1、SND-5962-92264 REV A = 9999996 009OL90 921 DEFENSE LOGISTICS AGENCY DEFENSE SUPPLY CENTER, COLUMBUS B . POST OFFICE BOX 3990 COLUMBUS, OH 43216-5000 IN REPLY REFERTO DSCC-VAC (Mr. T. Nguyen/(DSN)850-0671/6 14-692-0671/tvn) NOV 13 I996 SUBJECT: Notice of Revision (NOR) 5962-R028-97 for Standard Micro
2、circuit Drawing (SMD) 5962-92264 Militaryflndustry Distribution The enclosed NOR is approved for use effective as of the date of the NOR. In accordance with MIL-STD-100 SMD holders should, as a minimum, handwrite those changes described in the NOR to sheet 1 of the subject SMD. After completion, the
3、 NOR should be attached to the subject SMD for future reference. Those companies who were listed as approved sources of supply prior to this action have agreed to actions taken on devices for which they had previously provided DSCC a certificate of compliance. This is evidenced by an existing active
4、 current certificate of compliance on file at DSCC with a DSCC record of verbal coordination. The certificate of compliance for these devices is considered concurrence with the new revision unless DSCC is otherwise notified. If you have comments or questions, please contact Thanh Nguyen at (DSN)850-
5、0671/(614)692-0671. 1 Encl FONICA L. POELKING 1 Chief, Custom Microelectronics Team Federal Recycling Program Printed on Recycled Paper Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-1. DATE (YYMMDD) 96-1 0-1 7 NOTICE OF REVISION (NOR) THIS REVISION
6、 DESCRIBED BELOW HAS BEEN AUTHORIZED FOR THE DOCUMENT LISTED. b. ADDRESS (Street, City, State, Zip Code) 5. CAGE CODE i. ORIGINATOR Defense Supply Center, Columbus 67268 5962-R028-97 Fonn Approved OM9 No. 0704-0188 3990 E. Broad Street Columbus, OH 43216-5000 I. TYPED NAME (first, Middle Initial, La
7、st) i. TITLE OF DOCUMENT MICROCIRCUIT, DIGITAL, FAST CMOS, 16-BIT TRANSCEIVER/ AND LIMITED OUTPUT VOLTAGE SWING, MONOLITHIC SILICON 10. REVISION LETTER b. NEW REGISTER WITH THREE-STATE OUTPUTS, 7TL COMPATIBLE INPUTS a, CURRENT Initial A 67268 11. ECP NO. NIA 8. DOCUMENT NO. 5962-92264 DSCC-VAC Monic
8、a L. Poelking Sheet 1 : Sheet 6: 3. TITLE Revisions Itr column; add “A“. Revisions description column; add “Changes in accordance with NOR 5962-R028-97“. Revisions date column; add “96-10-1 7“. Revision level block; add “A. Rev status of sheets; for sheets 1 and 6, add “A. Table I, output short circ
9、uit current, 10s; change maximum limit from “-225 mA“ to “-250 mA“. Revision level block; add “A“. e. SIGNATURE 14. THIS SECTION FOR GOVERNMENT USE ONLY Chief, Custom Microelectronics Team 15a. ACTIVITY ACCOMPLISHING REVISION DSCC-VAC supplemented by the NOR may be used in manufacture. (2) Revised d
10、ocument must be received before manufacturer may incorporate this change. Monica L. Poelking b. REVISION COMPLETED (Signature) Thanh V. Nguyen ID Fonn 1695, APR 92 Previous editions are obsolete. f. DATE SIGNED (YYMMDD) 96-10-17 c. DATE SIGNED (YYMMDD) 96-1 0-1 7 Provided by IHSNot for ResaleNo repr
11、oduction or networking permitted without license from IHS-,-,-SMD-5462-92264 = b 0064229 580 = I I I REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED SHEET * CHECKED BY Thanh V. Nguyen APPROVED BY Monica L. Poelking SHEET 15 16 17 REV STATUS OF SHEETS MICROCIRCUIT, DIGITAL, FAST CMOS, 16-BIT TRANS
12、CEIVER/REGISTER WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS AND LIMITED OUTPUT VOLTAGE PMIC N/A DRAWING APPROVAL DATE 94-10-06 STANDARD MICROCIRCUIT DRAWING SWING, MONOLITHIC SILICON I I THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE REVISION LEVEL
13、 AMSC N/A SIZE I CAF7XJF I 5962-92264 A )ESC FORM 193 JUL 91 DISTRIBUTION STATEMENT A. SHEET 1 OF 21 5962-E425-94 Rpproved for public release; distribution is unlimited. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-5962-922b4 9999996 0064230 2
14、T2 REVISION LEVEL 1. SCOPE 1.1 Scope. This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes Q and M) and space application (device class VI, and a choice of case outlines
15、and lead finishes are available and are reflected in the Part or Identifying Number (PIN). 1.2.1 of PIIL-STD-883, “Provisions for the use of HIL-STD-883 in conjunction with compliant non-JAN devices“. available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN. Device c
16、lass N microcircuits represent non-JAN class B microcircuits in accordance with When SHEET 2 1.2 m. The PIN shall be as shown in the following example: 5r 1 92264 i i i i Federa 1 RHA Devi ce Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designa
