1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Drawing updated to reflect current requirements. -rrp 04-06-29 R. MONNIN REV SHET REV SHET REV STATUS REV A A A A A A A A A A A A OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 PMIC N/A PREPARED BY Dan Wonnell DEFENSE SUPPLY CENTER COLUMBUS STANDARD
2、MICROCIRCUIT DRAWING CHECKED BY Raymond Monnin COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Raymond Monnin MICROCIRCUIT, LINEAR, LINE RECEIVER, QUAD, DIFFERENTIAL, 3 VOLT, MONOLITHIC SILICON AND AGENCIES OF THE DEPARTMENT OF DEFENS
3、E DRAWING APPROVAL DATE 98-12-09 AMSC N/A REVISION LEVEL A SIZE A CAGE CODE 67268 5962-98585 SHEET 1 OF 12 DSCC FORM 2233 APR 97 5962-E323-04 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-98585 DEFENSE SUPP
4、LY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead
5、 finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 98585 01 Q F A Federal stock class designator RHA designato
6、r (see 1.2.1) Devicetype (see 1.2.2) Device class designator Caseoutline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator.
7、Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit f
8、unction 01 DS26LV32 Quad differential line driver, 3 volt 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 c
9、ompliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package styl
10、e F GDFP2-F16 or CDFP3-F16 16 Flatpack 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCU
11、IT DRAWING SIZE A 5962-98585 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ Supply voltage (VCC) 7.0 V Common mode range (VCM) 14 V Differential input voltage (VDIFF) . 14 V Enable input voltage (VIN) -0.5 V to
12、 VCC+0.5 V Storage temperature range . -65C to +150C Lead temperature (soldering, 4 seconds) 260C Maximum power dissipation, +25C 2/ 1087 mW Junction temperature (TJ) 175C Thermal resistance, junction-to-ambient (JA) . 138C/W Thermal resistance, junction-to-case (JC) 13.5C/W 1.4 Recommended operatin
13、g conditions. Supply voltage (VCC). 3.0 V to 3.6 V Ambient operating temperature range -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unles
14、s otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. M
15、IL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or www.
16、dodssp.daps.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in
17、this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. _ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Dera
18、te linearly 7.3 mW/C above +25C. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-98585 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3
19、.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as
20、described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as spec
21、ified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outline. The case outline shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth
22、table. The truth table shall be as specified on figure 2. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply ov
23、er the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In
24、 addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked
25、. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-3853
26、5. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see
27、 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this
28、 drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device cl
29、asses Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2 herein) involving dev
30、ices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore
31、 documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 77 (see MIL-PRF-38535, appendix A).Provided by IHSNot for ResaleNo reproduction or
32、 networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-98585 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TA +125C VCC= 3.0/3.
33、6 V, CL= 50 pF Group A subgroups Device type Limits Unit unless otherwise specified Min Max Minimum enable high level input voltage VIH1/ 1, 2, 3 All 2.0 V Maximum enable low level input voltage VIL1/ 1, 2, 3 All 0.8 V Minimum differential input voltage VTH VOUT= VOHor VOL, -0.5 V VCM +5.5 V 1, 2, 3
34、 All -200 +200 mV Input resistance RINVCC= 3.6 V, -0.5 V VCM +5.5 V, “one input AC Gnd” 1, 2, 3 All 5 k Logical “1” output voltage VOHVCC= 3.0 V, VDIFF= +1 V, IOUT= -6.0 mA 1, 2, 3 All 2.4 V Logical “0” output voltage VOLVCC= 3.0 V, VDIFF= -1 V, IOUT= 6.0 mA 1, 2, 3 All 0.5 V Input current IINVCC= 3
35、.6 V, VIN= +5.5 V, other input = Gnd 1, 2, 3 All 0 +1.8 mA VCC= 3.6 V, VIN= -0.5 V, other input = Gnd 1, 2, 3 All 0 -1.8 mA CC= 0 V, VIN= +5.5 V, other input = Gnd 1, 2, 3 All 0 +1.8 mA VCC= 0 V, VIN= -0.5 V, other input = Gnd 1, 2, 3 All 0 -1.8 mA Maximum enable input current IENVCC= 3.6 V, VIN= VC
36、Cor Gnd 1, 2, 3 All 1.0 A Quiescent power supply current ICCVCC= 3.6 V, no load, enable, ENABLE = VCCor Gnd, -0.5 V VCM +5.5 V 1, 2, 3 All 20 mA Tri-state output leakage current IOZVOUT= VCCor Gnd, ENABLE = VIL, ENABLE = VIH, VCC= 3.6 V 1, 2, 3 All 50 A Output short circuit current IOSVDIFF= +1 V, V
37、OUT= 0 V 2/ 1, 2, 3 All -10 -70 mA Functional test FT See 4.4.1c 7, 8 All See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-98585 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 432
38、18-3990 REVISION LEVEL A SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - continued. Test Symbol Conditions -55C TA +125C VCC= 3.0/3.6 V, CL= 50 pF Group A subgroups Device type Limits Unit unless otherwise specified Min Max Input to output propagation delay tPLHVCM= 1
39、.5 V 3/ see figure 3 9, 10, 11 All 6 45 ns Input to output propagation delay tPHLVCM= 1.5 V 3/ see figure 3 9, 10, 11 All 6 45 ns Skew tPHLD-tPLHD(same channel) tSK19, 10, 11 All 6 ns Pin to pin skew (same device) tSK29, 10, 11 All 6 ns Output enable time tPZH2 k to Gnd, see figure 3 4/ 9, 10, 11 Al
40、l 50 ns tPZL2 k to VCC, see figure 3 4/ 9, 10, 11 All 50 ns Output disable time tPHZ2 k to Gnd, see figure 3 4/ 9, 10, 11 All 50 ns PLZ2 k to VCC, see figure 3 4/ 9, 10, 11 All 50 ns 1/ Parameter tested go-no-go only. 2/ Short one output at a time. 3/ Generator waveform is specified as follows: f =
41、1 MHz, duty cycle = 50%, ZO= 50 , tr= tf 6 ns. Receiver inputs = 1 V to 2 V with measure points equal to 1.5 V on the inputs to VCCon the output. 4/ Generator waveform is specified as follows: f = 1 MHz, duty cycle = 50%, ZO= 50 , tr= tf 6 ns. Enable/ ENABLE inputs 0 V to 3 V with measure points equ
42、al to 1.5 V on the inputs, to VCCon the outputs for ZLand ZH, and (VOL+0.3 V) for LZ, and (VOH-0.3 V) for HZ. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-98585 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHI
43、O 43218-3990 REVISION LEVEL A SHEET 7 DSCC FORM 2234 APR 97 Device type 01 Case outline F Terminal number Terminal symbol 1 INPUT 1- 2 INPUT 1+ 3 OUTPUT 1 4 ENABLE 5 OUTPUT 2 6 INPUT 2+ 7 INPUT 2- 8 GND 9 INPUT 3- 10 INPUT 3+ 11 OUTPUT 3 12 ENABLE 13 OUTPUT 4 14 INPUT 4+ 15 INPUT 4- 16 VCCFIGURE 1.
44、Terminal connections. ENABLE ENABLE INPUT+ - INPUT- OUTPUT - L H X Z All other combinations VID +0.2 V H of enable inputs VID -0.2 V L OPEN H FIGURE 2. Truth table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A
45、5962-98585 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 8 DSCC FORM 2234 APR 97 FIGURE 3. Timing waveforms. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-98585 DEFENSE SUP
46、PLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 9 DSCC FORM 2234 APR 97 Notes: 1. When ENABLE is switched, ENABLE = 3 V. When ENABLE is switched, ENABLE = GND. 2. When ENABLE is active, ENABLE = 3 V. When ENABLE is active, ENABLE = GND. 3. S1- = 2 V, S1+ = 1 V, S2 =VCC. 4. S1- =
47、 1 V, S1+ = 2 V, S2 = GND. FIGURE 3. Timing waveforms Continued. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-98585 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 10 DSCC F
48、ORM 2234 APR 97 4. VERIFICATION 4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. For device classes Q and V, screening sh
