1、REVISIONSLTR DESCRIPTION DATE (YR-MO-DA) APPROVEDA Table I, delete; reference output, output voltage test. 98-04-15 K. A. CottongimREV SHEETREVSHEETREV STATUSOF SHEETSREV AAAAAAAAAAAASHEET 12345678910112PMIC N/APREPARED BY Gary Zahn DEFENSE SUPPLY CENTER COLUMBUS P. O. BOX 3990 COLUMBUS, OHIO 43216-
2、5000 STANDARDMICROCIRCUITDRAWINGTHIS DRAWING IS AVAILABLEFOR USE BY ALLDEPARTMENTSAND AGENCIES OF THEDEPARTMENT OF DEFENSEAMSC N/A CHECKED BYMichael C. JonesMICROCIRCUIT, HYBRID, ANALOG TO DIGITALCONVERTER, 10-BIT, 100 MSPSAPPROVED BYKendall A. CottongimDRAWING APPROVAL DATE97-06-24SIZEACAGE CODE672
3、685962-97563REVISION LEVELASHEET 1 OF 12DSCC FORM 2233APR 97 5962-E279-98DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGDEFENSE SUPPLY CENTE
4、R COLUMBUSCOLUMBUS, OHIO 43216-5000SIZEA5962-97563REVISION LEVELASHEET2DSCC FORM 2234APR 971. SCOPE1.1 Scope. This drawing documents five product assurance classes, class D (lowest reliability), class E, (exceptions), class G(lowest high reliability), class H (high reliability), and class K, (highes
5、t reliability) and a choice of case outlines and lead finishesare available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardnessassurance levels are reflected in the PIN.1.2 PIN. The PIN shall be as shown in the following example:5962 - 97563 01 H
6、 X C G0DG0D G0D G0D G0D G0DG0DG0D G0D G0D G0D G0DG0D G0D G0D G0D G0D G0D Federal RHA Device Device Case Leadstock class designator type class outline finishdesignator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3)/ Drawing number 1.2.1 Radiation hardness assurance (RHA) des
7、ignator. Device classes H and K RHA marked devices shall meet theMIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHAdevice.1.2.2 Device type(s). The device type(s) shall identify the circuit function as follows:Device type Generi
8、c number Circuit function01 AD9070TD 10-bit, 100 MSPS, analog-to-digital converter1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level asfollows:Device class Device performance documentationD, E, G, H, or K Certification and qua
9、lification to MIL-PRF-385341.2.4 Case outline(s). The case outline(s) shall be as designated in MIL-STD-1835 and as follows:Outline letter Descriptive designator Terminals Package styleX CDIP2-T28 28 Dual-in-line1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. Provided by I
10、HSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGDEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000SIZEA5962-97563REVISION LEVELASHEET3DSCC FORM 2234APR 971.3 Absolute maximum ratings. 1/Negative supply voltage (V ) . -6 V dcEEAnal
11、og inputs V - 1 V to +1.0 VEEDigital inputs V to 0.0 VEEV , V V to 0.0 VREF IN REF OUT EEDigital output current 20 mAThermal impedances:Junction to case ( ). 8(C/WJCAmbient to case ( ). 43(C/WCAJunction to ambient ( ) 51(C/WJAJunction temperature (T ) +175(CJCase temperature (T ) +150(CCLead tempera
12、ture soldering (10 seconds) +300(CStorage temperature range . -65(C to +150(C1.4 Recommended operating conditions.Negative supply voltage (V ) . -5 V dcEEAmbient operating temperature range . -55(C to +125(C2. APPLICABLE DOCUMENTS2.1 Government specification, standards, and handbook. The following s
