1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes in accordance with NOR 5962-R139-95. 95-05-11 K. A. Cottongim B Corrected figure 1 to move the side view of case outlines X and Z to the right side of the top view for the correct orientation. Figure 1; removed the min limit for the D dim
2、ension of 2.880 inches (73.15 mm) for the case outline Z. -sld 98-07-22 K. A. Cottongim C Add device type 02, class K, and radiation hardness assurance (RHA) requirements for levels L and R. 00-06-22 Raymond Monnin D Add paragraph 1.5 and note 2. Table I, output voltage test, device types 01 and 02,
3、 subgroups 2 and 3; change the min/max limits from 14.55 V and 15.45 V to 14.70 V and 15.30 V. Table I, output voltage test, device type 02, RHA levels L and R; change the min/max limits from 14.70 V and 15.30 V to 14.55 V and 15.45 V. Table 1, add new note 2 for enhanced low dose rate effects (renu
4、mber remaining notes in sequence). Paragraph 4.3.5.a, correct paragraph, remove condition A and add enhanced low dose rate effects. -gz 07-03-20 Robert M. Heber E Update Table I to include RHA level “P“. Update table in paragraph 4.3.5 to include RHA level “P “. Update bulletin page to include RHA l
5、evel “P“ part numbers. gc 07-05-31 Robert M. Heber REV SHEET REV SHEET REV STATUS REV E E E E E E E E E E E E OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 PMIC N/A PREPARED BY Steve L. Duncan DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Michael C. Jones COLUMBUS, OHIO 43218-
6、3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Kendall A. Cottongim MICROCIRCUIT, HYBRID, LINEAR, 15-VOLT, SINGLE CHANNEL, DC-DC CONVERTER AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 94-05-13 AMSC N/A REVISION LEVEL E SIZE A CAGE CODE
7、 67268 5962-93070 SHEET 1 OF 12 DSCC FORM 2233 APR 97 5962-E429-07Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93070 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 2 DSCC F
8、ORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes, class D (lowest reliability), class E, (exceptions), class G (lowered high reliability), class H (high reliability), and class K, (highest reliability) and a choice of case outlines and lead finishes which are
9、 available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 - 93070 01 H X X Federal RHA Device Device Case Lead stock class designato
10、r type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. Device classes H and K RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with t
11、he appropriate RHA designator. A dash (-) indicates a non-RHA device. Only the RHA levels specified herein are available. See 4.3.5. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 MTR2815S/883, MTR2815SF/883 DC-DC con
12、verter, 30 W, 15 V output 02 SMTR2815S, SMTR2815SF DC-DC converter, 30 W, 15 V output 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certificatio
13、n as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space applications. H Standard military quality class lev
14、el. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specifi
15、ed incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C, and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be spec
16、ified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This
17、 product may have a limited temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93070 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 3 DSCC FORM 2234 APR 97 1.2
18、.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 10 Dual-in-line Z See figure 1 10 Flange mount 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolut
19、e maximum ratings. 1/ Input voltage range -0.5 V dc to +50 V dc Power dissipation (PD) Device types 01 and 02 (non-RHA) 12 W Device type 02 (RHA levels L and R) . 14 W Output power . 30.9 W Lead soldering temperature (10 seconds) +300C Storage temperature range -65C to +150C 1.4 Recommended operatin
20、g conditions. Input voltage range +16 V dc to +40 V dc Case operating temperature range (TC). -55C to +125C 1.5 Radiation features. Maximum total dose available (dose rate = 9 rad(Si)/s): Device type 02 100 krad (Si) 2/ 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks.
