1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Correction to table I differential nonlinearity test limit. Editorial changes throughout. - drw 00-08-25 Raymond Monnin B Update drawing to current requirements. drw 06-08-30 Raymond Monnin REV SHET REV SHET REV STATUS REV B B B B B B B B B B B O
2、F SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 PMIC N/A PREPARED BY Sandra Rooney DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Sandra Rooney COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Michael A. Frye MICROCIRCU
3、IT, LINEAR, 12-BIT SERIAL AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 94-01-20 DACPORT, MONOLITHIC SILICON AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 67268 5962-93204 SHEET 1 OF 11 DSCC FORM 2233 APR 97 5962-E637-06 Provided by IHSNot for ResaleNo reproduction or networking permi
4、tted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93204 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (devi
5、ce classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN. 1.2 PIN. The PIN is as show
6、n in the following example: 5962 - 93204 01 M E A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2)Device class designatorCase outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices me
7、et the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type. The de
8、vice type identifies the circuit function as follows: Device type Generic number Circuit function 01 AD7243 12-bit serial DACPORT 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device class Device requirements documen
9、tation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline. The case outline is as designated in MIL-STD-1835 as follows:
10、 Outline letter Descriptive designator Terminals Package style E GDIP1-T16 or CDIP2-T16 16 Dual-in-line 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or netw
11、orking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93204 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/,2/ VDDto AGND, DGND . -0.3 V dc to +17 V dc VSSto AGND, DGND . +0.3 V
12、 dc to -17 V dc AGND to DGND. -0.3 V dc to VDD+ 0.3 V dc VOUTto AGND 3/ -6 V dc to VDD+ 0.3 V dc REFOUT to AGND. 0 V dc to VDDREFIN to AGND. -0.3 V dc to VDD+ 0.3 V dc Digital inputs to DGND. -0.3 V dc to VDD+ 0.3 V dc SDO to DGND -0.3 V dc to VDD+ 0.3 V dc Storage temperature range -65C to +150C Le
13、ad temperature (soldering, 10 seconds). +300C Power dissipation (PD) (TA= +75C) 4/ 450 mW 1.4 Recommended operating conditions. Positive supply voltage range (VDD) . +12 V dc to +15 V dc 5/ Negative supply voltage range (VSS) 0 V dc or -12 V dc to -15 V dc 5/ Voltage reference input (REFIN) +5 V dc
14、Ambient operating temperature range -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these document
15、s are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Compone
16、nt Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil or from the Standardization D
17、ocument Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable
18、 laws and regulations unless a specific exemption has been obtained. _ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ TA= +25C unless otherwise specified. 3/ The outpu
19、ts may be shorted to voltages in this range provided the power dissipation of the package is as specified. Short circuit current is typically 80 mA. 4/ Derate power dissipation above TA= +75C by 6 mW/C. 5/ Power supply tolerance 5%. Provided by IHSNot for ResaleNo reproduction or networking permitte
20、d without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93204 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accord
21、ance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MI
22、L-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein
23、 for device class M. 3.2.1 Case outline. The case outline shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified here
24、in, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The elec
25、trical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer ha
26、s the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Ce
27、rtification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificat
28、e of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-10
29、3 (see 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requiremen
30、ts of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notifica
31、tion of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DSCC, DSCCs agent,
32、 and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by thi
