1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Delete subgroups 10 and 11 in Table IIA for device class Q. - lgt 00-03-07 R. MONNIN B Change made to paragraph 3.2.3. Remove radiation test circuit for device types 01 and 02. rrp 00-10-13 R. MONNIN C Delete case outline Z figure 1. Drawing upda
2、ted to reflect current requirements. gt 03-02-28 R. MONNIN D For device type 02 only, make change to IOS(+)and IOS(-)test limits as specified under Table I. - ro 05-10-24 R. MONNIN E To make the title generic, delete the words “Radiation hardened” from the title block. Add footnote to Table IIB. Del
3、ete paragraph 4.4.4.1.1. Add CAGE code 60264. - ro 11-06-22 C. SAFFLE REV SHET REV E SHET 15 REV STATUS REV E E E E E E E E E E E E E E OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY L. G. TRAYLOR DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil STANDARD
4、MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY RAJESH PITHADIA APPROVED BY RAY MONNIN MICROCIRCUIT, LINEAR, SINGLE, LOW-INPUT-CURRENT OPERATIONAL AMPLIFIER, EXTERNALLY COMPENSATED, MONOLITHIC SILICON DRAWING APPROVAL DAT
5、E 99-02-12 AMSC N/A REVISION LEVEL E SIZE A CAGE CODE 67268 5962-98637 SHEET 1 OF 15 DSCC FORM 2233 APR 97 5962-E323-11 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-98637 DLA LAND AND MARITIME COLUMBUS, OH
6、IO 43218-3990 REVISION LEVEL E SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are
7、 reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 R 98637 01 V G A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1
8、2.2)Device class designatorCase outline (see 1.2.4) Leadfinish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices
9、 meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 PM108A Single low-inpu
10、t-current operational amplifier 02 LM108A Single low-input-current operational amplifier 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the
11、 requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive de
12、signator Terminals Package style C GDIP1-T14 or CDIP2-T14 14 Dual-in-line G MACY1-X8 8 Can H GDFP1-F10 or CDFP2-F10 10 Flat pack P GDIP1-T8 or CDIP2-T8 8 Dual-in-line Z GDFP1-G10 10 Flat pack with gull wing leads 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes
13、Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-98637 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 3 DSCC FORM 2234 APR 97 1.
14、3 Absolute maximum ratings. 1/ Supply voltage (VCC) . 22 V Input voltage (VIN) 2/ 15 V Differential input current 3/ . 10 mA Output short-circuit duration Indefinite Storage temperature range . -65C to +150C Lead temperature : Device type 01 (soldering, 60 seconds) . 300C Device type 02 (soldering,
15、10 seconds) . 300C Power dissipation (PD) 4/ 500 mW Thermal resistance, junction-to-case (JC) : Case C, G, H, P . See MIL-STD-1835 Case Z . 21C/W Thermal resistance, junction-to-ambient (JA) : 5/ Device type 01: Case G . 150C/W Case H . 119C/W Case P . 119C/W Device type 02: Case C . 94C/W Case G .
16、159C/W Case H . 229C/W Case P . 123C/W Case Z . 225C/W Junction temperature (TJ) +175C 1.4 Recommended operating conditions. Supply voltage (VCC) . 5 V dc to 20 V dc Ambient temperature range (TA) . -55C to +125C 1.5 Radiation features. Maximum total dose available (dose rate = 50 - 300 rads (Si)/s)
17、 100 krads (Si) 6/ _ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ For supply voltages less than 15 V, the absolute maximum input voltage is equal to the supply volta
18、ge. 3/ The inputs are shunted with back-to-back diodes for overvoltage protection. Therefore, if a differential input voltage in excess of 1 V is applied between the inputs, excessive current will flow, unless some limiting resistance is provided. 4/ The maximum power dissipation must be derated at
19、elevated temperatures and is dictated by TJ, JA, and TA. The maximum allowable power dissipation at any temperature is PD= (TJ TA)/JAor the number in 1.3 herein, whichever is lower. 5/ JAis specified for worst case mounting conditions, i.e., JAis specified for device in socket for TO, CerDIP, and P-
20、DIP packages. 6/ These parts may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects. Radiation end point limits for the noted parameters are guaranteed only for the conditions specified in MIL-STD-883, method 1019, condition A. Provided by IHSNot for Res
21、aleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-98637 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 4 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The f
22、ollowing specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturi
23、ng, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microc
24、ircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this dra
25、wing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q a
26、nd V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall b
27、e in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535
