1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Add device type 02. Add ground bounce criteria and test limits. Changes for device type 01. Editorial changes throughout. - JAK 94-08-19 Monica L. Poelking B Add vendor CAGE 27014. Make change to the limits in table I for IOZH,IOZL, IOFF, ICEX, I
2、IH, IIL, ICC, VOLP, VOHP, tPLH1, tPZH1, tPZL1, tPHZ1, tPLZ1, tPZH2, tPZL2, tPHZ2, tPLZ2, th1, and th2 for device type 01. Update boilerplate. - JAK 95-08-22 Thomas M. Hess C Changes in accordance with NOR 5962-R256-97. - JAK 97-03-31 Monica L. Poelking D Update boilerplate to current MIL-PRF-38535 r
3、equirements. - MAA 08-10-07 Thomas M. Hess REV SHEET REV SHEET REV D D D D D D D SHEET 15 16 17 18 19 20 21 REV D D D D D D D D D D D D D D REV STATUS OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Joseph A. Kerby CHECKED BY Thomas J. Ricciuti DEFENSE SUPPLY CENTER COLUMBUS CO
4、LUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil APPROVED BY Monica L. Poelking DRAWING APPROVAL DATE 93-01-15 MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, OCTAL LATCHED TRANSCEIVER WITH DUAL ENABLE, THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON SIZE A CAGE CODE 67268 5962-92314 STAN
5、DARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE AMSC N/A REVISION LEVEL D SHEET 1 OF 21 DSCC FORM 2233 APR 97 5962-E511-08 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SIZE A
6、 5962-92314 STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218 - 3990 REVISION LEVEL D SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space applicat
7、ion (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 9231
8、4 01 Q K A Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA le
9、vels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit
10、function as follows: Device type Generic number Circuit function 01 54ABT543 Octal latched transceiver with dual enable, three-state outputs, TTL compatible inputs 02 54ABT543A Octal latched transceiver with dual enable, three-state outputs, TTL compatible inputs 1.2.3 Device class designator. The d
11、evice class designator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. Q
12、or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style K GDFP2-F24 or CDFP3-F24 24 Flat pack L GDIP3-T24 or CDIP4-T24 24 Dual-in-line 3 CQCC1-N28
13、28 Square leadless chip carrier 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SIZE A 5962-92314 STANDARD
14、 MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218 - 3990 REVISION LEVEL D SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ 2/ 3/ Supply voltage range (VCC) -0.5 V dc to +7.0 V dc DC input voltage range (VIN) (except I/O ports) -0.5 V dc to +7.0 V dc 4/ DC input
15、voltage range (VIN) (I/O ports). -0.5 V dc to +5.5 V dc 4/ DC output voltage range (VOUT) . -0.5 V dc to +5.5 V dc 4/ DC input clamp current (IIK) (VINVCC). 50 mA DC output current (IOL) (per output): Device type 01 . +96 mA Device type 02 . +128 mA Maximum power dissipation (PD ). 500 mW Storage te
16、mperature range (TSTG) . -65C to +150C Lead temperature (soldering, 10 seconds). +300C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Junction temperature (TJ) +150C 1.4 Recommended operating conditions. 2/ 3/ Supply voltage range (VCC) +4.5 V dc to +5.5 V dc Input voltage range (VIN)
17、+0.0 V dc to VCCOutput voltage range (VOUT). +0.0 V dc to VCCMinimum high level input voltage (VIH). +2.0 V Maximum low level input voltage (VIL) +0.8 V Maximum high level output current (IOH) -24 mA Maximum low level output current (IOL) +48 mA Maximum input rise or fall rate (t/V) 5 ns/V Case oper
18、ating temperature range (TC). -55C to +125C 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Unless otherwise noted, all voltages are referenced to GND. 3/ The limits of
19、 the parameters specified herein shall apply over the full specified VCCrange and case temperature range of -55C to +125C. Unused inputs must be held high or low. 4/ The input and output voltage ratings may be exceeded provided that the input and output current ratings are observed. Provided by IHSN
20、ot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SIZE A 5962-92314 STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218 - 3990 REVISION LEVEL D SHEET 4 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards,
21、 and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation. or contract DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated
22、Circuits Manufacturing, General Specification For. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-7
23、80 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between t
