1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Update drawing boilerplate to current requirements of MIL-PRF-38534. 01-05-21 Raymond Monnin B Update drawing per 5 year review. -sld 09-01-12 Robert M. Heber REV SHEET REV SHEET REV STATUS REV B B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8
2、9 10 PMIC N/A PREPARED BY Gary Zahn DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Michael C. Jones COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Kendall A. Cottongim MICROCIRCUIT, HYBRID, LINEAR, VIDEO DRIV
3、ER AMPLIFIER AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 95-03-16 AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 67268 5962-94727 SHEET 1 OF 10 DSCC FORM 2233 APR 97 5962-E486-08 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDAR
4、D MICROCIRCUIT DRAWING SIZE A 5962-94727 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and le
5、ad finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 - 94727 01 H X X Federal RHA Device Device Case Lead
6、stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the
7、 appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 MSK 640B Video driver amplifier 02 MSK 641B Video driver amplifier 1.2.3 Device class designator. This
8、 device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follow
9、s: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space applications. H Standard military quality class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testi
10、ng version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C
11、and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the excepti
12、on(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a limited temperature range. 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-183
13、5 and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 9 Flange mount 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIR
14、CUIT DRAWING SIZE A 5962-94727 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ Supply voltage (+VCC) Device type 01 70 V dc Device type 02 100 V dc Power dissipation (PD) . 7.0 W 2/ Junction temperature (TJ) . +
15、150C Thermal resistance, junction-to-case (JC) . 12C/W (output devices) Storage temperature range -65C to +150C Lead temperature (soldering, 10 seconds). +300C 1.4 Recommended operating conditions. Supply voltage (+VCC) Device type 01 60 V dc Device type 02 80 V dc Frequency range DC to 130 MHz Case
16、 operating temperature range (TC) . -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these document
17、s are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATIONS MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case O
18、utlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue
19、, Building 4D, Philadelphia, PA 19111-5094.) 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 shall include the performance of all tests herein or as designated in the dev
20、ice manufacturers Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addi
21、tion, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliab
22、ility. 2/ For 10 ns continuous black to white transitions or worse case situations. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94727 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVE
23、L B SHEET 4 DSCC FORM 2234 APR 97 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal c
24、onnections. The terminal connections shall be as specified on figure 2. 3.2.3 Test circuit. The test circuit shall be as specified on figure 3. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and sh
25、all apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) shall be in ac
26、cordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked in MIL-HDBK-103 and QML-38534. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the devic
27、e described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed
28、. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DSCC-VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The c
29、ertificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of micro
30、circuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or fu
31、nction as described herein. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply: a. Preseal burn-in test, method 1030 of MIL-STD-883, (optional for classes H and K). (1) Test condition C or D. The test circuit shall be maintained by the m
32、anufacturer under document revision level control and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1030
33、of MIL-STD-883. (2) TAas specified in accordance with table I of method 1015 of MIL-STD-883. b. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to ei
34、ther DSCC-VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1015 of MIL-STD-883. (2) TAas specified in accordance with table I of method 1015 of MIL
35、-STD-883. c. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from
36、 IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94727 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Limits Test Symbol Conditions 1/ -55C TC+125C unless otherwise specified Group A subgroups
37、 Device type Min Max Unit 1 1.4 1.7 Input bias voltage VINDCIIN= IOUT= 0 2,3 All 1.3 1.8 V 01 26 34 Output offset voltage VOUTDCIIN= IOUT= 0 1,2,3 02 36 44 V 1,3 45 Quiescent current ICCIIN= IOUT= 0 V 2 All 65 mA Linearity error 2/ LE VOUTfrom +5 V to +50 V, f 10 kHz 4,5,6 All 5.0 % Low frequency ti
38、lt 3/ VTILT1 kHz square wave 4,5,6 All 1.5 V Bandwidth 2/ 3/ BW -3 dB point small signal 4,5,6 All 130 MHz 01 10.5 14.5 Voltage gain 2/ VG10 kHz 4,5,6 02 13 18 V/V Rise time 2/ tr10% to 90%, VOUT= 30 Vp-p 4,5,6 All 2.9 ns Fall time 2/ tf90% to 10%, VOUT= 30 Vp-p 4,5,6 All 2.9 ns 1/ For device type 0
39、1, +VCC= +60 V dc, VOUT= 30 V dc offset. For device type 02, +VCC= +80 V dc, VOUT= 40 V dc offset. See figure 3 for device types 01 and 02, R1= 215 ohms, C1= 100 pF, C2= 6.8 F, and CLOAD= 8.5 pF. 2/ Subgroups 5 and 6, if not tested shall be guaranteed to the specified limits in table I. 3/ Parameter
40、, if not tested shall be guaranteed to the specified limits in table I. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94727 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 6
41、DSCC FORM 2234 APR 97 Case outline X. Millimeters Inches Symbol Min Max Min Max A 6.35 .250 b 0.38 0.53 .015 .021 D 46.36 47.37 1.825 1.865 D1 26.92 27.43 1.060 1.080 D2 20.07 20.57 .790 .810 D3 9.91 10.41 .390 .410 E 17.02 17.52 .670 .690 eA 3.30 3.81 .130 .150 e 2.41 2.67 .095 .105 F 1.02 1.27 .04
42、0 .050 p 3.71 4.22 .146 .166 L 9.27 9.78 .365 .385 q 37.72 38.48 1.485 1.515 NOTES: 1. The U. S. preferred system of measurement is the metric SI. This case outline was originally designed using inch-pound units of measurement, in the event of conflict between the metric and inch-pound units, the in
43、ch-pound shall take precedence. 2. Pin numbers are for reference only. FIGURE 1. Case outline(s). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94727 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990
44、 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 Device type 01 Case outline X Terminal number Terminal symbol 1 2 3 4 5 6 7 8 9 Input Ground Ground +VCC+VCC+VCCGround Ground Output FIGURE 2. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license fr
45、om IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94727 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 8 DSCC FORM 2234 APR 97 NOTES: 1. For device type 01, +VCC= +60 V dc, VOUT= 30 V dc offset. For device type 02, +VCC= +80 V dc, VOUT= 40 V dc offset. 2. Device t
46、ypes 01 and 02, R1= 215 ohms, C1= 100 pF, C2= 6.8 F, and CLOAD= 8.5 pF. FIGURE 3. Test circuit. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94727 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 R
47、EVISION LEVEL B SHEET 9 DSCC FORM 2234 APR 97 TABLE II. Electrical test requirements. MIL-PRF-38534 test requirements Subgroups (in accordance with MIL-PRF-38534, group A test table) Interim electrical parameters - Final electrical parameters 1*, 2, 3, 4, 5, 6 Group A test requirements 1, 2, 3, 4, 5
48、, 6 Group C end-point electrical parameters 1, 4 End-point electrical parameters for radiation hardness assurance (RHA) devices Not applicable * PDA applies to subgroup 1. 4.3 Conformance and periodic inspections. Conformance inspection (CI) and periodic inspection (PI) shall be in accordance with MIL-PRF-38534 and as specified herein. 4.3.1 Group A inspection (CI). Group A inspection shall be in
