1、SMD-59b2-92204 REV A E 9%9999b 0089404 325 H DEFENSE LOGISTICS AGENCY DEFENSE SUPPLY CENTER, COLUMBUS 3990 EAST BROAD STREET COLUMBUS, OH 43216-5000 IN REPLY REFER TO DSCC-VAC (Mr. Miesse/(614) 692-0543 (DSN 850) SEP 2 6 .1596 SUBJECT: Notice of Revision (NOR) 5962-R200-96 for Standard Microcircuit
2、Drawing (SMD) 5962-92204 Military/Industry Distribution The enclosed NOR is approved for use effective as of the date of the NOR. In accordance with MIL-STD-100 SMD holders should, as a minimum, handwrite those changes described in the NOR to sheet 1 of the subject SMD. After completion, the NOR sho
3、uld be attached to the subject SMD for future reference. Those companies who were listed as approved sources of supply prior to this action have agreed to actions taken on devices for which they had previously provided DSCC a certificate of compliance. This is evidenced by an existing active current
4、 certificate of compliance on file at DSCC with a DSCC record of verbal coordination. The certificate of compliance for these devices is considered concurrence with the new revision unless DSCC is otherwise notified. If you have comments or questions, please contact Mr. Bernard Miesse at (614) 692-0
5、543 (DSN 850). 1 Encl Chief, Custom Microelectronics Team Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-NOTICE OF REVISION (NOR) THIS REVISION DESCRIBED BELOW HAS BEEN AUTHORIZED FOR THE DOCUMENT LISTED. ubiic mating burden fw is dieciion is estima
6、ted to average 2 hairs perresparse induding the me forreviewing instructions searching existing data sources sped o!this wllecbon of inforniabon, indudin su estions for reduung this burden, to Department of Defense, Washington !%adquarim Services. Diredorate LEASE DO NOT RETkN COUR COMPLETED FOkM TO
7、 EITHER OF THESE ADDRESSED. RETURN COMPLETED FORM TO THE GOVERNMENT athenn and mainpinin the da$ needed. compleng and reviM.ng the colledi distribution is unlimited. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SUD-5762-92204 9999996 0062335 980 I
8、 STANDARDIZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER I DAYTON, OHIO 45444 1. SCOPE 1.1 Scope. This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Tu0 product assurance classes consisting of military high reliability (device classes Q and MI an
9、d space application (device class V), and a choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). 1.2.1 of flIL-STD-883, “Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices“. available, a choice of Radiatio
10、n Hardness Assurance (RHA) levels are reflected in the PIN. Device class M microcircuits represent non-JAN class microcircuits in accordance with Uhen I 1.2 F. The PIN shall be as shown in the following example: SIZE 5962-92204 A REVISION LEVEL SHEET 5962 92204 M K X I I I l I l I I I I I I Lead Cas
11、e Device Devi ce RHA i Federal stock class designator type class outline finish designator (See 1.2.1) (See 1.2.2) designator (See 1.2.4) (See 1.2.5) / (See 1.2.3) / Drawing number 1.2.1 RHA designator. Device class M RHA marked devices shaLl wet the MIL-1-38535 appendix A specified RHA Levels and s
12、hall be marked with the appropriate RHA designator. MIL-1-38535 specified RHA levels and shall be marked with the appropriate RHA designator. non-RHA device. Device classes Q and V RHA marked devices shall meet the A dash (-1 indicates a 1.2.2 Device typeCs). The device typeCs) shall identify the ci
13、rcuit function as follows: Device type Generic number Circuit function o1 29FCT52AT Noninverting octal registered transceiver with three-state outputs, TTL compatible inputs and limited output voltage swing. 02 Z9FCT52BT Noninverting octal registered transceiver with three-state outputs, TTL compati
14、ble inputs and limited output voltage suing. 03 29FCT52CT Noninverting octal registered transceiver with three-state outputs, TTL compatible inputs and limited output voltage swing. 1.2.3 Device class designator. The device class designator shall be a single letter identifying the product assurance
15、level as follows: Device class Device requirements documentation I M Vendor self-certification to the requirements for non-JAN class 6 microcircuits in accordance with 1.2.1 of MIL-STD-883 Q or V Certification and qualification to MIL-1-38535 1.2.4 Case outline(s). The case outline(s) shall be a5 de
16、signated in MIL-STD-1835, and as follows: Outline letter Descriptive designator Termi na 1 s Package style K L 3 GDFPZ-F2Ii or CDFP3-F24 24 Flat package GDIP3-TZCi or CDIP4-T24 24 Dual-in-line package CQCCl -N28 28 Leadless-chip-carrier package 1.2.5 Lead finish. The lead finish shall be as specifie
