1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Make correction to test circuit on Figure 5 on page 12. Update boilerplate.- LTG 00-08-08 Monica L. Poelking B Update boilerplate to MIL-PRF-38535 requirements. LTG 01-04-05 Thomas M. Hess C Update test condition for high level output voltage (VO
2、H) and low level output voltage (VOL) in table I. Update boilerplate paragraphs to current MIL-PRF-38535 requirements. - MAA 09-06-26 Thomas M. Hess REV SHEET REV C C SHEET 15 16 REV STATUS REV C C C C C C C C C C C C C C OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Kenneth
3、Rice DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil STANDARD MICROCIRCUIT DRAWING CHECKED BY Charles F. Saffle, Jr. THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Raymond Monnin MICROCIRCUIT, DIGITAL, LOW VOLTAGE CMOS, QUADRUPLE 2-INPUT POSITIVE-OR
4、GATES, MONOLITHIC SILICON AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 97-11-25 AMSC N/A REVISION LEVEL c SIZE A CAGE CODE 67268 5962-97618 SHEET 1 OF 16 DSCC FORM 2233 APR 97 5962-E357-09 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IH
5、S-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97618 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and spac
6、e application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5
7、962 - 97618 01 Q C A | | | | | | | | | | | |_ Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet
8、 the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The d
9、evice type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 54LVC32A Quadruple 2-Input Positive -OR Gate 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device class Device re
10、quirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in
11、 MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style C GDIP1-T14 or CDIP2-T14 14 Dual-in-line D GDFP1-F14 or CDFP2-F14 14 Flat pack 2 CQCC1-N20 20 Square leadless chip carrier 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classe
12、s Q and V or MIL-PRF-38535, appendix A for device class M.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97618 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 3 DSCC FORM 2234
13、 APR 97 1.3 Absolute maximum ratings. 1/ 2/ 3/ Supply voltage range (VCC) -0.5 V dc to +6.5 V dc DC input voltage range (VIN) -0.5 V dc to +6.5 V dc 4/ DC output voltage range (VOUT) . -0.5 V dc to VCC+0.5 V dc 4/ 5/ DC input clamp current (IIK) (VINVCC) 50 mA Continuous output current (IOL) (VOUT=
14、0.0 to VCC) . 50 mA Continuous current through VCCor GND . 100 mA Maximum power dissipation at TA= +55C (in still air) . 500 mW 6/ Storage temperature range (TSTG) . -65C to +150C Lead temperature (soldering, 10 seconds) +300C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Junction tem
15、perature (TJ) +150C 1.4 Recommended operating conditions. 2/ 3/ 7/ Supply voltage range (VCC): Operating . +2.0 V dc to +3.6 V dc Data retention only (minimum) . +1.5 V dc Minimum high level input voltage (VIH) (VCC= 2.7 V to 3.6 V) +2.0 V dc Maximum low level input voltage (VIL) (VCC= 2.7 V to 3.6
16、V) . +0.8 V dc Input voltage range (VIN) 0.0 V to +5.5 V dc Output voltage range (VOUT) . 0.0 V to VCCMaximum high level output current (IOH): VCC= 2.7V . -12 mA VCC= 3.0 V -24 mA Maximum low level output current (IOL): VCC= 2.7V . +12 mA VCC= 3.0 V +24 mA Input transition rise or fall time rate (t/
17、V) . 0.0 ns/V to 7.0 ns/V Case operating temperature range (TC) . -55C to +125C _ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Unless otherwise noted, all voltages a
18、re referenced to GND. 3/ The limits for the parameters specified herein shall apply over the full specified VCCrange and case temperature range of -55C to +125C. 4/ The input and output negative voltage ratings may be exceeded provided that the input and output clamp current ratings are observed. 5/
19、 The value of VCCis provided in the recommended operating conditions table. 6/ The maximum package power dissipation is calculated using a junction temperature of 150C and a board trace length of 750 mils. 7/ Unused inputs must be held high or low to prevent them from floating. Provided by IHSNot fo
20、r ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97618 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 5 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and ha
21、ndbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuit
22、s Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuit. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Sta
23、ndard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Non-Government publications. The following document(s) form a par
24、t of this document to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. ELECTRONIC INDUSTRIES ALLIANCE (EIA) EIA/JEDEC Standard No. 52 - Standard for Description of Low Voltage TTL-Compatible CMOS Logic Devices. (C
25、opies of these documents are available online at http:/www.eia.org/ or from the Electronic Industries Alliance, 2500 Wilson Boulevard, Arlington, VA 22201-3834.) 2.3 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this dra
26、wing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as spec
27、ified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN
28、 class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case out
29、lines. The case outlines shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3. 3
30、.2.5 Ground bounce test circuit and waveforms. The ground bounce test circuit and waveforms shall be as specified on figure 4. 3.2.6 Switching waveforms and test circuit. The switching waveforms and test circuit shall be as specified on figure 5. Provided by IHSNot for ResaleNo reproduction or netwo
31、rking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97618 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 5 DSCC FORM 2234 APR 97 3.3 Electrical performance characteristics and post-irradiation parameter limits. Unless otherwise spec
32、ified herein, the electrical performance characteristics and post-irradiation parameter limits are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II.
