1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Update drawing boilerplate. 02-09-06 Raymond Monnin B Update drawing. -gz 07-02-05 Joseph Rodenbeck C Added a class E device. Updated paragraphs 3.1 and 4.2. Added paragraph 4.3.6 in section 4 for listing the class E exceptions. Added the class E
2、 part numbers in the Standard Microcircuit Drawing Bulletin page. -sld 10-05-02 Charles F. Saffle D Table I; Changed the max limit for IDD2from “14.5 mA“ to “17.0 mA“. Updated drawing paragraphs. -sld 12-12-05 Charles F. Saffle REV SHEET REV SHEET REV STATUS REV D D D D D D D D D D OF SHEETS SHEET 1
3、 2 3 4 5 6 7 8 9 10 PMIC N/A PREPARED BY Steve Duncan DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil/ STANDARD MICROCIRCUIT DRAWING CHECKED BY Michael Jones THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Kendall Cottongim MICROCIRCUIT, HYBRID, LIN
4、EAR, SINGLE CHANNEL, OPTICAL COUPLER AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 97-12-18 AMSC N/A REVISION LEVEL D SIZE A CAGE CODE 67268 5962-97557 SHEET 1 OF 10 DSCC FORM 2233 APR 97 5962-E112-13 Provided by IHSNot for ResaleNo reproduction or networking permitted without lice
5、nse from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97557 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case
6、outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 - 97557 01 H P X Federal RHA Device De
7、vice Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. Device classes H and K RHA marked devices shall meet the MIL-PRF-38534 specified R
8、HA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) shall identify the circuit function as follows: Device type Generic number Circuit function 01 HCPL-7851, ACPL-785E Optical coupler, single channel 1.2.3
9、 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product
10、assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space applications. H Standard military quality class level. This level is intended for use in applications where non-space high reliability devices
11、 are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conforman
12、ce inspections (Group A, B, C, and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be revi
13、ewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a limited temperature range. 1.2.4 Case outline(s). The case outline(s) s
14、hall be as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style P CDIP2-T8 8 Dual-in-line X See figure 1 8 Dual-in-line Y See figure 1 8 Dual-in-line Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-
15、STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97557 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 3 DSCC FORM 2234 APR 97 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Storage temperature range (TS) . -65C to +150C Su
16、pply voltage range (VDD1), (VDD2) . 0.0 V to 5.5 V Steady-state input voltage range (VIN+, VIN-) -2.0 V to VDD1+ 0.5 V 2/ 2 second transient input voltage range -6.0 V to VDD1+ 0.5 V 2/ Output voltage range (VOUT+, VOUT-) . -0.5 V to VDD2+ 0.5 V Junction temperature (TJ) +175C Lead solder temperatur
17、e (soldering, 10 seconds) +260C (1.6 mm below seating plane) 1.4 Recommended operating conditions. Supply voltage range . +4.5 V dc minimum to +5.5 V dc maximum Input voltage range -200 mV dc minimum to +200 mV dc maximum Ambient operating temperature range (TA) -55C to +125C 2. APPLICABLE DOCUMENTS
18、 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE
19、SPECIFICATION MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard M
20、icrocircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the e
21、vent of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The indi
22、vidual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 may include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applic
23、able device class. Therefore, the tests and inspections herein may not be performed for the applicable device class (see MIL-PRF-38534). Furthermore, the manufacturer may take exceptions or use alternate methods to the tests and inspections herein and not perform them. However, the performance requi
24、rements as defined in MIL-PRF-38534 shall be met for the applicable device class. Class E parts are defined in paragraph 4.3.6 and as specified herein. 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade perform
25、ance and affect reliability. 2/ If VIN-is brought above VDD1- 2 V with respect to GND1 an internal test mode may be activated. This test mode is not intended for customer use. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAW
26、ING SIZE A 5962-97557 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 4 DSCC FORM 2234 APR 97 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case
