1、 SMD-5962-92273 REV B W 9999996 0090894 943 DEFENSE LOGISTICS AGENCY DEFENSE SUPPLY CENTER, COLUMBUS POST OFFICE BOX 3990 COLUMBUS, OH 43216-5000 IN REPLY DEC 06 896 REFER TO DSCC-VAC (Mr. T. Nguyen/(DSN)850-0671/614-692-0671/tvn) SUBJECT: Notice of Revision (NOR) 5962-R049-97 for Standard Microcirc
2、uit Drawing (SMD) 5962-92273 Militaryflndustry Distribution The enclosed NOR is approved for use effective as of the date of the NOR. In accordance with MIL-STD- 1 O0 SMD holders should, as a minimum, handwrite those changes described in the NOR to sheet 1 of the subject SMD. After completion, the N
3、OR should be attached to the subject SMD for future reference. Those companies who were listed as approved sources of supply prior to this action have agreed to actions taken on devices for which they had previously provided DSCC a certificate of compliance. This is evidenced by an existing active c
4、urrent certificate of compliance on file at DSCC with a DSCC record of verbal coordination. The certificate of compliance for these devices is considered concurrence with the new revision unless DSCC is otherwise notified. If you have comments or questions, please contact Thanh Nguyen at (DSN)850-06
5、7 1/(6 14)692-O67 1 1 Encl . add “B. Revisions description column; add “Changes in accordance with NOR 5962-R049-97“ Revisions date column; add “96-1 1-08. Revision level block; change from “A“ to “B“. Rev status of sheets; for sheet 1, change from “A“ to “B. For sheet 7, add “B. Table I, output sho
6、rt circuit current, los; change maximum limit from “-225 mA“ to “-250 mA“ Table I, output drive current, IO; delete this test completely. Revision level block: add “B. 1 i. ECP NO. NIA a X (1) Existing document supplemented by the NOR may be used in manufacture. (2) Revised document must be received
7、 before manufacturer may incorporate this change. DSCC-VAC b. ACTIVITY AUTHORIZED TO APPROVE CHANGE FOR GOVERNMENT d. TITLE Chief, Custom Microelectronics Team c. TYPED NAME (First, Middle Initial, Last) 15a. ACTIVITY ACCOMPLISHING REVISION DSCC-VAC DD Form 1695, APR 92 e. SIGNATURE Monica L. Poelki
8、ng b. REVISION COMPLETED (Signature) Thanh V. Nguyen f. DATE SIGNED (YYMMD D) 96-1 1-08 c. DATE SIGNED (YYMMDD) 96-1 1-08 Previous editions are obsolete. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-b 00b7704 497 DEFENSE LOGISTICS AGENCY OAYTON. O
9、H 454445765 DEFENSE ELECTRONICS SUPPLY CENTER IN REPLY REFER To DESC-ELDC (Mr. Nguyen/(AV 986) 513-2966023/hrn) SUBJECT: Notice of Revision (NOR) -5962-R94-95 for Standardized Military Drawing (SMD) 5962-92273 Militaryhdustry Distribution The enclosed NOR is approved for use effective as of the date
10、 of the NOR. In accordance with MIL-STD-100 SMD holders should, as a minimum, handwrite those changes described in the NOR to sheet 1 of the subject SMD. After completion, the NOR should be attached to the subject SMD for future reference. Those companies who were listed as approved sources of suppl
11、y prior to this action have agreed to actions taken on devices for which they had previously provided DESC a certificate of compliance. This is evidenced by an existing active current certificate of compliance on file at DESC along with a DESC record of verbal coordination. The certificate of compli
12、ance for these devices is considered concurrence with the new revision unless DESC is otherwise notified. If you have comments or questions, please contact Thanh Nguyen at (AV)986-6023 or (513)296-6023. 1 Encl ICIONICA L. POELKING Chief, Custom Microelectronics Branch Provided by IHSNot for ResaleNo
13、 reproduction or networking permitted without license from IHS-,-,- 9999996 00b7705 323 I 4. ORIGINATOR a. TYPED NAME (First, Middle Initial, Last 1 NOTICE OF REVISION (NOR) b. ADDRESS (Street, City, State, Zip Code) 5. CAGE CODE Defense ELectronics Supply Center 67268 1507 Wilmington Pike Dayton, O
14、H 45444-5765 7. CAGE CODE 67268 1. DATE (YYMMDD) I TRANSPARENT LATCH UITH SERIES RESISTOR AND THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS AND LIMITED OUTPUT VOLTAGE SWING, MONOLITHIC SILICON 95-03-17 This revision described below has been authorized for the document listed. a. CURRENT b. NEW Initial
15、A a. (X one) Form Approved Ow6 No. 0704-0188 X (1) Existing document supplenented by the NOR may be used in manufacture. (2) Revised document must be received before manufacturer may incorporate this change. 2. PROCURING ACTIVITY NO. d. TITLE Chief, Custom Microelectronics 15a. ACTIVITY ACCOMPLISHIN
16、G REVISION DESC-ELDC 3. DODAAC e. SIGNATURE Monica L. Poelking b. REVISION COMPLETED (Signature) Thanh V. Nguyen 6. NOR NO. 5962-R094-95 8. DOCUMENT NO. 5962-92273 11. ECP NO. N/A )VE CHANGE FOR GOVERNMENT I c. TYPED NAME (First, Middle Initial, Last) king f. DATE SIGNED (YYMMDD) 95-03-17 C. DATE SI
