DLA SMD-5962-96828 REV A-2002 MICROCIRCUIT LINEAR VOLTAGE CONTROLLED OSCILLATOR MONOLITHIC SILICON《电压控制振荡器硅单片电路线型微电路》.pdf

上传人:livefirmly316 文档编号:701116 上传时间:2019-01-01 格式:PDF 页数:12 大小:78.60KB
下载 相关 举报
DLA SMD-5962-96828 REV A-2002 MICROCIRCUIT LINEAR VOLTAGE CONTROLLED OSCILLATOR MONOLITHIC SILICON《电压控制振荡器硅单片电路线型微电路》.pdf_第1页
第1页 / 共12页
DLA SMD-5962-96828 REV A-2002 MICROCIRCUIT LINEAR VOLTAGE CONTROLLED OSCILLATOR MONOLITHIC SILICON《电压控制振荡器硅单片电路线型微电路》.pdf_第2页
第2页 / 共12页
DLA SMD-5962-96828 REV A-2002 MICROCIRCUIT LINEAR VOLTAGE CONTROLLED OSCILLATOR MONOLITHIC SILICON《电压控制振荡器硅单片电路线型微电路》.pdf_第3页
第3页 / 共12页
DLA SMD-5962-96828 REV A-2002 MICROCIRCUIT LINEAR VOLTAGE CONTROLLED OSCILLATOR MONOLITHIC SILICON《电压控制振荡器硅单片电路线型微电路》.pdf_第4页
第4页 / 共12页
DLA SMD-5962-96828 REV A-2002 MICROCIRCUIT LINEAR VOLTAGE CONTROLLED OSCILLATOR MONOLITHIC SILICON《电压控制振荡器硅单片电路线型微电路》.pdf_第5页
第5页 / 共12页
点击查看更多>>
资源描述

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Paragraph 1.2.2, correct note 1. SMD bulletin, correct note 3. Update drawing boilerplate. 02-08-02 Raymond Monnin REV SHEET REV SHEET REV STATUS REV A A A A A A A A A A A OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 PMIC N/A PREPARED BY Gary Zahn DEF

2、ENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Michael C. Jones POST OFFICE BOX 3990 COLUMBUS, OHIO 43216-5000 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Kendall A. Cottongim MICROCIRCUIT, LINEAR, VOLTAGE CONTROLLED OSCILLATOR, MONOL

3、ITHIC SILICON AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 97-07-01 AMSC N/A REVISION LEVEL A SIZE A CAGE CODE 67268 5962-96828 SHEET 1 OF 11 DSCC FORM 2233 APR 97 5962-E522-02 DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited. Provided by IHSNot for

4、 ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96828 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL A SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classe

5、s as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown i

6、n the following example: 5962 - 96828 01 H X C Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked dev

7、ices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number 1/ Circuit function 01 MSK 1343B Voltag

8、e controlled oscillator 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing

9、(Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space applications. H Standard military quality class level. This level is intended for use in applications where non-s

10、pace high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not

11、 test) periodic and conformance inspections (Group A, B, C, and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquis

12、ition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a limited temperature range. 1/ MSK 1343B is

13、 similar to the 1648M as listed on Standard Microcircuit Drawing 5962-89778.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96828 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL A SHEE

14、T 3 DSCC FORM 2234 APR 97 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style 2 CQCC-N20 20 Leadless chip carrier 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Abso

15、lute maximum ratings. 1/ Power supply voltage at VCC= 0 V, (VEE) -8.0 V dc to 0 V dc Input voltage (VIN) at VEE= 5.2 V: (VINat AGC pin) -5.2 V dc to -3.4 V dc (VINat TANK pin) 0 V dc to VEEOutput source current, continuous (IO) . 39 mA Power dissipation (PD) at VCC= 5.0 V. 215 mW Output frequency (f

