1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes in accordance with NOR 5962-R127-96. 96-05-21 K. A. Cottongim B Added device type 02 with class K product assurance and radiation hardness assurance levels. 98-05-06 K. A. Cottongim C Made correction to paragraph 4.3.5.a. Updated paragrap
2、h 1.2.3 to define the five reliability class levels. Made changes to table I. -sld 01-06-18 Raymond Monnin D Made changes to XREG, and TTLOADin table I. Made additions to footnotes 3/ and 5/ for table I. -gjc 02-09-24 Raymond Monnin E Figure 1; Case outline X. Change the max limit for dimension “D“
3、from 1.455 inches to 1.460 inches and for dimension “E“ change the max limit from 1.125 inches to 1.130 inches. Editorial changes throughout. -sld 04-08-19 Raymond Monnin F Add RHA level P to device type 02. Add paragraph 1.5 and note 2. Add paragraph 3.2.3. Table I, VOUTripple voltage: Device type
4、01, change group A subgroups from 1 and 2 to 1, 2, and 3 with the max limit of 80 mV p-p. Device type 02 (non-RHA), keep group A subgroups 1 and 2 with the max limit of 160 mV p-p and subgroup 3 with a max limit of 240 mV p-p. Table 1, add new note 2 for enhanced low dose rate effects (renumber rema
5、ining notes in sequence). Paragraph 4.3.5.a, add enhanced low dose rate effects. -gz 07-06-06 Robert M. Heber G Added footnote 1 to table II, under group C end-point electricals. Updated drawing paragraphs. -sld 09-11-18 Charles F. Saffle REV SHEET REV SHEET REV STATUS REV G G G G G G G G G G G G G
6、G OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Steve L. Duncan DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil/ STANDARD MICROCIRCUIT DRAWING CHECKED BY Michael Jones THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEP
7、ARTMENT OF DEFENSE APPROVED BY Kendall A. Cottongim MICROCIRCUIT, HYBRID, LINEAR, 5 VOLT, DUAL CHANNEL, DC/DC CONVERTER DRAWING APPROVAL DATE 95-04-03 AMSC N/A REVISION LEVEL G SIZE A CAGE CODE 67268 5962-95559 SHEET 1 OF 14 DSCC FORM 2233 APR 97 5962-E010-10 Provided by IHSNot for ResaleNo reproduc
8、tion or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95559 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL G SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in pa
9、ragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following ex
10、ample: 5962 - 95559 01 H X X Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet th
11、e MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 MHF+2805D/883,MHF+2805DF/883 DC-DC co
12、nverter, 12 W, 5 V output 02 SMHF2805D,SMHF2805DF DC-DC converter, 12 W, 5V output 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification a
13、s well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space applications. H Standard military quality class level.
14、 This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified
15、incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specifie
16、d in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This pro
17、duct may have a limited temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95559 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL G SHEET 3 DSCC FORM 2234 APR 97 1.2.4 C
18、ase outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 8 Dual-in-line Z See figure 1 8 Flange package 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute ma
19、ximum ratings. 1/ Input voltage range -0.5 V dc to +50 V dc Power dissipation (PD): Device types 01 and 02 (non-RHA) 6 W Device type 02 (RHA levels P, L and R) . 8.5 W Output power . 12 W Lead soldering temperature (10 seconds) . +300C Storage temperature range -65C to +150C 1.4 Recommended operatin
20、g conditions. Input voltage range +16 V dc to +40 V dc Case operating temperature range -55C to +125C 1.5 Radiation features. Maximum total dose available (dose rate = 9 rad(Si)/s): Device type 02 (RHA levels P, L, and R) . 100 krad(Si) 2/ 2. APPLICABLE DOCUMENTS 2.1 Government specification, standa
21、rds, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38534 - Hybrid
22、Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 -
23、Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the t