17、GNED (YYMMDD) 95-03-17 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-REV STATUS OF SHEETS I PREPARED BY Thanh V. Nguyen CHECKED BY I PMIC NIA DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 STANDARDIZED MILITARY DRAWING THIS DRAWING IS AVAILAB
18、LE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE 94-06-24 , REVISION LEVEL i SIZE CAGE CODE 5962-92273 A 67268 SHEET 1 OF 19 Thanh V. Nguyen I MICROCIRCUIT, DIGITAL, FAST CMOS, -1 16-BIT NONINVERTING TRANSPARENT APPROVED BY Thomas M. Hess LATCH WITH SERIES RESISTOR AND THREE-S
19、TATE OUTPUTS, TTL COMPATIBLE INPUTS AND LIMITED OUTPUT VOLTAGE SWING, MONOLITHIC SILICON DRAWING APPROVAL DATE JUL 91 DISTRIBUTION STATEMENT A. 5962-E301-94 Approved for public release; distribution is unlimited. Provided by IHSNot for ResaleNo reproduction or networking permitted without license fr
20、om IHS-,-,-m b 0067707 1Tb I 1. SCOPE 1.1 Scope. This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). TWO product assurance classes consisting of military high reliability (device classes Q and M) and space application (device class V), and a choice of cas
21、e outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). 1.2.1 of MIL-STD-883, “Provisions for the use of HIL-STD-883 in conjunction with compliant non-JAN devices“. available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN
22、. Device class M microcircuits represent non-JAN class B microcircuits in accordance with When 1.2 u. The PIN shall be as shown in the following example: 5r i 92273 1 1 1 Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designato
23、r (see 1.2.4) (see 1.2.5) / (see 1.2.3) f Drawing number 1.2.1 RHA desiqnator. Device class fl RHA marked devices shall meet the MIL-1-38535 appendix A specified RHA Levels and shall be marked with the appropriate RHA designator. HIL-1-38535 specified RHA levels and shall be marked with the appropri
24、ate RHA designator. non-RHA device. Device classes Q and V RHA marked devices shall meet the A dash (-1 indicates a SIZE STANDARD1 ZED A 5962-92273 MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 REVISION LEVEL SHEET 2 J 1.2.2 Device type(s). The device typeCs) shall identify t
25、he circuit function as follows: Device type Generic number Circuit function o1 54FCT162373T 16-bit noninverting transparent latch with series resistor and three-state outputs, TTL compatible inputs and limited output voltage swing 16-bit noninverting transparent latch with series resistor and three-
26、state outputs, TTL compatible inputs and limited output voltage swing 16-bit noninverting transparent latch with series resistor and three-state outputs, TTL compatible inputs and limited output voltage swing 02 54 FCTI 62373AT 03 54FCT162373CT 1.2.3 Device class desiqnator. The device class designa
27、tor shall be a single letter identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883 Q or V Certification and qualification to MIL-1-38
28、535 1.2.4 Case outline(s). The case outline(s) shall be as designated in HIL-STD-1835, and as follows: Outline letter Descriptive desiqnator Terminals Packaqe style X GDFPI-F48 48 Flat pack 1.2.5 Lead finish. The lead finish shall be as specified in MIL-STD-883 (see 3.1 herein) for class El or HIL-1
29、-38535 for classes Q and V. designation is for use in specifications when lead finishes A, B, and C are considered acceptable and interchangeable without preference. Finish letter “X“ shall not be narked on the microcircuit or its packaging. The “X“ 4 Provided by IHSNot for ResaleNo reproduction or
30、networking permitted without license from IHS-,-,-i .3 1.4 1.5 Absolute maximum ratinqs. If Zf 3f Supply voltage range (V - - - - - - - - - - - - - - - - - - DC input voltage range Fv,) - - - - - - - - - - - - - - - - - DC output voltage range (Vo T) - - - - - - - - - - - - - - - - DC input clamp cu
31、rrent (I ,$ (VIN = -0.5 V 1 - - - - - - - - - OC output clamp current (VouT -0.5 V and +7.0 V) - - - - DC output source current (I - - - - - - - - - DC output sink current - - - - - - - - - - - - - - - - - Maximum low level input voltage (VIL) - - - - - - - - - - - - Minimum high level input voltage
32、 (VI 1 - - - - - - - - - - - - Case operating temperature range (T 7 - - - - - - - - - - - - Maximum input rise or fall rate (AtjAv): (from VIN 0.3 V to 2.7 v, 2.7 V to 0.3 v) - - - - - - - - Maximum high level output current (Io ) - - - - - - - - - - - Haximum tow level output current (io,-“ - - -
