1、APPROVED: October 28, 1988 EIA STANDARD Metallized Film Dielectric Capacitors for Alternating Current Application EIA-456-A JANUARY 1989 ELECTRONIC INDUSTRIES ASSOCIATION ENGINEERING DEPARTMENT EIA 456-A 89 M 3234b00 0070325 7 M NOTICE EIA Engineering Standards and Publications are designed to serve
2、 the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for his particular need. Existence of such Standa
3、rds and Publications shall not in any respect preclude any member or non-member of EIA from manufacturing or selling products not conforming to such Standards and Publications, nor shall the existence of such Standards and Publications preclude their voluntary use by those other than EIA members, wh
4、ether the standard is to be used either domestically or internationally. Recommended Standards and Publications are adopted by EIA without regard to whether or not their adoption may involve patents on articles, materials, or processes. By such action, EIA does not assume any liability to any patent
5、 owner, nor does it assume any obligation whatever to parties adopting the Recommended Standard or Publication. This Standard does not purport to address all safety problems associated with its use or all applicable regulatory requirements. It is the responsibility of the user of this Standard to es
6、tablish appropriate safety and health practices and to determine the applicability of regulatory limitations before its use. O (From Standards Proposal No. 1913, formulated under the cognizance of the EIA P-2.6 Subcommittee on A.C. Capacitors.) Copyright 1989 Published by ELECTRONIC INDUSTRIES ASSOC
7、IATION Engineering Department 1722 Eye Street, N.W. Washington, D.C. 20006 All rights reserved Price: $19.00 Printed in U.S.A. . EIA 45b-A 89 W 3234b00 0070126 9 W EIA- 4 56 -A FIXED METALLIZED FILM DIELECTRIC CAPACITORS FOR ALTERNATING CURRENT APPLICATIONS TABLE OF CONTENTS REFERENCE Page Scope . P
8、aragraph 1 1 Definitions Paragraph 2 . 1 Standard Designations . i Paragraph 3 . 2 Applicable Documents Paragraph 4 . 5 Standard Test Conditions . Paragraph 5 . 5 Quality Assurance Visual and Mechanical Examination Marking Dielectric Withstanding Voltage e . Capacitance . DissipationFactor SealTest
9、. Vibration . Saltspray Paragraph 6 . . 5 Paragraph 7 . 7 Paragraph 8 . 7 Paragraph 9 . 7 Paragraph 10 . 8 Paragraph 11 . 8 Paragraph 12 . 8 Paragraph 13 . 8 Paragraph 14 . 8 Humidity . Paragraph 15 . 8 Solderability Paragraph 16 . 9 Terminal Strength . 1. . Paragraph 17 . 9 Protective Device . Para
10、graph 18 . 9 Leakage Current Test . Paragraph 19 . 9 Capacitance Change With Temperature High Room Temperature Life Test . Paragraph 20 . 9 Paragraph 21 . 9 i EIA 45b-A 89 m 3234600 0070327 O m J REFERENCE Room Temperature Life Test Paragraph 22 . 11 Appiication Notes . Paragraph .2 3. 11 Appendix A
11、 Explanation of Rating Tabulations . 13 Appendix B :; Summary of EN Standard . Designation . 14 Appendix C . Bushing and Terminal Details . 1517 to Appendix D. ; . Case ode from Nominal Black -6% to -3% White -3% to o Yellow o to t3% Red +3% to +6% 3.8 Design options are described in Paragraphs 3.8.
12、1 through 3.8.5. 3.8.1 3.8.2 3.8.3 3.8.4 Protective device shall be identified by the letter “P”. Capacitors containing the protective device shall be recognized by Underwriters Laboratories, or equivalent. 3.8.1.1 3.8.1.2 This protective device is intended to prevent case rupture and expulsion of i
13、nternal material when used within the current and voltage fault rating of this device. A minimum clearance above the capacitor terminais is required for effective opera- tion of the protective device. Manufacturer should be consulted for minimum recommended clearance after installation. Discharge re
14、sistor shall be identified by the letter “R” and shall discharge the capacitor to 50 volts or leas within one minute after disconnection of the capacitor from the voltage Ground lug shall be identified by the letter “G”. (See Appendix for ground lug details.) supply* ,- Leakage current to case, 3.8.
