1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes IAW NOR 5962-R075-94 jak. 93-12-22 Monica L. Poelking B Changes IAW NOR 5962-R129-94 -tvn. 94-03-21 Monica L. Poelking C Changes IAW NOR 5962-R224-96 -bjm. 96-09-30 Thomas M. Hess D Incorporate NORs, notice of revisions, into the drawing.
2、 Update the boilerplate to the current requirements of MIL-PRF-38535. - jak 08-01-28 Thomas M. Hess E Add footnote 8/ to ICCin table I. - jak 10-03-22 Muhammad A. Akbar REV SHEET REV E E E E E SHEET 15 16 17 18 19 REV STATUS REV E E E E E E E E E E E E E E OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12
3、13 14 PMIC N/A PREPARED BY Jeffery Tunstall DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil STANDARD MICROCIRCUIT DRAWING CHECKED BY Thomas J. Ricciuti THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Monica L. Poelking MICROCIRCUIT, DIGITAL, FAST CMOS
4、, 4-BIT PRESETTABLE BINARY COUNTER WITH SYNCHRONOUS RESET, TTL COMPATIBLE INPUTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 93-09-27 AND LIMITED OUTPUT VOLTAGE SWING, MONOLITHIC SILICON AMSC N/A REVISION LEVEL E SIZE A CAGE CODE 67268 5962-92210 SHEET 1 OF 19 DSCC FORM 2233 APR
5、97 5962-E122-10 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92210 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing d
6、ocuments two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardn
7、ess Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 92210 01 M E A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2)Device class designatorCase outline (see 1.2.4) Leadfinish (see 1.2.5) / (see 1.2.3) / Dra
8、wing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RH
9、A designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01, 02 54FCT163T 4-bit presettable binary counters with synchronous reset, TTL compatible inputs and limited output volt
10、age swing 03, 04 54FCT163AT 4-bit presettable binary counters with synchronous reset, TTL compatible inputs and limited output voltage swing 05, 06 54FCT163CT 4-bit presettable binary counters with synchronous reset, TTL compatible inputs and limited output voltage swing 1.2.3 Device class designato
11、r. The device class designator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, append
12、ix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style E GDIP1-T16 or CDIP2-T16 16 Dual-in-line F GDFP2-F16 or CDFP3-F16 16 Flat pack 2 CQC
13、C1-N20 20 Square leadless chip carrier 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCU
14、IT DRAWING SIZE A 5962-92210 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ 2/ 3/ Supply voltage range (VCC) -0.5 V dc to +7.0 V dc DC input voltage range (VIN) -0.5 V dc to VCC+ 0.5 V dc 4/ DC output voltage r
15、ange (VOUT) . -0.5 V dc to VCC+ 0.5 V dc 4/ Input clamp current (IIK) (VIN= -0.5V) . -20 mA Output clamp current (IOK) (VOUT= -0.5V and+7.0 V) 20 mA DC output source current (IOH) per output -30 mA DC output sink current (IOL) per output . +70 mA DC VCCcurrent (ICC) . 260 mA DC ground current (IGND)
16、 550 mA Storage temperature range (TSTG) . -65C to +150C Case temperature under bias (TBIAS) . -65C to +135C Maximum power dissipation (PD) . 500 mW Lead temperature (soldering, 10 seconds) +300C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Junction temperature (TJ) +175C 1.4 Recomme
17、nded operating conditions. 2/ 3/ Supply voltage range (VCC) +4.5 V dc to +5.5 V dc Input voltage range (VIN) +0.0 V dc to VCCOutput voltage range (VOUT) . +0.0 V dc to VCCMaximum low level input voltage(VIL). 0.8 V Maximum high level input voltage (VIH) 2.7 V Case operating temperature range (TC) .