17、tor (see 1.2.4) (see 1.2.5) / (see 3.2.3) / Drawing number 1.2.1 RHA designator. Device class M RHA marked devices shall meet the MIL-1-38535 appendix A specified RHA Levels and shall be marked with the appropriate RHA designator. MIL-1-38535 specified RHA levels and shall be marked with the appropr
18、iate RHA designator. non-RHA device. Device classes Q and V RHA marked devices shall meet the A dash (-1 indicates a 1.2.2 Device type(s1. The device type(s) shall identify the circuit function as follows: Device type Generic number Circuit function o1 54F CT16646T 16-bit transceiver/register with t
19、hree-state outputs, TTL compatible inputs and limited output voltage swing o2 54F CT16646AT 16-bit transceiver/register with three-state outputs, TTL compatible inputs and limited output voltage suing 03 54FCT16646CT 16-bit transceiver/register with three-state outputs, TTL compatible inputs and lim
20、ited output voltage swing 1.2.3 Device class desiqnator. The device class designator shall be a single letter identifying the product assurance level as follows: Device class Device requirements documentation N Vendor self-certification to the requirements for non-JAN class B microcircuits in accord
21、ance with 1.2.1 of ML-STO-883 Q or V Certification and qualification to NIL-1-38535 1.2.4 Case outline(s). The case outline(s) shall be as designated in NIL-STO-1835, and as follows: Outline letter Descriptive designator Terminals Package style X GDFPI-F56 56 Flat pack inish shall be as specified in
22、 MIL-STO-883 (see 3.1 herein) for class M or cations when lead finishes A, 6, and C are considered acceptable and interchangeable Finish letter “X“ shall not be marked on the microcircuit or its packaging. The “X“ 1.2.5 Lead finish. The lead MIL-1-38535 for classes Q and V. designation is for use in
23、 specif without preference. STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 5962-92264 I I I I DESC FORM 193A JUL 91 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-. SIZE STANDARD A MICROCIRCUIT DRAWING DEFENSE ELE
24、CTRONICS SUPPLY CENTER DAYTON, OHIO 45444 REVISTON LEVEL 1.3 1.4 1.5 5962-92264 SHEET 3 Absolute maximum ratinqs. 11 2/ I/ Supply voltage range (V - - - - - - - - - - - - - - - - - - DC input voltage range LIN) - - - - - - - - - - - - - - - - - DC output voltage range (V - - - - - - - - - - - - - -
25、- - DC input clamp current (iIzYT(VIN = -0.5 v ) - - - - - - - - - DC output clamp current (IoK) (VOUT -0.5 V and +7.0 V) - - - - DC output source current (1 1 (per output) - - - - - - - - - DC output sink current (IOL?H(per output) - - - - - - - - - - Ground current (IGND) - - - - - - - - - - - - -
26、 - - - - - - - Storage temperature range (T 1 - - - - - - - - - - - - - - - Case temperature under bias ?fG ) - - - - - - - - - - - - - Lead temperature (soldering, Ifj%conds) - - - - - - - - - - - Thermal resistance, junction-to-case - - - - - - - - - - Junction temperature (TJ) - - - - - - - - - -
27、 - - - - - - - - Maximum power dissipation (PD) - - - - - - - - - - - - - - - - Recommended operatins conditions. 21 21 Supply voltage range (Vc 1 - - - - - - - - - - - - - - - - - - input voltage range (V - - - - - - - - - - - - - - - - - - Output voltage range - - - - - - - - - - - - - - - - - Max
28、imum low level input voltage (VIL) - - - - - - - - - - - - Minimum high level input voltage (VI ) - - - - - - - - - - - - Case operating temperature range (T Y - - - - - - - - - - - - Maximum input rise or fall rate (At5AV): - - - - - - - - Maximum high level output current (Io 1 - - - - - - - - - -
29、 - Maximum low level output current (IoLy - - - - - - - - - - - - DC Vcc current (Icc) - - - - - - - - - - - - - - - - - - (from VIN = 0.3 V to 2.7 V, 2.7 V to 0.3 V) Digital logic testing for device classes Q and V. Fault coverage measurement of manufacturing logic tests (MIL-STD-883, test method 5
30、012) - - - - - - - - -0.5 V dc to +7.0 V dc -0.5 V dc to Vcc + 0.5 V de d.5 V dc to Vcc -20 mA i20 mA -30 mA +70 mA i480 mA +I120 mA 41 -65OC to +150C -65OC to +1:35“C +3m0 c See MIL-STD-1835 +17SoC 1.0 w +4.5 V dc to 6.5 V dc +O.O V dc to Vcc +O.O V dc to Vcc 0.8 V 2.0 v -55OC to +125C 2.5 ns/V -24
31、 mA 48 mA XX percent 51 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, bulletin, and handbook. Unless otherwise specified, the following specification, standards, bulletin, and handbook of the issue listed in that issue of the Department of Defense Index of Specifications and Stand
32、ards specified in the solicitation, form a part of this drawing to the extent specified herein. - I/ Stresses above the absolute maximum rating may cause permanent damage to the device. maximum levels may degrade performance and affect reliability. 21 Unless otherwise noted, all voltages are referen
