DLA SMD-5962-97585 REV A-2006 MICROCIRCUIT DIGITAL BIPOLAR ADVANCED SCHOTTKY TTL OCTAL BUFFERS W ACTIVE LOW ENABLED 3-STATE INVERTED OUTPUTS MONOLITHIC SILICON《微型电路 数字型 双极 改进型肖特基晶体.pdf

上传人:unhappyhay135 文档编号:701225 上传时间:2019-01-01 格式:PDF 页数:14 大小:96.63KB
下载 相关 举报
DLA SMD-5962-97585 REV A-2006 MICROCIRCUIT DIGITAL BIPOLAR ADVANCED SCHOTTKY TTL OCTAL BUFFERS W ACTIVE LOW ENABLED 3-STATE INVERTED OUTPUTS MONOLITHIC SILICON《微型电路 数字型 双极 改进型肖特基晶体.pdf_第1页
第1页 / 共14页
DLA SMD-5962-97585 REV A-2006 MICROCIRCUIT DIGITAL BIPOLAR ADVANCED SCHOTTKY TTL OCTAL BUFFERS W ACTIVE LOW ENABLED 3-STATE INVERTED OUTPUTS MONOLITHIC SILICON《微型电路 数字型 双极 改进型肖特基晶体.pdf_第2页
第2页 / 共14页
DLA SMD-5962-97585 REV A-2006 MICROCIRCUIT DIGITAL BIPOLAR ADVANCED SCHOTTKY TTL OCTAL BUFFERS W ACTIVE LOW ENABLED 3-STATE INVERTED OUTPUTS MONOLITHIC SILICON《微型电路 数字型 双极 改进型肖特基晶体.pdf_第3页
第3页 / 共14页
DLA SMD-5962-97585 REV A-2006 MICROCIRCUIT DIGITAL BIPOLAR ADVANCED SCHOTTKY TTL OCTAL BUFFERS W ACTIVE LOW ENABLED 3-STATE INVERTED OUTPUTS MONOLITHIC SILICON《微型电路 数字型 双极 改进型肖特基晶体.pdf_第4页
第4页 / 共14页
DLA SMD-5962-97585 REV A-2006 MICROCIRCUIT DIGITAL BIPOLAR ADVANCED SCHOTTKY TTL OCTAL BUFFERS W ACTIVE LOW ENABLED 3-STATE INVERTED OUTPUTS MONOLITHIC SILICON《微型电路 数字型 双极 改进型肖特基晶体.pdf_第5页
第5页 / 共14页
点击查看更多>>
资源描述

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Update drawing to current requirements. Editorial changes throughout. - gap 06-12-12 Raymond Monnin REV SHET REV SHET REV STATUS REV A A A A A A A A A A A A A OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 PMIC N/A PREPARED BY Larry E. Shaw DEFENS

2、E SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Tuan D. Nguyen COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Raymond L. Monnin MICROCIRCUIT, DIGITAL, BIPOLAR, ADVANCED SCHOTTKY TTL, OCTAL BUFFERS W/ACTIVE AND AGENC

3、IES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 97-04-30 LOW ENABLED 3-STATE INVERTED OUTPUTS, MONOLITHIC SILICON AMSC N/A REVISION LEVEL A SIZE A CAGE CODE 67268 5962-97585 SHEET 1 OF 13 DSCC FORM 2233 APR 97 5962-E083-07 Provided by IHSNot for ResaleNo reproduction or networking permitted w

4、ithout license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97585 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device cla

5、sses Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN. 1.2 PIN. The PIN is as shown in t

6、he following example: 5962 - 97585 01 Q R X Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2)Device class designatorCase outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the

7、 MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The devic

8、e type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 54F240 Octal buffers w/active low enabled 3-state inverted outputs 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Devi

9、ce class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) ar

10、e as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style R GDIP1-T20 or CDIP2-T20 20 Dual-in-line package S GDFP2-F20 or CDFP3-F20 20 Flat package 2 CQCC1-N20 20 Square leadless chip carrier 1.2.5 Lead finish. The lead finish is as specified in MI

11、L-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97585 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION

12、LEVEL A SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ Supply voltage range (VCC) . -0.5 V dc to 7.0 V dc Input voltage range (VI) . -1.2 V dc to 7.0 V dc Input current range -30 mA to 5 mA Voltage range applied to any output in the disabled or power-off state . -0.5 V to 5.5 V Volta

13、ge range applied to any output in the high state -0.5 V to VCC Current into any output in the low state . 96 mA Operating free-air temperature range (TA) . -55C to +125C Maximum power dissipation (PD) . 71.5 mW Storage temperature range . -65C to +150C Thermal resistance, junction-to-case (JC) See M

14、IL-STD-1835 Junction temperature (TJ) . 175C 1.4 Recommended operating conditions. Supply voltage range (VCC) +4.5 V dc to +5.5 V dc Minimum high level input voltage (VIH) . +2.0 V Maximum low level input voltage (VIL) . +0.8 V Input clamp current (IIK) . -18mA Maximum high level output current (IOH

15、) -12 mA Maximum low level output current (IOL) +48 mA Operating free-air temperature range (TA) . -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified h

16、erein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Micr

17、ocircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksea

18、rch/ or www.dodssp.daps.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence.

