1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Figure1; Conversion table. For case outline T changes dimension s from .240 inches min and .260 inches max to .245 min and .255 max. -sld 99-06-07 K. A. Cottongim B Update drawing boilerplate. 04-06-03 Raymond Monnin C Table I; Change the maximum
2、 limit for the load regulation test (VRLOAD) from 20 mV to 30 mV for subgroups 2 and 3. Update drawing to the latest requirements. -sld 05-12-12 Raymond Monnin D Added footnote 1 to table II, under group C end-point electricals. Updated drawing paragraphs. -sld 11-04-13 Charles F. Saffle REV SHEET R
3、EV SHEET REV STATUS REV D D D D D D D D D D D D D D OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Steve L. Duncan DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil STANDARD MICROCIRCUIT DRAWING CHECKED BY Michael Jones THIS DRAWING IS AVAILABLE FOR USE BY
4、 ALL DEPARTMENTS APPROVED BY Kendall A. Cottongim MICROCIRCUIT, HYBRID, LINEAR, 5 VOLT, SINGLE CHANNEL, DC/DC CONVERTER AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 99-05-18 AMSC N/A REVISION LEVEL D SIZE A CAGE CODE 67268 5962-99548 SHEET 1 OF 14 DSCC FORM 2233 APR 97 5962-E126-1
5、1 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-99548 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product a
6、ssurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shal
7、l be as shown in the following example: 5962 - 99548 01 H T X Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator.
8、 RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 MOR2
9、805S/883 DC-DC converter, 100 W, 5 V output 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, an
10、d E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space applications. H Standard military quality class level. This level is intended for use in appl
11、ications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer gua
12、rantees (but may not test) periodic and conformance inspections (Group A, B, C, and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document;
13、therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a limited temperature ra
14、nge. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-99548 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 3 DSCC FORM 2234 APR 97 1.2.4 Case outline(s). The case outline(s) are as desi
15、gnated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style T See figure 1 12 Tabbed flange mount, lead formed up U See figure 1 12 Flange mount, lead formed down X See figure 1 12 Flange mount, short lead Y See figure 1 12 Tabbed flange mount, short lead Z S
16、ee figure 1 12 Tabbed flange mount, lead formed down 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Input voltage range (VIN) . -0.5 V dc to +50 V dc 2/ Power dissipation (PD) . 30 W Lead soldering temperature (10 seconds) . +300C Storage
17、temperature . -65C to +150C 1.4 Recommended operating conditions. Input voltage range (VIN) . +16 V dc to +40 V dc Output power . 100 W Case operating temperature range (TC) -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, sta
18、ndards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATIONS MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMEN
19、T OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these docume
20、nts are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, th
21、e text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the maximum levels may
22、degrade performance and affect reliability. 2/ An undervoltage lockout circuit shuts the unit off when the input voltage drops to approximately 14.5 volts. Operation of the unit between 14.5 volts and 16 volts is nondestructive at reduced output power, but performance is not guaranteed. Provided by
23、IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-99548 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item performance
24、requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 shall include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class. The
25、 manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for
26、the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connec
27、tions. The terminal connections shall be as specified on figure 2. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical
28、 test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed i
29、n 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conf
30、ormance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made avail
31、able to the preparing activity (DLA Land and Maritime- VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DLA Land and Maritime- VA shall aff
32、irm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and in
33、spection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 4.2 Screening. Screening shall be in accord
34、ance with MIL-PRF-38534. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DLA Land and Mar
35、itime- VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TAas specified in accordance with table I of method 1015 of MIL-STD-883
36、. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,
37、-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-99548 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TC+125C VIN= 28 V dc 0.5 V dc no external sync, CL= 0 unless otherwise specifie
38、d Group A subgroups Device type Limits Unit Min Max Output voltage VOUTIOUT= 20 A dc 1 01 4.95 5.05 V 2, 3 4.875 5.125 Output current IOUTVIN= 16 V, 28 V, and 40 V dc 1, 2, 3 01 20 A Output ripple voltage VRIPIOUT= 20 A, BW = 10 kHz to 20 MHz 1 01 70 mV p-p 2, 3 80 Line regulation VRLINEIOUT= 20 A,
39、VIN= 16 V dc to 40 V dc 1, 2, 3 01 20 mV Load regulation VRLOADIOUT= 0 to 20 A 1 01 20 mV 2,3 30 Input current IINIOUT= 0 A, inhibit 1 (pin 4) = 0 1, 2, 3 01 10 mA IOUT= 0 A, inhibit 2 (pin 12) = 0 70 IOUT= 0 A, inhibit 1 and 2 (pins 4 and 12) = open 150 Input ripple current IRIPIOUT= 20 A, BW = 10
40、kHz to 20 MHz 1 01 120 mA p-p 2, 3 130 Efficiency EFFIOUT = 20 A 1 01 78 % 2, 3 77 Isolation ISO Input to output or any pin to case at 500 V dc 1 01 100 M Capacitive load 1/ 2/ CLNo effect on dc performance 4 01 1000 F See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or ne
41、tworking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-99548 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions -55C TC+125C VIN= 28 V dc
42、 0.5 V dc no external sync, CL= 0 unless otherwise specified Group A subgroups Device type Limits Unit Min Max Power dissipation short circuit PDShort circuit 1, 2, 3 01 27 W Switching frequency FSIOUT= 20 A 4 01 480 580 kHz 5, 6 460 600 External sync range 3/ FSYNCIOUT= 20 A, TTL level to pin 6 4,
43、5, 6 01 525 625 kHz Output response to step transient load changes 4/ VTLOAD50 percent load to/from 100 percent load 4, 5, 6 01 -250 +250 mV pk Recovery time step transient load changes 2/ 4/ 5/ TTLOAD50 percent load to/from 100 percent load 4, 5, 6 01 200 s Output response to transient step line ch
44、anges 2/ 6/ VTLINEIout= 20 A, Input step from 16 V dc to 40 V dc 4, 5, 6 01 -400 +400 mV pk IOUT= 20 A, Input step from 40 V dc to 16 V dc -400 +400 Recovery time, transient step line changes 2/ 5/ TTLINEIOUT= 20 A, Input step from 16 V dc to 40 V dc 4, 5, 6 01 300 s IOUT= 20 A, Input step from 40 V
45、 dc to 16 V dc 300 Turn-on overshoot 3/ VtonosIOUT= 20 A, VIN= 0 to 28 V dc 4, 5, 6 01 50 mV pk Turn-on delay time 7/ TonDIOUT= 20 A, VIN= 0 to 40 V dc 4, 5, 6 01 10 ms Load fault recovery 2/ TrLFIOUT= 20 A 4, 5, 6 01 10 ms 1/ Capacitive load may be any value from 0 to the maximum limit without comp
46、romising dc performance. 2/ Parameter shall be tested as part of design characterization and after design or process changes; therefore, the parameter shall be guaranteed to the limits specified in table I. 3/ A TTL level waveform (VIH= 4.5 V minimum, VIL= 0.8 V maximum) with a 50 percent 10 percent
47、 duty cycle applied to the sync input pin (pin 6) within the sync range frequency shall cause the converters switching frequency to become synchronous with the frequency applied to the sync input pin (pin 6). 4/ Load step transition time is 10 microseconds minimum. 5/ Recovery time is measured from
48、the initiation of the transient until VOUThas returned to within 1 percent of its final value. 6/ Input step transition time greater than 10 microseconds. 7/ Turn-on delay time measurement is either for a step application of power at the input or the removal of a ground signal from the inhibit 1 pin (pin 4) or inhibit 2 pin (pin 12) while power is applied to the input. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-
