1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Replace reference to MIL-STD-973 with reference to MIL-PRF-38535. Delete 1.5 and make change to 4.4.1b. - ro 06-06-14 R. MONNIN REV SHET REV SHET REV STATUS REV A A A A A A A A A A A A A OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 PMIC N/A PREP
2、ARED BY LARRY E. SHAW DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY TUAN D. NGUYEN COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY RAY L. MONNIN AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE
3、 97-03-14 MICROCIRCUIT, DIGITAL, BIPOLAR, LOW-POWER SCHOTTKY TTL, 4-BIT MAGNITUDE COMPARATORS, MONOLITHIC SILICON AMSC N/A REVISION LEVEL A SIZE A CAGE CODE 67268 5962-97547 SHEET 1 OF 13 DSCC FORM 2233 APR 97 5962-E383-06 Provided by IHSNot for ResaleNo reproduction or networking permitted without
4、license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97547 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q
5、and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the follo
6、wing example: 5962 - 97547 01 Q E X Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2)Device class designatorCase outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF
7、-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s
8、) identify the circuit function as follows: Device type Generic number Circuit function 01 54LS85 4-bit magnitude comparators 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device class Device requirements documentati
9、on M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as f
10、ollows: Outline letter Descriptive designator Terminals Package style E GDIP1-T16 or CDIP2-T16 16 Dual-in-line F GDFP2-F16 or CDFP3-F16 16 Flat pack 2 CQCC1-N20 20 Square leadless chip carrier 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-3
11、8535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97547 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute
12、maximum ratings. 1/ 2/ 3/ Supply voltage range (VCC) . 7.0 V dc Input voltage (VI) . 7.0 V dc Operating free-air temperature range . -55C to +125C Maximum power dissipation (PD) 140 mW Storage temperature range -65C to +150C Junction temperature (TJ) 150C Thermal resistance, junction-to-case (JC) .
13、See MIL-STD-1835 1.4 Recommended operating conditions. 2/ 3/ Supply voltage range (VCC) +4.5 V dc to +5.5 V dc Minimum high level input voltage (VIH) +2.0 V Maximum low level input voltage (VIL) +0.7 V Maximum high level output current (IOH) . -400 A Maximum low level output current (IOL) +4 mA Case
14、 operating temperature range (TC) -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents
15、are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component
16、 Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil or from the Standardization Doc
17、ument Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) _ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Unless otherwise noted, all voltages
18、are referenced to GND. 3/ The limits for the parameters specified herein shall apply over the full specified VCCrange and case temperature range of -55C to +125C. Unused inputs must be held high or low. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,
19、-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97547 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 4 DSCC FORM 2234 APR 97 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing take
20、s precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified her
21、ein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class le
22、vel B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlines. Th
23、e case outlines shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Test circuit and timing waveforms. The test circuit and timing waveforms shall
24、 be as specified on figure 3. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full case operating t
25、emperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PI
26、N may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q
27、and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for devi
28、ce class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device clas
29、s M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall affirm that the
30、manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535
