DLA SMD-5962-96862 REV A-2008 MICROCIRCUIT DIGITAL ADVANCED HIGH SPEED CMOS QUADRUPLE BUS BUFFER GATE WITH THREE-STATE OUTPUTS MONOLITHIC SILICON《高级双极数字单硅片微电路 由高速互补金属氧化物半导体结构组成 带三态.pdf

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1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Update boilerplate to current MIL-PRF-38535 requirements. - MAA 08-06-25 Thomas M. Hess REV SHEET REV SHEET REV A A A SHEET 15 16 17 REV A A A A A A A A A A A A A A REV STATUS OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY

2、Joseph A. Kerby CHECKED BY Monica L. Poelking DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218 - 3990 http:/www.dscc.dla.mil APPROVED BY Monica L. Poelking DRAWING APPROVAL DATE 96-09-09 MICROCIRCUIT, DIGITAL, ADVANCED HIGH SPEED CMOS, QUADRUPLE BUS BUFFER GATE WITH THREE-STATE OUTPUTS, MONOLITHI

3、C SILICON SIZE A CAGE CODE 67268 5962-96862 STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE AMSC N/A REVISION LEVEL A SHEET 1 OF 17 DSCC FORM 2233 APR 97 5962-E420-08 Provided by IHSNot for ResaleNo reproduction or networki

4、ng permitted without license from IHS-,-,-SIZE A 5962-96862 STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218 - 3990 REVISION LEVEL A SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliabi

5、lity (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN i

6、s as shown in the following example: 5962 - 96862 01 Q C A Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked

7、 devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device t

8、ype(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 54AHC126 Quadruple bus buffer gate with three-state outputs. 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as fo

9、llows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case o

10、utline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style C GDIP1-T14 or CDIP2-T14 14 Dual-in-line D GDFP1-F14 or CDFP2-F14 14 Flat pack 2 CQCC1-N20 20 Square leadless chip carrier 1.2.5 Lead finish. The lead finish is as specified in M

11、IL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SIZE A 5962-96862 STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218 - 3990 REVISI

12、ON LEVEL A SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ 2/ 3/ Supply voltage range (VCC) -0.5 V dc to +7.0 V dc DC input voltage range (VIN) -0.5 V dc to +7.0 V dc 4/ DC output voltage range (VOUT) . -0.5 V dc to VCC+ 0.5 V dc 4/ DC input clamp current (IIK) (VINVCC). 20 mA Continu

13、ous output current (IOUT) (VOUT= 0.0 V to VCC) 25 mA Continuous current through VCCor GND 50 mA Maximum power dissipation at TA= +55C (in still air) (PD ) 500 mW Storage temperature range (TSTG) . -65C to +150C Lead temperature (soldering, 10 seconds). +300C Thermal resistance, junction-to-case (JC)

14、 . See MIL-STD-1835 Junction temperature (TJ) +150C 1.4 Recommended operating conditions. 2/ 3/ 5/ Supply voltage range (VCC) +2.0 V dc to +5.5 V dc Input voltage range (VIN) +0.0 V dc to +5.5 V dc Output voltage range (VOUT). +0.0 V dc to VCCMinimum high level input voltage (VIH): VCC= 2.0 V +1.5 V

15、 VCC= 3.0 V +2.1 V VCC= 5.5 V +3.85 V Maximum low level input voltage (VIL): VCC= 2.0 V +0.5 V VCC= 3.0 V +0.9 V VCC= 5.5 V +1.65 V Maximum high level output current (IOH): VCC= 2.0 V -50 A VCC= 3.0 V 0.3 V -4 mA VCC= 5.0 V 0.5 V -8 mA Maximum low level output current (IOL): VCC= 2.0 V +50 A VCC= 3.

16、0 V 0.3 V +4 mA VCC= 5.0 V 0.5 V +8 mA Maximum input rise or fall rate (t/V): VCC= 3.3 V 0.3 V 100 ns/V VCC= 5.0 V 0.5 V 20 ns/V Case operating temperature range (TC). -55C to +125C 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maxi

17、mum levels may degrade performance and affect reliability. 2/ Unless otherwise noted, all voltages are referenced to GND. 3/ The limits of the parameters specified herein shall apply over the full specified VCCrange and case temperature range of -55C to +125C. Unused inputs must be held high or low.

