1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Table I; Changed either the min or max limits for VRIP, VRLINE, VRLOAD, IIN, IRIP, Eff, PD, FS, VTLOAD, and TTLOADtests. Table I; removed the condition LIN= 5.5 H for the input ripple test. Figure 1; case outline Z, changed the figure to show the
2、 flange is no longer brazed on the package. Editorial changes throughout. -sld 02-02-13 Raymond Monnin B Correct paragraphs 4.2.a.2 and 4.3.3.b.2. 05-06-08 Raymond Monnin C In section 1.3; Add “Continuous” after Input voltage range, and also add Input voltage range transient 80 V for 120 ms. 08-03-2
3、4 Robert M. Heber REV SHEET REV SHEET REV STATUS REV C C C C C C C C C C C C OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 PMIC N/A PREPARED BY Gary Zahn DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Michael C. Jones COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWIN
4、G IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Ray Monnin MICROCIRCUIT, HYBRID, LINEAR, +5 VOLT AND 12 VOLT, TRIPLE CHANNEL, DC/DC CONVERTER AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 99-11-29 AMSC N/A REVISION LEVEL C SIZE A CAGE CODE 67268 5962-96730 SHEET 1 OF 12 DSCC
5、FORM 2233 APR 97 5962-E218-08 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96730 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope.
6、This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflec
7、ted in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 - 96730 01 H X X Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation
8、 hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Ge
9、neric number Circuit function 01 MHV28512T/883, MHV28512TF/883 DC-DC converter, 15 W, +5 V and 12 V outputs 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and re
10、quire QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space applications. H Standard mili
11、tary quality class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range
12、, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exce
13、ption(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML
14、 certified flow. This product may have a limited temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96730 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 3 DSCC
15、 FORM 2234 APR 97 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 10 Dual-in-line Z See figure 1 10 Flanged package 1.2.5 Lead finish. The lead finish shall be as specified in MI
16、L-PRF-38534. 1.3 Absolute maximum ratings. 1/ Input voltage range continuous -0.5 V dc to +50 V dc Input voltage range transient . 80 V for 120 ms Power dissipation (PD) . 9.5 W Output power 2/ . 15.3 W Lead temperature (soldering, 10 seconds). +300C Storage temperature range -65C to +150C 1.4 Recom
17、mended operating conditions. Input voltage range +16 V dc to +50 V dc Case operating temperature range (TC). -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent s
18、pecified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcir
19、cuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksea
20、rch/ or http:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes prece
21、dence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device, except for input voltage transients up to 80 volts for no more than 120 millise
22、conds. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Derate output power linearly above case temperature (TC) of +125C to 0 W at +130C. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUI
23、T DRAWING SIZE A 5962-96730 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Comp
24、liance with MIL-PRF-38534 may include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the perfo
25、rmance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, constru
26、ction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.3 Electrical performance chara
27、cteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II.
28、The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In ad
29、dition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should in
30、clude a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DSCC-VA) upon request. 3.7 Certificate of compliance. A certificate
31、 of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A ce
32、rtificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quali
33、ty Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96730 DEFENSE SUPPLY CENTER COLUMBUS C
34、OLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Limits Test Symbol Conditions -55C TC +125C VIN= 28 V dc 0.5 V no external sync, CL= 0 unless otherwise specified Group A subgroups Device type Min Max Unit 1 4.95 5.05 IOUT= 2 A
35、(main) 2,3 4.90 5.10 1 11.88 12.12 +IOUT= 208 mA (+aux) 2,3 11.76 12.24 1 11.82 12.18 Output voltage VOUT-IOUT= 208 mA (-aux) 2,3 01 11.70 12.30 V dc VIN= 16 V dc, 28 V dc, and 50 V dc (main) 2 A Output current 1/ IOUTVIN= 16 V dc, 28 V dc, and 50 V dc (aux) 1,2,3 01 333 mA 1 20 IOUT= 2 A, (main) B.
