1、SMD-5962-75540 777777b 007L300 672 FEVISIoNS LTR DEXRIFITON (YR-M-DA) WrnVEl) SHEFT 15 RFJ I 16 17 REV mws OF !3HEETS EiMIC N/A STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE AMSC N/A 18 ,* PREPARED BY Larry T. Gauder CHEC
2、KED BY Thomas M. Hess APPROVED BY Thomas M. Hess DRAUINC APPROVAL DATE 95 - O1 - 26 REVISION LEVEL DEFENSE mCS SUPPLY CENTER DAm, mo 45444 MICROCIRCUIT, DIGITAL, BTL HANDSHAKE TRANSCEIVER, MONOLITHIC SILICON SIZE I CAGE CODE 1 A 67268 5962-9554 O SHEET 1 OF 18 ESC FORM 193 JUL 94 DISTRIBUTION STATEM
3、EMT A. Approved for public release; distribution is unlimited. 5962 - E087-95 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SflD-5qb2-75540 9999996 007L30l, 509 m 1. SCOPE 1.1 Scope. This drawing forms a part of a one part - one part number docunen
4、tation system (see 6.6 herein). Tu0 product assurance classes consisting of military high reliability (device classes Q and MI and space application (device class V), and a choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Nunber (PIN). 1.2.1 of MIL
5、-STD-883, “Provisions for the use of MIL-STD-883 in conjunction uith compliant non-JAN devicesao. available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN. Device class M microcircuits represent non-JAN class 8 microcircuits in accordance uith Uhen 1.2 pIw. lhe PIN s
6、hall be as shown in the following example: 5r - , 95540 f i i Federal RHA Device Device tase Lead stock class designator type class out 1 ine finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing mmber 1.2.1 RHA designator. Device class M RHA marked dev
7、ices shall meet the MIL-1-38535 appendix A specified RHA Levels and shall be marked with the appropriate RHA designator. MIL-1-38535 specified RHA levels and shall be marked with the appropriate RHA designator. non-RHA device. Device classes Q and V RHA marked devices shall meet the A dash I-) indic
8、ates a STANDARD SIZE MICROCIRCUIT DRAWING A DAYTON, OHIO 45444 REvISIONLEivEL DEFENSE ELECTRONICS SUPPLY C these tests shall have been fault graded in accordance uith MIL-STO-883, test method 5012 (see 1.5 herein). For device classes 4.4.2 Group C inspection. The group C inspection end-point electri
9、cal parameters shall be as specified in table II herein. 4.4.2.1 a. Additional criteria for device class M. Steady-state life test conditions, method 1005 of MIL-STD-883: Test condition A, 6, C or D. levei control and shall be made available to the preparing or acquiring activity upon request. circu
10、it shall specify the inputs, outputs, biases, and pouer dissipation, as applicable, in accordance uith the intent specified in test method 1005. The test circuit shall be maintained by the manufacturer under document revision lhe test b. T = +12SoC, minim. c. Test duration: 1,000 hours, except as pe
11、rmitted by niethod 1005 of MIL-STD-883. A RESASION LEIVEL STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 DESC FDRM 193A m 94 5962-95540 SHEGT 16 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-5962-95540 999999
12、6 00713Lb T3T 1, 2, 3, 7, 8, I/ 9, 10, 11 TABLE II. Electrical test requirements. 1, 2, 3, 7, 11 8, 9, 10, 11 Test requirements STAND- SIZE MICROCIRCUIT DRAWIN A DAYTON, OHIO 45444 REVISIONLEVEL DEFENSE ELECTRONICS SUPPLY CENTER Interim electrical parameters (see 4.2) 5962-95540 SHEET 17 Final elect
13、rical parameters (see 4.2) Group A test requirements (see 4.4) Group C end-point electricat parameters (see 4.4) Group D end-point electrical parameters (see 4.4) Group E end-point electrical parameters (see 4.4) Subgroups Subgroups (in accordance with (in accordance uith MlL-STD-883, MIL-1-38535, t
14、able III) Device class M Devi ce class P Devi ce class V 1 1, 2, 3, 7, 81 9, 1, 2, 3, 7, 8, 10, 11 9, 10, 11 1 1. 2, 3 1, 2, 3 1, 2, 3 1, 2, 3 1 - 1/ PDA applies to subgroup 1. - 2/ PDA applies to subgroups 1 and 7. 4.4.2.2 Additional criteria for device classes CI and V. The steady-state life test
15、duration, test condition and test temperature, or approved alternatives shall be as specified in the device manufacturers PM plan in accordance with MIL-1-38535. manufacturers TRB, in accordance uith MIL-1-38535, and shall be made available to the acquiring or preparing activity upon request. accord
16、ance with the intent specified in test method 1005. lhe test circuit shall be maintained under docwnt revision level control by the device lhe test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in 4.4.3 Group D inspection. lhe group D inspection end-point e
17、lectrical parameters shall be as specified in table II herein. 4.4.4 GrOUD E inspection. Group E inspection is required only for parts intended to be marked as radiation hardness assured (see 3.5 herein). M shall be M and D. RHA levels for device classes Q and V shall be M, Dl RI and H and for devic