24、ext of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 1/ Stresses above the absolute maximum ratings may cause permanent damage to th
25、e device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ These parts may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects. Radiation end-point limits for the noted parameters are guaranteed only for the cond
26、itions as specified in MIL-STD-883, method 1019, condition C, tested at 9 rad(Si)/s. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95559 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEV
27、EL G SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 shall include the performance of all tests herein or as designated in t
28、he device manufacturers Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. I
29、n addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case ou
30、tline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.2.3 Radiation exposure circuit. The radiation exposure circuit shall be maintained by the manufacturer under document revisio
31、n level control and shall be made available to the preparing and acquiring activity upon request. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating te
32、mperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall
33、be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format
34、) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the
35、 manufacturer and be made available to the preparing activity (DSCC-VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DSCC-VA shall affirm t
36、hat the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspect
37、ion. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 4.2 Screening. Screening shall be in accordance
38、with MIL-PRF-38534. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DSCC-VA or the acquir
39、ing activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TAas specified in accordance with table I of method 1015 of MIL-STD-883. b. Interim and final
40、electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT
41、DRAWING SIZE A 5962-95559 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL G SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ 2/ -55C TC +125C VIN= 28 V dc 0.5 V, CL= 0 unless otherwise specified Group A subgroups Device
42、types Limits Unit Min Max Output voltage +VOUTIOUT= 1.2 A 1 01,02 4.950 5.050 V 2,3 01,02 4.850 5.150 P,L,R 1,2,3 02 4.750 5.250 -VOUT1 01,02 -4.920 -5.080 2,3 01,02 -4.820 -5.180 P,L,R 1,2,3 02 -4.720 -5.280 Output current 3/ IOUTVIN= 16 V dc to 40 V dc 1,2,3 01,02 0.0 2.4 A P,L,R 02 0.0 2.4 VOUTri
43、pple voltage (VOUT) VRIPIOUT= 1.2 A, B.W. = 10 kHz to 2MHz 1,2,3 01 80 mV p-p 1,2 02 160 3 02 240 P,L,R 1,2,3 02 300 VOUTline regulation +VOUTVRLINEIOUT= 1.2 A, VIN= 16 V dc to 40 V dc 1,2,3 01,02 50 mV P,L,R 02 100 -VOUT01 80 02 100 P,L,R 02 200 VOUTload regulation +VOUT-VOUTVRLOADIOUT= 0 to 1.2 A,
44、 both outputs changed simultaneously 1,2,3 01,02 50 mV P,L,R 02 100 01 100 02 150 P,L,R 02 300 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95559 DEFENSE SUPPLY CENTER COLUMB
45、US COLUMBUS, OHIO 43218-3990 REVISION LEVEL G SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions 1/ 2/ -55C TC +125C VIN= 28 V dc 0.5 V, CL= 0 unless otherwise specified Group A subgroups Device types Limits Unit Min Max Cross regulation
46、 4/ (-VOUT) XREG50% IOUT= 1.2 A, TC= +25C, +IOUT= 50% to 10%, -IOUT= 50% 1 01,02 7.5 % 50% IOUT= 1.2 A, TC= +25C, -IOUT= 50% to 10%, +IOUT= 50% 7.5 50% IOUT= 1.2 A, TC= +25C, +IOUT= 70% -IOUT= 30% 01,02 7.5 P,L,R 02 11.5 50% IOUT= 1.2 A, TC= +25C, +IOUT= 30%, -IOUT= 70% 01,02 7.5 P,L,R 02 11.5 Input
47、 current IINIOUT= 0, inhibit pin (pin 1) = 0 V 1,2,3 01,02 12 mA P,L,R 02 15 IOUT= 0, inhibit pin (pin 1) = open 01 40 02 50 P,L,R 02 100 Input ripple current IRIPIOUT= 1.2 A, LIN = 2 H, B. W. = 10 kHz to 10 MHz 1 01 50 mA p-p 2,3 80 1 02 80 2,3 120 P,L,R 1,2,3 02 150 Efficiency Eff IOUT= 1.2 A 1 01
48、 77 % 2,3 75 1 02 75 2,3 72 P,L,R 1,2,3 02 68 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95559 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL G SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions 1/ 2/ -55C TC +125C VIN= 28 V dc 0.5 V, CL=
