1、NOTICE OF REVISION (NOR)THIS REVISION DESCRIBED BELOW HAS BEEN AUTHORIZED FOR THE DOCUMENT LISTED.1. DATE(YYMMDD)96-04-04Form ApprovedOMB No. 0704-0188Public reporting burden for this collection is estim ated to average 2 hours per response, including the time for reviewing instructions, searching e
2、xisting data sources,gathering and maintaining the data needed, and completing and reviewing the collection of information. Send comments regarding this burden estimate or any otheraspect of this collection of information, including suggestions for reducing this burden, to Department of Defense, Was
3、hingtion Headquarters Services, Directoratefor Information Operations and Reports, 1215 Jefferson Davis Highway, Suite 1204, Arlington, VA 22202-4302, and to the Office of Management and Budget, PaperworkReduction Project (0704-0188), Washington, DC 20503.PLEASE DO NOT RETURN YOUR COMPLETED FORM TO
4、EITHER OF THESE ADDRESSED. RETURN COMPLETED FORM TO THE GOVERNMENT ISSUINGCONTRACTING OFFICER FOR THE CONTRACT/ PROCURING ACTIVITY NUMBER LISTED IN ITEM 2 OF THIS FORM.2. PROCURINGACTIVITY NO.3. DODAAC4. ORIGINATORb. ADDRESS (Street, City, State, Zip Code)Defense Electronics Supply Center1507 Wilmin
5、gton PikeDayton, OH 45444-57655. CAGE CODE672686. NOR NO.5962-R087-96a. TYPED NAME (First, Middle Initial,Last)7. CAGE CODE672688. DOCUMENT NO.5962-957999. TITLE OF DOCUMENTMICROCIRCUIT, LINEAR, 12-BIT DATA ACQUISTION SYSTEM,8 CHANNEL DIFFERENTIAL ENDED AND 16 CHANNEL SINGLEENDED INPUTS, HYBRID10. R
6、EVISION LETTER11. ECP NO.N/Aa. CURRENTNoneb. NEWA12. CONFIGURATION ITEM (OR SYSTEM) TO WHICH ECP APPLIESAll13. DESCRIPTION OF REVISIONSheet 1: Revisions ltr column; add “A“.Revisions description column; add “Changes in accordance with NOR 5962-R087-96“.Revisions date column; add “96-04-04“.Revision
7、level block; add“A“.Rev status of sheets; for sheets 1 and 8 add “A“.Sheet 8: Table I, Conversion time, at 8-bit cycle, for device types 01 and 02, maximum limit: delete “15“ and substitute “17“. Revision level block; add “A“.14. THIS SECTION FOR GOVERNMENT USE ONLYa. (X one)X (1) Existing document
8、supplemented by the NOR may be used in manufacture.(2) Revised document must be received before manufacturer may incorporate this change.(3) Custodian of master document shall make above revision and furnish revised document.b. ACTIVITY AUTHORIZED TO APPROVE CHANGE FOR GOVERNMENTDESC-ELDTc. TYPED NA
9、ME (First, Middle Initial, Last)Kendall A. Cottongimd. TITLEChief, Electronic Components Branche. SIGNATUREKendall A. Cottongimf. DATE SIGNED(YYMMDD)96-04-0415a. ACTIVITY ACCOMPLISHING REVISIONDESC-ELDTb. REVISION COMPLETED (Signature)Gary Zahnc. DATE SIGNED(YYMMDD)96-04-04DD Form 1695, APR 92 Previ
10、ous editions are obsolete.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-REVISIONSLTR DESCRIPTION DATE (YR-MO-DA) APPROVEDREV SHEETREVSHEET 15 16 17 18 19REV STATUSOF SHEETSREVSHEET 123456789101121314PMIC N/APREPARED BY Gary Zahn DEFENSE ELECTRONICS
11、 SUPPLY CENTER DAYTON, OHIO 45444 STANDARDMICROCIRCUITDRAWINGTHIS DRAWING IS AVAILABLEFOR USE BY ALLDEPARTMENTSAND AGENCIES OF THEDEPARTMENT OF DEFENSEAMSC N/A CHECKED BYMichael C. JonesMICROCIRCUIT, LINEAR, 12-BIT DATA ACQUISITION SYSTEM, 8 CHANNEL DIFFERENTIAL ENDED AND 16CHANNEL SINGLE ENDED, INP
12、UTS, HYBRIDAPPROVED BYKendall A. CottongimDRAWING APPROVAL DATE95-10-30SIZEACAGE CODE672685962-95799REVISION LEVELSHEET 1 OF 19DESC FORM 193JUL 94 5962-E005-96DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.Provided by IHSNot for ResaleNo reproduction or networking p