19、 Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. _ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliabil

20、ity. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97585 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The in

21、dividual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The indivi

22、dual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and h

23、erein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be a

24、s specified on figure 2. 3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3. 3.2.5 Test circuit and timing waveforms, The test circuit and timing waveforms shall be as specified on figure 4. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless

25、 otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified

26、 in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitation

27、s, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535

28、, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes

29、 Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of

30、 supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device c

31、lass M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this

32、 drawing. 3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class

33、 M, DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M

34、devices covered by this drawing shall be in microcircuit group number 9 (see MIL-PRF-38535, appendix A).Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97585 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 4321

35、8-3990 REVISION LEVEL A SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TC +125C Group A subgroups Limits Unit unless otherwise specified Min Max High level output voltage VOHVCC= 4.5 V 2/ IOH= -3 mA 1, 2, 3 2.4 V VCC= 4.5 V 2/ IOH= -12 m

36、A 2 Low level output voltage VOLVCC= 4.5 V 2/ IOL= 48 mA 1, 2, 3 0.55 V Input clamp voltage VIKVCC= 4.5 V II= -18 mA 1, 2, 3 -1.2 V High level input current IIHVCC= 5.5 V VI= 2.7 V 1, 2, 3 20 A Low level input current IILVCC= 5.5 V VI= 0.5 V 1, 2, 3 -1 mA Input current IIVCC= 5.5 V VI= 7 V 1, 2, 3 0

37、.1 mA Short circuit output current IOSVCC= 5.5 V 3/ VO= 0 V 1, 2, 3 -100 -225 mA Supply current ICCHVCC= 5.5 V Outputs high 1, 2, 3 29 mA ICCLOutputs low 75 ICCZOutputs disabled 63 Off-state output leakage current IOZHVCC= 5.5 V VO= 2.7 V 1, 2, 3 50 A IOZLVCC= 5.5 V VO= 0.5 V 1, 2, 3 -50 A Functiona

38、l tests See 4.4.1b, VCC= 4.5 V, 5.5 V 7, 8 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97585 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET

39、6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions 1/ -55C TC +125C Group A subgroups Limits Unit unless otherwise specified Min Max Propagation delay time, low- to-high level output, tPLH4/ 5/ 9 2.2 7 ns from any A to Y 10, 11 2.2 9 Propagati

40、on delay time, high- to-low level output, tPHL9 1.2 4.7 ns from any A to Y 10, 11 1.2 6 Output enable time, high level tPZH9 1.2 5.2 ns output, OE to Y 10, 11 1.2 6.5 Output enable time, low level tPZL9 3.2 9 ns output, OE to Y 10, 11 3.2 10.5 Output disable time, high level tPHZ9 1.2 5.3 ns output,

41、 OE to Y 10, 11 1.2 6.5 Output disable time, low level tPLZ9 1.2 8 ns output, OE to Y 10, 11 1.2 12.5 1/ Unused inputs that do not directly control the pin under test must be put at +2.5 V or - 0.4 V. No unused inputs shall exceed 5.5 V or go less than 0.0 V. No inputs shall be floated. 2/ All outpu

42、ts must be tested. In the case where only one input at VILmaximum or VIHminimum produces the proper state, the test must be performed with each input being selected as the VILmaximum or VIHminimum input. 3/ The output conditions have been chosen to produce a current that closely approximates one hal

43、f of the true short circuit output current, IOS. Not more than one output will be tested at one time and duration of the test condition shall not exceed one second. 4/ For group A subgroup 9, VCC= 5 V, CL= 50 pF, and RL= 500 . 5/ For group A subgroups 10, 11, VCC= 4.5 V to 5.5 V, CL= 50 pF, and RL=

44、500 . Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97585 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 7 DSCC FORM 2234 APR 97 Case outlinesR, S, and 2 Terminal number Ter

45、minal symbol 1 1 OE 2 1A1 3 2Y4 4 1A2 5 2Y3 6 1A3 7 2Y2 8 1A4 9 2Y1 10 GND 11 2A1 12 1Y4 13 2A2 14 1Y3 15 2A3 16 1Y2 17 2A4 18 1Y1 19 2 OE 20 VCCFIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRA

46、WING SIZE A 5962-97585 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 8 DSCC FORM 2234 APR 97 (each buffer) Inputs Output OE A Y L H L L L H H X Z H = High level voltage L = Low level voltage X = Irrelevant FIGURE 2. Truth table. FIGURE 3. Logic diagram. Provided by

47、IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97585 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 9 DSCC FORM 2234 APR 97 See notes on next sheet. FIGURE 4. Test circuit and timing wav

48、eforms. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97585 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 10 DSCC FORM 2234 APR 97 NOTES: 1. CLincludes probe and jig capacitance. 2. All input pulses are supplied by generators having the following characteristics: PRR 1 MHz, tr= tf 2.5 ns, duty cycle = 50%. 3. When measuring propagation delay times of 3-state output

展开阅读全文
相关资源
猜你喜欢
相关搜索

当前位置:首页 > 标准规范 > 国际标准 > 其他

copyright@ 2008-2019 麦多课文库(www.mydoc123.com)网站版权所有
备案/许可证编号:苏ICP备17064731号-1