33、The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufac
34、turer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A.
35、3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a ce
36、rtificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL
37、-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the re
38、quirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8
39、Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DSCC, DSCC
40、s agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covere
41、d by this drawing shall be in microcircuit group number 36 (see MIL-PRF-38535, appendix A).Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97618 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISI
42、ON LEVEL C SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +2.0 V VCC +3.6 V Devicetype VCCGroup A subgroups Limits 3/ Unit unless otherwise specified Min Max High level output voltage 3006 VOH
43、For all inputs affecting output under test, VIH= 2.0 V or VIL= 0.8 V, For all other inputs VIN=VCCor GND IOH= -100 A All 2.7 V and 3.6 V 1,2,3 (VCC-0.2) V For all inputs affecting output under test, VIH= 2.0 V or VIL= 0.8 V, For all other inputs VIN=VCCor GND All 2.7 V 1,2,3 2.2 IOH= -12 mA 3.0 V 2.
44、4 For all inputs affecting output under test, VIH= 2.0 V or VIL= 0.8 V, For all other inputs VIN=VCCor GND IOH= -24 mA All 3.0 V 1,2,3 2.2 Low level output voltage 3007 VOLFor all inputs affecting output under test, VIH= 2.0 V or VIL= 0.8 V, For all other inputs VIN=VCCor GND IOL= +100 A All 2.7 V a
45、nd 3.6 V 1,2,3 0.2 V For all inputs affecting output under test, VIH= 2.0 V or VIL= 0.8 V For all other inputs VIN=VCCor GND IOL= +12 mA All 2.7 V 1,2,3 0.4 For all inputs affecting output under test, VIH= 2.0 V or VIL= 0.8 V For all other inputs VIN=VCCor GND IOL= +24 mA All 3.0 V 1,2,3 0.55 Input
46、current high 3010 IIHFor input under test, VIN= 5.5 V for all other inputs VIN=VCCor GND All 3.6 V 1,2,3 +5.0 A Input current low 3009 IIL For input under test, VIN= GND for all other inputs VIN=VCCor GND All 3.6 V 1,2,3 -5.0 Quiescent supply current 3005 ICCFor all other inputs VIN=VCCor GND IOUT=
47、0.0 A All 3.6 V 1,2,3 10.0 A See footnotes at end of table.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97618 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 7 DSCC FORM 223
48、4 APR 97 TABLE I. Electrical performance characteristics - Continued. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +2.0 V VCC +3.6 V Devicetype VCCGroup A subgroups Limits 3/ Unit unless otherwise specified Min Max Quiescent supply current delta TTL input levels 3005 ICCOne input at VCC - 0.6 V, other inputs at VCCor GND All 2.7 V and 3.6 V 1,2,3 500 A Input capacitance 3012 CINTC= +25C VIN= VCCor GND See 4.4.1c All 3.3 V 4 15 pF Power dissipation capacitance CPD4/ CL= 50 pF mi
