1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Drawing updated to reflect current requirements. gt 03-01-24 Raymond Monnin B Update paragraphs to current MIL-PRF-38535 requirements. - drw 10-03-12 Charles F. SaffleREV SHET REV SHET REV STATUS REV B B B B B B B B B B B B B B OF SHEETS SHEET 1
2、2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Rajesh Pithadia DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY Rajesh Pithadia
3、APPROVED BY Raymond Monnin MICROCIRCUIT, LINEAR, HIGH SPEED DIFFERENTIAL LINE DRIVER, MONOLITHIC SILICON DRAWING APPROVAL DATE 98-12-10 AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 67268 5962-97621 SHEET 1 OF 14 DSCC FORM 2233 APR 97 5962-E225-10 Provided by IHSNot for ResaleNo reproduction or network
4、ing permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97621 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliabil
5、ity (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is
6、 as shown in the following example: 5962 - 97621 01 Q E A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2)Device class designatorCase outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked de
7、vices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type
8、. The device type identifies the circuit function as follows: Device type Generic number Circuit function 01 55LVDS31 High speed differential line driver 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device class Dev
9、ice requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline. The case outline is as designated in
10、MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style E GDIP1-T16 or CDIP2-T16 16 Dual-in-line F GDFP2-F16 or CDFP3-F16 16 Flat pack 2 CQCC1-N20 20 Square leadless chip carrier 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes
11、 Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97621 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234
12、 APR 97 1.3 Absolute maximum ratings. 1/, 2/ Supply voltage range (VCC) . -0.5 V to 4 V Input voltage range (VI) -0.5 V to VCC+ 0.5 V Continuous total power dissipation, TA 25C: 3/ Cases E and 2 1375 mW Case F 1000 mW Thermal resistance, junction-to-case (JC) See MIL-STD-1835 Thermal resistance, jun
13、ction-to-ambient (JA): Case E 100C/W Case F . 150C/W Case 2 85C/W Storage temperature range (TSTG) -65C to +150C Lead temperature 1.6 mm (1/16 inch) from case for 10 seconds . +260C Junction temperature (TJ) . 150C/W 1.4 Recommended operating conditions. Supply voltage range (VCC) . 3 V to 3.6 V Hig
14、h-level input voltage (VIH) 2 V min Low-level input voltage (VIL) . 0.8 V max Operating free-air temperature (TA) -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the ext
15、ent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Metho
16、d Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.
17、dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothin
18、g in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. _ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/
19、 All voltages, except differential I/O bus voltages, are with respect to the network ground terminal. 3/ Derate factor at TA 25C for cases E and 2 is 11.0 mW/C and for case F is 8.0 mW/C. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICRO
20、CIRCUIT DRAWING SIZE A 5962-97621 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified here
21、in or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class lev
22、el B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlines. The
23、 case outlines shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unle
24、ss otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups spec
25、ified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limit
26、ations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-
27、38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device cl
28、asses Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved sour
29、ce of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for dev
30、ice class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to
31、 this drawing. 3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device
32、class M, DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device cla