13、ermitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGDEFENSE ELECTRONICS SUPPLY CENTERDAYTON, OHIO 45444SIZEA5962-95799REVISION LEVEL SHEET2DESC FORM 193AJUL 941. SCOPE1.1 Scope. This drawing forms a part of a one part - one part number documentation system (see 6.6 herein).This drawing
14、 describes device requirements for hybrid microcircuits to be processed in accordance with MIL-PRF-38534.Two product assurance classes, military high reliability (device class H) and space application (device class K) and achoice of case outlines and lead finishes are available and are reflected in
15、the Part or Identifying Number (PIN).When available, a choice of radiation hardness assurance levels are reflected in the PIN.1.2 PIN. The PIN shall be as shown in the following example:5962 - 95799 01 H X X G0DG0D G0D G0D G0D G0DG0DG0D G0D G0D G0D G0DG0D G0D G0D G0D G0D G0D Federal RHA Device Devic
16、e Case Leadstock class designator type class outline finishdesignator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3)/ Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. Device classes H and K RHA marked devices shall meet theMIL-PRF-38534 specified RHA leve
17、ls and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHAdevice.1.2.2 Device type(s). The device type(s) shall identify the circuit function as follows:Device type Generic number Circuit function01 SP9462TH/B 12 Bit data acquisition system, 16 channel single ended in
18、put,25 s02 SP9463TH/B 12 Bit data acquisition system, 8 channel differential ended input,25 s03 SP9472TH/B 12 Bit data acquisition system, 16 channel single ended input,15 s04 SP9473TH/B 12 Bit data acquisition system, 8 channel differential ended input,15 s1.2.3 Device class designator. This device
19、 class designator shall be a single letter identifying the product assurance level asfollows:Device class Device requirements documentationH or K Certification and qualification to MIL-PRF-385341.2.4 Case outline(s). The case outline(s) shall be as designated in MIL-STD-1835 and as follows:Outline l
20、etter Descriptive designator Terminals Package styleX See figure 1 68 Pin grid array 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534 for classes H and K. Finish letter “X“shall not be marked on the microcircuit or its packaging. The “X“ designation is for use in specificati
21、ons when leadfinishes A, B, and C are considered acceptable and interchangeable without preference.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGDEFENSE ELECTRONICS SUPPLY CENTERDAYTON, OHIO 45444SIZEA5962-95799REVISION
22、LEVEL SHEET3DESC FORM 193AJUL 941.3 Absolute maximum ratings. 1/Supply voltage range (V ) -0.5 V dc to +16.0 V dcCCSupply voltage range (V ) . +0.5 V dc to -16.0 V dcEELogic input voltage range (V ) . -0.5 V dc to +5.5 V dcDDAnalog input channels . 15 V dcDigital inputs -0.5 V dc to +5.5 V dcPower d
23、issipation (P ) See table IDThermal resistance, junction-to-case (G15 ) . 30C/WJCThermal resistance, junction-to-ambient (G15 ). 45C/WJAJunction temperature (T ) +175G28CJStorage temperature range . -65G28C to +150G28CLead temperature (soldering, 10 seconds) +300G28C1.4 Recommended operating conditi
24、ons.Supply voltage range (V ) +14.25 V dc to +15.75 V dcCCSupply voltage range (V ) . -14.25 V dc to -15.75 V dcEELogic input voltage range (V ) . +4.75 V dc to +5.25 V dcDDAmbient operating temperature range (T ) . -55G28C to +125G28CA2. APPLICABLE DOCUMENTS2.1 Government specification, standards,