18、-55C to +125C Maximum input rise or fall rate (t/V): (from VIN= 0.3 V to 2.7 V, 2.7 V to 0.3 V) 5 ns/V Maximum high level output current (IOH): Device types 01, 03, and 05 . -12 mA Device types 02, 04, and 06 . -6 mA Maximum low level output current (IOL) 32 mA 1/ Stresses above the absolute maximum
19、 rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Unless otherwise noted, all voltages are referenced to GND. 3/ The limits for the parameters specified herein shall apply over the full specified VCCrange and
20、 case temperature range of -55C to +125C. 4/ For VCC 6.5 V, the upper limit on the range is limited to 7.0 V. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92210 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHI
21、O 43218-3990 REVISION LEVEL E SHEET 4 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of thes
22、e documents are those listed in the issue of the Department of Defense Index of Specifications and Standards (DoDISS) and supplement thereto, cited in the solicitation. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits Manufacturing, General Specification for. DEPARTMENT OF DEF
23、ENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are
24、available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing ta
25、kes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified h
26、erein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class
27、level B devices and as specified herein. This drawing has been modified to allow the manufacturer to use the alternate die/fabrication requirements of paragraph A.3.2.2 of MIL-PRF-38535 or other alternative approved by the Qualifying Activity. 3.2 Design, construction, and physical dimensions. The d
28、esign, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The termi
29、nal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3. 3.2.5 Ground bounce load circuit and waveforms. The ground bounce load circuit and waveforms shall be as
30、specified on figure 4. 3.2.6 Switching waveforms and test circuit. The switching waveforms and test circuit shall be as specified on figure 5. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92210 DEFENSE SUP
31、PLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 5 DSCC FORM 2234 APR 97 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as spec
32、ified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with
33、the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA
34、designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or
35、 “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. For class Q product built in accordance with A.3.2.2 of MIL-PRF-38535 or other alternative approved by the Qualifying Activity, the “QD” certification mark shall be used
36、 in place of the “QML” or “Q” certification mark. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate
37、 of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers prod
38、uct meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device clas
39、s M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any
40、 change that affect this drawing. 3.9 Verification and review for device class M. For device class M, DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at
41、the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 38 (see MIL-PRF-38535, appendix A). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-
42、,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92210 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +4.5 V VCC +5.5 V unl
43、ess otherwise specified Devicetype VCCGroup A subgroups Limits 3/ Unit Min Max High level output voltage 3006 VOH14/ For all inputs affecting output under test VIH= 2.7 V, VIL= 0.8 V For all other inputs VIN= VCCor GND IOH= -300 A*- All 4.5 V 1, 2, 3 2.7 VCC-0.5 V VOH2For all inputs affecting output
44、 under test VIH= 2.7 V, VIL= 0.8 V For all other inputs VIN= VCCor GND IOH= -12 mA 01, 03,05 4.5 V 1, 2, 3 2.4 VCC-0.5 IOH= -6 mA 02, 04,06 4.5 V 1, 2, 3 2.4 VCC-0.5 IOH= -12 mA 2.0 VCC-0.5 Low level output voltage 3007 VOL14/ For all inputs affecting output under test VIH= 2.7 V, VIL= 0.8 V For all
45、 other inputs VIN= VCCor GND IOL= 300 A All 4.5 V 1, 2, 3 0.20 V VOL2For all inputs affecting output under test VIH= 2.7 V, VIL= 0.8 V For all other inputs VIN= VCCor GND IOL= 32 mA 4.5 V 1, 2, 3 0.55 Negative input clamp voltage 3022 VIC-For input under test, IIN= -15 mA 01, 03,05 4.5 V 1, 2, 3 -1.
46、3 V For input under test, IIN= -18 mA 02, 04,06 -1.2 Input current high 3010 IIHFor input under test, VIN= VCCFor all other inputs, VIN= VCCor GND 01, 03,05 5.5 V 1, 2 +0.1 A 3 +1.0 02, 04,06 1, 2 +1.0 3 +5.0 Input current low 3010 IILFor input under test, VIN= GND For all other inputs, VIN= VCCor G
47、ND 01, 03,05 5.5 V 1, 2 -0.1 A 3 -1.0 02, 04,06 1, 2 -1.0 3 -5.0 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92210 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 R
48、EVISION LEVEL E SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +4.5 V VCC +5.5 V unless otherwise specified Device type VCCGroup A subgroups Limits 3/ Unit Min Max Input capacitance 3012 CIN5/ See 4.4.1c TC= +25 All GND 4 10 pF Output capacitance 3012 COUT5/ See 4.4.1c TC= +25 All GND 4 12 pF Short circuit output current 3005 IOS6/ For all inputs VIN= VCCor GND VOUT= GND All 5.5 V 1, 2, 3 -60 -225 mA Dynamic power supply current ICCD4/ 7/ Outputs open All 5.5 V
