1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes in accordance with NOR 5962-R051-94. 93-11-30 K. A. Cottongim B Add device types 09 through 24. 95-01-19 K. A. Cottongim C Changes in accordance with NOR 5962-R121-95. 95-04-27 K. A. Cottongim D Changes in accordance with NOR 5962-R014-96
2、. 95-12-15 K. A. Cottongim E Add device types 25 and 26. Add case outlines T and U. 98-06-11 K. A. Cottongim F Correct figure 1, case outline Z, pin 1 index. 98-09-11 K. A. Cottongim G Add device types 27 through 46 and case outlines M and N. 01-05-23 Raymond Monnin H Paragraph 1.2.2, device types 3
3、8, 39, 40, and 41, circuit function for device types 38 and 40, remove -15 V and for device types 39 and 41, remove -15 V. Remove remaining supply references to aforementioned device types throughout document. 02-07-15 Raymond Monnin J Table I, Low and High level input currents (IIL1, IIL2, IIH1, an
4、d IIH2), add new note. 02-09-05 Raymond Monnin K Rewrite paragraphs 4.2.a.2. and 4.3.3.b.2 to add TC. 04-07-16 Raymond Monnin L Update drawing paragraphs. -sld 12-02-14 Charles F. Saffle REV SHEET REV L L L L L L L L L L L L L L L SHEET 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 REV STATUS REV L L
5、 L L L L L L L L L L L L OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Steve Duncan DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil/ STANDARD MICROCIRCUIT DRAWING CHECKED BY Michael C. Jones THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENT
6、S AND AGENCIES OF THE DEPARTMENT OF DEFENSE APPROVED BY Kendall A. Cottongim MICROCIRCUIT, HYBRID, LINEAR, MIL-STD-1553, BC/RTU/MT, MULTIPLEXED TERMINAL DRAWING APPROVAL DATE 93-09-17 AMSC N/A REVISION LEVEL L SIZE A CAGE CODE 67268 5962-93065 SHEET 1 OF 29 DSCC FORM 2233 APR 97 5962-E163-12 Provide
7、d by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93065 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL L SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance
8、classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as s
9、hown in the following example: 5962 - 93065 01 H X X Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA mark
10、ed devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 BU-65170X1 MI
11、L-STD-1553, RT, 4K RAM, +5/-15 V transceiver BU-65170BX1 MIL-STD-1553, RT, 4K RAM, +5/-15 V transceiver 02 BU-65170X2 MIL-STD-1553, RT, 4K RAM, +5/-12 V transceiver BU-65170BX2 MIL-STD-1553, RT, 4K RAM, +5/-12 V transceiver 03 BU-61580X1 MIL-STD-1553, BC/RT/MT, 4K RAM, +5/-15 V transceiver BU-61580B
12、X1 MIL-STD-1553, BC/RT/MT, 4K RAM, +5/-15 V transceiver 04 BU-61580X2 MIL-STD-1553, BC/RT/MT, 4K RAM, +5/-12 V transceiver BU-61580BX2 MIL-STD-1553, BC/RT/MT, 4K RAM, +5/-12 V transceiver 05 BU-65171X1 MIL-STD-1553, RT, 4K RAM, +5/-15 V transceiver, RT address latch BU-65171BX1 MIL-STD-1553, RT, 4K
13、RAM, +5/-15 V transceiver, RT address latch 06 BU-65171X2 MIL-STD-1553, RT, 4K RAM, +5/-12 V transceiver, RT address latch BU-65171BX2 MIL-STD-1553, RT, 4K RAM, +5/-12 V transceiver, RT address latch 07 BU-61581X1 MIL-STD-1553, BC/RT/MT, 4K RAM, +5/-15 V transceiver, RT address latch BU-61581BX1 MIL
14、-STD-1553, BC/RT/MT, 4K RAM, +5/-15 V transceiver, RT address latch 08 BU-61581X2 MIL-STD-1553, BC/RT/MT, 4K RAM, +5/-12 V transceiver, RT address latch BU-61581BX2 MIL-STD-1553, BC/RT/MT, 4K RAM, +5/-12 V transceiver, RT address latch 09 BU-65170CX3 MIL-STD-1553, RT, 4K RAM, +5 V transceiver 10 BU-
