DLA SMD-5962-96818 REV B-2010 MICROCIRCUIT DIGITAL ADVANCED HIGH SPEED CMOS BUS TRANSCEIVER WITH THREE-STATE OUTPUTS MONOLITHIC SILICON.pdf

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1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Correct input voltage range (VIN) in section 1.4. Correct note 7 for trand tfin figure 5. Add table III, delta limits. Update boilerplate to the requirements of MIL-PRF-38535. Editorial changes throughout. TVN 03-11-14 Thomas M. Hess B Update boi

2、lerplate paragraphs to the current MIL-PRF-38535 requirements. - LTG 10-05-14 Thomas M. Hess REV SHET REV B B B SHEET 15 16 17 REV STATUS REV B B B B B B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Joseph A. Kerby DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHI

3、O 43218-3990 http:/www.dscc.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE AMSC N/A CHECKED BY Thanh V. Nguyen APPROVED BY Monica L. Poelking MICROCIRCUIT, DIGITAL, ADVANCED HIGH SPEED CMOS, BUS TRANSCEIVER WITH TH

4、REE-STATE OUTPUTS, MONOLITHIC SILICON DRAWING APPROVAL DATE 96-08-19 REVISION LEVEL B SIZE A CAGE CODE 67268 5962-96818 SHEET 1 OF 17 DSCC FORM 2233 APR 97 5962-E302-10 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZ

5、E A 5962-96818 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choic

6、e of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 96818 01 Q R A Federal stock clas

7、s designator RHA designator (see 1.2.1) Device type (see 1.2.2)Device class designatorCase outline (see 1.2.4) Leadfinish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the app

8、ropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type

9、 Generic number Circuit function 01 54AHC245 Octal bus transceiver with three-state outputs 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to

10、the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive

11、 designator Terminals Package style R GDIP1-T20 or CDIP2-T20 20 Dual-in-line S GDFP2-F20 or CDFP3-F20 20 Flat pack 2 CQCC1-N20 20 Square leadless chip carrier 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class

12、M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96818 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ 2/ 3/ Supply v

13、oltage range (VCC) -0.5 V dc to +7.0 V dc DC input voltage range (VIN) -0.5 V dc to +7.0 V dc 4/ DC output voltage range (VOUT) . -0.5 V dc to VCC+ 0.5 V dc 4/ DC input clamp current (IIK) (VIN 0.0 V) . -20 mA DC output clamp current (IOK) (VOUT 0.0 V or VOUT VCC) . 20 mA Continuous output current (

14、IOUT) (VOUT= 0.0 to VCC) 25 mA Continuous current through VCCor GND . 75 mA Maximum power dissipation at TA= +55C (in still air) (PD) . 700 mW Storage temperature range (TSTG) . -65C to +150C Lead temperature (soldering, 10 seconds) +300C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835

15、Junction temperature (TJ) +175C 1.4 Recommended operating conditions. 2/ 3/ 5/ Supply voltage range (VCC) +2.0 V dc to +5.5 V dc Input voltage range (VIN) 0.0 V to +5.5 V dc Output voltage range (VOUT) . 0.0 V to VCCMinimum high level input voltage (VIH): VCC= 2.0 V . +1.5 V VCC= 3.0 V . +2.1 V VCC=

16、 5.0 V 0.5 V . +3.85 V Maximum low level input voltage (VIL): VCC= 2.0 V . +0.5 V VCC= 3.0 V . +0.9 V VCC= 5.0 V 0.5 V . +1.65 V Maximum high level output current (IOH): VCC= 2.0 V . -50.0 A VCC= 3.3 V 0.3 V . -4.0 mA VCC= 5.0 V 0.5 V . -8.0 mA Maximum low level output current (IOL): VCC= 2.0 V . +5

17、0.0 A VCC= 3.3 V 0.3 V . +4.0 mA VCC= 5.0 V 0.5 V . +8.0 mA Maximum input transition rise or fall rate (t/v): VCC= 3.3 V 0.3 V . 100 ns/V VCC= 5.0 V 0.5 V . 20 ns/V Case operating temperature range (TC) . -55C to +125C 1/ Stresses above the absolute maximum rating may cause permanent damage to the d

18、evice. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Unless otherwise noted, all voltages are referenced to GND. 3/ The limits for the parameters specified herein shall apply over the full specified VCCrange and case temperature range of -55C to +125C. 4

19、/ The input and output voltage ratings may be exceeded provided that the input and output current ratings are observed. 5/ Unused inputs must be held high or low to ensure proper device operation. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STAND

20、ARD MICROCIRCUIT DRAWING SIZE A 5962-96818 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this

