1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Update drawing boilerplate. Editorial changes throughout. 03-06-24 Raymond Monnin B Table II, added note 1 to Group C end-point test parameters. Editorial changes throughout. -sld 13-12-10 Charles F. Saffle REV SHEET REV SHEET REV STATUS REV B B
2、B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 PMIC N/A PREPARED BY Steve L. Duncan DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil/ STANDARD MICROCIRCUIT DRAWING CHECKED BY Michael C. Jones THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Kendall A
3、 Cottongim MICROCIRCUIT, HYBRID, LINEAR, SAMPLING ANALOG TO DIGITAL CONVERTER, 14-BIT, 1 MHZ AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 96-04-02 AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 67268 5962-94757 SHEET 1 OF 9 DSCC FORM 2233 APR 97 5962-E075-14 Provided by IHSNot for Res
4、aleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94757 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined
5、in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the followi
6、ng example: 5962 - 94757 01 H X A Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall me
7、et the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 ADS-927/883 Sampling A/D convert
8、er, 14-bit, 1 MHz 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class
9、 G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space applications. H Standard military quality class level. This level is intended for use in applications where non-space h
10、igh reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test)
11、 periodic and conformance inspections (Group A, B, C, and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition
12、document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a limited temperature range. Provided by IHSNot fo
13、r ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94757 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and
14、 as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 24 Dual-in-line 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Positive supply voltage range (VCC) . 0 to +16 V dc Negative supply voltage range (VEE
15、) 0 to -16 V dc Logic supply voltage (VDD) . 0 to +6 V dc Digital input voltage range . -0.3 V dc to VDD+ 0.3 V dc Analog input . 15 V Lead temperature (soldering, 10 seconds) +300C Junction temperature (TJ) +175C Storage temperature range -65C to +150C Power dissipation (PD) . 1.95 W Thermal resist
16、ance: Junction-to-case (JC) . 5C/W Junction-to-ambient (JA) 27C/W 1.4 Recommended operating conditions. Positive supply voltage range (VCC) . +14.25 V dc to +15.75 V dc Negative supply voltage range (VEE) . -14.25 V dc to -15.75 V dc Logic supply voltage range (VDD) . +4.75 V dc to +5.25 V dc Ambien
17、t operating temperature range (TA) -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents
18、 are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Out
19、lines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/quicksearch.dla.mil/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D,
20、 Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption ha
21、s been obtained. 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDAR
22、D MICROCIRCUIT DRAWING SIZE A 5962-94757 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534.
23、Compliance with MIL-PRF-38534 shall include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the
24、 performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, c
25、onstruction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.2 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.2.3 Timing diagram. The
26、timing diagram shall be as specified on figure 3. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirement
27、s. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In
28、addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspectio
29、n group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the prepa
30、ring activity (DLA Land and Maritime -VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DLA Land and Maritime -VA shall affirm that the manu
31、facturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Samplin
32、g and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 4.2 Screening. Screening shall be in accordance with MIL-PRF
33、-38534. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DLA Land and Maritime -VA or the
34、acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1015 of MIL-STD-883. (2) TAas specified in accordance with table I of method 1015 of MIL-STD-883. b. Interim
35、 and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MI
36、CROCIRCUIT DRAWING SIZE A 5962-94757 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Bi
37、polar input VIN-5 V to +5 V range 7 01 Pass Gain error BGE -5 V to +5 V range 4 01 0.15 %FSR 5, 6 0.40 Bipolar offset error BOE -5 V to +5 V range 4 01 0.10 %FSR 5, 6 0.40 Full scale absolute accuracy FSE 4 01 0.15 %FSR 5, 6 0.5 Differential non-linearity DNL 4 01 0.95 LSB 5, 6 0.99 No missing codes
38、 NMC Abbreviated test 4, 5, 6 01 Pass Conversion rate CONR 4, 5, 6 01 1 MHz Resolution RES 1, 2, 3 01 14 Bits Digital output coding OC Offset binary 1, 2, 3 01 Pass Peak harmonics PHAR Analog input at -0.5 dB 4 01 -78 dB 100 kHz to 500 kHz 5, 6 -77 Total harmonic distortion THD Analog input at -0.5
39、dB 4 01 -76 dB 100 kHz to 500 kHz 5, 6 -74 Signal to noise ratio without distortion SNR Analog input at -0.5 dB 4 01 +75 dB 100 kHz to 500 kHz 5, 6 +73 Signal to noise ratio with distortion SNRD Analog input at -0.5 dB 4 01 +73 dB 100 kHz to 500 kHz 5, 6 +71 Positive supply current ICCVCC= +15.0 V d
40、c 1, 2, 3 01 +65 mA Negative supply current IEEVEE= -15.0 V dc 1, 2, 3 01 -45 mA Logic supply current IDDVDD= +5.0 V dc 1, 2, 3 01 +80 mA Power dissipation PD1, 2, 3 01 1.95 Watts Power supply rejection ratios PSRR 4, 5, 6 01 0.02% FSR/ %V 1/ Unless otherwise specified, the following conditions appl
41、y: VCC= +15.0 V dc, VEE= -15.0 V dc, and VDD= +5.0 V dc. Logic “0“ = +0.8 V, Logic “1“ = +2.0 V. VFSR = 5.0 V. Sampling rate = 1 MHz. 1 minute warm-up time. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-947
42、57 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 Case outline X. Symbol Millimeters Inches Min. Max. Min. Max. A 5.97 .235 A1 4.83 .190 b 0.41 0.51 .016 .020 b2 0.89 1.14 .035 .045 c 0.23 0.30 .009 .012 D 33.3 1.31 D1 27.81 28.07 1.095 1.105 e 2.41 2.
43、67 .095 .105 eA 14.97 15.49 .59 .61 E 20.3 .80 L 5.08 .200 Q 0.5 0.8 .02 .03 S1 2.41 2.67 .095 .105 NOTES: 1. The U.S. preferred system of measurement is the metric SI. This item was designed using inch-pound units of measurement. In case of problems involving conflicts between the metric and inch-p
44、ound units, the inch-pound units shall rule. FIGURE 1. Case outline(s). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94757 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 7 DSCC FORM
45、 2234 APR 97 Device type 01 Case outline X Terminal number Terminal symbol 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 Bit 14 (LSB) Bit 13 Bit 12 Bit 11 Bit 10 Bit 9 Bit 8 Bit 7 Bit 6 Bit 5 Bit 4 Bit 3 VDDDigital ground EOC Start convert Bit 2 Bit 1 (MSB) Analog ground Analog inpu
46、t +10 V reference out VCCAnalog ground VEEFIGURE 2. Terminal connections. FIGURE 3. Timing diagram.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94757 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISIO
47、N LEVEL B SHEET 8 DSCC FORM 2234 APR 97 TABLE II. Electrical test requirements. MIL-PRF-38534 test requirements Subgroups (in accordance with MIL-PRF-38534, group A test table) Interim electrical parameters - Final electrical parameters 1*,2,3,4,5,6 Group A test requirements 1,2,3,4,5,6 Group C end-
48、point electrical 1/ parameters 1,2,3 End-point electrical parameters for radiation hardness assurance (RHA) devices Not applicable * PDA applies to subgroup 1. 1/ As a minimum, for all Group C testing performed after 13/12/10 manufacturers shall perform subgroups 1, 2, and 3 from the Group A electrical test table (Table C-Xa of MIL-PRF-38534). 4.3 Conformance and periodic