15、65170CX6 MIL-STD-1553, RT, 4K RAM, +5 V transceiver 11 BU-61580CX3 MIL-STD-1553, BC/RT/MT, 4K RAM, +5 V transceiver 12 BU-61580CX6 MIL-STD-1553, BC/RT/MT, 4K RAM, +5 V transceiver 13 BU-65171CX3 MIL-STD-1553, RT, 4K RAM, +5 V transceiver, RT address latch 14 BU-65171CX6 MIL-STD-1553, RT, 4K RAM, +5
16、V transceiver, RT address latch 15 BU-61581CX3 MIL-STD-1553, BC/RT/MT, 4K RAM, +5 V transceiver, RT address latch 16 BU-61581CX6 MIL-STD-1553, BC/RT/MT, 4K RAM, +5 V transceiver, RT address latch 17 BU-61585X1 MIL-STD-1553, BC/RT/MT, 12K RAM, +5/-15 V transceiver 18 BU-61585X2 MIL-STD-1553, BC/RT/MT
17、, 12K RAM, +5/-12 V transceiver 19 BU-61586X1 MIL-STD-1553, BC/RT/MT, 12K RAM, +5/-15 V transceiver, RT address latch 20 BU-61586X2 MIL-STD-1553, BC/RT/MT, 12K RAM, +5/-12 V transceiver, RT address latch 21 BU-61585BX3 MIL-STD-1553, BC/RT/MT, 12K RAM, +5 V transceiver 22 BU-61585BX6 MIL-STD-1553, BC
18、/RT/MT, 12K RAM, +5 V transceiver 23 BU-61586BX3 MIL-STD-1553, BC/RT/MT, 12K RAM, +5 V transceiver, RT address latch 24 BU-61586BX6 MIL-STD-1553, BC/RT/MT, 12K RAM, +5 V transceiver, RT address latch Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-ST
19、ANDARD MICROCIRCUIT DRAWING SIZE A 5962-93065 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL L SHEET 3 DSCC FORM 2234 APR 97 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: - Continued. Device type Generic number Circuit function 25 BU-61588BX3 MIL-
20、STD-1553, BC/RT/MT, 4K RAM, +5 V transceiver 26 BU-65178BX3 MIL-STD-1553, RT, 4K RAM, +5 V transceiver 27 BU-65179BX3 MIL-STD-1553, RT/RT_BOOT, 10, 12, 16, 20 MHz, 4K RAM, +5 V transceiver 28 BU-61688AX3 MIL-STD-1553, BC/RT/MT, 12/16 MHz, 64K RAM, +5 V transceiver 29 BU-61689AX3 MIL-STD-1553, BC/RT/
21、MT, 10/20 MHz, 64K RAM, +5 V transceiver 30 BU-65170DX3 MIL-STD-1553, RT, 4K RAM, +5 V transceiver 31 BU-65170DX6 MIL-STD-1553, RT, 4K RAM, +5 V transceiver, with TX inhibits external 32 BU-61580DX3 MIL-STD-1553, BC/RT/MT, 4K RAM, +5 V transceiver 33 BU-61580DX6 MIL-STD-1553, BC/RT/MT, 4K RAM, +5 V
22、transceiver, with TX inhibits external 34 BU-65171DX3 MIL-STD-1553, RT, 4K RAM, +5 V transceiver, RT address latch 35 BU-65171DX6 MIL-STD-1553, RT, 4K RAM, +5 V transceiver, RT address latch, with TX inhibits external 36 BU-61581DX3 MIL-STD-1553, BC/RT/MT, 4K RAM, +5 V transceiver, RT address latch
23、37 BU-61581DX6 MIL-STD-1553, BC/RT/MT, 4K RAM, +5 V transceiver, RT address latch, with TX inhibits external 38 BU-61585DX3 MIL-STD-1553, BC/RT/MT, 12K RAM, +5 V transceiver 39 BU-61585DX6 MIL-STD-1553, BC/RT/MT, 12K RAM, +5 V transceiver 40 BU-61586DX3 MIL-STD-1553, BC/RT/MT, 12K RAM, +5 V transcei
24、ver, RT address latch 41 BU-61586DX6 MIL-STD-1553, BC/RT/MT, 12K RAM, +5 V transceiver, RT address latch 42 BU-61588CX3 MIL-STD-1553, BC/RT/MT, 12/16 MHz, 4K RAM, +5 V transceiver 43 BU-65178CX3 MIL-STD-1553, RT, 4K RAM, +5 V transceiver 44 BU-65179CX3 MIL-STD-1553, RT/RT_BOOT, 10, 12, 16, 20 MHz, 4
25、K RAM, +5 V transceiver 45 BU-61688BX3 MIL-STD-1553, BC/RT/MT, 12/16 MHz, 64K RAM, +5 V transceiver 46 BU-61689BX3 MIL-STD-1553, BC/RT/MT, 10/20 MHz, 64K RAM, +5 V transceiver 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level
26、. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. T
27、his level is intended for use in space applications. H Standard military quality class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening
