1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Figure 1, case outlines T, U, Y, and Z, change to dimensioning and symbols format. Update drawing boilerplate. Editorial changes throughout. 02-07-24 Raymond Monnin B Table I, Input to output insulation leakage current test (IIO) conditions colum
2、n, change relative humidity = 45 % to relative humidity 65 %. 04-10-27 Raymond Monnin REV SHEET REV SHEET REV STATUS REV B B B B B B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Steve L. Duncan DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHEC
3、KED BY Michael Jones POST OFFICE BOX 3990 COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Kendall A. Cottongim MICROCIRCUIT, HYBRID, LINEAR, DUAL AND QUAD CHANNEL, OPTICAL COUPLER AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPR
4、OVAL DATE 97-11-12 AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 67268 5962-98001 SHEET 1 OF 14 DSCC FORM 2233 APR 97 5962-E015-05 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-98001 DEFENSE SUPPLY CENTER COLU
5、MBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Id
6、entifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 - 98001 01 K E X Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.
7、2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. Device classes H and K RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indi
8、cates a non-RHA device. 1.2.2 Device type(s). The device type(s) shall identify the circuit function as follows: 1/ Device type Generic number Circuit function 01 HCPL-268K, 66013-301 Dual channel, optocoupler with common supply voltage and ground connections 02 HCPL-563K Dual channel, optocoupler w
9、ith common supply voltage and ground connections 03 HCPL-663K Dual channel, optocoupler with separate supply voltage and ground connections 04 HCPL-665K Quad channel, optocoupler with common supply voltage and ground connections 1.2.3 Device class designator. This device class designator shall be a
10、single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance d
11、ocumentation K Highest reliability class available. This level is intended for use in space applications. H Standard military quality class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military
12、quality class. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C, and D). E Designates devices which
13、are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affe
14、ct system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a limited temperature range. 1/ The devices listed herein are available as class H microcircuits (high reliability) on 81028.Provided by IH
15、SNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-98001 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 1.2.4 Case outline(s). The case outline(s) shall be as designate
16、d in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style E CDIP2-T16 16 Dual-in-line F CDFP4-F Flat package P CDIP2-T8 8 Dual-in-line T See figure 1 16 Dual-in-line U See figure 1 16 Dual-in-line X CQCC1-N24 24 Square leadless chip carrier Y See figure 1 8 Dual
17、-in-line Z See figure 1 8 Dual-in-line 2 CQCC1-N20 20 Square leadless chip carrier 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Supply voltage (VCC) (1 minute maximum) 7 V dc Input current (each channel) . 40 mA dc ( 1 ms duration) Avera
18、ge input current (each channel) . 20 mA dc Storage temperature range. -65C to +150C Package power dissipation (each channel). 200 mW Lead temperature (soldering, 10 seconds) +260C Junction temperature (TJ) . +175C Input power dissipation (each channel). 35 mW Reverse input voltage (each channel). 5
19、V dc Output current (IO) (each channel) 25 mA dc Output power dissipation (each channel) 40 mW Output voltage (VO) (each channel) 7 V dc Enable input voltage (VE) 5.5 V dc (device type 03 only) 1.4 Recommended operating conditions. Supply voltage range (VCC) . 4.5 V dc to 5.5 V dc High level input c
20、urrent 2/ . 12.5 mA minimum to 16.0 mA maximum (each channel) Low level input current 250 A dc maximum (each channel) Normalized fanout (TTL load) . 6 maximum (each channel) Case operating temperature range (TC) -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handb
21、ooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38534 - Hybrid Microcircuits,
22、 General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the ma
23、ximum levels may degrade performance and affect reliability. 2/ The 12.5 mA condition permits at least 20 percent hFE(CTR) degradation. The initial switching threshold is 10 mA dc or less. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICR
24、OCIRCUIT DRAWING SIZE A 5962-98001 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents
