1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Figure 1, case outline X, change lead length from .250“ min to .240“ min. Figure 1, case outline Y, to change the maximum package width from .800“ max to .780“ max. Figure 1, case outlines X and Y, convert dimensioning to symbol and inches/millim
2、eters table. Add vendor CAGE code S7631. Update drawing boilerplate. 03-08-22 Raymond Monnin B Rewrite paragraphs 4.2.a.2. and 4.3.3.b.2 to add TC. 04-07-16 Raymond Monnin REV SHEET REV SHEET REV STATUS REV B B B B B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 PMIC N/A PREPARED BY
3、Gary Zahn DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Michael C. Jones POST OFFICE BOX 3990 COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Kendall A. Cottongim MICROCIRCUIT, HYBRID, LINEAR, 90 VOLT, SYNCHR
4、O TO DIGITAL CONVERTER AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 96-05-29 AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 67268 5962-96844 SHEET 1 OF 13 DSCC FORM 2233 APR 97 5962-E333-04 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,
5、-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96844 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outline
6、s and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 - 96844 01 H X A Federal RHA Device Device Ca
7、se Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked
8、with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function Accuracy 1.0 LSB 01 SD-14591X2-112 90 V, 400 Hz, S/D converter, 14-bit 5.2 min 02 SD-14591X2-114
9、90 V, 400 Hz, S/D converter, 14-bit 2.6 min 03 SD-14591X3-112 90 V, 60 Hz, S/D converter, 14-bit 5.2 min 04 SD-14591X3-114 90 V, 60 Hz, S/D converter, 14-bit 2.6 min 05 SD-14592X2-112 90 V, 400 Hz, S/D converter, 16-bit 5.2 min 06 SD-14592X2-114 90 V, 400 Hz, S/D converter, 16-bit 2.6 min 07 SD-1459
10、2X2-115 90 V, 400 Hz, S/D converter, 16-bit 1.3 min 08 SD-14592X3-112 90 V, 60 Hz, S/D converter, 16-bit 5.2 min 09 SD-14592X3-114 90 V, 60 Hz, S/D converter, 16-bit 2.6 min 10 SD-14592X3-115 90 V, 60 Hz, S/D converter, 16-bit 1.3 min 1.2.3 Device class designator. This device class designator shall
11、 be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device perform
12、ance documentation K Highest reliability class available. This level is intended for use in space applications. H Standard military quality class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard mil
13、itary quality class. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C, and D). E Designates devices
14、which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversel
15、y affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a limited temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-STANDARD
16、 MICROCIRCUIT DRAWING SIZE A 5962-96844 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X
17、 See figure 1 36 Dual-in-line Y See figure 1 36 Flat pack 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Positive supply voltage (VCC). +18 V dc Logic supply voltage (VDD). +7.0 V dc Reference input voltage 130 V rms Digital input voltage
18、range. -0.3 V dc to +7.0 V dc Power dissipation, TC= +125C (PD). 720 mW Storage temperature range . -65C to +150C Lead temperature (soldering, 10 seconds) +300C Thermal resistance junction-to-case (JC) . 8.0C/W Thermal resistance junction-to-ambient (JA) 20C/W 1.4 Recommended operating conditions. P
19、ositive supply voltage (VCC). +14.25 V dc to +15.75 V dc Logic supply voltage (VDD). +4.5 V dc to +5.5 V dc Case operating temperature range (TC) -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a
20、 part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-ST
21、D-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online
22、at http:/assist.daps.dla.mil/quicksearch/ or www.dodssp.daps.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the t
23、ext of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the maximum levels may deg
24、rade performance and affect reliability.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96844 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREME
25、NTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 may include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) p
26、lan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall
27、 not affect the form, fit, or function of the device for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accorda
28、nce with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.2.3 Timing diagram(s). The timing diagram(s) shall be as specified on figure 3. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical
29、performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I.