25、and handbook. Unless otherwise specified, the following specification,standards,and handbook of the issue listed in that issue of the Department of Defense Index of Specifications andStandards specified in the solicitation, form a part of this drawing to the extent specified herein.SPECIFICATIONMILI
26、TARYMIL-PRF-38534 - Hybrid Microcircuits, General Specification for.STANDARDSMILITARYMIL-STD-883 - Test Methods and Procedures for Microelectronics.MIL-STD-973 - Configuration Management.MIL-STD-1835 - Microcircuit Case Outlines.HANDBOOKMILITARYMIL-HDBK-780 - Standardized Military Drawings.(Copies o
27、f the specification, standards, and handbook required by manufacturers in connection with specificacquisition functions should be obtained from the contracting activity or as directed by the contracting activity.)2.2 Order of precedence. In the event of a conflict between the text of this drawing an
28、d the references citedherein, the text of this drawing shall take precedence.1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at themaximum levels may degrade performance and affect reliability.Provided by IHSNot for ResaleNo reproduction or
29、networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGDEFENSE ELECTRONICS SUPPLY CENTERDAYTON, OHIO 45444SIZEA5962-95799REVISION LEVEL SHEET4DESC FORM 193AJUL 943. REQUIREMENTS3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38534 an
30、d as specified herein.3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be asspecified in MIL-PRF-38534 and herein.3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1.3.2.2 Terminal connections. The
31、 terminal connections shall be as specified on figure 2.3.2.3 Operating modes. The operating modes shall be as specified on figure 3.3.2.4 Truth table(s). The truth table(s) shall be as specified on figure 4.3.2.5 Timing diagram(s). The timing diagram(s) shall be as specified on figure 5.3.3 Electri
32、cal performance characteristics. Unless otherwise specified herein, the electrical performancecharacteristics are as specified in table I and shall apply over the full specified operating temperature range.3.4 Electrical test requirements. The electrical test requirements shall be the subgroups spec
33、ified in table II.The electrical tests for each subgroup are described in table I.3.5 Marking. Marking shall be in accordance with MIL-PRF-38534. The part shall be marked with the PIN listed in1.2 herein. In addition, the manufacturers PIN may also be marked as listed in QML-38534.3.6 Manufacturer e
34、ligibility. In addition to the general requirements of MIL-PRF-38534, the manufacturer of thepart described herein shall maintain the electrical test data (variables format) from the initial quality conformanceinspection group A lot sample, produced on the certified line, for each device type listed
35、 herein. The data shouldalso include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This datashall be maintained under document revision level control by the manufacturer and be made available to the preparingactivity (DESC-EC) upon request.3.7 Certificate
36、of compliance. A certificate of compliance shall be required from a manufacturer in order tosupply to this drawing. The certificate of compliance submitted to DESC-EC shall affirm that the manufacturersproduct meets the requirements of MIL-PRF-38534 and the requirements herein.3.8 Certificate of con
37、formance. A certificate of conformance as required in MIL-PRF-38534 shall be provided witheach lot of microcircuits delivered to this drawing.4. QUALITY ASSURANCE PROVISIONS4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534.4.2 Screening. Screen