21、The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38534 - Hybrid Microcircuits, Gener
22、al Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircui
23、t Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict betwe
24、en the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 1/ Stresses above the absolute maximum ratings may cause permanent dama
25、ge to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ These parts may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects. Radiation end-point limits for the noted parameters are guaranteed only for
26、the conditions as specified in MIL-STD-883, method 1019, condition C, tested at 9 rad(Si)/s. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93070 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVI
27、SION LEVEL E SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 may include the performance of all tests herein or as designate
28、d in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device cl
29、ass. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 C
30、ase outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.2.3 Radiation exposure circuit. The radiation exposure circuit shall be maintained by the manufacturer under document r
31、evision level control and shall be made available to the preparing and acquiring activity upon request. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operat
32、ing temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device
33、shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables
34、format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control
35、by the manufacturer and be made available to the preparing activity (DSCC-VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DSCC-VA shall af
36、firm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and i
37、nspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 4.2 Screening. Screening shall be in accor
38、dance with MIL-PRF-38534. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DSCC-VA or the
39、acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TAas specified in accordance with table I of method 1015 of MIL-STD-883. b. Interim and
40、final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCI
41、RCUIT DRAWING SIZE A 5962-93070 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ 2/ -55C TC +125C VIN= 28 V dc 0.5 V Group A subgroups Device types Limits Unit no externa
42、l sync, CL= 0 unless otherwise specified Min Max 1 14.85 15.15 IOUT= 2.0 A dc 2,3 01,02 14.70 15.30 Output voltage VOUTP, L, R 1,2,3 02 14.55 15.45 V dc VIN= 16 V dc to 40 V dc 1,2,3 01, 02 2000 Output current IOUTP, L, R 1,2,3 02 2000 mA 1 40 IOUT= 2.0 A BW = 10 kHz to 2 MHz 2,3 01,02 90 VOUTripple
43、 voltage VRIPP, L, R 1,2,3 02 180 mVp-p VIN=16 V dc to 40 V dc IOUT= 2.0 A 1,2,3 01,02 50 VOUTline regulation VRLINEP, L, R 1,2,3 02 100 mV IOUT= 0 to 2.0 A 1,2,3 01,02 50 VOUTload regulation VRLOADP, L, R 1,2,3 02 100 mV IOUT= 0 A, Inhibit (pin 2) = 0 1,2,3 01,02 8 P, L, R 1,2,3 02 10 IOUT= 0 A, In
44、hibit (pin 2) = open 1, 2, 3 01,02 75 Input current IINP, L, R 1,2,3 02 175 mA IOUT= 2.0 A, BW = 10 kHz to 10 MHz 1, 2, 3 01,02 50 IINripple current IRIPP, L, R 1,2,3 02 65 mAp-p See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from
45、IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93070 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions 1/ 2/ -55C TC +125C VIN= 28 V dc 0.5 V Group A subgroups
46、 Device types Limits Unit no external sync, CL= 0 unless otherwise specified Min Max Efficiency Eff IOUT= 2.0 A 01 81 % 1 02 79 01 78 2, 3 02 76 P, L, R 1,2,3 02 72 Isolation ISO Input to output or any pin to case (except pins 7 and 8) at 500V dc, 1 01,02 100 M TC= +25C P, L, R 1 02 100 Capacitive l
47、oad 3/ 4/ CLNo effect on dc performance, TC= +25C 4 01,02 3000 F P, L, R 4 02 3000 Short circuit PDShort circuit 1 01,02 10 W power dissipation 2,3 01,02 12 P, L, R 1,2,3 02 14 Switching frequency FSIOUT= 2.0 A 4,5,6 01,02 550 650 kHz P, L, R 4,5,6 02 400 750 External sync range 5/ FSYNCIOUT= 2.0 A,
48、 TTL level to pin 9 4,5,6 01,02 500 675 kHz P, L, R 4,5,6 02 550 650 VOUTstep load transient 6/ VTLOAD50% load to/from 100% load 4,5,6 01,02 -500 +500 mV pk P, L, R 4,5,6 02 -1100 +1100 VOUTstep load transient recovery 4/ 6/ 7/ TTLOAD50% load to/from 100% load 4,5,6 01,02 200 s P, L, R 4,5,6 02 800 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-930