36、W. = 10 kHz to 2 MHz 2,3 22 1 20 Output ripple voltage 2/ VRIPIOUT= 208 mA, (aux) B.W. = 10 kHz to 2 MHz 2,3 01 22 mV p-p VIN: 16 V to/from (main) 50 V dc, IOUT= 2 A 5 VIN: 16 V to/from (+aux) 50 V dc, IOUT= 208 mA 35 Line regulation VRLINEVIN: 16 V to/from (-aux) 50 V dc, IOUT= 208 mA 1,2,3 01 40 m
37、V IOUT: 0 to 2 A (main) 20 +IOUT= 0 to 208 mA, (+aux) both outputs changed simultaneously 30 Load regulation VRLOAD-IOUT = 0 to 208 mA, (-aux) both outputs changed simultaneously 1,2,3 01 70 mV IOUT= 0 (main and aux), Inhibit (pin 8): 0 V dc, (tied to pin 10) 10 Input current IIN IOUT= 0 (main and a
38、ux), Inhibit (pin 8): open 1,2,3 01 37 mA See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96730 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 6
39、 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Limits Test Symbol Conditions -55C TC +125C VIN= 28 V dc 0.5 V no external sync, CL= 0 unless otherwise specified Group A subgroups Device type Min Max Unit 1 25 Input ripple current IRIPIOUT= 2 A (main), IOUT= 208 m
40、A (aux), B.W. = 10 kHz to 10 MHz 2,3 01 30 mA p-p 1 75 Efficiency Eff IOUT= 2 A (main), IOUT= 208 mA (aux) 2,3 01 74 % Isolation ISO Input to output or any pin to case (except pins 6 and 7) at 500 V dc, TC= +25C 1 01 100 M Short circuit on main. PD= PIN- total POUT 1 9 2,3 9.5 1 9 Power dissipation
41、PDShort circuit on each aux. output individually. PD= PIN- total POUT2,3 01 9.5 W (main) 200 Capacitive load 3/ 4/ CLNo effect on dc performance, TC= +25C(aux) 4 01 100 F 4 290 335 Switching frequency 5/ FSIOUT= 2 A (main), IOUT= 208 mA (aux) 5,6 01 250 355 kHz External sync range 4/ 5/ FSYNCIOUT= 2
42、 A (main), IOUT= 208 mA (aux), TTL level to pin 9 4,5,6 01 500 700 kHz 4 -250 +250 50 percent load to/from 100 percent load (main) 5,6 -350 +350 4 -550 +550 Output response to step load transient 6/ VTLOAD50 percent load to/from 100 percent load (aux), balanced loads on each output 5,6 01 -600 +600
43、mV pk 4 2.5 50 percent load to/from 100 percent load (main) 5,6 3 4 3.5 Recovery time from step load transient 6/ 7/ TTLOAD50 percent load to/from 100 percent load (aux), balanced loads on each output 5,6 01 4 ms See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networki
44、ng permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96730 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Limits Test Symbol Conditions -55C TC +125C V
45、IN= 28 V dc 0.5 V no external sync, CL= 0 unless otherwise specified Group A subgroups Device type Min Max Unit Input step: 16 V dc to/from 50 V dc, IOUT= 2 A (main) -400 +400 Output response to step line transient 4/ 8/ VTLINEInput step: 16 V dc to/from 50 V dc, IOUT= 208 mA (aux) 4,5,6 01 -500 +50
46、0 mV pk Input step: 16 V dc to/from 50 V dc, IOUT= 2 A (main) 3 Recovery time from step line transient 4/ 7/ 8/ TTLINEInput step: 16 V dc to/from 50 V dc, IOUT= 208 mA (aux) 4,5,6 01 4 ms VIN: 0 to 28 V dc, IOUT= 2 A (main) 100 Start up overshoot 4/ VtonOSVIN: 0 to 28 V dc, IOUT= 208 mA (aux) 4,5,6
47、01 240 mV pk Start up delay 9/ TonDVIN: 0 to 28 V dc, IOUT= 2 A (main), IOUT= 208 mA (aux) 4,5,6 01 15 ms Load fault recovery 4/ 7/ TrLFIOUT: from S.C. to 2 A (main) or IOUT: from S.C. to 208 mA (aux) 4,5,6 01 25 ms 1/ Up to 80 percent of total auxiliary power (333 mA) may be taken from either side.
48、 However, the sum of both auxiliary output currents shall not exceed 416 mA. 2/ Bandwidth guaranteed by design. Tested for 10 kHz to 2 MHz. 3/ Capacitive load may be any value from 0 to the maximum limit without compromising dc performance. 4/ Parameter shall be tested as part of design characterization and after design or process changes. Thereaft
