1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Update boilerplate to MIL-PRF-38535 requirements. Editorial changes throughout. LTG 02-12-23 Thomas M. Hess B Add device Class V requirements as follows: Add footnote 3/ on table IIA, Add Burn-in and operating life test delta limits parameters on
2、 table IIB. Update boilerplate to current MIL-PRF-38535 requirements. - MAA 08-10-06 Thomas M. Hess REV SHEET REV B B B B B SHEET 15 16 17 18 19 REV STATUS REV B B B B B B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Joseph A. Kerby STANDARD MICROCIRCUIT DRAW
3、ING CHECKED BY Charles F. Saffle, Jr. DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil APPROVED BY Monica L. Poelking THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 97-12-04 MICROCIRCUIT, DIGITAL, LO
4、W VOLTAGE CMOS, OCTAL BUS TRANSCEIVER AND REGISTER WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 67268 5962-97626 SHEET 1 OF 19 DSCC FORM 2233 APR 97 5962-E467-08 Provided by IHSNot for Resale-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5
5、962-97626 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of
6、case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 97626 01 Q L A Federal RHA Device Devi
7、ce Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appro
8、priate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type G
9、eneric number Circuit function 01 54LVC646A Octal Bus transceiver and register with three-state outputs 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certi
10、fication to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter
11、 Descriptive designator Terminals Package style L GDIP3-T24 or CDIP4-T24 24 Dual-in-line K GDFP2-F24 or CDFP3-F24 24 Flat pack 3 CQCC1-N28 28 Square leadless chip carrier 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for d
12、evice class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHSSTANDARD MICROCIRCUIT DRAWING SIZE A 5962-97626 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ 2/ 3/ S
13、upply voltage range (VCC) -0.5 V dc to +6.5 V dc DC input voltage range (VIN): Except I/O ports . -0.5 V dc to +6.5 V dc 4/ I/O ports. -0.5 V dc to VCC+0.5 V dc 4/ 5/ DC output voltage range (VOUT ) (high impedance or power-off state) . -0.5 V dc to +6.5 V dc 4/ DC output voltage range (VOUT ) (high
14、 or low state) . -0.5 V dc to VCC+0.5 V dc 4/ 5/ DC input clamp current (IIK) (VINVCC) 50 mA Continuous output current (IOUT) (VOUT= 0 to VCC). 50 mA 5/ Continuous current through VCCor GND . 100 mA Maximum power dissipation at TA= +55C (in still air) 500 mW 6/ Storage temperature range (TSTG). -65C
15、 to +150C Lead temperature (soldering, 10 seconds). +300C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Junction temperature (TJ) +150C 1.4 Recommended operating conditions. 2/ 3/ 7/ Supply operating voltage range (VCC) +2.0 V dc to +3.6 V dc Supply operating minimum voltage (VCC) (Da
16、ta retention only) +1.5 V dc Minimum high level input voltage (VIH) (VCC= 2.7 V to 3.6 V) +2.0 V Maximum low level input voltage (VIL) (VCC= 2.7 V to 3.6 V). +0.8 V Input voltage range (VIN) 0.0 V to +5.5 V dc Output voltage range (VOUT): High or low state 0.0 V to VCC High impedance state. 0.0 V to
17、 5.5 V dc Maximum high level output current (IOH): VCC= 2.7V . -12 mA VCC= 3.0 V -24 mA Maximum low level output current (IOL): VCC= 2.7V . +12 mA VCC= 3.0 V +24 mA Maximum input rise and fall rate (t/V) 10 ns/V Case operating temperature range (TC). -55C to +125C _ 1/ Stresses above the absolute ma
18、ximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Unless otherwise noted, all voltages are referenced to GND. 3/ The limits for the parameters specified herein shall apply over the full specified VCCrang
19、e and case temperature range of -55C to +125C. 4/ The input and output negative voltage ratings may be exceeded provided that the input and output clamp current ratings are observed. 5/ The value of VCCis provided in the recommended operating conditions section 1.4. 6 The maximum package power dissi
20、pation is calculated using a junction temperature of 150C and a board trace length of 750 mils. 7/ Unused inputs must be held high or low to prevent them from floating. Provided by IHSNot for Resale-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97626 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 432
21、18-3990 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these doc
22、uments are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuit. MIL-STD-1835 - Interface Standard Electronic Com
23、ponent Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 R
24、obbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Non-Government publications. The following document(s) form a part of this document to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. ELECTRONIC INDU
25、STRIES ALLIANCE (EIA) JEDEC Standard No. 20 - Standard for Description of 54/74ACXXXX and 54/74ACTXXXX Advanced High-Speed CMOS Devices. (Copies of these documents are available online at http:/www.eia.org/ or from the Electronic Industries Alliance, 2500 Wilson Boulevard, Arlington, VA 22201-3834.)