13、pecification, standards, and handbook form a part ofthis drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed in theissue of the Department of Defense Index of Specifications and Standards (DoDISS) and supplement thereto, cited in thesoli
14、tation.SPECIFICATIONDEPARTMENT OF DEFENSEMIL-PRF-38534 - Hybrid Microcircuits, General Specification for.STANDARDSDEPARTMENT OF DEFENSEMIL-STD-883 - Test Methods and Procedures for Microelectronics.MIL-STD-973 - Configuration Management.MIL-STD-1835 - Microcircuit Case Outlines.HANDBOOKDEPARTMENT OF
15、 DEFENSEMIL-HDBK-780 - Standard Microcircuit Drawings.(Unless otherwise indicated, copies of the specification, standards, and handbook are available from the StandardizationDocument Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)2.2 Order of precedence. In the event of a
16、conflict between the text of this drawing and the references cited herein, the text ofthis drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless aspecific exemption has been obtained.1/ Stresses above the absolute maximum rating may cause perm
17、anent damage to the device. Extended operation at themaximum levels may degrade performance and affect reliability.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGDEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000SIZE
18、A5962-97563REVISION LEVELASHEET4DSCC FORM 2234APR 973. REQUIREMENTS3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be inaccordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 may include the performance of all tests herein or asdes
19、ignated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class. Therefore, the tests and inspections herein may not be performed for the applicable device class (see MIL-PRF-38534). Futhermore, the manufacturers may take exceptions or use alternate
20、methods to the tests and inspections herein and notperform them. However, the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable deviceclass.3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in
21、MIL-PRF-38534 and herein.3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein.3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1.3.2.3 Output coding table(s). The output coding table(s) shall be as specified on figure 2.3.2.4 Timing
22、diagram(s). The timing diagram(s) shall be as specified on figure 3.3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics areas specified in table I and shall apply over the full specified operating temperature range.3.4 Electrical
23、test requirements. The electrical test requirements shall be the subgroups specified in table II. The electricaltests for each subgroup are defined in table I.3.5 Marking of Device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked withthe PIN listed in 1.
24、2 herein. In addition, the manufacturers vendor similar PIN may also be marked as listed in QML-38534.3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device describedherein shall maintain the electrical test data (variables format) from the ini
25、tial quality conformance inspection group A lot sample,for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for thosewhich, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer an
26、d bemade available to the preparing activity (DSCC-VA) upon request.3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to thisdrawing. The certificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacture
27、rs product meetsthe performance requirements of MIL-PRF-38534 and herein.3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot ofmicrocircuits delivered to this drawing.4. QUALITY ASSURANCE PROVISIONS4.1 Sampling and inspection. Sam
28、pling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modifiedin the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, orfunction as described herein.Provided by IHSNot for ResaleNo reproduction or networking
29、permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGDEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000SIZEA5962-97563REVISION LEVELASHEET5DSCC FORM 2234APR 97TABLE I. Electrical performance characteristics. G0DG0D G0D G0DG0D G0DTest G0D Symbol G0D Conditions 1/ G0D Group A G0D De
30、vice G0D Limits G0D UnitG0DG0D -55(C T +125(C G0D subgroups G0D type G0D G0DCG0DG0D unless otherwise specified G0D G0DG0DG0DG0DG0DG0D G0DG0DG0D Min G0D Max G0DG0DG0D G0D G0DG0DG0DG0DDC AccuracyG0DG0D G0D G0DG0DG0DG0DDifferential nonlinearity G0DDLE G0DG0D 4 G0D 01 G0D -1.0 G0D +1.25 G0DLSBG0DG0D G0D
31、 G0DG0DG0DG0DG0DG0D G0D 5, 6 G0DG0D -1.0 G0D +2.00 G0DG0DG0D G0D G0DG0DG0DG0DIntegral nonlinearity G0DILE G0DG0D 4 G0D 01 G0D -1.5 G0D +1.5 G0DLSBG0DG0D G0D G0DG0DG0DG0DG0DG0D G0D 5, 6 G0DG0D -2.25 G0D +2.25 G0DG0DG0D G0D G0DG0DG0DG0DGain error 2/ G0DAE G0DG0D 4 G0D 01 G0D -4 G0D +4 G0D%FSG0DG0D G0D
32、 G0DG0DG0DG0DG0DG0D G0D 5, 6 G0DG0D -6 G0D +6 G0DAnalog InputG0DG0D G0D G0DG0DG0DG0DInput offset voltage G0DV G0DG0D 1 G0D 01 G0D -18 G0D +18 G0DmVIN OFFG0DG0D G0D G0DG0DG0DG0DG0DG0D G0D 2, 3 G0DG0D -20 G0D +20 G0DG0DG0D G0D G0DG0DG0DG0DInput resistance G0DR G0DG0D 1, 2, 3 G0D 01 G0D 10 G0DG0Dk6ING0
33、DG0D G0D G0DG0DG0DG0DG0DG0D G0D G0DG0DG0DG0DInput bias current G0DI G0DG0D 1, 2, 3 G0D 01 G0DG0D 200 G0DAIBG0DG0D G0D G0DG0DG0DG0DSwitching PerformanceG0DG0D G0D G0DG0DG0DG0DMaximum conversion rate G0DCVR G0DG0D 9, 10, 11 G0D 01 G0D 100 G0DG0DMSPSMAXG0DG0D G0D G0DG0DG0DG0DG0DG0D G0D G0DG0DG0DG0DEnco
34、de pulse width high 3/ G0Dt G0DSee figure 3, T = +25(C G0D 9 G0D 01 G0D 4.5 G0D 13 G0DnsEH AG0DG0D G0D G0DG0DG0DG0DG0DG0D G0D G0DG0DG0DG0DEncode pulse width low 3/ G0Dt G0DSee figure 3, T = +25(C G0D 9 G0D 01 G0D 4.5 G0D 13 G0DnsEL AG0DG0D G0D G0DG0DG0DG0DG0DG0D G0D G0DG0DG0DG0DOutput valid time G0D
35、t G0DSee figure 3, 4/ G0D 9, 10, 11 G0D 01 G0D 1.5 G0DG0DnsVG0DG0D G0D G0DG0DG0DG0DG0DG0D G0D G0DG0DG0DG0DOutput propagation delay G0Dt G0DSee figure 3, 4/ G0D 9, 10, 11 G0D 01 G0DG0D 4.0 G0DnsPDG0DG0D G0D G0DG0DG0DG0DSee footnotes at end of table.Provided by IHSNot for ResaleNo reproduction or netw
36、orking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGDEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000SIZEA5962-97563REVISION LEVELASHEET6DSCC FORM 2234APR 97TABLE I. Electrical performance characteristics - Continued.G0DG0D G0D G0DG0D G0DTest G0D Symbol G0D Conditions 1/
37、G0D Group A G0D Device G0D Limits G0D UnitG0DG0D -55(C T +125(C G0D subgroups G0D type G0D G0DCG0DG0D unless otherwise specified G0D G0DG0DG0DG0DG0DG0D G0DG0DG0D Min G0D Max G0DG0DG0D G0D G0DG0DG0DG0DSwitching Performance - Continued.G0DG0D G0D G0DG0DG0DG0DOutput rise time G0Dt G0DG0D 9, 10, 11 G0D
38、01 G0DG0D 1.2 G0DnsrG0DG0D G0D G0DG0DG0DG0DG0DG0D G0D G0DG0DG0DG0DOutput fall time G0Dt G0DG0D 9, 10, 11 G0D 01 G0DG0D 1.2 G0DnsfG0DG0D G0D G0DG0DG0DG0DDigital InputsG0DG0D G0D G0DG0DG0DG0DLogic “1“ current G0DI G0DG0D 4, 5, 6 G0D 01 G0DG0D 10 G0DAINHG0DG0D G0D G0DG0DG0DG0DG0DG0D G0D G0DG0DG0DG0DLog
39、ic “0“ current G0DI G0DG0D 4, 5, 6 G0D 01 G0DG0D 10 G0DAINLG0DG0D G0D G0DG0DG0DG0DDigital OutputsG0DG0D G0D G0DG0DG0DG0DLogic “1“ voltage G0DV G0DG0D 4, 5, 6 G0D 01 G0D -1.15 G0D G0DVOUTHG0DG0D G0D G0DG0DG0DG0DG0DG0D G0D G0DG0DG0DG0DLogic “0“ current G0DV G0DG0D 4, 5, 6 G0D 01 G0DG0D -1.60 G0DVOUTLG
40、0DG0D G0D G0DG0DG0DG0DPower SupplyG0DG0D G0D G0DG0DG0DG0DV supply current G0DI G0DV = -5 V dc G0D 1, 2, 3 G0D 01 G0D 80 G0D 150 G0DmAEE EE EEG0DG0D G0D G0DG0DG0DG0DG0DG0D G0D G0DG0DG0DG0DPower dissipation G0DP G0D 5/ G0D 1, 2, 3 G0D 01 G0D 400 G0D 750 G0DmWDG0DG0D G0D G0DG0DG0DG0DG0DG0D G0D G0DG0DG0
41、DG0DPower supply sensitivity G0DPSS G0DT = +25(C, 6/ G0D 1 G0D 01 G0DG0D 0.012 G0DV/VAG0DG0D G0D G0DG0DG0DG0DDynamic PerformanceG0DG0D G0D G0DG0DG0DG0DSignal-to-noise ratio G0DSNR G0DT = +25(C, f = 10.3 MHz G0D 4 G0D 01 G0D 55 G0DG0DdBAIN(without harmonics) G0DG0D 7/ G0DG0DG0DG0DG0DG0DG0D G0D G0DG0D
42、G0DG0DG0DG0D f = 41 MHz G0DG0DG0D 54 G0DG0DING0DG0D G0D G0DG0DG0DG0DG0DG0D G0D G0DG0DG0DG0DSignal-to-noise ratio G0DSINAD G0DT = +25(C, f = 10.3 MHz G0D 4 G0D 01 G0D 54 G0DG0DdBAIN(with harmonics) G0DG0D 7/ G0DG0DG0DG0DG0DG0DG0D G0D G0DG0DG0DG0DG0DG0D f = 41 MHz G0DG0DG0D 51 G0DG0DING0DG0D G0D G0DG0
43、DG0DG0DSee footnotes at end of table.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGDEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000SIZEA5962-97563REVISION LEVELASHEET7DSCC FORM 2234APR 97TABLE I. Electrical perfor
44、mance characteristics - Continued.G0DG0D G0D G0DG0D G0DTest G0D Symbol G0D Conditions 1/ G0D Group A G0D Device G0D Limits G0D UnitG0DG0D -55(C T +125(C G0D subgroups G0D type G0D G0DCG0DG0D unless otherwise specified G0D G0DG0DG0DG0DG0DG0D G0DG0DG0D Min G0D Max G0DG0DG0D G0D G0DG0DG0DG0DDynamic Per
45、formance - Continued.G0DG0D G0D G0DG0DG0DG0DEffective number of bits G0DENB G0DT = +25(C, f = 10.3 MHz G0D 4 G0D 01 G0D 8.8 G0DG0DBitsAING0DG0D 7/ G0DG0DG0DG0DG0DG0DG0D G0D G0DG0DG0DG0DG0DG0D f = 41 MHz G0DG0DG0D 8.3 G0DG0DING0DG0D G0D G0DG0DG0DG0DG0DG0D G0D G0DG0DG0DG0D2nd harmonic distortion G0DHD
46、2 G0DT = +25(C, f = 10.3 MHz G0D 4 G0D 01 G0D 63 G0DG0DdBcAING0DG0D 7/ G0DG0DG0DG0DG0DG0DG0D G0D G0DG0DG0DG0DG0DG0D f = 41 MHz G0DG0DG0D 58 G0DG0DING0DG0D G0D G0DG0DG0DG0DG0DG0D G0D G0DG0DG0DG0D3rd harmonic distortion G0DHD3 G0DT = +25(C, f = 10.3 MHz G0D 4 G0D 01 G0D 65 G0DG0DdBcAING0DG0D 7/ G0DG0D
47、G0DG0DG0DG0DG0D G0D G0DG0DG0DG0DG0DG0D f = 41 MHz G0DG0DG0D 57 G0DG0DING0DG0D G0D G0DG0DG0DG0D1/ V = -5 V dc, Encode = 100 MSPS, outputs loaded with 100 6 to -2 V, unless otherwise specified.EE2/ Gain error and gain temperature coefficient are based on the analog-to-digital converter only, (with a f
48、ixed -2.5 V externalreference).3/ Parameter is guaranteed by design and characterization testing.4/ t and t are measured from the threshold crossing of the ENCODE input to the 50% levels of the digital outputs. TheVPDoutput ac load during test is 10 pF.5/ Power dissipation is measured under the following conditions: fs = 100MSPS, analog i