31、or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2 herein) involving devices acquired to this drawing i
32、s required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made av
33、ailable onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 101 (see MIL-PRF-38535, appendix A). Provided by IHSNot for ResaleNo reproduction or networking permitted without
34、 license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97547 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TC +125C 4.5 V VCC 5.5 V Group A subgroups Device
35、 type Limits 1/ Unit unless otherwise specified Min Max Input clamp voltage VIKII= -18 mA, VCC= 4.5 V 1,2,3 01 -1.5 V Short circuit output current IOS2/ VCC= 5.5 V 1,2,3 01 -20 -100 mA High level output voltage VOHIOH= -400 A, VCC= 4.5 V, VIL= 0.7 V, VIH= 2 V 1,2,3 01 2.5 V Low level output voltage
36、VOLIOL= 4 mA, VCC= 4.5 V, VIL= 0.7 V, VIH= 2 V 1,2,3 01 0.4 V Input current at maximum input voltage IIVI= 7 V, VCC= 5.5 V, A B inputs 1,2,3 01 0.1 mA VI= 7 V, VCC= 5.5 V, all other inputs 0.3 High level input current IIHVI= 2.7 V, VCC= 5.5 V, A B inputs 1,2,3 01 20 A VI= 2.7 V, VCC= 5.5 V, all othe
37、r inputs 60 Low level input current IILVI= 0.4 V, VCC= 5.5 V, A B inputs 1,2,3 01 -0.4 mA VI= 0.4 V, VCC= 5.5 V, all other inputs -1.2 Supply current ICCVI= 4.5 V, VCC= 5.5 V 3/ 1,2,3 01 20 mA Functional test VCC= 4.5 V, 4/ VIN= VIHmin or VILmax, verify output VO, see 4.4.1b 7,8 01 L H VCC= 5.5 V, 4
38、/ VIN= VIHmin or VILmax, verify output VO, see 4.4.1b L H See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97547 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION
39、 LEVEL A SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions -55C TC +125C 4.5 V VCC 5.5 V Number of gate levels Group A subgroups Limits 1/ Unit device type 01 unless otherwise specified Min Max Propagation delay time, low-to-high level ou
40、tput, tPLHVCC= 5 V, TA= +25C, 5/ 1 9 36 ns any A or B data input CL= 15 pF, RL= 2 k, 2 36 to output A B 3 36 VCC= 5 V, TA= +25C, 5/ CL= 15 pF, RL= 2 k, to output A = B 4 45 Propagation delay time, high-to-low level output, tPHLVCC= 5 V, TA= +25C, 5/ 1 9 30 ns any A or B data input CL= 15 pF, RL= 2 k
41、, 2 30 to output A B 3 30 VCC= 5 V, TA= +25C, 5/ CL= 15 pF, RL= 2 k, to output A = B 4 45 Propagation delay time, low-to-high level output, A B 1 9 22 ns Propagation delay time, high-to-low level output, A B 1 9 17 ns Propagation delay time, low-to-high level output, A = B input tPLHVCC= 5 V, TA= +2
42、5C, 5/ CL= 15 pF, RL= 2 k, to output A = B 2 9 20 ns Propagation delay time, high-to-low level output, A = B input tPHLVCC= 5 V, TA= +25C, 5/ CL= 15 pF, RL= 2 k, to output A = B 2 9 26 ns See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without lice
43、nse from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97547 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions -55C TC +125C unless otherwise specified Group A
44、subgroups Device type Limits 1/ Unit Min MaxPropagation delay time, low-to-high level output, A B or A = B input tPLHVCC= 5 V, TA= +25C, 5/ CL= 15 pF, RL= 2 k, to output A B or A = B input tPHLVCC= 5 V, TA= +25C, 5/ CL= 15 pF, RL= 2 k, to output A B in A = B in 5 A B out A B in 6 A = B out NC 7 A B
45、out 8 GND A = B out 9 B0 A B A B A B3 X X X X X X H L L A3 B2 X X X X X H L L A3 = B3 A2 B1 X X X X H L L A3 = B3 A2 = B2 A1 B0 X X X H L L A3 = B3 A2 = B2 A1 = B1 A0 B0 X X X L H L A3 = B3 A2 = B2 A1 = B1 A0 = B0 H L L H L L A3 = B3 A2 = B2 A1 = B1 A0 = B0 L H L L H L A3 = B3 A2 = B2 A1 = B1 A0 = B
46、0 X X H L L H A3 = B3 A2 = B2 A1 = B1 A0 = B0 H H L L L L A3 = B3 A2 = B2 A1 = B1 A0 = B0 L L L H H L H = High level voltage L = Low level voltage X = Irrelevant FIGURE 2. Truth table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIR
47、CUIT DRAWING SIZE A 5962-97547 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 10 DSCC FORM 2234 APR 97 NOTES: 1. CLincludes probe and jig capacitance. 2. All diodes are 1N3064 or equivalent FIGURE 3. Test circuit and timing waveforms. Provided by IHSNot for ResaleNo
48、reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97547 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 11 DSCC FORM 2234 APR 97 4. VERIFICATION 4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall no