21、 drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-S

22、TD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at

23、https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes

24、 precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified here

25、in or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class lev

26、el B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlines. The

27、 case outlines shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3. 3.2.5 Groun

28、d bounce load circuit and waveforms. The ground bounce load circuit and waveforms shall be as specified on figure 4. 3.2.6 Switching waveforms and test circuit. The switching waveforms and test circuit shall be as specified on figure 5. 3.3 Electrical performance characteristics and postirradiation

29、parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be

30、 the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96818 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3

31、990 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has th

32、e option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certif

33、ication/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of

34、 compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (s

35、ee 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements o

36、f MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification

37、 of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DSCC, DSCCs agent, and

38、 the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this dr

39、awing shall be in microcircuit group number 37 (see MIL-PRF-38535, appendix A). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96818 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B

40、SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +2.0 V VCC +5.5 V unless otherwise specified VCCGroup A subgroups Limits 3/ Unit Min Max High level output voltage 3006 VOHFor all inputs affecti

41、ng output under test, VIN= VIHor VIL For all other inputs, VIN= VCCor GND IOH= -50 A 2.0 V 1, 2, 3 1.9 V 3.0 V 2.9 4.5 V 4.4 IOH= -4 mA 3.0 V 1 2.58 2, 3 2.48 IOH= -8 mA 4.5 V 1 3.94 2, 3 3.8 Low level output voltage 3007 VOLFor all inputs affecting output under test, VIN= VIHor VILFor all other inp

42、uts, VIN= VCCor GND IOL= 50 A 2.0 V 1, 2, 3 0.1 V 3.0 V 0.1 4.5 V 0.1 IOL= 4 mA 3.0 V 1 0.36 2, 3 0.5 IOL= 8 mA 4.5 V 1 0.36 2, 3 0.5 Input current high 3010 IIH4/ For input under test, VIN= VCC For all other inputs, VIN= VCCor GND A or B inputs 5.5 V 1 +0.1 A 2, 3 +1.0 OE or DIR 1 +0.1 2, 3 +1.0 In

43、put current low 3009 IIL4/ For input under test, VIN= GND For all other inputs, VIN= VCCor GND A or B inputs 5.5 V 1 -0.1 A 2, 3 -1.0 OE or DIR 1 -0.1 2, 3 -1.0 Three-state output leakage current high 3021 IOZH5/ OE = VIH For all other inputs, VIN= VCCor GND VOUT= VCC 5.5 V 1 +0.25 A 2, 3 +2.5 Three

44、-state output leakage current low 3020 IOZL5/ OE = VIH For all other inputs, VIN= VCCor GND VOUT= GND5.5 V 1 -0.25 A 2, 3 -2.5 Quiescent supply current 3005 ICCFor all inputs, VIN= VCCor GND IOUT= 0.0 A 5.5 V 1 4.0 A 2, 3 40.0 See footnotes at end of table. Provided by IHSNot for ResaleNo reproducti

45、on or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96818 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test and MIL-STD-883 test metho

46、d 1/ Symbol Test conditions 2/ -55C TC +125C +2.0 V VCC +5.5 V unless otherwise specified VCCGroup A subgroups Limits 3/ Unit Min Max Input capacitance, OE or DIR inputs 3012 CINTC= +25C VIN= VCCor GND See 4.4.1c 5.0 V 4 10.0 pF I/O port capacitance, An or Bn inputs 3012 CI/OTC= +25C VIN= VCCor GND

47、See 4.4.1c 5.0 V 4 10.0 pF Power dissipation capacitance CPD6/ CL= 50 pF minimum f = 1 MHz See 4.4.1c 5.0 V 4 15.0 pF Low level ground bounce noise VOLP7/ VIH= VCC, VIL= 0.0 V TA= +25C See 4.4.1d See figure 4 5.0 V 4 1400 mV VOLV7/ 5.0 V 4 -1300 High level VCCbounce noise VOHP7/ 5.0 V 4 900 mV VOHV7

48、/ 5.0 V 4 -1100 Functional test 3014 8/ VIN= VIHor VILVerify output VOUTSee 4.4.1b 2.0 V 7, 8 L H 3.0 V 5.5 V Propagation delay time, An to Bn or Bn An 3003 tPLH, tPHL9/ CL= 15 pF minimum 10/ See figure 5 3.0 V and 3.6 V 9 8.4 ns 10, 11 1.0 10.0 4.5 V and 5.5 V 9 5.5 10, 11 1.0 6.5 CL= 50 pF minimum See figure 5 3.0 V and 3.6 V 9 11.9 10, 11 1.0 13.5 4.5 V and 5.5 V 9 7.5 10, 11 1.0 8.5 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT

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