1、.c SND-5962-922JIL REV A = h 0090130 457 m DEFENSE LOGISTICS AGENCY DEFENSE SUPPLY CENTER, COLUMBUS 3990 EAST BROAD STREET COLUMBUS, OH 43216-5000 SUBJECT: Notice of Revisam (NOR (SMD) 5962-92211 5962-R25-96 for Standard Ldrocircuit Drawing Military/Industry Distribution The enclosed NOR is approved
2、 for use effective as of the date of the NOR. In accordance with MIL-STD-100 SMD holders should, as a minimum, handwrite those changes described in the NOR to sheet 1 of the subject SMD. After completion, the NOR should be attached to the subject SMD for future reference. Those companies who were li
3、sted as ap:xoved sources of supply prior to this action have agreed to actions taken ondevices for which they had previously provided DSCC a certificate of compliance. This is evidenced by existing active current certificate of compliance on file at DSCC with a DSCC record of verbal coordkation. The
4、 certificate of compliance for these devices is considered coiicurrence with the new revision unless DSCC is otherwise notified. If you have comments or questions, please contact Mr. Bernard Miesse at (614) 692-0543 (DSN 850). 1 Encl Chief, Custom Microelectronics Team Provided by IHSNot for ResaleN
5、o reproduction or networking permitted without license from IHS-,-,-NOTICE OF REVISION (NOR) THIS REVISION DESCRIBED BELOW HAS BEEN AUTHORIZED FOR THE DOCUMENT LISTED. b. ADDRESS (Street, City, State, Zip code) 5. CAGE CODE 6. NOR NO. 4. ORIGINATOR Defense Supply Center, Columbus 67268 5962-R225-96
6、1. DATE (WMMDD) Form Approved 96-09-30 OM8 NO. 0704-0188 3990 East Broad Street Columbus, OH 43216-5000 a. TYPED NAME (First, Middle Initial, Last) Pvbc burden -alia rrmerban is in 7 M IMJ mu inrlwiinn h. li- w UM in.imi add ItAII. Revisions description colunn; add IlChanges in accordance with NOR 5
7、962-R225-96“. Revisions date colum; add 1196-09-3011. Revision level block; add t8A8t. Rev status of sheets; for sheets 1 and 8, add 14A“. I 9. TITLE OF DOCUMENT MICROCIRCUIT. DIGITAL, FAST CMOS, NONINVERTING QUAD 2-INPUT MULTIPLEXER, THREE-STATE OUTPUTS, lTL COMPATIBLE INPUTS AND LIMITED OUTPUT VOL
8、TAGE SWING, MONOLITHIC SILICON Initial A 1 O. REVISION LETTER a. CURRENT b. NEW Table I, Lou level ground bounce noise, Vop, device types 02, 04 and 06; change maxim limit from a4100018 to 1 5 00“ . 11. ECP NO. N/A Tabie I, Lou level ground bounce noise, VOLV, device types 02, 04 and 06; change maxi
9、mun limit from 81-1000tl to Table I, high level VCC bounce noise, VWV, device types 02, 04 and 06; change maxim limit from 11-60011 to Revision 13vel block; add tlA1l. II- 1700“. I - 650“. X a. (xone) (1) Existing document supplemented by the NOR may be used in manufacture. (2) Revised document must
10、 be received before manufacturer may incorporate this change (3) Custodian of master document shall make above revision and furnish revised document. b. ACTIVITY AUTHOZIZED TO APPROVE CHANGE FOR GOVERNMENT DSCC-VAC c. TYPED NAME (First, Middle Initial, Last) Monica L. Poelking d. TITLE Chief, Custom
11、 Microelectronics 15a. ACTIVITY ACCOMPLISHING REVISION DSCC-VAC e. SIGNATURE f. DATE SIGNED (YYMMDD) Monica L. Poelking 96-09-30 b. REVISION COMPLETED (Signature) c. DATE SIGNED (Y YMMDD) 96-09-30 Bernard J. Miesse Provided by IHSNot for ResaleNo reproduction or networking permitted without license
12、from IHS-,-,-SMD-5b2-922Ll m b 0042267 703 m _ . - -_ LTR DESCRIPTION DATE (YR-MO-DA) APPROVED REV SHEET I I I I REV I I I APPROVED BY Monica L. Poelking DRAWING APPROVAL DATE 93-06-01 REVISION LEVEL SHEET 15 16 17 REV STATUS OF SHEETS NONINVERTING QUAD 2-INPUT MULTIPLEXER, THREE-STATE OUTPUTS, TTL
13、COMPATIBLE INPUTS AND LIMITED OUTPUT VOLTAGE SWING, MONOLITHIC SILICON SIZE CAGE CODE 5962-9221 1 A 67268 PMIC N/A STANDARD I ZED MILITARY DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE AMSC ntA PREPARED BY Joseph A. Kerby DEFENSE ELECTRONICS S
14、UPPLY CENTER DAYTON, OHIO 45444 CHECKED BY - -. . - - - . Thomas J. Ricciuti I MICROCIRCUIT, DIGITAL, FAST CMOS SHEET 1 OF 20 193 JUL 91 DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited. 5962-E260-93 f Provided by IHSNot for ResaleNo reproduction or networking permitt
15、ed without license from IHS-,-,-SMD-5962-922LL W b 0042268 b4T W 1. SCOPE 1.1 Scope. This drawing forms a part of a one part - one part ndr documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes E, QI and M) and space application
16、(device classes S and U), and a choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIH). Device class M microcircuits represent non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STO-883, “Provisions for the use of MIL-STD-883 in c
17、onjunction with compliant non-JAN devices When available, a choice of radiation hardness assurance (RHA.) levels are reflected in the PIN. 1.2 E. The PIN shall be as shown in the following example: - I I T T T 5962 92211 Federa 1 RHA Dev i ce Device Case Lead stock class designator me class outline
18、finish designator (See 1.2.1) (See 1.2.2) designator (See 1.2.4) (See 1.2.5) LA (See 1.2.3) I Drawing msiiber 1.2.1 RHA desiqnatw. Oevice classes M, E, and S RHA marked devices shall meet the MIL-M-38510 specified RHA levels and shall be marked with the appropriate RHA designator. kvice classes Q an
19、d V RHA marked devices shall meet the MIL-1-38535 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device tm(s). The device type(s) shall identify the circuit function as follows: Device type Generic nu 5 ns/V -12 nd 32 nd XX
20、percent 5/ i I/ Stresses above the absolute maximum rating my cause permanent damage to the device. Extended operation at the maxinum levels my degrade performance and affect reliability. ?/ Unless otherwise noted, all voltages are referenced to GND. 31 The limits for the parameters specified herein
21、 shall apply over the full specified Vcc range and case temperature range of -55OC to +125OC. o/ For Vcc L 6.5 V, the upper limit on the range is limited to 7.0 V. 51 Values will be added when they become available. STANDARDIZED SIZE 5962-92211 MILITARY DRAWING A DEFWSE ELECTRONICS SUPPLY CENTER DAY
22、TON, OHIO 45444 REVISION LEVEL SHEET I I I 3 ESC FORM 193A JUL 91 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-59b2-922LL 999999b 0042270 2T8 2. APPLICABLE DOCUMENTS 2.1 Government speclfications. standards. bulletin, and handbook. Unless othe
23、rwise specified, the following specifications. standards, bulletin, and handbook of the issue listed in that issue of the Department of Defense Index of Specifications and Standards specified in the solicitation, form a part of this drawing to the extent specified herein. SPEC I FI CATIONS MILITARY
24、MIL-M-38510 - Microcircuits, General Specification for. MIL- 1-38535 - Integrated Circuits, Manufacturing, General Specification for. STANDARDS MILITARY r MI L-STD-480 - Confiduration Control-Engineering Changes, Deviations and Waivers. MIL-STO-883 - Test Methods and Procedures for Microelectronics.
25、 MIL-STO-1835 - Microcircuit Case Outlines BULLETIN MI L I TARY MIL-BUL-103 - List of Standardized Military Drawings (SMDs). HANDBOOK MILITARY MIL-HDBK-780 - Standardized Military Drawings. (Copies of the specifications, standards, bulletin, and handbook required by manufacturers in connection with
26、specific acquisition functions should be obtained from the contracting actlvity or as directed by the contracting activity.) herein, the text of this drawing shall ,take precedence. 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited 3. REQUI
27、REMENTS 3.1 Item requirements. The individual item requirements for device class M shall be in accordance with 1.2.1 of MIL-STO-883, “Provisions for the use of MIL-STO-883 in conjunction with compliant non-JAN devices“ and as specified herein. The individual item requirenients for device classes B a
28、nd S shall be in accordance with MIL-M-38510 and as specified herein. The individual item requirements for device classes Q and V shall be in accordance with MIL-1-38535. the device manufacturers Quality Management (QM) plan, and as specified herein. 3.2 Desian, construction, and Physical dimensions
29、. The design, construction, and physical dimensions shall be as specified in MIL-M-38530 for device classes M, B, and S and MIL-1-38535 for device classes Q and V and herein. I 3.2.1 Case outline. The case outline shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal con
30、nections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shali be as specified on figure 2. 3.2.4 Loqic diagram. The logic diagram shall be as specified on figure 3. 3.2.5 Ground bounce waveforms and test circuit. The ground bounce load circuit and waveforms shall be as specifi
31、ed on figure 4. 3.2.6 Switchina waveforms and test circuit. The switching waveforms and test circuit shall be as specified on figure 5. STANDARDIZED 5962-92211 HUITARY DRAWING DEFKNSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 DESC FORM 193A JUL 91 Provided by IHSNot for ResaleNo reproduction or n
32、etworking permitted without license from IHS-,-,-SHD-59b2-922LL W 9999996 0042273 334 W STANDARIZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 3.3 Electrical performance characteristics and Dostirradiation parameter limits. Unless otherwise specified herein. the electrical