24、he text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for
25、 device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for dev
26、ice class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and
27、 V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2
28、. 3.2.4 Block or Logic diagram. The block or logic diagram shall be as specified on figure 3. 3.2.5 Ground bounce load circuit and waveforms. The ground bounce load circuit and waveforms shall be as specified on figure 4. 3.2.6 Switching waveforms and test circuit. The switching waveforms and test c
29、ircuit shall be as specified on figure 5. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SIZE A 5962-92314 STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218 - 3990 REVISION LEVEL D SHEET 5 DSCC FORM 2234 APR 97 3.3 El
30、ectrical performance characteristics and post-irradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and post-irradiation parameter limits are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical t
31、est requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages
32、 where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with
33、MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as requi
34、red in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance s
35、hall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for d
36、evice classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-3
37、8535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that aff
38、ects this drawing. 3.9 Verification and review for device class M. For device class M, DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of t
39、he reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 128 (see MIL-PRF-38535, appendix A). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SIZE A 5962-
40、92314 STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218 - 3990 REVISION LEVEL D SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Limits 3/ Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +4.5 V VCC +5.5 V unles
41、s otherwise specified Device type VCCGroup A subgroups Min Max Unit VOH1For all inputs affecting output under test, VIN= 2.0 V or 0.8 V IOH= -3 mA All 4.5 V 1, 2, 3 2.5 VOH2For all inputs affecting output under test, VIN= 2.0 V or 0.8 V IOH= -3 mA All 5.0 V 1, 2, 3 3.0 High level output voltage 3006
42、 VOH3For all inputs affecting output under test, VIN= 2.0 V or 0.8 V IOH= -24 mA All 4.5 V 1, 2, 3 2.0 V Low level output voltage 3007 VOLFor all inputs affecting output under test, VIN= 2.0 V or 0.8 V IOL= +48 mA All 4.5 V 1, 2, 3 0.55 V Three - state output leakage current high 3021 IOZH 4/ 5/ 6/
43、For control inputs affecting output under test, VIN= 2.0 V or 0.8 V VOUT= 2.7 V All 5.5 V 1, 2, 3 +10.0 A Three - state output leakage current low 3020 IOZL 4/ 5/ 6/ For control inputs affecting output under test, VIN= 2.0 V or 0.8 V VOUT= 0.5 V All 5.5 V 1, 2, 3 -10.0 A 01 1, 2, 3 +2.0 Control inpu
44、ts 02 1, 2, 3 +1.0 Input current high 3010 IIHFor input under test, VIN= VCC For all other inputs, VIN= VCCor GND An, Bn inputs 7/ All 5.5 V1, 2, 3 +100 A 01 1, 2, 3 -2.0 Control inputs 02 1, 2, 3 -1.0 Input current low 3009 IILFor input under test, VIN= GND For all other inputs, VIN= VCCor GND An,
45、Bn inputs 7/ All 5.5 V1, 2, 3 -100 A Negative input clamp voltage 3022 VIC-For input under test, IIN= -18 mA All 4.5 V 1, 2, 3 -1.2 V 01 1, 2, 3 100 Off-state leakage current IOFFFor input or output under test, VIN or VOUT 4.5 V All other pins at 0.0 V 02 0.0 V1 100 A High-state leakage current ICEX
46、For output under test, VOUT= 5.5 V For all other inputs, VIN= VCCor GND; outputs at high logic state All 5.5 V 1, 2, 3 +50 A See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SIZE A 5962-92314 STANDARD MICROCIRCUIT DRAWIN
47、G DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218 - 3990 REVISION LEVEL D SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics-Continued Limits 3/ Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +4.5 V VCC +5.5 V unless otherwise specified Dev
48、ice type VCCGroup A subgroups Min Max Unit 01 14.0 Input capacitance 3012 CINTC= +25C, See 4.4.1c 02 5.0 V 4 14.0 pF 01 19.5 Input capacitance 3012 CI/OTC= +25C, See 4.4.1c 02 5.0 V 4 19.5 pF 01 -50 -180 Short circuit output current 3011 IOS 8/ For all inputs, VIN= VCCor GND VOUT= 2.5 V 02 5.0 V 1, 2, 3 -50 -200 mA 01 1, 2, 3 2.5 Quiescent supply current delta, TTL input levels 3005 ICC9/ For input under test, VIN= 3.4 V For all other inputs, VIN= VCCor GND; 02 5.5 V1, 2, 3 1.5 mA 01 1, 2, 3 250 1 350 Quiescent