17、d in MIL-STD-883 (see 3.1 herein) for class M or MIL-1-38535 for classes Q and V. designation is for use in specifications when lead finishes A, a, and C are considered acceptable and interchangeable without preference. Finish letter “X“ shall not be marked on the microcircuit or its packaging. The
18、“X“ DESC FORM 193A JUL 91 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-5762-92204 9999996 O062336 BA7 1.3 Absolute maximum ratings. I/ 2/ 31 STANDARDIZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 Supply voltage rang
19、e (V - - - - - - - - - - - - - - - - - DC input voltage range FS N) - - - - - - - - - - - - - - - - DC output voltage range (4, T) - - - - - - - - - - - - - - - DC input clamp current (I Ky (V = -0.5 VI - - - - - - - - - DC output clamp current (a!“, = -0.5 V and +7.0 V) - - DC output source current
20、 ( ) per output - - - - - - - - - - DC output sink current (IoLyper output - - - - - - - - - - - DC ground current FI,) - - - - - - - - - - - - - - - - - - Storage temperature range (T Case temperature under bias ?JsIAs) - - - - - - - - - - - - - Maximum power dissipation (P ) - - - - - - - - - - -
21、- - - - Lead temperature (soldtring,D1O seconds) - - - - - - - - - - Thermal resistance, junction-to-case (e 1 - - - - - - - - - Junction temperature (TJ) - - - - - - - - - - - - - - - - - - 1.4 Recommended weratinq conditions. 21 31 Supply voltage range (Vc - - - - - - - - - - - - - - - - - input v
22、oltage range (V N - - - - - - - - - - - - - - - - - - Output voltage range (BOUT) - - - - - - - - - - - - - - - - - Maximum Lou level input voltage (V 1 - - - - - - - - - - - - Minimum high level input voltage (6 1 - - - - - - - - - - - Case operating temperature range (TY - - - - - - - - - - - - Ma
23、ximum input rise and fall rate dt/Av): (from VIN = 0.3 V to 2.7 V, 2.7 V to 0.3 V) - - - - - - - - Maximum high level output current (Io - - - - - - - - - - - Maximum tou level output current (io - - - - - - - - - - - 1.5 Digital Logic testinq for device classes Q and V. Fault coverage measurement o
24、f manufacturing DC Vcc current (Ic ) - - - - - - - - - - - - - - - - - - - - G) -_- JC L logic tests (MIL-STD-883, test method 5012) - - - - - - - - SIZE 5962-92204 A SHEET REVISION LEVEL 3 -0.5 v -0.5 v -0.5 v -20 mA dc to +7.0 V dc dc to Vcc + 0.5 V dc dc to Vcc + 0.5 V dc 4/ 4/ I20 mA -30 mA +70
25、RIA I260 mA I550 nui -65C to +150“C -65C to +135“C 500 mW +3OoDC See MIL-STD-1835 +175C +4.5 V dc to +5.5 V dc +O.O V dc to Vcc +O.O V dc to Vcc 0.8 v 2.0 v -55C to +125“C 5 ns/V -12 mA 48 mA XX percent I/ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. maximu
26、m levels may degrade performance and affect reliability. 21 Unless otheruise noted, all voltages are referenced to GND. s/ The limits for the parameters specified herein shall apply over the full specified Vcc range and case temperature range of -55C to +12SoC. i/ For Vcc 2 6.5 V, the upper limit on
27、 the range is limited to 7.0 V. i/ Values will be added uhen they become available. Extended operation at the Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-5962-92204 m 999999b 0062337 753 m STANDARDIZED SIZE MILITARY DRAWING A DEFENSE ELECTRON
28、ICS SUPPLY CENTER DAYTON, OHIO 45444 REVISION LEVEL 2. APPLICABLE DOCUMENTS 5962-92204 SHEET 4 2.1 Government specification, standards, bulletin, and handbook. Unless otherwise specified, the following specification, standards, bulletin, and handbook of the issue listed in that issue of the Departme
29、nt of Defense Index of Specifications and Standards specified in the solicitation, form a part of this drawing to the extent specified herei n - SPECIFICATION M 1 LITARY MIL-1-38535 STANDARDS MILITARY MIL-STD-883 - MIL-STD-973 - MI L-STD-1835 - BULLETIN MILITARY MIL-BUL-103 - HANDBOOK M I LITARY MIL
30、-HDBK-780 - Integrated Circuits, Manufacturing, General Specification for. Test Methods and Procedures for Microelectronics. Configuration Management. Microcircuit Case Outlines List of Standardized Military Drawings (SMDs). Standardized Military Drawings. (Copies of the specifications, standards, b
31、ulletin, and handbook required by manufacturers in connection with specific acquisition functions should be obtained from the contracting activity or as directed by the contracting activity.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cite
