1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Redraw. Update drawing to current requirements. drw 10-02-01 Charles F. Saffle REV SHET REV SHET REV STATUS REV A A A A A A A A A A A A A A OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Marcia Kelleher DEFENSE SUPPLY CENTE
2、R COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY Rajesh Pithadia APPROVED BY Michael A. Frye MICROCIRCUIT, DIGITAL-LINEAR, QUAD, 8-BIT ANALOG DATA ACQUIS
3、ITION AND MONITORING SYSTEMS, MONOLITHIC SILICON DRAWING APPROVAL DATE 95-12-04 AMSC N/A REVISION LEVEL A SIZE A CAGE CODE 67268 5962-95513 SHEET 1 OF 14 DSCC FORM 2233 APR 97 5962-E146-10 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICR
4、OCIRCUIT DRAWING SIZE A 5962-95513 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (devi
5、ce class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 95513 01 Q E
6、A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2)Device class designatorCase outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and ar
7、e marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type. The device type identifies the circuit function as fol
8、lows: Device type Generic number Circuit function 01 ADC0851 8-bit analog data acquisition and monitoring systems 02 ADC0858 8-bit analog data acquisition and monitoring systems 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as f
9、ollows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline. The case outl
10、ine is as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style E GDIP1-T16 or CDIP2-T16 16 Dual-in-line R GDIP1-T20 or CDIP2-T20 20 Dual-in-line 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-P
11、RF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95513 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 3 DSCC FORM 2234 APR 97 1.3 Absol
12、ute maximum ratings. 1/ Supply voltage (VCC) 6.5 V Voltage at logic and analog inputs . -0.3 V to VCC+ 0.3 V Input current per pin 2/ . 5 mA Input current per package 20 mA Storage temperature range -65C to +150C Junction temperature (TJ) . +150C Lead temperature (soldering, 10 seconds) . +260C Powe
13、r dissipation (PD) . 160 mW Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Thermal resistance, junction-to-ambient (JA): Device type 01 73C/W Device type 02 68C/W 1.4 Recommended operating conditions. Supply voltage range (V+) 3.0 V V+ 15.5 V Ambient operating temperature range (TA) -5
14、5C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation
15、or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENS
16、E HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia,
17、 PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtaine
18、d. _ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ When the input voltage (VIN) at any pin exceeds the power supply rails (VINV+) the absolute value of the current at
19、 that pin should be limited to 5 mA or less. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95513 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 4 DSCC FORM 2234 APR 97 3. RE
20、QUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or
21、function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shal
22、l be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outline. The case outline shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1.
23、3.2.3 Mode selection table. The mode selection table shall be as specified on figure 2. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified
24、 in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with th
25、e PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA de
26、signator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “
27、Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the req
28、uirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an appr
29、oved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conform
30、ance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product
31、(see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable re
32、quired documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 57 (see MIL-PRF-38535, appendix A).Provided by IHSNo
33、t for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95513 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Condit