38、ing shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply:a. Burn-in test, method 1015 of MIL-STD-883.(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under documentrevision level control and shall be made available to eith
39、er DESC-EC or the acquiring activity uponrequest. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, asapplicable, in accordance with the intent specified in test method 1015 of MIL-STD-883.(2) T as specified in accordance with table I of method 1015 of MIL-STD-
40、883.Ab. Interim and final electrical test parameters shall be as specified in table II herein, except interimelectrical parameter tests prior to burn-in are optional at the discretion of the manufacturer.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-
41、,-STANDARDMICROCIRCUIT DRAWINGDEFENSE ELECTRONICS SUPPLY CENTERDAYTON, OHIO 45444SIZEA5962-95799REVISION LEVEL SHEET5DESC FORM 193AJUL 94TABLE I. Electrical performance characteristics. G0DG0D G0D G0DG0D G0DTest G0D Symbol G0D Conditions 1/ G0D Group A G0D Device G0D Limits G0D UnitG0DG0D -55G28C G0
42、6 T G06 +125G28C G0D subgroups G0D type G0D G0DAG0DG0D unless otherwise specified G0DG0DG0DG0DG0DG0DG0D G0DG0DG0D Min G0D Max G0DG0DG0D G0D G0DG0DG0DG0DG0DG0D G0D G0DG0DG0DG0DInput voltage range G0DV G0DUnipolar, V = 0 V to 10 V G0D 1,2,3 G0D All G0D 0 G0D 10 G0D VIN ING0DG0D G0DG0DG0DG0DG0DG0DG0D G
43、0D G0DG0DG0DG0DG0DG0DUnipolar, 2/ 3/ G0DG0DG0D 0 G0D 0.1 G0DG0DG0D G0DG0DG0DG0DG0DG0DG0D G0D G0DG0DG0DG0DG0DG0DBipolar, V = -10 V to G0DG0DG0D 0 G0D 10 G0D ING0DG0D+10 V G0DG0DG0DG0DG0DG0DG0D G0D G0DG0DG0DG0DG0DG0DBipolar, 2/ 3/ G0DG0DG0D 0 G0D 0.1 G0DG0DG0D G0DG0DG0DG0DG0DG0DG0D G0D G0DG0DG0DG0DG0D
44、G0DBipolar, V = -5 V to +5 V G0DG0DG0D 0 G0D 5 G0DING0DG0D G0DG0DG0DG0DG0DG0DG0D G0D G0DG0DG0DG0DG0DG0DBipolar, 2/ 3/ G0DG0DG0D 0 G0D 0.05 G0DG0DG0D G0D G0DG0DG0DG0DG0DG0D G0D G0DG0DG0DG0DCommon mode voltage G0DCMRR G0D20 V dc to 1 kHz 3/ G0D 4,5,6 G0D All G0D 80 G0D -80 G0D dBrange G0DG0D G0D G0DG0
45、DG0DG0DG0DG0D G0D G0DG0DG0DG0DFeedthrough G0DG0D1 kHz 3/ G0D 1,2,3 G0D All G0D 0 G0D 100 G0D dBG0DG0D G0D G0DG0DG0DG0DDIGITAL INPUTSG0DG0D G0D G0DG0DG0DG0DMUX input channel G0DG0Dlogic 1 (4.0 V) G0D 1,2,3 G0D All G0DG0D 30 G0D Aselect G0DG0D G0D G0DG0DG0DG0DG0DG0Dlogic 0 (0.8 V) G0DG0DG0DG0D 30 G0DG
46、0DG0D G0D G0DG0DG0DG0DSample/hold command G0DG0Dlogic 1 (2.4 V) 3/ G0D 1,2,3 G0D All G0DG0D 30 G0D AG0DG0D G0DG0DG0DG0DG0DG0DG0D G0D G0DG0DG0DG0DG0DG0Dlogic 0 (0.8 V) 3/ G0DG0DG0DG0D 30 G0DG0DG0D G0D G0DG0DG0DG0DG0DG0D G0D G0DG0DG0DG0DADC section G0DG0Dlogic 1 (2.4 V) G0D 1,2,3 G0D All G0DG0D 30 G0D
47、 AG0DG0D G0D G0DG0DG0DG0DG0DG0Dlogic 0 (0.8 V) G0DG0DG0DG0D 30 G0DACCURACYG0DG0D G0D G0DG0DG0DG0DNonlinearity G0DNL G0DEnd-point method 4/ G0D 1 G0D All G0D -0.5 G0D +0.5 G0D LSBG0DG0D G0D G0DG0DG0DG0DG0DG0D G0D 2,3 G0DG0D -1.0 G0D +1.0 G0DG0DG0D G0D G0DG0DG0DG0DDifferential G0DDLN G0D4/ G0D 1 G0D A
48、ll G0D -0.5 G0D +0.5 G0D LSBnonlinearity G0DG0D G0D G0DG0DG0DG0DG0DG0D G0D 2,3 G0DG0D -0.5 G0D +1.5 G0DG0DG0D G0D G0DG0DG0DG0DUnipolar Gain error G0DUAE G0DGain = 1 G0D 1 G0D All G0D -0.7 G0D +0.7 G0D %FSRG0DG0D G0D G0DG0DG0DG0DG0DG0D G0D 2,3 G0DG0D -1 G0D +1 G0DG0DG0D G0D G0DG0DG0DG0DBipolar gain error G0DBAE G0DGain = 1 G0D 1 G0D All G0D -0.7 G0D +0.7 G0D %FSRG0DG0D G0D G0DG0DG0DG0DG0DG0D G0D 2,3 G0DG0D -1 G0D +1 G0DSee footnotes at end of table.Provided by IHSNot for ResaleNo reproduction or networking