33、ss M devices covered by this drawing shall be in microcircuit group number 53 (see MIL-PRF-38535, appendix A).Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97621 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHI
34、O 43218-3990 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TA+125C Group A subgroups Device type Limits Unit unless otherwise specified Min Max Differential output voltage magnitude VODRL= 100 , See figure 3 1, 2, 3 01 247
35、 454 mV Change in differential output voltage magnitude between logic states VODRL= 100 , See figure 3 1, 2, 3 01 -50 50 mV Steady-state common-mode output voltage VOC(SS)See figure 4 1, 2, 3 01 1.125 1.375 V Change in steady-state common-mode output voltage between logic states VOC(SS)See figure 4
36、1, 2, 3 01 -50 50 mV Peak-to-peak common-mode output voltage VOC(PP)See figure 4 1, 2, 3 01 150 mV Supply current ICCVIN= 0.8 V or 2 V, Enabled, No load 1, 2, 3 01 20 mA VIN= 0.8 V or 2 V, RL= 100 , Enabled 35 VIN= 0 V or VCC, Disabled 1 High level input current IIHVIH= 2 V 1, 2, 3 01 20 A Low level
37、 input current IILVIL= 0.8 V 1, 2, 3 01 10 A Short-circuit output current IOSVO(Y)or VO(Z)= 0 V 1, 2, 3 01 -24 mA VOD= 0 V 12 High impedance output current IOZVO= 0 or 2.4 V 1, 2, 3 01 1 A Power off output current IO(OFF)VCC= 0 V, VO= 2.4 V 1, 2, 3 01 4 A Functional test FT See 4.4.1c 7, 8A, 8B 01 P
38、ropagation delay time, low-to-high level output tpLHRL= 100 CL= 10 pF, See figure 3 4, 5, 6 01 0.5 4 ns Propagation delay time, high-to-low level output tpHLRL= 100 CL= 10 pF, See figure 3 4, 5, 6 01 1 4.5 ns Differential output signal rise time (20% to 80%) trRL= 100 CL= 10 pF, See figure 3 1/ 4, 5
39、, 6 01 0.4 1 ns See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97621 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 TAB
40、LE I. Electrical performance characteristics - continued. Test Symbol Conditions -55C TA+125C Group A subgroups Device type Limits Unit unless otherwise specified Min Max Differential output signal fall time (80% to 20%) tfRL= 100 CL= 10 pF, See figure 3 1/ 4, 5, 6 01 0.4 1 ns Pulse skew (tpHL tpLH)
41、 tsk(p)RL= 100 CL= 10 pF, See figure 3 1/ 4, 5, 6 01 0.6 ns Channel-to-channel output skew tsk(o)RL= 100 CL= 10 pF, See figure 3 1/, 2/ 4, 5, 6 01 0.6 ns Propagation delay time, high impedance to high level output tpZHSee figure 5 4, 5, 6 01 15 ns Propagation delay time, high impedance to low level
42、output tpZLSee figure 5 4, 5, 6 01 15 ns Propagation delay time, high level to high impedance output tpHZSee figure 5 4, 5, 6 01 17 ns Propagation delay time, low level to high impedance output tpLZSee figure 5 4, 5, 6 01 15 ns 1/ Tested initially and after any design or process changes which affect
43、 this parameter. 2/ Channel-to-channel output skew is the maximum delay time difference between drivers on the same device. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97621 DEFENSE SUPPLY CENTER COLUMBUS
44、 COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 Device type 01 Case outlines E and F 2 Terminal number Terminal symbol 1 1A NC 2 1Y 1A 3 1Z 1Y 4 G 1Z 5 2Z G 6 2Y NC 7 2A 2Z 8 GND 2Y 9 3A 2A 10 3Y GND 11 3Z NC 12 G 3A 13 4Z 3Y 14 4Y 3Z 15 4A G 16 VCCNC 17 - - - 4Z 18 - - - 4
45、Y 19 - - - 4A 20 - - - VCCNC = No connect FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97621 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET
46、8 DSCC FORM 2234 APR 97 INPUT A ENABLES OUTPUTS G G Y Z H H X H L L H X L H H X L H L L X L L H X L H Z Z OPEN H X L H OPEN X L L H H = High level L = Low level Z = High impedance (off) X = Irrelevant FIGURE 2. Truth table. Provided by IHSNot for ResaleNo reproduction or networking permitted without
47、 license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97621 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 9 DSCC FORM 2234 APR 97 NOTES: 1. All input pulses are supplied by a generator having the following characteristics: tror tf 1 ns, pulse repetition ra
48、te (PRR) = 50 Mpps, pulse width = 10 0.2 ns. 2. CL= includes instrumentation and fixture capacitance within 6 mm of the device under test (D.U.T). FIGURE 3. Test circuit with timing and voltage definitions for the differential output signal. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97621 DEFENSE SUPPLY CENTER CO
