1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Change terms and voltage levels for Ground Bounce tests. - CS 97-04-24 Monica L. Poelking B Change the device name to reflect the Bus Hold feature, and adjust limits to characterize the performance of the optimized die. Editorial changes througho
2、ut. - CS 98-04-20 Monica L. Poelking C Update boilerplate to MIL-PRF-38535 requirements. - LTG 08-10-20 Thomas M. Hess REV SHET REV C C C C C SHEET 15 16 17 18 19 REV STATUS REV C C C C C C C C C C C C C C OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Joseph A. Kerby CHECKED
3、BY Thanh V. Nguyen DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil APPROVED BY Monica L. Poelking STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 96-02-08 MICROCIRCUIT,
4、DIGITAL, ADVANCED BIPOLAR CMOS, 3.3-VOLT 16-BIT TRANSPARENT D-TYPE LATCH WITH BUS HOLD, THREE-STATE OUTPUTS, AND TTL COMPATIBLE INPUTS, MONOLITHIC SILICON AMSC N/A REVISION LEVEL C SIZE A CAGE CODE 67268 5962-96810 SHEET 1 OF 19 DSCC FORM 2233 APR 97 5962-E498-08 Provided by IHSNot for ResaleNo repr
5、oduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96810 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisti
6、ng of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.
7、1.2 PIN. The PIN is as shown in the following example: 5962 - 96810 01 Q X A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2)Device class designatorCase outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q
8、and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device
9、. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 54LVTH16373 3.3-volt 16-bit transparent D-type latch with bus hold, three-state outputs, and TTL compatible inputs 1.2.3 Device class designator. The device class desig
10、nator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification
11、 and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X GDFP1-F48 48 Flat pack 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device class
12、es Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96810 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 3 DSCC FORM 22
13、34 APR 97 1.3 Absolute maximum ratings. 1/ 2/ 3/ Supply voltage range (VCC) -0.5 V dc to +4.6 V dc DC input voltage range (VIN) -0.5 V dc to +7.0 V dc 4/ DC output voltage range applied to any output in the high state or power-off state (VOUT) -0.5 V dc to +7.0 V dc 4/ DC output current (IOL) (per o
14、utput) +96 mA DC output current (IOH) (per output) . +48 mA 5/ DC input clamp current (IIK) (VINVCC. 6/ Power dissipation values are derived using the formula PD= VCCICC+ nVOLIOL, where VCCand IOLare as specified in 1.4 above, ICCand VOLare as specified in table I herein, and n represents the total
15、number of outputs. 7/ Unused inputs must be held high or low to prevent them from floating. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96810 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVIS
16、ION LEVEL C SHEET 4 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are th
17、ose cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case
18、Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenu
19、e, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specif
20、ic exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM pla
21、n shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, const
22、ruction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outline. The case outline shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connection
23、s shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3. 3.2.5 Ground bounce load circuit and waveforms. The ground bounce load circuit and waveforms shall be as specified on f
24、igure 4. 3.2.6 Switching waveforms and test circuit. The switching waveforms and test circuit shall be as specified on figure 5. 3.2.7 Radiation exposure circuit. The radiation exposure circuit shall be maintained by the manufacturer under document revision level control and shall be made available
25、to the preparing and acquiring activity upon request. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over t
26、he full case operating temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96810 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 5 DSCC FORM 2234 APR 97 3.4 Elec
27、trical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For