28、and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C, and D). E Designates devices which are based upon one of the other classes (K, H, or G)
29、with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quali
30、ty class. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a limited temperature range. 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style M See fi
31、gure 1 72 Quad flat package with lead forming N See figure 1 70 Flat package with lead forming T See figure 1 72 Quad flat package with tie bars U See figure 1 81 Pin grid array Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DR
32、AWING SIZE A 5962-93065 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL L SHEET 4 DSCC FORM 2234 APR 97 X See figure 1 70 Dual-in-line Y See figure 1 70 Flat package Z See figure 1 70 Dual-in-line, J-lead 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 A
33、bsolute maximum ratings. 1/ Positive supply voltage range (+5VA, +5VB) -0.3 V dc to +7.0 V dc Negative supply voltage range (-VA, -VB) +0.3 V dc to -18 V dc Logic supply voltage range (+5 V logic) -0.3 V dc to +6.0 V dc Power dissipation (PD): 2/ 3/ 4/ Device types 01, 03, 05, 07, 17, 19, 38, and 40
34、 2.23 W Device types 27, 28, 29, 44, 45, 46 . 2.08 W Device types 02, 04, 06, 08, 18, 20, 39, and 41 2.16 W Device types 09 through 16, 21 through 24, 30 through 37 . 2.85 W Device types 25, 26, 42, and 43 1.97 W Storage temperature range . -65 C to +150 C Lead temperature (soldering, 10 seconds) .
35、+300 C Thermal resistance, junction to case (qJC) . 6.99 C/W 3/ 1.4 Recommended operating conditions. Positive supply voltage range (+5VA, +5VB): Device types 01 through 08, 17 through 20, 38 through 41 . +4.5 V dc to +5.5 V dc Device types 09 through 16, 21 through 29, 30 through 37, 42 through 46
36、. +4.75 V dc to +5.25 V dc Negative supply voltage range (-VA, -VB): Device types 01, 03, 05, 07, 17, and 19 -14.25 V dc to -15.75 V dc Device types 02, 04, 06, 08, 18, and 20 -11.40 V dc to -12.60 V dc Logic supply voltage range (+5V logic) . +4.5 V dc to +5.5 V dc Minimum logic high input voltage
37、(VIH). 2.0 V dc Maximum logic low input voltage (VIL) 0.8 V dc Operating frequency (FOP) . 10, 12, 16, or 20 MHz Case operating temperature range (TC) . -55 C to +125 C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handboo
38、ks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDAR
39、DS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliabili
40、ty. 2/ Applies up to TC= +125 C. 3/ Hottest die. 4/ Assumes 100 percent transmitter duty cycle on one channel and 0 percent duty cycle on the other channel. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-930
41、65 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL L SHEET 5 DSCC FORM 2234 APR 97 DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.dap
42、s.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Noth
43、ing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with
44、 MIL-PRF-38534 shall include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance re
45、quirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, an
46、d physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.2.3 Pin functions. The pin functions sh
47、all be as specified in table III. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrica
48、l test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conform