28、 appendix A and herein for device class M. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Radiation exposure circuit. The radiation exposure circuit shall be maintained by
29、 the manufacturer under document revision level control and shall be made available to the preparing and acquiring activity upon request. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and
30、 postirradiation parameter limits are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table IIA. The electrical tests for each subgroup are defined in tab
31、le I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. F
32、or RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. Provided by IHSNot for ResaleNo reproduction or networking permi
33、tted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-98637 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ 2/ 3/ -55C TA+125C Group A subgroups Device type
34、 Limits Unit unless otherwise specified Min Max Input offset voltage VIORS= 50 4/ 1 01 -0.5 0.5 mV 2, 3 -1.0 1.0M, D, P, L, R 1 -2.0 2.0 +VCC= 35 V, -VCC= -5 V, 1 02 -0.5 0.5 mV VCM= -15 V 2, 3 -1.0 1.0 M, D, P, L, R 1 -0.5 0.5 +VCC= 5 V, -VCC= -35 V, 1 02 -0.5 0.5 mV VCM= 15 V 2, 3 -1.0 1.0 M, D, P
35、 L, R 1 -0.5 0.5 +VCC= 20 V, -VCC= 20 V, 1 02 -0.5 0.5 mV VCM= 0 V 2, 3 -1.0 1.0 M, D, P, L, R 1 -0.5 0.5 +VCC= 5 V, -VCC= -5 V 1 02 -0.5 0.5 mV 2, 3 -1.0 1.0M, D, P, L, R 1 -0.5 0.5 Input offset voltage temperature sensitivity VIO/ T 5/ 6/ 2, 3 All -5.0 5.0 V/C See footnotes at end of table. Provi
36、ded by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-98637 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Tes
37、t Symbol Conditions 1/ 2/ 3/ -55C TA+125C Group A subgroups Device type Limits Unit unless otherwise specified Min Max Input offset current IIO4/ 1 01 -0.2 0.2nA 2, 3 -0.4 0.4M, D, P, L, R 1 -1.0 1.0 +VCC= 35 V, -VCC= -5 V, 1 02 -0.2 0.2 nA VCM= -15 V, RS= 5 M 2, 3 -0.4 0.4 M, D, P, L, R 1 0.5 +VCC=
38、 5 V, -VCC= -35 V, 1 02 -0.2 0.2 nA VCM= 15 V, RS= 5 M 2, 3 -0.4 0.4 M, D, P, L, R 1 0.5 RS= 5 M 1 02 -0.2 0.2 nA 2, 3 -0.4 0.4M, D, P, L, R 1 0.5 +VCC= 5 V, -VCC= -5 V, 1 02 -0.2 0.2 nA RS= 5 M 2, 3 -0.4 0.4 M, D, P, L, R 1 0.5 Input offset current temperature sensitivity IIO/T 5/ 6/ 2, 3 All -2.5
39、2.5 pA/C See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-98637 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical
40、 performance characteristics - Continued. Test Symbol Conditions 1/ 2/ 3/ -55C TA+125C Group A subgroups Device type Limits Unit unless otherwise specified Min Max Input bias current IIB4/ 1 01 -0.1 2.0nA 2 -1.0 2.03 -0.1 3.0M, D, P, L, R 1 -25.0 25.0 +VCC= 35 V, -VCC= -5 V, 1 02 -0.1 2.0 nA VCM= -1
41、5 V, RS= 5 M 2 -1.0 2.0 3 -0.1 3.0M, D, P, L, R 1 5.0 +VCC= 5 V, -VCC= -35 V, 1 02 -0.1 2.0 nA VCM= 15 V, RS= 5 M 2 -1.0 2.0 3 -0.1 3.0M, D, P, L, R 1 5.0 RS= 5 M 1 02 -0.1 2.0 nA 2 -1.0 2.03 -0.1 3.0M, D, P, L, R 1 5.0 +VCC= 5 V, -VCC= -5 V, 1 02 -0.1 2.0 nA RS= 5 M 2 -1.0 2.0 3 -0.1 3.0M, D, P, L,
42、 R 1 5.0 Power supply rejection ratio +PSRR +VCC= 10 V, RS= 50 , -VCC= -20 V, 6/ 1, 2, 3 All -16 16 V/V -PSRR +VCC= 20 V, RS= 50 , -VCC= -10 V, 6/ 1, 2, 3 All -16 16 V/V Input voltage common mode rejection CMR VCM= 15 V 6/1, 2, 3 All 96 dB See footnotes at end of table. Provided by IHSNot for Resale
43、No reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-98637 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 8 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions 1/ 2
44、/ 3/ -55C TA+125C Group A subgroups Device type Limits Unit unless otherwise specified Min Max Adjustment for input offset voltage VIOADJ(+) VCC= 20 V 6/ 1 01 No external ADJ mV Adjustment for input offset voltage VIOADJ(-) VCC= 20 V 6/ 1 01 No external ADJ mV Output short-circuit current (for posit
45、ive output) IOS(+)VCC= 15 V , 6/ 7/ 1 01 -15.0 mA t 25 ms 02 -20.0 2, 3 02 -20.0 Output short-circuit current (for negative output) IOS(-)VCC= 15 V, 6/ 7/ 1 01 15.0 mA t 25 ms 02 20.0 2, 3 02 20.0 Supply current ICCVCC= 15 V 6/ 1, 2 All 0.6 mA 3 0.8 Output voltage swing (maximum) VOPVCC= 20 V, 6/ RL
46、 10 k 4, 5, 6 01 -16.0 16.0 V +VOPRL= 10 k 4, 5, 6 02 -16.0 V -VOPRL= 10 k 4, 5, 6 02 16.0 V Open loop voltage gain (single ended) AVSVCC= 15 V, 8/ 4 01 80 V/mV RL= 10 k, VOUT= 10 V 5, 6 40 M, D, P, L, R 1 10 AVS(+)VCC= 20 V, 8/ 4 02 80 V/mV RL= 10 k, VOUT= +15 V 5, 6 40 AVS(-)VCC= 20 V, 8/ 4 02 80
47、 V/mV RL= 10 k, VOUT= -15 V 5, 6 40 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-98637 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 9 DSCC FORM 2234
48、 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions 1/ 2/ 3/ -55C TA+125C Group A Subgroups Device type Limits Unit unless otherwise specified Min Max Open loop voltage gain (single ended) AVSVCC= 5 V, 8/ RL= 10 k, VOUT= 2 V 4, 5, 6 02 20 V/mV Transient response rise time TR(tr)6/ 9 01 1000 ns RL= 10 k, CL= 100 pF,