33、- - - - - - - - - Digital loqic testing for device classes GI and V. Fault coverage measurement of manufacturing logic tests (MIL-STD-883, test method 5012) - - - - - - - - W 99999b 00b7708 2. APPLICABLE DOCUMENTS 032 -0.5 V dc to +7.0 V dc -0.5 V dc to Ycc t 0.5 V dC -0.5 V dc to Vcc + 0.5 V dc 41
34、s/ -20 mA i20 mA -30 mA +70 mA +480 KIA +I120 m -65OC to +150C -65OC to +135“C +3oO0 c See MIL-STD-1835 +175“c 1.0 u +4.5 V dc to +5.5 V dc +O.O v dc to Vcc +O.O V dc to Vcc 0.8 V 2.0 v -55OC to +125OC 2.5 nsfv 16 mA -16 UA XX percent sf 2.1 Government specification, standards, bulletin, and handboo
35、k. Unless otherwise specified, the following specification, standards, bulletin, and handbook of the issue listed in that issue of the Department of Defense Index of Specifications and Standards specified in the solicitation, form a part of this drawing to the extent specified herein. I/ Stresses ab
36、ove the absolute maximum rating may cause permanent damage to the device. maximum levels may degrade performance and affect reliability. 2/ Unless otherwise noted, all voltages are referenced to GND. I/ The limits for the parameters specified herein shall apply over the full specified Vct range and
37、case temperature range of -55OC to t125OC. s/ For Vcc 2 6.5 V, the upper limit on the range is limited to 7.0 V. - 51 Values will be added when they become available. Extended operation at the STANDARDIZED 5962-92273 MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 ESC FORM 193A
38、 JUL 91 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-999999b O067709 T79 STANDARDIZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 SPECIFICATION MILITARY IL-1-38535 - STAHDARDS MILITARY MIL-STD-883 - MIL-STD-973 - MIL-STD-
39、1835 - BULLETIN M IL1 TARY MIL-BUL-103 - HANDBOOK MILITARY MIL-HDBK-780 - SIZE A 5962-92273 REVISION LEVEL SHEET 4 Integrated Circuits, Manufacturing, General Specification for. Test Methods and Procedures for Microelectronics. Configuration Management. Microcircuit Case Outlines List of Standardize
40、d Military Drawings (SMDs). Standardized Military Drawings. (Copies of the specification, standards, bulletin, and handbook required by manufacturers in connection with specific acquisition functions should be obtained from the contracting activity or as directed by the contracting activity.) 2.2 Or
41、der of precedence. In the event of a conflict between the text of this drawing and the references Cited herein, the text of this drawing shall take precedence. 3. REPUIREMENTS 3.1 The individual item requirements for device class il shall be in accordance with 1.2.1 Of MIL-STD-883, “Provisions for t
42、he use of MIL-STD-883 in conjunction with compliant non-JAN devices“ and as specified herein. device manufacturers Quality Management (QM) plan, and as specified herein. Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-1-38535, the 3.2 De
43、sign, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-STD-883 (see 3.1 herein) for device class M and MIL-1-38535 for device classes Q and V and herein. 3.2.1 Case outline. 3.2.2 Terminal connections. 3.2.3 Truth table. 3.2.4 Loqi
44、c diagram. 3.2.5 Ground bounce load circuit and waveforms. The case outline shall be in accordance with 1.2.4 herein. The terminal connections shall be as specified on figure 1. The truth table shall be as specified on figure 2. The logic diagram shall be as specified on figure 3. The ground bounce
45、load circuit and waveforms shall be as specified on figure 4. 3.2.6 Switchinq waveforms and test circuit. figure 5. The switching waveforms and test circuit shall be as specified on 3.3 Etectrical Performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, th
46、e electrical performance characteristics and postirradiation parameter limits are as specified in table 1 and shall apply over the full case operating temperature range. and limits are as specified in table I. 3.4 Electrical test requirements. Test conditions for these specified Characteristics The
47、electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-W 9999996 00b7710 790 3.5 Marking. The part shall be marked with
48、 the PIN listed in 1.2 herein. Marking for device class M shall be in iccordance with MIL-STD-883 (see 3.1 herein). IIL-EUL-103. In addition, the manufacturers PIN may also be marked as listed in Marking for device classes Q and V shall be in accordance with MIL-1-38535. 3.5.1 Certification/complian
49、ce mark. The compliance mark for device class t4 shall be a “C“ as required in IIL-STD-883 (see 3.1 herein). in MIL-1-38535. The certification mark for device classes Q and V shall be a QML“ or “Q“ as required 3.6 Certificate of compliance. For device class M, a certificate of compliance shall be required from a nanufacturer in order to be listed as an approved source of supply in MIL-EUL-103 (see 6.7.2 here