18、e Class a. b. End-point electrical parameters shall be as specified in table II herein. For device class H, the devices shall be subjected to radiation hardness assured tests as specified in MIL-1-38535, appendix A, for the RHA level being tested. For device classes Q and V, the devices or test vehi
19、cle shall be subjected to radiation hardness assured tests as specified in MIL-1-36535 for the RHA level being tested. defined in table I at TA = +25OC t5“C, after exposure, to the subgroups specified in table II herein. When specified in the purchase order or contract, a copy of the RHA delta Limit
20、s shall be supplied. All device classes must meet the postirradiation end-point electrical parameter limits as c. 5. PACKAGING Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-5.1 Packasins reuuirements. The requirements for packaging shall be in acco
21、rdance with MIL-STO-8-83 (see 3.1 herein) for device class M and MIL-1-38535 for device classes CI and V. 6. NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Goverment microcircuit applications (original equipment), design applications, and logistics purposes
22、. contractor-prepared specification or drawing. 6.1.1 Replaceability. Microcircuits covered by this drauing will replace the same generic device covered by a 6.1.2 Substitutability. Device class Q devices uill replace device class M devices. 6.2 Configuration control of SHDs. record for the individu
23、al docunents. Form 1692, Engineering Change Proposal. application requires configuration control and which SMDs are applicable to that system. of users and this list will be used for coordination and distribution of changes to the drawings. covering microelectronic devices (FSC 5962) should contact
24、DESC-EC, telephone (513) 296-6047. All proposed changes to existing SMDs will be coordinated with the users of This coordination will be accomplished in accordance uith MIL-STD-973 using DD 6.3 Record of users. Military and industrial users shall inform Defense Electronics Supply Center when a syste
25、m DESC will maintain a record Users of drauings STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 6.4 Cments. Cments on this drawing should be directed to DESC-EC, Dayton, Ohio 45444-5270, or telephone (513) 296-5377. I SIZE 5962-95540 A REVISIWLFVEL SHEET 18 6.5 Abb
26、reviations. symbols. and definitions. The abbreviations, symbols, and definitions used herein are defined in MIL-1-38535 and MIL-STD-1331. I 6.6 One part - one mrt number system. The one part - one part nunber system described below has been developed to allow for transitions between identical gener
27、ic devices covered by the three major microcircuit requirements docunents (MIL-H-38534, MIL-1-38535, and 1.2.1 of MIL-SlD-83) without the necessity for the generation of unique PINS. lhe three mi litary requirements docunents represent different class levels, and previously when a device manufacture
28、r upgraded mi 1 itary product from one class level to another, the &nef its of the upgraded product were unavailable to the Original Equipnent Manufacturer (OEM), that was contractually locked into the original unique PIM. establishing a one part number system covering all three docunents, the OEM c
29、an acquire to the highest class level available for a given generic device to meet system needs without modifying the original contract parts selection cri teri a. By Military docunentation format New MIL-H-38531 Standardized Military Draui ngs Meu MIL-1-38535 Standardized Military Draui ngs New 1.2
30、.1 of MIL-STD-883 Standardized Military Drauings 6.7 Sources of supply. Example PIN under new system 5962-XXXXXZZ(H or K)YY 5962-XXXXXZZ(P or V)YY 5962-XXXXXZ2UI)YY Manufacturing source listing PML-38534 QHL-38535 MIL-BUL-103 Docment listing MIL-BUL-103 MIL-BUL-103 MIL-BUL-IO3 Provided by IHSNot for
31、 ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-5962-95540 E 9979996 0071318 802 r Standardized Vendor military drauing CAGE PIN nhr 5962-9554001QXX 27014 STANDARDIZED MILITARY DRAWING SOURCE APPROVAL BULLETIN DATE: 95-01-26 Approved sources of supply for SMD 5962-955
32、40 are listed belou for imnediate acquisition only and shall be added to MIL-SUL-103 during the next revision. The vendors listed below have agreed to this drawing and a certificate of compliance has been submitted to and accepted by DESC-EC. MIL-BUL-103 uill be revised to include the addition or de
33、tetion of sources. This bulletin is superseded by the next dated revision of MIL-BUL-103. Vendor simi lar PIN I/ S3884AW/883 Vendor CAGE nunber 27014 Vendor name and address National Semiconductor Corporation P.O. Box 58090 Santa Clara, Ca. 95052-8090 The information contained herein is disseminated for convenience only and the Goverment assunes no liability uhatsoever for any inaccuracies in this information bulletin. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-