33、ced to GND. - 31 The limits for the parameters specified herein shall apply over the full specified VcC range and case temperature range of -55OC to +125OC. For Vcc 2 6.5 V, the upper limit on the range is limited to 7.0 V. Values will be added when they become available. Extended operation at the -
34、 41 - 5/ DESC FORM 193A JUL 91 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SPECIFICATION MILITARY MIL-1-38535 STANDARDS MILITARY MIL-STD-883 MIL-STD-973 RIL-STD-1835 BULLETIN MILITARY MIL-BUL-103 HANDBOOK MILITARY MIL-HDBK-780 REVISION LEVEL - In
35、tegrated Circuits, Manufacturing, General Specification for. SHEPT 4 Test Methods and Procedures for Microelectronics. Configuration Management. Microcircuit Case Outlines - List of Standardized Military Drawings (SMDs). Standardized Military Drauings. (Copies of the specification, standards, bullet
36、in, and handbook required by manufacturers in connection with specific acquisition functions should be obtained from the contracting activity or as directed by the contracting activity.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited her
37、ein, the text of this drawing shall take precedence. 3. REQUIREMENTS 3.1 The individual item requirements for device class M shall be in accordance with 1.2.1 Of MIL-STD-883, “Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices“ and as Specified herein. device manufac
38、turers Quality tfanagement (QM) plan, and as specified herein. Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-1-38535, the 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shalt be as
39、specified in MIL-STD-883 (see 3.1 herein) for device class M and MIL-1-38535 for device classes Q and V and herein. 3.2.1 Case outline. The case outline shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure I. 3.2.3 Truth table
40、. The truth table shall be as specified on figure 2. 3.2.4 Lwic diaciram. The Logic diagram shatl be as specified on figure 3. 3.2.5 Ground bounce load circuit and waveforms. The ground bounce load circuit and waveforms shall be as specified on figure 4. 3.2.6 Switching waveforms and test circuit. f
41、igure 5. The switching waveforms and test circuit shall be as specified on 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter Limits are as specified in table I a
42、nd shall apply over the full case operating temperature range. and limits are as specified in table I. Test conditions for these specified characteristics 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each su
43、bgroup are defined in table I. STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 I 5962-92264 I I I DESC FORM 193A JUL 91 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-3.5 Marking. The part shall be marked with the
44、PIN listed in 1.2 herein. Marking for device class M shall be in accordance with MIL-STD-883 (see 3.1 herein). $IL-BUL-103. In addition, the manufacturers PIN may also be marked as listed in Rarking for device classes Q and V shall be in accordance with MIL-1-38535. 3.5.1 Certificationlcompliance ma
45、rk. The compliance mark for device class M shall be a “C“ as required in NIL-STD-883 (see 3.1 herein). in MIL-1-38535. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required 3.6 Certificate of compliance. For device class M, a certificate of compliance shaLL be require
46、d from a nanufacturer in order to be listed as an approved source of supply in NIL-BUL-103 (see 6.7.2 herein). classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.7.1 herein). listing as an
47、approved source of supply for this drawing shall affirm that the manufacturers product meets, for device class M the requirements of MIL-STD-883 (see 3.1 herein), or for device classes Q and V, the requirements of MIL-1-38535 and the requirements herein. For device lhe certificate of compliance subm
48、itted to DESC-EC prior to 3.7 Certificate of conformance. A certificate of conformance as required for device class M in MIL-STD-883 (see 3.1 herein) or for device classes Q and V in MIL-1-38535 shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of chanqe fo
49、r device class M. For device class M, notification to DESC-EC of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change as defined in MIL-STD-973. For device class M, DESC, DESCs agent, and the acquiring activity Offshore documentation 3.9 Verification and review for device class M. retain the option to review the manufacturers facility and applicable required documentation. shall be made available ons