15、4.1 Low leakage current to case, required by UL1012 and UL1029, for some lighting and power 8upply applications shall be identified by the letter “K”. The leakage current value shall be determined by agreement between the supplier and the user. Low leakage current to case for motor application shall
16、 be identified by the . option letter “L”. When 115 volts 60 Hz is applied between the shorted capacitor terminale and the bare case the leakage current shail not exceed the following values: 3.8.4.2 EIA Li5b-A 89 323LibOO 0070332 4 EIA-456-A Page 5 Nominal Capacitance 0-14pF 14.1-2OpF 20.1 to 35pF
17、35.1 to 55pF O to 1OpF Voltage Rating 0-500 0-500 0-500 0-500 501 -660 Max. Leakage Micro Amperes 60 70 1 O0 150 1 O0 3.8.5 Room temperature life test - where a room temperature life test is required, it shall be identified by the letter “S”. The test is described in Paragraph 22. 4. APPLICABLE DOCU
18、MENTS The latest revisions of the following standards when specified form part of this document. (a) E.I.A. Standard RS-186, Standard Test Methods for Electronics Component Parts. (b) Bulletin E.I.A. Source Code and Date Code. (c) NEMA Standard Publication DC2-1970 Residential Controls (Quick-Connec
19、t Terminals). (d) U. L. Standards UL1012, Power Supplies, and UL1029, HID Lamp Ballasts. E.I.A. publications may be obtained from Electronic Industries Association, 2001 Eye Street, N.W., Washington, D.C. 20006. NEMA publications may be obtained from National Electrical Manufacturers Association, 21
20、01 L Street, Suite 300, Washington, D.C. 20037. U. L. Standards may be obtained from Underwriters Laboratories, Inc., Publications Department, 207 East Ohio Street, Chicago, Illinois 60611. 5. STANDARD TEST CONDITIONS 5.1 Standard atmospheric conditions under which tests are to be conducted or refer
21、red to shall be as shown below unless otherwise specified. Temperature: 20C to 35C (referred to 23C +2”C values) Barometric Pressure: 28 to 32 inches (94 to 110 kilopascals) Relative Humidity: Less than 80% 5.2 Standard test frequency is at 60 Hz. Measurements at other frequencies shall be referred
22、to 60 Hz. 6. QUALITY ASSURANCE 6.1 Recommended order of tests shall be as shown in Table 1. (See Page 7). No sample shall be sub- jected to more than one group of tests in Group 2, and Group 3 and Group 4. 6.2 Number of samples and allowable failures shall be as determined by agreement between the u
23、ser and the supplier. EIA 45b-A 89 W 3234600 0070333 b EIA- 4 5 6-A Page 6 TABLE 1 QUALITY ASSURANCE TEST PROGRAMS Requirements GROUP 1 (100% of Sample) Mechanical Inspection Paragraph 7 Marking Paragraph8 Dielectric Withstanding Voltage .-. . Paragraph 9 Capacltance Paragraph 10 Dissipation Factor
24、. Paragraph 11 Seal . Paragraph 12 Leakage Current to Case Paragraph 19 GROUP2 . (10% of Sample) Vibration Paragraph 13 Salt Spray (For Plated or Fainted Cases) . . .-. Paragraph 14 GROUP 3 (20% of Sample) Solderability (where required) Paragraph 16 Terminal Strength .Paragraph 17 Humidity Paragraph
25、 15 Protective Device Test where required) . Paragraph 18 (70% of Sample) Low Temperature Capacitance Change Paragraph 20.1 High Temperature Capacitance Change Paragraph 20.2 Room Temperature Life Test (where required) . Paragraph 22 High Temperature Life Test Paragraph 21 - EIA 456-A 89 3234600 007
26、0134 8 W . EIA- 4 5 6 -A Page 7 7. 7.1 7.2 7.3 8. 8.1 9. 9.1 9.2 9.3 9.4 VISUAL AND MECHANICAL EXAMINATION* Dimensions shall be within the tolerances allowed. Marketing shall be legible, complete and correct. Physical appearance shall be uniform in quality and capacitors shall be free from pits, cor
27、rosion, cracks, rough edges, and other defecb that will affect life, serviceability or appearance. MARKING Marking shall be permanent ink or metal stamping and shall consist of the following items: 1. Nominal capacitance in microfarads 2. Rated voltage in volts (RMS) 3. Rated frequency in Hz 4. Name
28、 or symbol of manufacturer 5. Metallized or SH 6. Manufacturers part number 7. E. I. A. date code identification 8. Temperature “C (where required) 9. Underwriters Laboratories or equivalent protective device identification (where required) 10. Underwriters Laboratories or equivalent paint identific
29、ation (where required) 11. Non-PCB identification (No-PCB) 12. Terminal identification (where required) (Herm-C-Fan and dual capacitors) DIELECTRIC WITHSTANDING VOLTAGE Between terminals - Capacitors shall be capable of withstanding the application of 1.75 x rated ac voltage for one second. Capacito
