DLA SMD-5962-98514 REV D-2012 MICROCIRCUIT HYBRID LINEAR NEGATIVE VOLTAGE REGULATOR.pdf

上传人:syndromehi216 文档编号:701279 上传时间:2019-01-01 格式:PDF 页数:10 大小:123.56KB
下载 相关 举报
DLA SMD-5962-98514 REV D-2012 MICROCIRCUIT HYBRID LINEAR NEGATIVE VOLTAGE REGULATOR.pdf_第1页
第1页 / 共10页
DLA SMD-5962-98514 REV D-2012 MICROCIRCUIT HYBRID LINEAR NEGATIVE VOLTAGE REGULATOR.pdf_第2页
第2页 / 共10页
DLA SMD-5962-98514 REV D-2012 MICROCIRCUIT HYBRID LINEAR NEGATIVE VOLTAGE REGULATOR.pdf_第3页
第3页 / 共10页
DLA SMD-5962-98514 REV D-2012 MICROCIRCUIT HYBRID LINEAR NEGATIVE VOLTAGE REGULATOR.pdf_第4页
第4页 / 共10页
DLA SMD-5962-98514 REV D-2012 MICROCIRCUIT HYBRID LINEAR NEGATIVE VOLTAGE REGULATOR.pdf_第5页
第5页 / 共10页
点击查看更多>>
资源描述

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Add figure 3, test circuit. 01-06-27 Raymond Monnin B Correct figure 3, test circuit, VOUTequation. 01-10-26 Raymond Monnin C Updated drawing to the latest requirements. -sld 06-10-24 Raymond Monnin D Added footnote 1 to table II, under group C e

2、nd-point electricals. Updated drawing paragraphs. -sld 12-05-15 Charles F. Saffle REV SHEET REV SHEET REV STATUS REV D D D D D D D D D OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 PMIC N/A PREPARED BY Gary Zahn DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil/ STANDARD MICROCIR

3、CUIT DRAWING CHECKED BY Michael C. Jones THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Kendall A. Cottongim MICROCIRCUIT, HYBRID, LINEAR, NEGATIVE VOLTAGE REGULATOR AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 97-10-27 AMSC N/A REVISION LEVEL D SIZE A CAGE CODE

4、67268 5962-98514 SHEET 1 OF 9 DSCC FORM 2233 APR 97 5962-E167-12 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-98514 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 2 DSCC FORM 2234 A

5、PR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness a

6、ssurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 - 98514 01 H I X Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Draw

7、ing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function

8、as follows: Device type Generic number Circuit function 01 MSK 1362B 1/ Negative voltage regulator 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML

9、 Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space applications. H Standard military qual

10、ity class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufac

11、turer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s)

12、must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certifie

13、d flow. This product may have a limited temperature range. 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style I MACY1-X10 10 Can 1/ The MSK 1362B is similar to the LM104H. Provided by IHSNot for R

14、esaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-98514 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 3 DSCC FORM 2234 APR 97 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Abso

15、lute maximum ratings. 1/ Input voltage (VIN) 50 V Input-output voltage differential 50 V 2/ Total power dissipation (PD) 500 mW Thermal resistance junction-to-case (qJC) . See MIL-STD-1835 Thermal resistance junction-to-ambient (qJA) 150 C/W Junction temperature (TJ) +150 C Storage temperature -65 C

16、 to +150 C Lead temperature (soldering, 10 seconds) +300 C 1.4 Recommended operating conditions. Input voltage range -50 V dc to -8.0 V dc Case operating temperature range (TC) -55 C to +125 C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification

17、, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATIONS MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPA

18、RTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these d

19、ocuments are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herei

20、n, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the maximum levels

21、 may degrade performance and affect reliability. 2/ When external booster transistors are used, the minimum output-input voltage differential is increased, in the worst case, by approximately 1 volt. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-ST

22、ANDARD MICROCIRCUIT DRAWING SIZE A 5962-98514 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38

23、534. Compliance with MIL-PRF-38534 shall include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, howeve

24、r the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3.2 Design, construction, and physical dimensions. The desi

25、gn, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Logic diagram(s). The logic

