1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Update drawing to reflect current requirements. 05-01-25 Raymond Monnin B Updated drawing paragraphs. -sld 11-03-07 Charles F. Saffle REV SHEET REV SHEET REV STATUS REV B B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 PMIC N/A PREPARED BY
2、 Gary Zahn DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil STANDARD MICROCIRCUIT DRAWING CHECKED BY Michael C. Jones THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Kendall A. Cottongim MICROCIRCUIT, LINEAR, VOLTAGE REGULATOR, POSITIVE, ADJUSTABLE, LOW DROPOUT
3、, MONOLITHIC SILICON AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 99-06-10 AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 67268 5962-98650 SHEET 1 OF 10 DSCC FORM 2233 APR 97 5962-E122-11 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,
4、-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-98650 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lea
5、d finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 - 98650 01 H T A Federal RHA Device Device Case Lead s
6、tock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the
7、appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number 1/ Circuit function 01 SDP1086 1.5 A, positive voltage regulator, adjustable, low dropout 1.2.3 Device class designator. Th
8、is device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as foll
9、ows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space applications. H Standard military quality class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced tes
10、ting version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B,
11、C and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the excep
12、tion(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a limited temperature range. 1/ The SDP1086 is similar to the LT1086 or OM186 listed on Standard Micro
13、circuit Drawing 5962-89981.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-98650 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 1.2.4 Case outline(s). The case
14、outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style N See figure 1 3 Z-tab with nonisolated tab, (TO-257), with glass seal T See figure 1 3 Flange mount with nonisolated tab, (TO-257), with glass seal U See figure 1 3 Flange moun
15、t with isolated tab, (TO-257), with glass seal Z See figure 1 3 Z-tab with isolated tab, (TO-257), with glass seal 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Input to output voltage differential 25 V dc Output current (IOUT) 1.0 A Stor
16、age temperature range -65C to +150C Lead temperature (soldering, 10 seconds) +300C Junction temperature (TJ) +150C Power dissipation (PD) . Internally limited Thermal resistance junction-to-case (JC): Cases N and T . 3.5C/W Cases U and Z . 4.2C/W Thermal resistance junction-to-ambient (JA) 42C/W 1.4
17、 Recommended operating conditions. Input to output voltage differential 15 V dc Output current (IOUT) 10 mA to 1.0 A Ambient operating temperature range(TA) . -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and han
18、dbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STA
19、NDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are avai
20、lable online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the maximum levels ma
21、y degrade performance and affect reliability. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-98650 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 2.2 Order of
22、precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item re
23、quirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 may include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as desig
24、nated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the
25、 form, fit, or function of the device for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4
26、herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified o
27、perating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The de
28、vice shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (varia
29、bles format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level con
30、trol by the manufacturer and be made available to the preparing activity (DLA Land and Maritime- VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submit
31、ted to DLA Land and Maritime- VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this dr
32、awing. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-98650 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Tes
33、t Symbol Conditions 1/ -55C TA+125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Reference voltage VREF(VIN- VOUT) = 3.0 V, IOUT= 10 mA 1 01 1.238 1.262 V 1.5 V (VIN- VOUT) 15 V, 10 mA IOUT 1.0 A 1,2,3 1.220 1.270 Line regulation 2/ VRLINE1.5 V (VIN- VOUT) 15 V, IOUT=
34、 10 mA 1,2,3 01 0.2 % Load regulation 2/ VRLOAD(VIN- VOUT) = 3.0 V, 10 mA IOUT 1.0 A 1 01 0.8 % 2,3 1.0 Dropout voltage VDOIOUT= 1.0 A, VREF= 1.0% 1,2,3 01 1.5 V Thermal regulation 30 ms pulse, TA= +25C 1 01 0.04 %/W Ripple rejection OUTINVVf = 120 Hz, CADJ= 25 F, COUT= 25 F (tantalum), IOUT= 1.0 A,
35、 (VIN- VOUT) = 3.0 V 4,5,6 01 60 dB Adjust pin current IADJ1.5 V (VIN- VOUT) 15 V, 10 mA IOUT 1.0 A 1,2,3 01 120 A Adjust pin current change IADJ1.5 V (VIN- VOUT) 15 V, 10 mA IOUT 1.0 A, TA= +25C 1 01 5.0 A Minimum load current IMIN(VIN- VOUT) = 25 V 1,2,3 01 10 mA Current limit ILIM(VIN- VOUT) = 5.