30、 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-3853
31、4, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for tho
32、se which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DSCC-VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order
33、to supply to this drawing. The certificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be
34、 provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall
35、 not affect the form, fit, or function as described herein. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the ma
36、nufacturer under document revision level control and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL
37、-STD-883. (2) TAor TCas specified in the approved manufacturers QM plan. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. Provided by IHSNot for Res
38、aleNo reproduction or networking permitted without license from IHS-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96844 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Limits Test Symbol Conditions
39、 1/ -55C TC +125C unless otherwise specified Group A subgroups Device type Min Max Unit Differential linearity DL 2/ 7,8A,8B All -1.0 +1.0 LSB Accuracy repeatability AR 2/ 7,8A,8B All -1.0 +1.0 LSB 01,03, 05,08 -5.2 +5.2 02,04, 06,09 -2.6 +2.6 Output accuracy AOUT 3/ 4,5,6 07,10 -1.3 +1.3 LSB Refere
40、nce synthesizer 2/ RS Reference phase shift between the converter signal and reference inputs 4,5,6 All -45 +45 Degree Single ended 100 Reference input impedance 2/ ZIN1Differential 4,5,6 All 250 k Reference input common mode range 2/ CMR14,5,6 All -210 +210 Vpk Single ended 4/ All 85 Signal input i
41、mpedance 2/ ZIN2 Differential 4/ 4,5,6 All 130 k Signal input common mode range 2/ CMR24/ 4,5,6 All -25 +25 V Digital output low voltage 5/ VOLIOL= 1.6 mA, output bits 1 through 16 and BIT 1,2,3 All 0.4 V Digital output high voltage 5/ VOHIOH= 400 A, output bits 1 through 16 and BIT 1,2,3 All 2.8 V
42、Output leakage current (high impedance 2/ 5/ IZOutput bits 1 through 16 1,2,3 All -10 +10 A Digital output delay, converter busy tCBPositive pulse, see figure 3 7,8A,8B All 0.4 2.0 s Digital output error detection (built-in-test) 6/ BIT Logic 1 indicates fault, minimum error for bit condition 7,8A,8
43、B All 20 100 LSB See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96844 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 TABL
44、E I. Electrical performance characteristics - Continued. Limits Test Symbol Conditions 1/ -55C TC +125C unless otherwise specified Group A subgroups Device type Min Max Unit 14-bit mode 01-04 5.3 7.3 Analog output error 2/ eOUT16-bit mode 7,8A,8B 05-10 2.6 3.6 mV rms /LSB Analog output offset voltag
45、e VOSVOUTat zero speed 6/ 4,5,6 All -35 +35 mV Analog output positive linearity error 7/ EUP 6/ 4,5,6 All 2.0 % Analog output negative linearity error 7/ EUN 6/ 4,5,6 All 2.0 % Analog output reversal error EB Difference between positive and negative linearity 6/ 4,5,6 All 2.0 % Bias voltage VBIAS4,5
46、,6 All 1/3 VCC, 10% V dc Analog output scale factor SF Slope of the linearity line 6/ 8/ 4,5,6 All 15 % Digital input high voltage VIHINH, EL, EM, and digital output bits 7,8A,8B All 2.4 V Digital input low voltage VILINH, EL, EM, and digital output bits 7,8A,8B All 0.8 V Inhibit (INH) voltage VINHN
47、o digital angles change while INH is logic 0 7,8A,8B All 0.8 V Enable voltage 5/ VE7,8A,8B All 0.8 V Disable voltage 5/ (high impedance) VD16-bit mode, EM controls output bits 1 through 8 and EL controls output bits 9 through 16. 14-bit mode, EM controls output bits 1 through 6 and EL controls outpu
48、t bits 7 through 14. 7,8A,8B All 2.0 V See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96844 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Limits Test Symbol Conditions 1/ -55C TC +125C unless otherwise specified Group A subgroups Device type Min Max Unit Positive