32、d herein, the text of this drawing shall take precedence. 3. REQUIREMENTS 3.1 The individual item requirements for device class M shall be in accordance with 1.2.1 of MIL-STD-883, “Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices“ and as specified herein. The indiv
33、idual item requirements for device classes Q and V shall be in accordance with MIL-1-38535, the device manufacturers Quality Management (OM) plan, and as specified herein. Item requirements. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be
34、 as specified in MIL-STD-883 (see 3.1 herein) for device class M and MIL-1-38535 for device classes Q and V and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. 3.2.3 Truth tables. 3.2.4 Loqic diaqram. 3.2.5 Ground bounce load circu
35、it and waveforms. The terminal connections shail be as Specified on figure 1. The truth tables shall be as specified on figure 2. The logic diagram shall be as specified on figure 3. The ground bounce load circuit and waveforms shall be as specified on figure 4. 3.2.6 Switching waveforms and test ci
36、rcuit. figure 5. The switching waveforms and test circuit shall be as specified on Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-5962-92204 m 9999996 0062338 b9T STANDARDIZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER 3.3 Electrical per
37、formance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full case operating temperature range. and limits are as specified in
38、 table I. Test conditions for these specified characteristics SIZE 5962-92204 A 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with t
39、he PIN listed in 1.2 herein. Marking for device class M shall be in accordance with MIL-STD-883 (see 3.1 herein). MIL-BUL-103. In addition, the manufacturers PIN may also be marked as listed in Marking for device classes Q and V shall be in accordance with MIL-1-38535. 3.5.1 Certification/compliance
40、 mark. The compliance mark for device class M shall be a “C“ as required in NIL-STD-883 (see 3.1 herein). in MIL-1-38535. The certification mark for device classes Q and V shall be a “QML“ or Q“ as required 3.6 Certificate of compliance. For device class M, a certificate of compliance shall be requi
41、red from a manufacturer in order to be listed as an approved source of supply in MIL-BUL-103 (see 6.7.2 herein). classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.7.1 herein). listing as a
42、n approved source of supply for this drawing shall affirm that the manufacturers product meets, for device class M the requirements of MIL-STD-883 (see 3.1 herein), or for device classes Q and V, the requirements of MIL-1-38535 and the requirements herein. For device The certificate of compliance su
43、bmitted to DESC-EC prior to 3.7 Certificate of conformance. A certificate of conformance as required for device class M in MIL-STD-883 (see 3.1 herein) or for device classes Q and V in MIL-1-38535 shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change
44、for device class M. For device class M, notification to DESC-EC of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change as defined in MIL-STD-973. 3.9 Verification and review for device class M. For device class M, DESC, DESCs agent, and the acquir
45、ing activity Offshore documentation retain the option to review the manufacturers faci lity and applicable required documentation. shall be made available onshore at the option of the reviewer. 3.10 Microcircuit qroup assignment for device class M. Device class M devices covered by this drawing shal
46、l be in microcircuit group nuiaber 37 (see MIL-1-38535, appendix A). 4. QUALITY ASSURANCE PROVISIONS 4.1 Sampling and inspection. For device class M, sampling and inspection procedures shall be in accordance with MIL-STO-883 (see 3.1 herein). with MIL-1-38535 and the device manufacturers QM plan. co
47、nducted on all devices prior to quality conformance inspection. For device classes Q and V, screening shall be in accordance with MIL-1-38535, and shall be conducted on all devices prior to qualification and technology conformance inspection. For device classes Q and V, sampling and inspection proce
48、dures shall be in accordance 4.2 Screening. For device class M, screening shall be in accordance with method 5004 of MIL-STD-883, and shall be 4.2.1 Additional criteria for device class M. a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, EI, C or D. The test circuit shall be mainta
49、ined by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1015. (2) TA = +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein. DAYTON, OHIO 45444 I I REVISION LEV