36、0 V 1,2,3 01 1.5 2.5 A (VIN- VOUT) = 25 V 0.075 Temperature stability 3/ TVOUT-55C TJ +125C 1,2,3 01 1.5 % Long term stability 3/ t VOUT30 ms pulse, TA= +125C 2 01 1 % 1/ IOUTmaximum = 1.0 A. 2/ Line and load regulation are measured at a constant junction temperature using a low duty cycle pulse tec
37、hnique. Although power dissipation is internally limited, regulation is guaranteed up to the maximum power dissipation of 15 W. Power dissipation is determined by the input/output differential voltage and the output current. Guaranteed maximum power dissipation will not be available over the full in
38、put/output voltage range. 3/ If not tested, shall be guaranteed to the limits specified in table I. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-98650 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISI
39、ON LEVEL B SHEET 6 DSCC FORM 2234 APR 97 Case outlines T and U. Inches mm .005 0.13 .010 0.25 .020 0.51 Symbol Millimeters Inches Min Max Min Max A 4.83 5.08 .190 .200 A1 0.89 1.14 .035 .045 A2 3.05 BSC .120 BSC b 0.64 0.89 .025 .035 D 16.38 16.89 .645 .665 D1 10.41 10.92 .410 .430 D3 0.00 1.65 .000
40、 .065 e 2.54 BSC .100 BSC E 10.41 10.72 .410 .422 L 12.70 19.05 .500 .750 O 13.39 13.64 .527 .537 P 3.56 3.81 .140 .150 NOTE: The U.S. government preferred system of measurement is the metric SI system. However, this item was originally designed using inch-pound units of measurement. In the event of
41、 conflict between the metric and inch-pound units, the inch-pound units shall take precedence. FIGURE 1. Case outline(s). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-98650 DLA LAND AND MARITIME COLUMBUS,
42、OHIO 43218-3990 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 Case outlines N and Z. Symbol Millimeters InchesMin Max Min MaxA 23.11 23.37 .910 .920A1 10.41 10.67 .410 .420A2 6.22 6.48 .245 .255A3 3.05 3.30 .120 .130b 0.71 0.81 .028 .032D 4.70 5.59 .135 .220D1 2.92 3.18 .115 .125D2 0.89 1.14 .035 .
43、045e 2.54 BSC .100 BSCL 10.41 10.67 .410 .420L1 12.70 19.05 .500 .750L2 6.22 6.48 .245 .255L3 3.05 3.30 .120 .130P 3.05 3.30 .120 .130NOTE: The U.S. government preferred system of measurement is the metric SI system. However, this item was originally designed using inch-pound units of measurement. I
44、n the event of conflict between the metric and inch-pound units, the inch-pound units shall take precedence. FIGURE 1. Case outline(s) - Continued. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-98650 DLA LA
45、ND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 8 DSCC FORM 2234 APR 97 Device type 01 Case outlines N and T (nonisolated tab) U and Z (isolated tab) Terminal number Terminal symbol Terminal symbol 1 2 3 Tab Adjust No connection Input Output Adjust Output Input No connection FIGURE
46、2. Terminal connections.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-98650 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 9 DSCC FORM 2234 APR 97 TABLE II. Electrical test requireme
47、nts. MIL-PRF-38534 test requirements Subgroups (in accordance with MIL-PRF-38534, group A test table) Interim electrical parameters 1 Final electrical parameters 1*, 2, 3, 4, 5, 6 Group A test requirements 1, 2, 3, 4, 5, 6 Group C end-point electrical parameters 1, 2, 3 End-point electrical parameters for Radiation Hardness Assurance (RHA) devices Not applicable * PDA applies to subgroup 1. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. T