25、are available online at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the ref
26、erences cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G
27、, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 may include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or op
28、timize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3.2 Design,
29、construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be
30、as specified on figure 2. 3.2.3 Switching test circuit(s) and waveform(s). The switching test circuit(s) and waveform(s) shall be as specified on figure 3. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in ta
31、ble I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) sh
32、all be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein
33、 shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall
34、be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DSCC-VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of comp
35、liance (original copy) submitted to DSCC-VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered
36、 to this drawing. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-98001 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance
37、characteristics. Limits Test Symbol Conditions -55C TC +125C unless otherwise specified Group A subgroups Device type Min Max Unit Low level output voltage VOLVCC= 5.5 V, IF= 10 mA, IOL= 10 mA 1/ 2/ 1,2,3 All 0.6 V Current transfer ratio hFE(CTR) VO= 0.6 V, IF= 10 mA, VCC= 5.5 V 1/ 1,2,3 All 100 % H
38、igh level output current IOHVCC= 5.5 V, Vo= 5.5 V, IF= 250 A 1/ 1,2,3 All 250 A 01,02 28 03 14 High level supply current ICCHVCC= 5.5 V, IF1= IF2= 0 mA, IF3= IF4= 0 mA 3/ 1,2,3 04 42 mA 01,02 36 03 18 Low level supply current ICCLVCC= 5.5 V, IF1= IF2= 20 mA, IF3= IF4= 20 mA 3/ 1,2,3 04 50 mA 1,2 01
39、1.75 3 01 1.85 Input forward voltage VFIF= 20 mA 1/ 1,2,3 02,03,04 1.90 V Input reverse breakdown voltage VBRIR= 10 A 1/ 1,2,3 All 5.0 V Input to output insulation leakage current II-O TC= +25C, VI-O= 1500 V, Relative humidity 65 %, t = 5 seconds 4/ 1 All 1.0 A Capacitance between input-output CI-O
40、f = 1 MHz, TC= +25C 5/ 6/ 4 All 4.0 pF 9 100 Propagation delay time, low to high output level tPLHRL= 510, CL= 50 pF, IF= 13 mA 1/ 7/ 10,11 All 140 ns 9 100 Propagation delay time, high to low output level tPHLRL= 510, CL= 50 pF, IF= 13 mA 1/ 8/ 10,11 All 120 ns See footnotes at end of table. Provid
41、ed by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-98001 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Contin
42、ued. Limits Test Symbol Conditions -55C TC +125C unless otherwise specified Group A subgroups Device type Min Max Unit Output rise time tLHRL= 510, CL= 50 pF, IF= 13 mA 1/ 9,10,11 All 90 ns Output fall time tHLRL= 510, CL= 50 pF, IF= 13 mA 1/ 9,10,11 All 40 ns Common mode transient immunity at high
43、output level CMHVCM= 50 V(peak), VO= 2.0 V(minimum), RL= 510, IF= 0 mA 1/ 6/ 9,10,11 All -1000 V/s Common mode transient immunity at low output level CMLVCM= 50 V(peak), VO= 0.8 V(maximum), RL= 510, IF= 10 mA 1/ 6/ 9,10,11 All -1000 V/s 1/ Each channel of device types 01, 02, and 04. Device type 03
44、functions as two independent single channel units. 2/ It is essential that a bypass capacitor (.01 to 0.1 F, ceramic) be connected from VCCto ground. Total lead length between both ends of this capacitor and the isolator should not exceed 20 mm. 3/ IF3and IF4apply to device type 04 only. 4/ All devi
45、ces are considered as two terminal. II-Ois measured between all input leads or terminals shorted together and all output leads or terminals shorted together. 5/ Measured between each input pair shorted together and all outputs shorted together. 6/ Parameters shall be tested as part of device initial
46、 characterization and after design or process changes. Parameters shall be guaranteed to the limits specified in table I for all lots not specifically tested. 7/ The tPLHpropagation delay is measured from the 6.5 mA point on the trailing edge of the input pulse to the 1.5 V point on the trailing edg
47、e of the output pulse. 8/ The tPHLpropagation delay is measured from the 6.5 mA point on the leading edge of the input pulse to the 1.5 V point on the leading edge of the output pulse. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIR
48、CUIT DRAWING SIZE A 5962-98001 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 Case outline T. Millimeters Inches Symbol Min Max Min Max A 4.57 .180 A1 1.40 1.65 .055 .065 b 0.41 0.51 .016 .020 c 0.18 0.33 .007 .013 D 20.07 20.83 .790 .820 e 2.29 2.79 .090 .110 E 9.65 9.91 .380 .390 E1 8.13 .320 L 1.07 1.32 .042 .052 S 0.89 1.52 .035 .060 Case outline U. Millimeters Inches Symbol Min Max Min Max A 4.32 .170 A1 1.14 1.40 .045 .055 b 0.41 0.51 .016 .