26、diagram(s) shall be as specified on figure 2. 3.2.4 Test circuit. The test circuit shall be as specified on figure 3. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full sp

27、ecified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-3853

28、4. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test da

29、ta (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision

30、level control by the manufacturer and be made available to the preparing activity (DLA Land and Maritime -VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original cop

31、y) submitted to DLA Land and Maritime -VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered t

32、o this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described

33、herein. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-98514 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Te

34、st Symbol Conditions 1/ -55 C TC +125 C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Load regulation VRLOAD0 mA IL 20 mA VIN= -42 V 1,2,3 01 -5 +5 mV Line regulation VRLINEVOUT -5 V, DVIN= (0.1) VIN 1,2,3 01 -1 +1 % Standby current drain ISTANDBYIL= 0 mA, VO= -35 V 1,

35、2,3 01 -5 mA Input voltage range 2/ VIN1,2,3 01 -50 -8 V Output voltage range 2/ VOUT1,2,3 01 -40 -0.015 V Voltage drop out 2/ VDOUTIL= 20 mA 1,2,3 01 2 50 V IL= 5 mA 0.5 50 Ripple rejection 2/ VRIPVIN -15 V, C = 10 mF, f = 120 Hz 1,2,3 01 0.5 mV/V -7 V VIN -15 V, C = 10 mF, f = 120 Hz 1.0 Output vo

36、ltage scale factor 2/ VOUTSFRLOAD2and RLOAD3= 2.4 kW 1,2,3 01 1.8 2.2 V/kW 1/ VIN-1= -42 V dc 1%, VIN-2= -37.8 V dc 1%. Unless otherwise specified, see figure 3. 2/ Parameter shall be guaranteed to the limits specified in table I for all lots not specifically tested. Device type 01 Case outline I Te

37、rminal number Terminal symbol 1 2 3 4 5 6 7 8 9 10 Adjustment Reference Reference supply Compensation Unregulated input (-VIN) Current limit Booster output Regulated output Common/ground (+VIN) No connection NOTE: Pin 5 is connected to case. FIGURE 1. Terminal connections. Provided by IHSNot for Res

38、aleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-98514 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 6 DSCC FORM 2234 APR 97 FIGURE 2. Logic diagram. Provided by IHSNot for ResaleNo reproduction or networking p

39、ermitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-98514 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 7 DSCC FORM 2234 APR 97 NOTE: NC is no connection. FIGURE 3. Test circuit. Provided by IHSNot for ResaleNo reproduction or networking permitted

40、 without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-98514 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 8 DSCC FORM 2234 APR 97 TABLE II. Electrical test requirements. MIL-PRF-38534 test requirements Subgroups (in accordance with MIL-PRF-38534, group A te

41、st table) Interim electrical parameters 1 Final electrical parameters 1*, 2, 3 Group A test requirements 1, 2, 3 Group C end-point electrical 1/ parameters 1,2,3 End-point electrical parameters for radiation hardness assurance (RHA) devices Not applicable 1/ As a minimum, for all Group C testing per

42、formed after (12-05-15) manufacturers shall perform subgroups 1, 2, and 3 from the Group A electrical test table (Table C-Xa of MIL-PRF-38534). * PDA applies to subgroup 1. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply: a. Preseal b

43、urn-in test, method 1030 of MIL-STD-883. (optional for class H) (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DLA Land and Maritime -VA or the acquiring activity upon request. Als

44、o, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1015 of MIL-STD-883. (2) TAas specified in accordance with table I of method 1015 of MIL-STD-883. b. Burn-in test, method 1015 of MIL-STD-883. (

45、1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DLA Land and Maritime -VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, an

46、d power dissipation, as applicable, in accordance with the intent specified in test method 1015 of MIL-STD-883. (2) TAas specified in accordance with table I of method 1015 of MIL-STD-883. c. Interim and final electrical test parameters shall be as specified in table II herein, except interim electr

47、ical parameter tests prior to burn-in are optional at the discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-98514 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D