33、s drawing shall be in microcircuit group number 80 (see MIL-PRF-38535, appendix A).Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93204 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL
34、 B SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TA+125C unless otherwise specified Group A subgroups Device type Limits Unit Min MaxRelative accuracy 2/ RA 1, 2, 3 01 1 LSB Differential nonlinearity 2/ DNL Guaranteed monotonic 1, 2, 3
35、01 0.9 LSB Unipolar offset error 2/ UOE DAC latch contents all 0s 1, 2, 3 01 5 LSB Bipolar zero error BZE DAC latch contents 2048 1, 2, 3 01 6 LSB Full scale error 2/ 3/ AE 1, 2, 3 01 7 LSB Voltage reference output REFOUT 1, 2, 3 01 4.95 5.05 V Reference load change REFLC Reference load current (IL)
36、 change (0-100 A) 1, 2, 3 01 -1 mV Reference input range 4/ REFIN 1, 2, 3 01 4.95 5.05 V Reference input current RIN 1, 2, 3 01 5 A Digital input high 2/ voltage VINH7. 8 01 2.4 V Digital input low 2/ voltage VINL7, 8 01 0.8 V Digital input current IINVIN= 0 V to VDD, VDD= 15.75 V, VSS= -15.75 V 1,
37、2, 3 01 1 A Input capacitance CINSee 4.4.1c 4 01 8 pF Digital output low voltage VOLISINK= 1 mA 1, 2, 3 01 0.4 V Digital output high voltage VOHISOURCE= 400 A 1, 2, 3 01 4.0 V Analog output range resistor ROUT1, 2, 3 01 15 30 k Analog output voltage 5/ ranges VOUT Single supply, VSS= 0 V 1, 2, 3 01
38、5 10 V Dual supplies, VSS= -12 V to -15 V 5 10 -5 +5 Positive power supply current IDDVDD= 15.75 V, VSS= -15.75 V, output unloaded, 10 V range 1, 2, 3 01 12 mA Negative power supply current ISSVDD= 15.75 V, VSS= -15.75 V, output unloaded, 10 V range, dual supplies 1, 2, 3 01 4 mA See footnotes at en
39、d of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93204 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance charac
40、teristics - continued. Test Symbol Conditions 1/ -55C TA+125C unless otherwise specified Group A subgroups Device type Limits Unit Min MaxVoltage output settling time, positive full scale 6/ change tPSSee 4.4.1c 4 01 12 s Voltage output settling time, negative full scale 6/ change tNSVSS= -12 V to -
41、15 V See 4.4.1c 4 01 10 s SCLK cycle time 7/ 8/ t1SCLK mark/space ratio range is 40/60 to 60/40, see figure 2 9, 10, 11 01 200 ns SYNC to SCLK falling edge setup time 7/ 8/ t2See figure 2 9, 10, 11 01 50 ns SYNC to SCLK hold time t3See figure 2 9 01 120 ns 7/ 8/ 10, 11 190 Data setup time 7/ 8/ t4Se
42、e figure 2 9, 10, 11 01 10 ns Data hold time 7/ 8/ t4See figure 2 9, 10, 11 01 100 ns SYNC high to LDAC low 7/ 8/ t6See figure 2 9, 10, 11 01 0 ns LDAC pulse width 7/ 8/ t7See figure 2 9, 10, 11 01 50 ns LDAC high to SYNC low 7/ 8/ t6See figure 2 9, 10, 11 01 0 ns CLR pulse width 7/ 8/ t9See figure
43、2 9, 10, 11 01 75 ns SCLK falling edge to SD0 t10SD0 load capacitance is no 9 01 120 ns Valid 7/ 8/ 9/ Greater than 50 pF 10, 11 180 1/ VDD= +11.4 V to +15.75 V. VSS= 0 V or 11.4 V to 15.75 V. AGND = DGND = 0 V. REFIN = +5 V. RL= 2 k. CL= 100 pF to AGND. Parts are guaranteed over this supply range.
44、Individual tests are performed with known worst case supply conditions. Unless otherwise noted VDD= +11.4 V and VSS= 11.4 V 2/ VDD= 14.25 V, VSS= 0 V on 10 V range. VDD= 14.25 V, VSS= 14.25 V on 10 V range. VDD= 11.4 V, VSS= 11.4 V on 5 V range 3/ Measured with respect to REFIN and includes unipolar
45、 and bipolar offset error. 4/ REFIN is connected to REFOUT for all tests except RIN. 5/ Analog output voltage ranges are guaranteed by passing of DC accuracy tests. 6/ 0 V to +10 V output range is available only with VDD +14.25 V. 7/ All input signals are specified with tr= tf= 5 ns (10% to 90% 0f 5
46、 V) and timed from a voltage level of 1.6 V. 8/ Subgroups 10 and 11 are measured only at initial design characterization and after process or design changes which might affect this parameter. This limit is guaranteed even though it is not tested. 9/ t10measured only at initial design characterizatio
47、n and after process or design changes which might affect this parameter. This limit is guaranteed even though it is not tested. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93204 DEFENSE SUPPLY CENTER COLU
48、MBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 Device type 01 Case outline E Terminal number Terminal symbol 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 REFIN REFOUT CLR BIN/COMP SCLK SDIN SYNC DGND LDAC DCEN SD0 AGND ROFSVOUTVSSVDDFIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93204 DEFENSE SUPPLY CENTER COLUMBUS COLUMB