33、 Derformance characteristics and Dostirradiation Darameter limits are as sDecified in table I SIZE 5962-92211 A REVISION LEVEL SHEET 5 and shll apply over the full case operating temperature range. Test conditions for these specified characteristics and limits are as specified in table I. 3.4 Electr
34、ical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. Marking for device class M shall be in accordance with MIL-ST
35、O-883 (see 3.1 herein). In addition, the manufacturers PIN may also be marked as listed in MIL-BUL-103. Marking for device classes B and S shall be in accordance with MIL-M-38510. Marking for device classes p and V shall be in accordance with MIL-1-38535. 3.5.1 Certification/compliance mark. The com
36、pliance mark for device class M shall be a “C“ as required in MIL-STO-883 (see 3.1 herein). The certification mark for device classes B and S shall be a “J“ or “JAN“ as required in MIL-M-38510. The certification mark for device classes Q and V shall be a “QML“ as required in MIL-1-38535. manufacture
37、r in order to be listed as an approved source of supply in MIL-BUL-103 (see 6.7.3 herein). For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.7.2 herein). The certificate of comp
38、liance submitted to DESC-EC prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device class M the requirements of MIL-STD-883 (see 3.1 herein), or for device classes Q and V, the requirements of MIL- 1-38535 and the requirements h
39、erein. 3.7 Certificate of conformance. A certificate of conformance as required for device class M In MIL-STD-883 (see 3.1 herein) or device classes B and S in MIL-M-38510 or for device classes Q and V in MIL-1-36535 shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Not
40、ification of chame for device class M. For device class M, notification to DESC-EC of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change as defined in MIL-STD-480. 3.6 Certificate of cowliance. For device class M, a certificate of compliance shal
41、l be required from a 3.9 Verification and review for device class M. For device class M, DESC, DESCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of
42、 the reviewer. this drawing shall be in microcircuit group number 39 (see MIL-M-38510, appendix E). 3.10 Microcircuit qroup assiqnment for device classes M, B, and S. Device classes M, B, and S devices covered by 3.11 Serialization for device class S. All device class S devices shall be serialized i
43、n accordance with MIL-M-38510. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-59b2-92211 W 99999b 0042272 070 = STLLWDbBDIZED MILITARY DRAWING DEFENSE LECTRONICS SUPPLY CEWTISR M!lTON, OHIO 45444 TABLE I. Electrical performance characteristics -
44、 continued. SIZE 5962-92211 A i REVISION LEVEL SHEET k 6 Group A Devfce. type Al 1 vcc Unit Test conditions unless other:ti s 5.5 v unless otherwtie specified I - Al 1 Max I I le5 I nb I - OE - GND For all other inputs VI, - Vcc or GNO Quiescent supply I Ica current output lOW lJe3 I I 5.5 v For all
45、 inputs VIN - Vcc or GHD Al 1 5.5 v 1.2.3 1.5 1 IIV! I I Outputs open, IFor switching I All 15.5 V - GND imuts I 4,5,6 I I 4.0 1 mA Total supply current ICCT ut One bit toggling f - 10 MHZ, 5d4 utv cvcle. For nonswhha. /For switchina 1 Outputs open. y For switching OE - 6No IN Or Four bits toggling
46、f - 2.5 MHz. 5 Duty cycle, For nonswitching For switching i inputs I - I I I l f t I + 8.0 I Low level ground bounce noise :Ili i: Tk- +25 *C See figure 4 5.0 V - 5.0 V 4i I- + I- l i- + 41 I- 01.03, 05 02,04, o6 01,03, 05 02,04, 06 01.03. 05 02.04. 06 o1 .o3 05 02,04 Low level ground bounce nOiSe 1
47、 5.0 V - 5.0 V I -1 fllv 900 High level V bounce nSFse I -600 High level V bounce nSFse See footnotes at end of table. JUL 91 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-59b2-922LL m 9999996 OOq2275 ABT m STANDARDIZED MILITARY DWWING DEFENSE
48、ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 Test and MIL-ST-883 test method I/ SIZE 5962-92211 A REVISION LEVEL SHEET 9 Functional test Propagation delay time, In to in 3003 Propagation delay time, S to Zn 3003 Propagation delay - output enable OE to in 3003 Propagation delay - output disable OE to
49、 in 3003 TABLE I. Electrical performance characteristi Test conditions ev i ce -55OC 5 T s +125“C ZJ type 4.5 v s F 1 5.5 v s-1 t unless otherwike specified i :IL ; i: i 1 All VJPify output vo See 4.4.ld tpHL, CL - 50 pF minimum, R - 5000, tpLH s and the absolute value of the magnitude, not the sign, is relative to the minimum and maximum limits, as applicable, listed herein. All devices shall