48、 SHEET 9 DSCC FORM 2234 APR 97 4.3 Conformance and periodic inspections. Conformance inspection (CI) and periodic inspection (PI) shall be in accordance with MIL-PRF-38534 and as specified herein. 4.3.1 Group A inspection (CI). Group A inspection shall be in accordance with MIL-PRF-38534 and as follows: a. Tests shall be as specified in table II herein. b. Subgroups 4, 5, 6, 7, 8, 9, 10, and 11 shall be omitted. 4.3.2

展开阅读全文
相关资源
猜你喜欢
  • ASTM E2422-2011 Standard Digital Reference Images for Inspection of Aluminum Castings《检验铝铸件的标准数字参考图像》.pdf ASTM E2422-2011 Standard Digital Reference Images for Inspection of Aluminum Castings《检验铝铸件的标准数字参考图像》.pdf
  • ASTM E2422-2017 Standard Digital Reference Images for Inspection of Aluminum Castings《铝铸件检验用标准数字参考图像》.pdf ASTM E2422-2017 Standard Digital Reference Images for Inspection of Aluminum Castings《铝铸件检验用标准数字参考图像》.pdf
  • ASTM E2425-2005 Standard Test Method for Loss Modulus Conformance of Dynamic Mechanical Analyzers《动态机械分析仪损耗模量一致性的标准试验方法》.pdf ASTM E2425-2005 Standard Test Method for Loss Modulus Conformance of Dynamic Mechanical Analyzers《动态机械分析仪损耗模量一致性的标准试验方法》.pdf
  • ASTM E2425-2011 Standard Test Method for Loss Modulus Conformance of Dynamic Mechanical Analyzers《动态机械分析仪损耗模量一致性的标准试验方法》.pdf ASTM E2425-2011 Standard Test Method for Loss Modulus Conformance of Dynamic Mechanical Analyzers《动态机械分析仪损耗模量一致性的标准试验方法》.pdf
  • ASTM E2425-2016 Standard Test Method for Loss Modulus Conformance of Dynamic Mechanical Analyzers《动态机械分析仪的损耗模量一致性的标准试验方法》.pdf ASTM E2425-2016 Standard Test Method for Loss Modulus Conformance of Dynamic Mechanical Analyzers《动态机械分析仪的损耗模量一致性的标准试验方法》.pdf
  • ASTM E2426-2005 Standard Practice for Pulse Counting System Dead Time Determination by Measuring Isotopic Ratios with SIMS《用SIMS测量同位素比率对脉冲计算系统死时间测定的标准实施规程》.pdf ASTM E2426-2005 Standard Practice for Pulse Counting System Dead Time Determination by Measuring Isotopic Ratios with SIMS《用SIMS测量同位素比率对脉冲计算系统死时间测定的标准实施规程》.pdf
  • ASTM E2426-2010 Standard Practice for Pulse Counting System Dead Time Determination by Measuring Isotopic Ratios with SIMS《通过用次级离子质谱法测量同位素比率对脉冲计算系统死时间测定的标准实施规程》.pdf ASTM E2426-2010 Standard Practice for Pulse Counting System Dead Time Determination by Measuring Isotopic Ratios with SIMS《通过用次级离子质谱法测量同位素比率对脉冲计算系统死时间测定的标准实施规程》.pdf
  • ASTM E2427-2005 Standard Test Method for Acceptance by Performance Testing of U S Standard Test Sieves《用美国标准试验筛的性能测试进行验收用标准试验方法》.pdf ASTM E2427-2005 Standard Test Method for Acceptance by Performance Testing of U S Standard Test Sieves《用美国标准试验筛的性能测试进行验收用标准试验方法》.pdf
  • ASTM E2427-2011 Standard Test Method for Acceptance by Performance Testing for Sieves《验收筛的性能测试的标准试验方法》.pdf ASTM E2427-2011 Standard Test Method for Acceptance by Performance Testing for Sieves《验收筛的性能测试的标准试验方法》.pdf
  • 相关搜索

    当前位置:首页 > 标准规范 > 国际标准 > 其他

    copyright@ 2008-2019 麦多课文库(www.mydoc123.com)网站版权所有
    备案/许可证编号:苏ICP备17064731号-1