16、MAX). 225 MHz (typical) Storage temperature range. -55!C to +165!C Lead temperature (soldering, 10 seconds) . +300!C Junction temperature (TJ) . +165!C Thermal resistance, junction-to-case (JC) 20!C/W Thermal resistance, junction-to-ambient (JA). 20!C/W 1.4 Recommended operating conditions. Supply v

17、oltage at VEE= GND (VCC). +5.0 V dc Supply voltage at VCC= GND (VEE). -5.2 V dc Peak to peak TANK voltage 400 mV Output duty cycle 50% Ambient operating temperature range (TA) . -55!C to +125!C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specificatio

18、n, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed in the issue of the Department of Defense Index of Specifications and Standards (DoDISS) and supplement thereto, cited in the solicitatio

19、n. SPECIFICATION DEPARTMENT OF DEFENSE MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. STANDARDS DEPARTMENT OF DEFENSE MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. 1/ Stresses above the absolute maximum ratin

20、gs may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96828 DEFENSE SUPPLY CENTE

21、R COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL A SHEET 4 DSCC FORM 2234 APR 97 HANDBOOKS DEPARTMENT OF DEFENSE MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Unless otherwise indicated, copies of the specification, standards, and handbooks

22、 are available from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this

23、 document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38

24、534 may include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class. Therefore, the tests and inspections herein may not be performed for the applicable device class (see MIL-PRF-38534). Furthe

25、rmore, the manufacturer may take exceptions or use alternate methods to the tests and inspections herein and not perform them. However, the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. 3.2 Design, construction, and physical dimensions. The design

26、, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Logic diagram(s). The logic di

27、agram(s) shall be as specified on figure 2. 3.2.4 Test circuit(s). The test circuit(s) shall be as specified on figure 3. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the ful

28、l specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-

29、38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical tes

30、t data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revis

31、ion level control by the manufacturer and be made available to the preparing activity (DSCC-VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted t

32、o DSCC-VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. Provided by IHSN

33、ot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96828 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL A SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Limits Test Symbo

34、l Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Min Max Unit ICCInputs and outputs open, VCC= 5.0 V, VEE= 0 V, TA= +25C 40 Power supply current IEEInputs and outputs open, VEE= -5.2 V, VCC= 0 V, TA= +25C 1 01 -41 mA 1 1.85 2 1.60 VIHBIL= -5.0 mA, VCC= 5.0 V 3 0

35、1 2.70 V 1 -3.35 2 -3.60 High input voltage 2/ VIHAIL= -5.0 mA, VEE= -5.2 V 3 01 -3.13 V 1 1.35 2 1.10 VILBIL= -5.0 mA, VCC= 5.0 V 3 01 1.57 V 1 -3.85 2 -4.10 Low input voltage 2/ VILAIL= -5.0 mA, VEE= -5.2 V 3 01 -3.63 V VOHBTANK pin = +1.35 V, OUTPUT pin = -5 mA VCC= 5.0 V, VEE= 0 V, TA= +25C 4.04

36、 4.25 Logic “1“ output voltage VOHATANK pin = -3.85 V, OUTPUT pin = -5 mA VEE= -5.2 V, VCC= 0 V, TA= +25C 1 01 -0.96 -0.75 V See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-9682

37、8 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL A SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Limits Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Min Max Unit VOHBTANK pin = +

38、1.10 V, OUTPUT pin = -5 mA VCC= 5.0 V, VEE= 0 V, TA= +125C 4.16 4.40 VOHATANK pin = -4.10 V, OUTPUT pin = -5 mA VEE= -5.2 V, VCC= 0 V, TA= +125C 2 01 -0.84 -0.60 V VOHBTANK pin = +1.57 V, OUTPUT pin = -5 mA VCC= 5.0 V, VEE= 0 V, TA= -55C 3.92 4.13 Logic “1“ output voltage - Continued. VOHATANK pin =