18、 4/ The input and output voltage ratings may be exceeded provided that the input and output current ratings are observed. 5/ Unused inputs must be held high or low to prevent them from floating. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SIZE A

19、5962-96862 STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218 - 3990 REVISION LEVEL A SHEET 4 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this

20、 drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-S

21、TD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at

22、http:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes

23、precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herei

24、n or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class leve

25、l B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlines. The

26、case outlines shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Block or Logic diagram. The block or logic diagram shall be as specified on figu

27、re 3. 3.2.5 Ground bounce load circuit and waveforms. The ground bounce load circuit and waveforms shall be as specified on figure 4. 3.2.6 Switching waveforms and test circuit. The switching waveforms and test circuit shall be as specified on figure 5. 3.3 Electrical performance characteristics and

28、 post-irradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and post-irradiation parameter limits are as specified in table I and shall apply over the full case operating temperature range. Provided by IHSNot for ResaleNo reproduction or networki

29、ng permitted without license from IHS-,-,-SIZE A 5962-96862 STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218 - 3990 REVISION LEVEL A SHEET 5 DSCC FORM 2234 APR 97 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in t

30、able II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, th

31、e manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, app

32、endix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q an

33、d V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supp

34、ly in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class

35、M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this draw

36、ing. 3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, D

37、SCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devic

38、es covered by this drawing shall be in microcircuit group number 36 (see MIL-PRF-38535, appendix A). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SIZE A 5962-96862 STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218 -

39、 3990 REVISION LEVEL A SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Limits 3/ Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +4.5 V VCC +5.5 V unless otherwise specified VCCGroup A subgroups Min Max Unit 2.0 V 1.9 3.0 V 2.9 IOH= -50 A 4.

40、5 V 1, 2, 3 4.4 1 2.58 IOH= -4 mA 3.0 V 2, 3 2.48 1 3.94 High level output voltage 3006 VOHFor all inputs affecting output under test VIN= VIHMin or VILMax For all other inputs VIN= VCCor GND IOH= -8 mA 4.5 V 2, 3 3.8 V 2.0 V 0.1 3.0 V 0.1 IOL= +50 A 4.5 V 1, 2, 3 0.1 1 0.36 IOL= +4 mA 3.0 V 2, 3 0.

41、50 1 0.36 Low level output voltage 3007 VOLFor all inputs affecting output under test, VIN= VIHMin or VILMax For all other inputs VIN= VCCor GND IOL= +8 mA 4.5 V 2, 3 0.50 V 1 +0.1 Input current high 3010 IIHFor input under test, VIN= VCCFor all other inputs, VIN= VCCor GND 5.5 V 2, 3 +1.0 A 1 -0.1

42、Input current low 3009 IILFor input under test, VIN= GND For all other inputs, VIN= VCCor GND 5.5 V 2, 3 -1.0 A 1 +0.25 Three-state output leakage current high 3021 IOZHFor input mOE = 0.0 V For all other inputs, VIN= VCCor GND VOUT= VCC5.5 V 2, 3 +2.5 A 1 -0.25 Three-state output leakage current lo

43、w 3020 IOZLFor input mOE = 0.0 V For all other inputs, VIN= VCCor GND VOUT= GND 5.5 V 2, 3 -2.5 A 1 4.0 Quiescent supply current 3005 ICCFor all inputs, VIN= VCCor GND IOUT= 0.0 A 5.5 V 2, 3 40.0 A Input capacitance 3012 CINTC= +25C, VIN= VCCor GND See 4.4.1c 5.0 V 4 10.0 pF Power dissipation capaci

44、tance CPD4/ CL= 50 pF minimum f = 1 MHz See 4.4.1c 5.0 V 4 14.0 pF See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SIZE A 5962-96862 STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218 - 39

45、90 REVISION LEVEL A SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Limits 3/ Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +4.5 V VCC +5.5 V unless otherwise specified VCCGroup A subgroups Min Max Unit VOLP5/ 5.0 V 4 1100 Low

46、level ground bounce noise VOLV5/ 5.0 V 4 -1100 mV VOHP5/ 5.0 V 4 500 High level VCCbounce noise VOHV5/ CL= 50 pF minimum VIN= 0.0 V to VCCTA= +25C See 4.4.1d See figure 4 5.0 V 4 -750 mV 2.0 V 3.0 V Functional test 3014 6/ VIN= VIHMin. r VILMax. Verify output VOUTSee 4.4.1b 5.5 V 7, 8 L H 9 8.0 3.0

47、V and 3.6 V 10, 11 1.0 9.5 9 5.5 CL= 15 pF minimum RL= 1k See figure 5 8/ 4.5 V and 5.5 V 10, 11 1.0 6.5 ns 9 11.5 3.0 V and 3.6 V 10, 11 1.0 13.0 9 7.5 tPLH 7/ CL= 50 pF minimum RL= 1k See figure 5 4.5 V and 5.5 V 10, 11 1.0 8.5 ns 9 8.0 3.0 V and 3.6 V 10, 11 1.0 9.5 9 5.5 CL= 15 pF minimum RL= 1k

48、 See figure 5 8/ 4.5 V and 5.5 V 10, 11 1.0 6.5 ns 9 11.5 3.0 V and 3.6 V 10, 11 1.0 13.0 9 7.5 Propagation delay time, mA to mY 3003 tPHL 7/ CL= 50 pF minimum RL= 1k See figure 5 4.5 V and 5.5 V 10, 11 1.0 8.5 ns See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SIZE A 5962-96862 STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218 - 3990 REVISION

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