34、ions 1/ -55C TA+125C Group A subgroups Device type Limits Unit unless otherwise specified Min Max CONVERTER AND MULTIPLEXER CHARACTERISTICS Total unadjusted error ETU 1, 2, 3 All 1 LSB Comparator offset VCO1, 2, 3 All 20 mV VREFinput resistance RIV1, 2, 3 All 3.5 10 k Common mode input voltage VICMA
35、ll MUX inputs and COM input 1, 2, 3 All GND 0.05 VCC+ 0.05 V DC common mode error ECCVCM= -0.05 V to +0.05 V 1, 2, 3 All 1/4 LSB Power supply sensitivity VSENVREF= 4.75 V, VCC= 5 V 5% 1, 2, 3 All 1/4 LSB REF= 4.5 V, VCC= 5 V 10% 1/2 Off channel leakage current IOFFOn channel = 5 V, 2/ Off channel =
36、0 V 1, 2, 3 All -3.0 A On channel = 0 V, 2/ Off channel = 5 V +3.0 On channel leakage current IONOn channel = 5 V, 2/ Off channel = 0 V 1, 2, 3 All +3.0 A On channel = 0 V, 2/ Off channel = 5 V -3.0 DIGITAL CHARACTERISTICS Logical “1” input voltage VINHVCC= 5.5 V 1, 2, 3 All 2.2 V Logical “0” input
37、voltage VINLVCC= 4.5 V 1, 2, 3 All 0.8 V Logical “1” input current IIHVIN= VCC1, 2, 3 All 3.0 A Logical “0” input current IILVIN= 0 V 1, 2, 3 All -3.0 A Logical “1” output voltage except VOHVCC= 4.5 V, IOUT= -360 A 1, 2, 3 All 2.4 V INT VCC= 4.5 V, IOUT= -10 A 4.2 Logical “0” output voltage VOLVCC=
38、4.5 V, IOUT= 1.6 mA 1, 2, 3 All 0.4 V See footnotes at end of table.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95513 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 6 DSCC
39、 FORM 2234 APR 97 TABLE I. Electrical performance characteristics - continued. Test Symbol Conditions 1/ -55C TA+125C Group A subgroups Device type Limits Unit unless otherwise specified Min Max Three state output current (D0) IOTHCS = logic “1” = 5 V, VOUT= 0.4 V 1, 2, 3 All -3.0 A CS = logic “1” =
40、 5 V, VOUT= 5 V +3.0 ISOURCE, except INT ISOURCEVOUTshorted to GND 1, 2, 3 All 6.5 mA ISINKISINKVOUTshorted to ICC1, 2, 3 All 8 mA Supply current ICCfCLK= 1 MHz 1, 2, 3 All 10 mA Data clock frequency fCLK3/ 9, 10, 11 02 2 MHz Clock duty time DT 3/ 9, 10, 11 All 40 60 % CS falling edge or data input
41、valid to CLK rising edge tS3/ 9, 10, 11 All 70 ns Data input valid after CLK rising edge tH3/ 9, 10, 11 All 30 ns CLK rising edge to output data valid tPD1tPD0CL= 100 pF 3/ 9, 10, 11 All 200 ns Rising edge of CS to data output Hi-Z t1Ht0HCL= 100 pF, RL= 2 k 3/ 9, 10, 11 All 200 ns Oscillator clock f
42、requency (analog timing) fOSCREXT= 3.16 k, CEXT= 170 pF 3/ 9, 10, 11 All 0.6 1.4 MHz CS to end of conversion delay fEOC3/ 9, 10, 11 All 1 2 OSC CLK periodsConversion time fCONV3/ 9, 10, 11 All 17 18 OSC CLK periodsCS to interrupt delay tCS - INT3/ 9, 10, 11 All 120 ns 1/ VCC= +5 V, VREF= 4.5 V, AGND
43、= DGND= 0 V, fOSC= 1 MHz (REXT= 3.16 k, CEXT= 170 pF). 2/ Leakage current is measured with the oscillator clock disabled. 3/ VCC= +5 V, VREF= 4.5 V, AGND= DGND= 0 V, fCLK= 1 MHz, tr= tf= 5 ns. See figure 3. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS
44、-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95513 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 7 DSCC FORM 2234 APR 97 Device type 01 02 Case outline E R Terminal number Terminal symbol 1 VCCVCC2 OSC OSC 3 CS CS 4 CLK CLK 5 DI DI 6 DO DO 7 INT INT 8 EOC EOC 9 VR
45、EF DGND10 AGNDVREF 11 COM AGND12 CH1 COM 13 CH0 CH7 14 COMPL CH6 15 COMPH CH5 16 DGNDCH4 17 - - - CH3 18 - - - CH2 19 - - - CH1 20 - - - CH0 FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING
46、 SIZE A 5962-95513 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 8 DSCC FORM 2234 APR 97 MODE ADDRESS MODE M3 M2 M1 M0 1 0 0 0 Watchdog 1 0 0 1 Write one limit 1 0 1 0 One A/D conversion 1 0 1 1 Read one limit 1 1 0 0 Test (for factory use only) 1 1 0 1 Write all li
47、mits 1 1 1 0 Auto A/D conversion 1 1 1 1 Read all limits FIGURE 2. Mode selection table. FIGURE 3. Test circuit and timing diagrams. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95513 DEFENSE SUPPLY CENTER
48、 COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 9 DSCC FORM 2234 APR 97 NOTE: To change to a new mode of operation, this time must be shorter than 8 OSC clock periods for device type 01 and shorter than 32 OSC clock periods for device type 02. FIGURE 3. Test circuit and timing diagrams - continued. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCU
