1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Update the boilerplate paragraphs to current requirements as specified in MIL-PRF-38535. - jak 09-01-21 Charles F. Saffle REV SHET REV A A SHET 15 16 REV STATUS REV A A A A A A A A A A A A A A OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC
2、 N/A PREPARED BY Joseph A. Kerby STANDARD MICROCIRCUIT DRAWING CHECKED BY Charles F. Saffle Jr. DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Monica L. Poelking AND AGENCIES OF THE DEPARTMENT OF DEFENS
3、E DRAWING APPROVAL DATE 97-03-27 MICROCIRCUIT, DIGITAL, ADVANCED HIGH-SPEED CMOS, QUADRUPLE 2 INPUT POSITIVE-NOR GATE, MONOLITHIC SILICON AMSC N/A REVISION LEVEL A SIZE A CAGE CODE 67268 5962-97528 SHEET 1 OF 16 DSCC FORM 2233 APR 97 5962-E125-09 Provided by IHSNot for ResaleNo reproduction or netwo
4、rking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97528 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliab
5、ility (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN
6、is as shown in the following example: 5962 - 97528 01 Q C A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2)Device class designatorCase outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked
7、devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device ty
8、pe(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 54AHC02 Quadruple 2 input positive-NOR gate 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device clas
9、s Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as de
10、signated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style C GDIP1-T14 or CDIP2-T14 14 Dual-in-line D GDFP1-F14 or CDFP2-F14 14 Flat pack 2 CQCC1-N20 20 Square leadless chip carrier 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for de
11、vice classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97528 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 3 DS
12、CC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ 2/ 3/ Supply voltage range (VCC) . -0.5 V dc to +7.0 V dc DC input voltage range (VIN) . -0.5 V dc to +7.0 V dc 4/ DC output voltage range (VOUT) -0.5 V dc to VCC+0.5 V dc 4/ DC input clamp current (IIK) (VINVCC) 20 mA Continuous output current (I
13、O) (VOUT= 0 V to VCC) . 25 mA Continuous current through VCCor GND 50 mA Maximum power dissipation at TA= +55C (instill air) (PD) . 500 mW 5/ Storage temperature range (TSTG) -65C to +150C Lead temperature (soldering, 10 seconds) +300C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Jun
14、ction temperature (TJ) . +150C 1.4 Recommended operating conditions. 2/ 3/ 6/ Supply voltage range (VCC) . +2.0 V dc to +5.5 V dc Input voltage range (VIN) . +0.0 V dc to +5.5 V dc Output voltage range (VOUT) +0.0 V dc to VCCMinimum high level input voltage (VIH): VCC= 2.0 V +1.5 V VCC= 3.0 V +2.1 V
15、 VCC= 5.0 V 0.5 V . +3.85 V Maximum low level input voltage (VIL): VCC= 2.0 V +0.5 V VCC= 3.0 V +0.9 V VCC= 5.0 V 0.5 V . +1.65 V Maximum high level output current (IOH): VCC= 2.0 V -50 A VCC= 3.3 V 0.3 V -4 mA VCC= 5.0 V 0.5 V . -8 mA Maximum low level output current (IOL): VCC= 2.0 V +50 A VCC= 3.