26、 2.3 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMEN
27、TS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function
28、 as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as
29、specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3
30、Truth table. The truth table shall be as specified on figure 2. 3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3. 3.2.5 Ground bounce test circuit and waveforms. The ground bounce test circuit and waveforms shall be as specified on figure 4. 3.2.6 Switching waveforms and test
31、 circuit. The switching waveforms and test circuit shall be as specified on figure 5. Provided by IHSNot for Resale-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97626 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 3.3 Electrical performance c
32、haracteristics and post-irradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and post-irradiation parameter limits are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The
33、electrical test requirements shall be the subgroups specified in table IIA. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the
34、 entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Markin
35、g for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535,
36、 appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from
37、 a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V
38、, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shal
39、l be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.
40、9 Verification and review for device class M. For device class M, DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Mic
41、rocircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 37 (see MIL-PRF-38535, appendix A). Provided by IHSNot for Resale-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97626 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 4321
42、8-3990 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test and MIL-STD-883 test method 1/ Limits 3/ Unit Symbol Test conditions 2/ -55C TC +125C +2.0 V VCC +3.6 V unless otherwise specified VCCGroup A subgroups Min Max High level output voltage 3006 I
43、OH= -100 A 2.7 V and 3.6 V 1, 2, 3 VCC-0.2V 2.7 V 1, 2, 3 2.2 IOH= -12 mA 3.0 V 2.4 VOHFor all inputs affecting output under test VIN= VIHor VILFor all other inputs VIN= VCCor GND IOH= -24 mA 3.0 V 1, 2, 3 2.2 Low level output voltage 3007 VOLFor all inputs affecting output under test VIN= VIHor VIL
44、For all other inputs VIN= VCCor GND IOL= 100 A 2.7 V and 3.6 V 1, 2, 3 0.2 V IOL= 12 mA 2.7 V 1, 2, 3 0.4 IOL= 24 mA 3.0 V 1, 2, 3 0.55 Input current high 3010 IIH4/ For input under test, VIN= 5.5 V For all other inputs, VIN= VCCor GND 3.6 V 1, 2, 3 +5.0 A Input current low 3009 IIL4/ For input unde
45、r test, VIN= 0.0 V For all other inputs, VIN= VCCor GND 3.6 V 1, 2, 3 -5.0 A Off-state leakage current IOFFFor input/output under test, VINor VOUT= 5.5 V For all other inputs, VIN= VCCor GND 0.0 V 1, 2, 3 15.0 A Three-state output current high 3021 IOZH5/ For control inputs affecting output under te
46、st, VIN= 2.0 V or 0.8 V VOUT= 5.5 V 3.6 V 1, 2, 3 +30.0 A Three-state output current low 3020 IOZL5/ For control inputs affecting output under test, VIN= 2.0 V or 0.8 V VOUT= 0.0 V 3.6 V 1, 2, 3 -30.0 A For all inputs, VIN= VCCor GND IOUT= 0.0 A 3.6 V 1, 2, 3 20.0A Quiescent supply current 3005 ICC3
47、.6 V VIN 5.5 V IOUT= 0.0 A 6/ 3.6 V 1, 2, 3 20.0A See footnotes at end of table. Provided by IHSNot for Resale-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97626 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance c
48、haracteristics - Continued. Limits 3/ Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +2.0 V VCC +3.6 V unless otherwise specified VCCGroup A subgroups Min Max Unit Quiescent supply current delta, TTL input levels 3005 ICCOne input at VCC-0.6 V, Other inputs at VCCor GND 2.7 V and 3.6 V 1, 2, 3 500.0 A Input capacitance 3012 CINTC= +25C Vbias= 2.5 V See 4.4.1c Control Inputs 3.3 V 4 12.0 pF Input/output capacitance 3012 CI/OTC= +25C Vbias= 2.5V See 4.4.1c A or B ports 3.3 V 4 17.0 pF Power dissipation capacitance per buffer driver CPDf = 10 MHz See 4.4.1c
