A CAGE CODE 67268 5962-92152 SHEET 1 OF 12 DSCC FORM 2233 APR 97 5962-E534-11Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962
8、-92152 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are ref
9、lected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 - 92152 01 G X X Federal RHA Device Device Case Lead stock class designator type class outline f
10、inish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) ind
11、icates a non-RHA device. 1.2.2 Device types. The device types identify the circuit function as follows: Device type Generic number Circuit function 01 PA21M Dual, high power, wide common mode range, operational amplifier 02 MSK 184G Dual, high power, wide common mode range, operational amplifier 03
12、MSK 181G Single, high power, wide common mode range, operational amplifier (selected current limit) 04 MSK 181G Single, high power, wide common mode range, operational amplifier 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance lev
13、el. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available.
14、 This level is intended for use in space applications. H Standard military quality class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screenin
15、g and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C, and D). E Designates devices which are based upon one of the other classes (K, H, or G
16、) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified qua
17、lity class. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a limited temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92152 DLA LAND AND MA
18、RITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 3 DSCC FORM 2234 APR 97 1.2.4 Case outlines. The case outlines are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 8 Flange mount Y See figure 1 8 Dual-in-line (power) Z
19、 See figure 1 8 Dual-in-line (Z-tab power) 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Supply voltage (VS): Device type 01 2.5 V dc to 20 V dc Device types 02, 03, and 04 4 V dc to 30 V dc Differential input voltage . VSCommon mode Inpu
20、t voltage (VCM): Device type 01 +VS, -VS- 0.5 V dc Device types 02, 03, and 04 +VS- 3 V dc, -VS- 0.1 V dc Output current (device types 02, 03, and 04) . 4 A Power dissipation (PD): Each amplifier . 25 W Both amplifiers 36 W Junction temperature (TJ) . +150C Thermal resistance, junction-to-case (JC):
21、 Device type 01 3.4C/W (both amplifiers) Device type 02 3.5C/W (each amplifier) Device type 03 and 04 2.5C/W Lead temperature (soldering, 10 seconds) . +300C Storage temperature range -65C to +150C 1.4 Recommended operating conditions. Supply voltage (VS): Device type 01 15 V dc Device types 02, 03,
22、 and 04 4 V dc to 30 V dc Case operating temperature range (TC): Device type 01 -55C to +125C Device types 02, 03, and 04 -40C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to
23、 the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Stan
24、dard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dl
25、a.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reli
26、ability. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92152 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 4 DSCC FORM 2234 APR 97 2.2 Order of precedence. In the event of a conflic
27、t between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item perfo
28、rmance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 may include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class
29、. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device
30、 for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal conne
31、ctions. The terminal connections shall be as specified on figure 2. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrica
32、l test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of devices. Marking of devices shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1
33、.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conform
34、ance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made availabl
35、e to the preparing activity (DLA Land and Maritime-VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DLA Land and Maritime-VA shall affirm t
36、hat the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspect
37、ion. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 4.2 Screening. Screening shall be in accordance
38、with MIL-PRF-38534. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DLA Land and Maritime
39、-VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TAor TCas specified in accordance with table I of method 1015 of MIL-STD-883.
40、 b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-
41、STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92152 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ 2/ -55C TC+125C VS= 15 V dc 5% unless otherwise specified Group A subgroups Device
42、 type Limits Unit Min Max Quiescent current IQVIN= 0 V dc, AV = 100 1,2,3 01 105 mA VIN= 0 V dc 1 02 40 mA 2,3 46 1 03,04 20 2,3 23 Input offset voltage VOSVIN= 0 V dc, AV = 100, VS= 2.5 V dc 1,2,3 01 15 mV VIN= 0 V dc, AV = 100, VS= 15 V dc 15 mV VIN= 0 V dc, VS= 30 V dc, TC= +25C 1 02,03, 04 10 mV
43、 VIN= 0 V dc, AV = 100, VS= 20 V dc 1,2,3 01 19 mV Input offset current 3/IOSVIN= 0 V dc 1,2,3 01,02, 03,04 500 nA Input bias current 3/IBVIN= 0 V dc 1,2,3 01,02, 03,04 1000 nA Positive current limit +ILIMRL= 10, RLIM= 34 k 1 03 1.425 1.575 A 04 1.350 1.650 Negative current limit -ILIMRL= 10, RLIM=
44、34 k 1 03 -1.575 -1.425 A 04 -1.650 -1.350 Output voltage VOVS= 9.5 V dc, IO= 2 A, RL= 3 TC= +25C 4 01 6.0 V VS= 30 V dc, IO= 0.6 A, TC= +25C 4 02,03, 04 27 V See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MIC
45、ROCIRCUIT DRAWING SIZE A 5962-92152 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions 1/ 2/ -55C TC+125C VS= 15 V dc 5% unless otherwise specified Group A subgroups Device
46、 type Limits Unit Min Max Output voltage - Continued. VO VS= 11 V dc, IO= 100 mA, RL= 100 4,5,6 01 10 V VS= 30 V dc, IO= 3 A, TC= +25C 4 02,03, 04 25.5 V VS= 4.8 V dc, IO= 1 A, RL= 3 4,5,6 01 3.0 V VS= 4 V dc, IO= 750 mA, RL= 3 TC= +125C 5 2.25 V VS= 9.5 V dc, IO= 2 A, RL= 3 TC= -55C 6 6.0 V Cross t
47、alk XTLK RL= 3 , TC= +25C 4 01 50 dB Stability/noise ENAV = 1, CL= 1.5 nF 4,5,6 01 1.0 mV Slew rate SRRL= 500 4,5,6 01 0.5 V/s VOUT= 50 Vp-p, RL= 500, TC= +25C 4 02 1.0 V/s 03,04 6 V/s Open loop gain 3/ AOLRL= 500 , f = 10 Hz4,5,6 01 75 dB VOUT= 50 Vp-p, RL= 1 kTC= +25C4 02,03,04 90 dB Common mode r
48、ejection 3/ CMR VS= 17 V dc, RL= 500 , VCM= 14 V dc 4,5,6 01 60 dB VIN= 27 V, VS= 30 V dc, TC= +25C 4 02,03,04 80 dB 1/ Device types 02, 03, and 04 minimum to maximum operating/test conditions is -40C TC +125C. 2/ For device type 03 and 04, ILIMis connected to -VSand Enable/Status is left open. 3/ For device types 02, 03, and 04, this parameter shall be guaranteed by design if not tested. Provide