39、 -3.63 V, OUTPUT pin = -5 mA VEE= -5.2 V, VCC= 0 V, TA= -55C 3 01 -1.08 -0.87 V VOLBTANK pin = +1.85 V, OUTPUT pin = -5 mA VCC= 5.0 V, VEE= 0 V, TA= +25C 3.20 3.43 VOLATANK pin = -3.35 V, OUTPUT pin = -5 mA VEE= -5.2 V, VCC= 0 V, TA= +25C 1 01 -1.85 -1.62 V VOLBTANK pin = +1.60 V, OUTPUT pin = -5 mA

40、 VCC= 5.0 V, VEE= 0 V, TA= +125C 3.23 3.51 Logic “0“ output voltage VOLATANK pin = -3.60 V, OUTPUT pin = -5 mA VEE= -5.2 V, VCC= 0 V, TA= +125C 2 01 -1.82 -1.54 V See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD

41、 MICROCIRCUIT DRAWING SIZE A 5962-96828 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL A SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Limits Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Dev

42、ice type Min Max Unit VOLBTANK pin = +2.07 V, OUTPUT pin = -5 mA VCC= 5.0 V, VEE= 0 V, TA= -55C 3.13 3.38 Logic “0“ output voltage - Continued. VOLATANK pin = -3.13 V, OUTPUT pin = -5 mA VEE= -5.2 V, VCC= 0 V, TA= -55C 3 01 -1.92 -1.67 V VBIASBTANK pin = +1.35 V, VCC= 5.0 V, VEE= 0 V, TA= +25C 1.45

43、1.75 VBIASATANK pin = -3.85 V, VEE= -5.2 V, VCC= 0 V, TA= +25C 1 01 -3.75 -3.45 V VBIASBTANK pin = +1.10 V, VCC= 5.0 V, VEE= 0 V, TA= +125C 1.20 1.50 VBIASATANK pin = -4.10 V, VEE= -5.2 V, VCC= 0 V, TA= +125C 2 01 -4.00 -3.70 V VBIASBTANK pin = +1.57 V, VCC= 5.0 V, VEE= 0 V, TA= -55C 1.67 1.97 Bias

44、voltage VBIASATANK pin = -3.65 V, VEE= -5.2 V, VCC= 0 V, TA= -55C 3 01 -3.53 -3.23 V Maximum frequency of oscillation 2/ fMAXVCC=5.0 V, TA= +25C, VEE= 0 V, VPP= 400 mV, duty cycle = 50% 4 01 200 MHz Functional test See figure 3. 7,8 01 PASS/FAIL 1/ All voltages are referenced to ground. See figure 3

45、. 2/ Guaranteed by design, but not tested. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96828 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL A SHEET 8 DSCC FORM 2234 APR 97 Device

46、type 01 Case outline 2 Terminal number Terminal symbol 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 NC VCC1NC OUTPUT NC NC NC AGC NC VEE1NC VEE2NC BIAS POINT NC NC NC TANK NC VCC2VCC1Positive supply voltage 1 NC No connection OUTPUT OutputAGC Automatic gain control limits the current through t

47、he emitter-coupled pair of transistors and allows optimum frequency response of the oscillator. VEE1Negative supply voltage 1 EE2Negative supply voltage 2 BIAS POINT Gives power to the TANK circuit which is controlled by the AGC. TANK Oscillator control which causes circuit to oscillate given freque

48、ncy. CC2Positive supply voltage 2 FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96828 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL A SHEET 9 DSCC FORM 2234 APR 97 FIGURE 2. Logic diagram. NOTES: 1. Use high impedance probe ( 1.0 M must be used). Inductor (L) = 40 nH 1 percent and capacitor (C) = 10 pF 1 percent.

展开阅读全文
相关资源
猜你喜欢
相关搜索

当前位置:首页 > 标准规范 > 国际标准 > 其他

copyright@ 2008-2019 麦多课文库(www.mydoc123.com)网站版权所有
备案/许可证编号:苏ICP备17064731号-1