27、 outline(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.2.3 Propagation delay times test circuit. The propagation delay times test circuit shall be as specified on figure 3. 3.2.4 Common mode rejecti
28、on test circuit. The common mode rejection test circuit shall be as specified on figure 4. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperatu
29、re range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be mark
30、ed with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from
31、the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufa
32、cturer and be made available to the preparing activity (DLA Land and Maritime -VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DLA Land an
33、d Maritime -VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. VERIFICA
34、TION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 4.2 Screening. Scre
35、ening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to
36、 either DLA Land and Maritime -VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TAshall be +125C minimum. Classes H, G, and D s
37、hall be 160 hours minimum. Classes K and E shall be 320 hours minimum. b. The class E device(s) shall meet the class K screening requirements of MIL-PRF-38534, except as specified herein. c. Interim and final electrical test parameters shall be as specified in table II herein, except interim electri
38、cal parameter tests prior to burn-in are optional at the discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97557 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D
39、SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TC +125C 4.5 V (VDD1, VDD2) 5.5 V unless otherwise specified Group A subgroups Device type Limits Unit Min Max Input offset voltage VOS1/ 1,2,3 01 -1.0 5.0 mV Gain G -200 mV VIN+ +200 mV, VIN-=
40、 0 V 1 01 7.60 8.4 V/V 2,3 7.36 8.64 200 mV non-linearity NL200-200 mV VIN+ +200 mV, VIN-= 0 V 2/ 1 01 0.2 % 2,3 0.8 100 mV non-linearity NL100-100 mV VIN+ +100 mV, VIN-= 0 V 2/ 1 01 0.1 % 2,3 0.2 Output common mode voltage VOCM-400 mV VIN+ +400 mV, VIN-= 0 V 1,2,3 01 2.20 2.80 V Input supply curren
41、t IDD1-400 mV VIN+ +400 mV, VIN-= 0 V 1,2,3 01 15.5 mA Output supply current IDD2-400 mV VIN+ +400 mV, VIN-= 0 V 1,2,3 01 17.0 mA Input-output insulation leakage current 3/ II-O RH = 45%, t = 5 seconds, VI-O= 1500 V dc, TA= +25C 1 01 1.0 A Common mode rejection CMRVCM= 1 kV, TA= +25C 4/ 5/ 9 01 5 kV
42、/s Propagation delay to 50% tPD50VIN+= 0 to 100 mV step 9,10,11 01 7.5 s Propagation delay to 90% tPD90VIN+= 0 to 100 mV step 9,10,11 01 11.0 s Rise/Fall time (10% - 90%) tR/FVIN+= 0 to 100 mV step 9,10,11 01 7.5 s Small signal bandwidth (-3 dB) 6/ f-3 dB9,10,11 01 45 kHz 1/ Exact offset value is de
43、pendent on layout of external bypass capacitors. 2/ Non-linearity is defined as half of the peak-to-peak output deviation from the best fit gain line, expressed as a percentage of the full scale differential output voltage. 3/ Device considered a two-terminal device. Pins 1, 2, 3, and 4 are shorted
44、together and pins 5, 6, 7, and 8 are shorted together. 4/ CMR (also known as IMP or Isolation Mode Rejection) specifies the minimum rate of rise of a common mode signal applied across the isolation boundary at which small output perturbations begin to occur. These output perturbations can occur with
45、 both the rising and falling edges of the common mode waveform and may be of either polarity. A CMR failure is defined as a perturbation exceeding 200 mV at the output of the CMR test circuit. 5/ Parameters are tested as part of device initial characterization and after design and process changes on
46、ly. Parameters shall be guaranteed to the limits specified in table I for all lots not specifically tested. 6/ The small signal bandwidth (f-3 dB) test is guaranteed by the rise/fall time test. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD
47、 MICROCIRCUIT DRAWING SIZE A 5962-97557 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 6 DSCC FORM 2234 APR 97 Case outline X. Symbol Millimeters Inches Min Max Min Max A 4.57 .180 A1 1.40 1.65 .055 .065 b 0.41 0.51 .016 .020 c 0.18 0.33 .007 .013 D 9.40 9.91 .370 .390 e 2.29
48、 2.79 .090 .110 E 9.65 9.91 .380 .390 E1 8.13 .320 L 1.07 1.32 .042 .052 S 0.89 1.27 .035 .050 Case outline Y. Symbol Millimeters Inches Min Max Min Max A 4.32 .170 A1 1.14 1.40 .045 .055 b 0.41 0.51 .016 .020 c 0.18 0.33 .007 .013 D 9.40 9.91 .370 .390 e 2.29 2.79 .090 .110 E 8.13 .320 eA 7.37 7.87 .290 .310 Q 0.51 .020 S 0.89 1.27 .035 .050 NOTES: 1. The U.S. government preferred system of measurement is the metric SI. This item was designed using inch-pound units of measurement. In cas