16、3 V 0.3 V +4 mA VCC= 5.0 V 0.5 V . +8 mA Minimum input rise or fall rate (t/V): VCC= 3.3 V 0.3 V 100 ns/V VCC= 5.0 V 0.5 V . 20 ns/V Case operating temperature range (TC) -55C to +125C 1/ Stresses above the absolute maximum rating may cause permanent damage to the device, Extended operation at the m
17、aximum levels may degrade performance and affect reliability. 2/ Unless otherwise noted, all voltages are referenced to GND. 3/ The limits for the parameters specified herein shall apply over the full specified VCCrange and case temperature range of -55C to +125C. 4/ The input and output voltage rat
18、ings may be exceeded providing that the input and output current ratings are observed. 5/ The maximum package power dissipation is calculated using a junction temperature of 150 C and a board trace length of 750 mils. 6/ Unused inputs must be held high or low to prevent them from floating. Provided
19、by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97528 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 4 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, stand
20、ards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integr
21、ated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-
22、HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict bet
23、ween the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requiremen
24、ts for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements f
25、or device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes
26、 Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on fi
27、gure 2. 3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3. 3.2.5 Ground bounce waveforms and test circuit. The ground bounce waveforms and test circuit shall be as specified on figure 4. 3.2.6 Switching waveforms and test circuit. The switching waveforms and test circuit shall
28、 be as specified on figure 5. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97528 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 5 DSCC FORM 2234 APR 97 3.3 Electrical perfo
29、rmance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements
30、. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking o
31、f the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. M
32、arking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-3
33、8535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required
34、 from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q
35、and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A
36、 shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawin
37、g. 3.9 Verification and review for device class M. For device class M, DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.1
38、0 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 36 (see MIL-PRF-38535, appendix A). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING
39、 SIZE A 5962-97528 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC+125C +2.0 V VCC +5.5 V unless otherwise specified VCCGroup
40、 A subgroups Limits 3/ Unit Min Max 2.0 V 1.9 3.0 V 2.9 IOH= -50 A 4.5 V 1, 2, 3 4.4 1 2.58 IOH= -4 mA 3.0 V 2, 3 2.48 1 3.94 High level output voltage 3006 VOHFor all inputs affecting outputs under test, VIN= VIHor VILFor all other inputs, VIN= VCCor GND IOH= -8 mA 4.5 V 2, 3 3.8 V 2.0 V 0.1 3.0 V
41、0.1 IOL= +50 A 4.5 V 1, 2, 3 0.1 1 0.36 IOL= +4 mA 3.0 V 2, 3 0.5 1 0.36 Low level output voltage 3007 VOLFor all inputs affecting outputs under test, VIN= VIHor VILFor all other inputs, VIN= VCCor GND IOL= +8 mA 4.5 V 2, 3 0.5 V 1 +0.1 Input current high 3010 IIHFor input under test, VIN= VCCFor al
42、l other inputs, VIN= VCCor GND 5.5 V 2, 3 +1.0 A 1 -0.1 Input current low 3009 IILFor input under test, VIN= GND For all other inputs, VIN= VCCor GND 5.5 V 2, 3 -1.0 A 1 2.0 Quiescent supply current, 3005 ICCFor all inputs, VIN= VCCor GND IOUT= 0 A 5.5 V 2, 3 20 A Input capacitance 3012 CINTC= +25C
43、VIN= VCCor GND See 4.4.1c 5.0 V 4 10.0 pF Power dissipation capacitance CPD4/ TC= +25C f = 1 MHz See 4.4.1c 5.0 V 4 15.0 pF VOLP5/ 5.0 V 4 1700 Low level ground bounce noise VOLV5/ 5.0 V 4 -1700 mV VOHP5/ 5.0 V 4 900 High level VCCbounce noise VOHV5/ VIH= VCC, VIL = 0.0 V TA= +25C See 4.4.1d See fig
44、ure 4 5.0 V 4 -900 mV See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97528 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 7 DSCC FORM 2234 APR
45、97 TABLE I. Electrical performance characteristics Continued. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC+125C +2.0 V VCC +5.5 V unless otherwise specified VCCGroup A subgroups Limits 3/ Unit Min Max 2.0 V 3.0 V Functional tests 3014 6/ VIN= VIHor VILVerify output VOSee 4.4
46、.1b 5.5 V 7, 8 L H 9 7.9 3.0 V and 3.6 V 10, 11 1.0 9.5 ns 9 5.5 CL= 15 pF minimum See figure 5 8/ 4.5 V and 5.5 V 10, 11 1.0 6.5 ns 9 11.4 3.0 V and 3.6 V 10, 11 1.0 13.0 ns 9 7.5 Propagation delay time, mA or mB to mY 3003 tPLH7/ CL= 50 pF minimum See figure 5 4.5 V and 5.5 V 10, 11 1.0 8.5 ns 9 7
47、.9 3.0 V and 3.6 V 10, 11 1.0 9.5 ns 9 5.5 CL= 15 pF minimum See figure 5 8/ 4.5 V and 5.5 V 10, 11 1.0 6.5 ns 9 11.4 3.0 V and 3.6 V 10, 11 1.0 13.0 ns 9 7.5 Propagation delay time, mA or mB to mY 3003 tPHL7/ CL= 50 pF minimum See figure 5 4.5 V and 5.5 V 10, 11 1.0 8.5 ns 1/ For tests not listed i
48、n the referenced MIL-STD-883 (e.g. ICC) utilize the general test procedure under the conditions listed herein. 2/ Each input/output, as applicable, shall be tested at the specified temperature, for the specified limits to the tests in table I herein. Output terminals not designated shall be high level logic, low level logic, or open, except for all ICCand ICCtests, the output terminals shall be open. When performing the ICCtests, the current meter shall be placed in the circuit such that all current flows through the