28、packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordan
29、ce with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“
30、as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of comp
31、liance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meet
32、s, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in M
33、IL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change
34、that affects this drawing. 3.9 Verification and review for device class M. For device class M, DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the opt
35、ion of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 127 (see MIL-PRF-38535, appendix A).Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STAND
36、ARD MICROCIRCUIT DRAWING SIZE A 5962-96810 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +2.7 V VCC +3.6 V unless oth
37、erwise specified Device type VCCGroup A subgroups Limits 3/ Unit Min Max Negative input clamp voltage 3022 VIKFor input under test, IIN= -18 mA All 2.7 V 1,2,3 -1.2 V High level output voltage 3006 VOH1For all inputs affecting output under test, VIN= 2.0 V or 0.8 V IOH= -100 A All 2.7 V and 3.6 V 1,
38、2,3 VCC-0.2 V VOH2For all inputs affecting output under test, VIN= 2.0 V or 0.8 V IOH= -8 mA All 2.7 V 1,2,3 2.4 VOH3For all inputs affecting output under test, VIN= 2.0 V or 0.8 V IOH= -24 mA All 3.0 V 1,2,3 2.0 Low level output voltage 3007 VOL1For all inputs affecting output under test, VIN= 2.0
39、V or 0.8 V IOL= 100 A All 2.7 V 1,2,3 0.2 V VOL2For all inputs affecting output under test, VIN= 2.0 V or 0.8 V IOL= 24 mA All 2.7 V 1,2,3 0.5 VOL3For all inputs affecting output under test, VIN= 2.0 V or 0.8 V IOL= 16 mA All 3.0 V 1,2,3 0.4 VOL4For all inputs affecting output under test, VIN= 2.0 V
40、 or 0.8 V IOL= 32 mA All 3.0 V 1,2,3 0.5 VOL5For all inputs affecting output under test, VIN= 2.0 V or 0.8 V IOL= 48 mA All 3.0 V 1,2,3 0.55 Input current high 3010 IIHFor input under test, VIN= 5.5 V All 0.0 V and 3.6 V 1,2,3 10.0 A Control pins For input under test, VIN= VCCAll 3.6 V 1,2,3 1.0 Dat
41、a pins For input under test, VIN= VCCAll 3.6 V 1,2,3 1.0 Input current low 3009 IILControl pins For input under test, VIN= GND All 3.6 V 1,2,3 -1.0 A Data pins For input under test, VIN= GND All 3.6 V 1,2,3 -5.0 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networkin
42、g permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96810 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test and MIL-STD-883 test method 1/ Symbol Tes
43、t conditions 2/ -55C TC +125C +2.7 V VCC +3.6 V unless otherwise specified Device type VCCGroup A subgroups Limits 3/ UnitMin Max Input bus hold current IHOLDData inputs, VIN= 0.8 V All 3.0 V 1,2,3 75 A Data inputs, VIN= 2.0 V -75 Three-state output leakage current high 3021 IOZH4/ VOUT= 3.0 V All 3
44、.6 V 1,2,3 5.0 A Three-state output leakage current low 3020 IOZL4/ VOUT= 0.5 V All 3.6 V 1,2,3 -5.0 A Three-state output current, power-up IOZPU4/ VOUT= 0.5 V to 3.0 V mOE = Dont care All 0.0 V to 1.5 V 1,2,3 100.0 A Three-state output current, power-down IOZPD4/ VOUT= 0.5 V to 3.0 V mOE = Dont car
45、e All 1.5 V to 0.0 V 1,2,3 100.0 A Quiescent supply current 3005 ICCOutputs high For all inputs, VIN= VCCor GND IOUT= 0.0 A All 3.6 V 1,2,3 0.19 mA Outputs low For all inputs, VIN= VCCor GND IOUT= 0.0 A 5.0 Outputs disabled For all inputs, VIN= VCCor GND IOUT= 0.0 A 0.19 Quiescent supply current del
46、ta, TTL input levels 3005 ICC5/ For input under test VIN= VCC - 0.6 V For all other inputs VIN= VCCor GND All 3.0 V and 3.6 V 1,2,3 0.2 mA Low level ground bounce noise VOLP6/ All 3.0 V 4 750 mV Low level ground bounce noise VOLV6/ VIH= 2.7 V, VIL= 0.0 V TA= +25C See figure 4 See 4.4.1d All 3.0 V 4
47、-770 High level VCCbounce noise VOHP6/ All 3.0 V 4 960 High level VCCbounce noise VOHV6/ All 3.0 V 4 -1200 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96810 DEFENSE SUPPLY C
48、ENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 8 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +2.7 V VCC +3.6 V unless otherwise specified Device type VCCGroup A subgroups Limits 3/ UnitMin Max Input capacitance CINTC= +25C, See 4.4.1c VIN= 3.0 V or 0.0 V All 3.3 V 4 10.0 pF Output capacitance COUTTC= +25C, See 4.4.1c VOUT= 3.0 V or 0.0 V All 3.3 V 4 15.0 Functional test 3014 7/ VIN= 0.4 V or 2.4 V See 4.4.1b All 2.7 V and 3.
