1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Drawing updated to reflect current requirements. -ro 01-10-18 R. MONNIN B Drawing updated as part of 5 year review. -rrp 07-04-17 Robert M. Heber REV SHET REV SHET REV STATUS REV B B B B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12
2、PMIC N/A PREPARED BY RICK C. OFFICER DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY CHARLES E. BESORE COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY MICHAEL A. FRYE MICROCIRCUIT, LINEAR, VIDEO OPERATIONAL AMP
3、LIFIER WITH DISABLE, MONOLITHIC SILICON AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 93-10-29 AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 67268 5962-93132 SHEET 1 OF 12 DSCC FORM 2233 APR 97 5962-E279-06 Provided by IHSNot for ResaleNo reproduction or networking permitted without l
4、icense from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93132 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q a
5、nd M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN. 1.2 PIN. The PIN is as shown in the follo
6、wing example: 5962 - 93132 01 M P X Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2)Device class designatorCase outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF
7、-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s
8、) identify the circuit function as follows: Device type Generic number Circuit function 01 AD810 Video operational amplifier with disable 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device class Device requirements
9、 documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1
10、835 and as follows: Outline letter Descriptive designator Terminals Package style P GDIP1-T8 or CDIP2-T8 8 Dual-in-line 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo repr
11、oduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93132 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ Supply voltage (VS) . 18 V dc Common mode input volta
12、ge (VCM) VSDifferential input voltage (VID) . 6 V dc Power dissipation (PD) 1.3 W 2/ Lead temperature range (soldering 60 seconds) . 300C Storage temperature range -65C to +150C Thermal resistance, junction-to-case (JC) See MIL-STD-1835 Thermal resistance, junction-to ambient (JA) . 110C/W 1.4 Recom
13、mended operating conditions. Power supply voltage range (VS) . 2.5 V to 18 V Ambient operating temperature range (TA) . -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to t
14、he extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test
15、 Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.
16、daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of thi
17、s drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. _ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade perf
18、ormance and affect reliability. 2/ Maximum power dissipation is specified so that TJdoes not exceed +175C at an ambient temperature of +25C. Derate above TA= +25C for case P at 9 mW/C. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIR
19、CUIT DRAWING SIZE A 5962-93132 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein
20、or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level
21、B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlines. The ca
22、se outlines shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics
23、 and postirradiation parameter limits are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in
24、table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the
25、 device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification
26、 mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-3
27、8535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compl
28、iance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.
29、7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device
30、class M, notification to DSCC-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DSCC, DSCCs agent, and the acquiring activity retain the option
31、to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group numbe
32、r 85 (see MIL-PRF-38535, appendix A).Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93132 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Elec
33、trical performance characteristics. Test Symbol Conditions -55C TA +125C RL= 150 Group A subgroups Device type Limits 1/ Unit unless otherwise specified Min Max Input offset voltage VIOVS= 5 V and 15 V 1 01 -6 +6 mV 2,3 -15 +15 Input bias current -IIBVS= 5 V, 15 V, 1,2,3 01 -5 +5 A +IIBVCM= 0 V -10
34、+10 Open-loop transresistance RVSVS= 15 V, VOUT= 10 V, RL= 400 1,2,3 01 1.0 M VS= 5 V, VOUT= 2.5 V, RL= 100 0.2 Open loop gain AOLVS= 15 V, VOUT= 10 V, RL= 400 1,2,3 01 80 dB VS= 5 V, VOUT= 2.5 V, RL= 100 72 Common mode rejection ratio CMRR VS= 5 V, VCM= 2.5 V 1,2,3 01 50 dB VS= 15 V, VCM= 12 V 56 C
35、MRRIBVS= 5 V and 15 V -0.4 0.4 A/V Power supply rejection ratio PSRR VS= 4.5 V to 18 V 1,2,3 01 60 dB PSRRIBVS= 4.5 V and 18 V -0.3 0.3 A/V Input common mode voltage range CMVR VS= 5 V 1,2,3 01 -2.5 +2.5 V VS= 15 V -12 +12 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction o
36、r networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93132 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions -55C TA +125C
37、RL= 150 Group A subgroups Device type Limits 1/ Unit unless otherwise specified Min Max Output voltage swing 2/ +VOUTVS= 5 V, RL= 150 1,2,3 01 +2.5 V VS= 15 V, RL= 400 1 +12.5 2,3 +12 -VOUTVS= 5 V, RL= 150 1,2,3 -2.5 VS= 15 V, RL= 400 1 -12.5 2,3 -12 Output current IOUTVS= 5 V and 15 V 1,2,3 01 30 m
38、A Power supply quiescent current IQVS= 5 V 1 01 7.5 mA VS= 15 V 8.0 VS= 5 V and 15 V 2,3 11.0 Power down current IDNVS= 5 V 1 01 2.3 mA VS= 15 V 2.8 VS= 5 V 2,3 3.5 VS= 15 V 4.0 Disable pin current 3/ ILOGICDISABLE pin = 0 V, VS= 5 V, TA= +25C 1 01 75 A DISABLE pin = 0 V, VS= 15 V, TA= +25C 400 Inpu
39、t resistance 3/ +RINVS= 15 V, TA= +25C 4 01 2.5 M See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93132 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B
40、 SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions -55C TA +125C RL= 150 Group A subgroups Device type Limits 1/ Unit unless otherwise specified Min Max Minimum DISABLE 3/ pin current to disable IDVS= 5 V and 15 V 1 01 10 40 A Bandwidth a
41、t 3 dB 3/ BW AV= +2, RFB= 715 , VS= 5 V, TA= +25C 4 01 40 MHz AV= +2, RFB= 715 , VS= 15 V, TA= +25C 55 Bandwidth at 0.1 dB 3/ BW AV= +2, RFB= 715 , VS= 5 V, TA= +25C 4 01 13 MHz AV= +2, RFB= 715 , VS= 15 V, TA= +25C 15 Full power bandwidth 3/ FPBW VS= 15 V, VOUT= 20 VPP, RL= 400 , TA= +25C 4 01 8 MH
42、z Slew rate 3/ SR VS= 15 V, RL= 400 , AV= -10, TA= +25C, measured at 10% to 90% points, rising and falling edge 4 01 500 V/s VS= 5 V, RL= 150 , AV= -10, TA= +25C, measured at 10% to 90% points, rising and falling edge 175 Differential gain 3/ DG VS= 15 V, f = 3.58 MHz, TA= +25C 4 01 0.05 % VS= 5 V,
43、f = 3.58 MHz, TA= +25C 0.07 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93132 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 8 DSCC FORM 223
44、4 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions -55C TA +125C RL= 150 Group A subgroups Device type Limits 1/ Unit unless otherwise specified Min Max Differential phase 3/ DP VS= 15 V, f = 3.58 MHz, TA= +25C 4 01 0.07 Degree VS= 5 V, f = 3.58 MHz, TA= +25C
45、0.08 1/ The algebraic convention, whereby the most negative value is a minimum and the most positive value is a maximum, is used in this table. Negative current shall be defined as conventional current flow out of a device terminal. 2/ The voltage swing test is defined as useful operating range, but
46、 no saturation range. 3/ If not tested, shall be guaranteed to the limits specified in table I herein. 4. VERIFICATION 4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or as modified in the device manufacturers Qual
47、ity Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. For device classes Q and V, screening shall be in ac
48、cordance with MIL-PRF-38535, and shall be conducted on all devices prior to qualification and technology conformance inspection. For device class M, screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. 4.2.1 Additional criteria for device class M. a. Burn-in test, method 1015 of MIL-STD-883. (1) Te
