1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Correct notes 4 and 5 of table I. Correct table II subgroups for final electrical and Group A test requirements. Update figure 1, case outline X. Update drawing boilerplate. Editorial changes throughout. 02-06-11 Raymond Monnin B Update drawing.
2、-gz 07-02-05 Joseph Rodenbeck REV SHEET REV SHEET REV STATUS REV B B B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 PMIC N/A PREPARED BY Gary Zahn DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Michael C. Jones POST OFFICE BOX 3990 COLUMBUS, OHIO 43218-3990 http:/
3、www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Kendall A. Cottongim MICROCIRCUIT, HYBRID, DIGITAL-LINEAR, 12-BIT, DUAL CHANNEL, ANALOG TO DIGITAL CONVERTER AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 96-10-30 AMSC N/A REVISION LEVEL B SIZE A CAG
4、E CODE 67268 5962-95815 SHEET 1 OF 11 DSCC FORM 2233 APR 97 5962-E229-07Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95815 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2
5、DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radi
6、ation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 - 95815 01 H X A Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (s
7、ee 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the c
8、ircuit function as follows: Device type Generic number Circuit function 01 AD10242 Dual channel, 12-bit, 40 MSPS, MCM, analog to digital converter 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by t
9、he requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use
10、 in space applications. H Standard military quality class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections wi
11、th a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C, and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to th
12、e requirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is de
13、fined by the manufacturers internal, QML certified flow. This product may have a limited temperature range. 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 68 Leaded ceramic chip
14、 carrier 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95815 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVE
15、L B SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ Positive supply voltage (VCC) . 0 V dc to +7.0 V dc Negative supply voltage (VEE) 0 V dc to -7.0 V dc Analog input voltage -7.0 V dc to +7.0 V dc Analog input current. -10 mA to +10 mA Digital input voltage (ENCODE). 0 V dc to +7.0 V
16、 dc ENCODE, ENCODE differential voltage . +4 V dc Digital output current -40 mA to +40 mA Gain and offset adjust voltage range . VEEto VCCDigital input voltage range . +0.5 V to VEEPower dissipation (PD) . 2.0 W Thermal resistance junction-to-case (JC) 11C/W Thermal resistance junction-to-ambient (J
17、A). 30C/W Junction temperature (TJ) +175C Storage temperature -65C to +150C Lead temperature (soldering, 10 seconds). +300C 1.4 Recommended operating conditions. Positive supply voltage (VCC) . +4.75 V dc to +5.25 V dc Negative supply voltage (VEE) -5.46 V dc to -4.96 V dc Case operating temperature
18、 range (TC). -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in th
19、e solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. DEPARTMENT OF D
20、EFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins A
21、venue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a sp
22、ecific exemption has been obtained. 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. Provided by IHSNot for ResaleNo reproduction or networking permitted without license fr
23、om IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95815 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in acco
24、rdance with MIL-PRF-38534. Compliance with MIL-PRF-38534 may include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspec
25、tions herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3.2 Design, construction, and physical
26、dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3
27、.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the su
28、bgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may
29、also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed h
30、erein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DSCC-VA) upon request. 3.7 Certifica
31、te of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 C
32、ertificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in
33、 the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply: a. Burn-in test, method 1015 of
34、MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and po
35、wer dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TAas specified in accordance with table I of method 1015 of MIL-STD-883. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical para
36、meter tests prior to burn-in are optional at the discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95815 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B
37、 SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TC +125C Group A subgroups Device type Limits Unit unless otherwise specified Min Max 1 -0.5 +0.5 Offset error OFFERROR2,3 01 -2.0 +2.0 %FS 1 -1.0 +1.0 Gain error 2/ AVERROR2,3 01 -1.5 +1.5
38、 %FS AIN199 101 AIN2198 202 Analog input resistance AIN32/ 1,2,3 01 396 404 ohms Input capacitance CINTA= +25C 3/ 4/ 1 01 7.0 pF Logic “1“ voltage (analog) VIH5/ 6/ 1,2,3 01 2.0 5.0 V Logic “0“ voltage (analog) VIL5/ 6/ 1,2,3 01 0 0.8 V Logic “1“ current (analog) IIHVINH= 5 V 5/ 6/ 1,2,3 01 800 A Lo
39、gic “0“ current (analog) IILVINL= 0 V 5/ 6/ 1,2,3 01 -400 A Logic “1“ voltage output (digital) VOH7/ 1,2,3 01 3.5 V Logic “0“ voltage output (digital) VOL8/ 1,2,3 01 0.65 V Supply currents ICCTOTAL1,2,3 01 400 mA ENCODE pulse width high ENCHI3/ 4,5,6 01 12 ns ENCODE pulse width low ENCLO3/ 4,5,6 01
40、41 ns See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95815 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Elec
41、trical performance characteristics - Continued. Test Symbol Conditions 1/ -55C TC +125C Group A subgroups Device type Limits Unit unless otherwise specified Min Max Output delay tODTA= +25C 3/ 4,5,6 01 10 14 ns Maximum conversion rate CNVMAX9/ 4,5,6 01 40 MSPS 4 63 Analog input at 4.85 MHz and 9.9 M
42、Hz 5,6 62 4 60 Signal-to-noise ratio 10/ SNR Analog input at 19.5 MHz 5,6 01 59 dB 4 62 Analog input at 4.85 MHz 5,6 61 Analog input at 9.9 MHz 4,5,6 60 Signal-to-noise and distortion 11/ SINAD Analog input at 19.5 MHz 4,5,6 01 58 dB Analog input at 4.85 MHz 4,5,6 70 Analog input at 9.9 MHz 4,5,6 63
43、 Spurious free dynamic range 12/ SPUR Analog input at 19.5 MHz 4,5,6 01 60 dBFS Two tone intermodulation distortion rejection 13/ IMD F1, F2 are -7 dBFS 4,5,6 01 -70 dBc Channel to channel isolation 3/ 14/ ISO TA= +25C 1 01 -75 dB VIN= 2.0 x full scale 100 Overvoltage recovery time 15/ ORT VIN= 4.0
44、x full scale 4,5,6 01 200 nsSee footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95815 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 7 DSCC FORM 223
45、4 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions 1/ -55C TC +125C Group A subgroups Device type Limits Unit unless otherwise specified Min Max +4.75 V VCC +5.25 V 0.02 %FSR/ % VCCPower supply rejection ratio PSRR -5.45 V VEE -4.96 V 7,8 01 0.02 %FSR/ % VEE
46、1/ VCC(analog) = +5 V dc, VEE= -5 V dc, and VCC(digital) = +5 V dc, unless otherwise specified. 2/ Gain test is preformed on AIN3 over the specified input voltage range. 3/ Parameter shall be tested as part of device initial characterization and after design and process changes. Parameter shall be g
47、uaranteed to the limits specified in table I for all lots not specifically tested. 4/ Input capacitance specifications combines die and package capacitance 5/ ENCODE (pins 29 and 51) driven single-ended source: ENCODE (pins 28 and 52) bypassed to ground through 0.01 F capacitor. 6/ ENCODE (pins 29 a
48、nd 51) may also be driven differentially in conjunction with ENCODE (pins 28 and 52). 7/ Outputs sourcing 10 A. 8/ Outputs sinking 10 A. 9/ Maximum conversion rate allows for variation in ENCODE DUTY CYCLE of 50%, 5%. 10/ Analog input signal power at -1 dBFS; signal-to-noise ratio (SNR) is the ratio of signal level to total noise (first 5 harmonics removed). ENCODE = 40 MSPS. 11/ Analo