30、rs shall be discharged through a 10,000 ohm resistor to limit the current. Terminals to case - Capacitors shall be capable of withstanding the application of 2 x rated ac voltage plus 1,000 volts for one second. Non-metal cased capacitors shall be tested by applying the voltage between the terminals
31、 and an aluminum foil contacting all surfaces except the surface on which the terminals are attached. Alternate tests to those outlined in Paragraphs 9.1 and 9.2 may be conducted at a dc voltage equal to the peak voltage of the specified ac test voltage. Where dc voltage is used the capacitors shall
32、 be charged and discharged through a 10,000 ohm resistor. Capacitors shall be considered defective if they show evidence qf continuous or intermittent open circuit during or after the test of Paragraph 9.1. Momentary short circuits are permitted as these capaci- tors are self-healing. 9.4.1 Capacito
33、rs shall be considered defective if they show evidence of permanent short circuit dur- ing or after the test of Paragraph 9.1 and 9.2. - EIA 45b-A 9 = 3234600 0070135 T = EIA-rS 5 6 -A Page 8 10; CAPACITANCE TEST 10.1 Capacitance measurements shall be made on an ac bridge at 60 Hz or shall be referr
34、ed to such a measurement. Values of capacitance measured.shall be within the specified tolerance at or referred to a temperature of 23OC I2OC with rated voltage applied. 11. DISSIPATION FACTOR TEST 11.1 Dissipation factor of each capacitor shall not exceed 0.1% for E and F characteristics and 0.6% ,
35、 for G and H characierktics when measured at or referred to 60 Hz rated voltage applied at any temperature between 23C and the maximum rated temperature (70C for Characteristics E and G, 90C for Characteristics F and H). 12. SEALTEST 12.1 Liquid filled capacitors shall be capable of withstanding a t
36、emperature of 90C in circulating air for a ten minute period past the time the entire capacitor has reached a temperature of 85C without evidence of leakage of the impregnant. 12.2 Liquid filled capacitors shall be capable of withstanding two thermal cycles each consisting of 24! hours at -55C follo
37、wed by 24 hours at room temperature without evidence of leakage of the impregnant. 13, VIBRATION TEST 13.1 Capacitors shall be capable of withstanding vibration of E. I. A. Standard RS-186, Method 7, Type III test except duration of test shall be thirty minutes per plane without physical or electri-
38、 cal damage. 14. SALT SPRAY TEST 14.1 Painted or plated finishes shall be capable of withstanding 500 hours salt spray test per E. I. A. Standard RS-186, Method 5, Type II test with less than 5% of the case surface showing finish breakdown or case failure when rust is removed. Test shall be conducte
39、d with 5% salt in the water at a temperature of 35C. 15. HUMIDITY TEST 15.1 Capacitors shall be measured for capacitance and dissipation factor following procedures outlined in Paragraphs 10 and 11. 15.2 Capacitors shall be subjected to 240 hours humidity exposure following procedures described in E
40、. I. A. Standard RS-186, Method II. 15.3 After removal from the humidity exposure, the capacitors shall be measured for capacitance and dissipation factor as described in Paragraph 15.1, 15.4 Capacitance change shall be within 2% of initial values and dissipation factor shall remaiii within themaxim
41、urn values specified in Paragraph 11.1. - EIA 956-A 89 3239600 0070336 3 9 EIA- 4 5 6-A Page 9 16. SOLDERABILITY a 16. P Solder type terminals shall be easily soldered using tin-lead solders with non-corrosive fluxes and standard soldering techniques. 17. TERMINAL STRENGTH 17.1 All quick-connect ter
42、minals shall be capable of withstanding 3 inckpounds (0.34 newtonmeter), of torque and 50 pounds (220 newtons) of axial compression and puii without damage. 18. PROTECTIVE DEVICE 18.1 Protective device shall be recognized by Underwriters Laboratories, or equivalent. It shall meet test requirements a
43、greed between the user and the supplier. 19. LEAKAGE CURRENT TEST 19.1 Leakage current test shall be conducted to ensure compliance with Paragraph 3.8.4. 20. CAPACITANCE CHANGE WITH TEMPERATURE 20.1 Capacitance change from 23C to 40C shall be within limits of f2 to -5% for Characteristics E, F, G an
44、d H as measured in Paragraph 10. 20.2 Capacitance change from 23C to high temperature rating as measured in Paragraph 10 shall be within the following range. e High Temp Cap. Change Characteristic Rating from 23C E 70“ C +2% -5% F G H 21. HIGH TEMPERATURE LIFE TEST 90“ c 70C 90C +2% -7% +m -2% +lo%
45、-2% . 21.1 Capacitance and dissipation factor shall be measured according to Paragraphs 10 and 11 prior to life testing. 21.2 Capacitors shall be capable of passing the accelerated life tests described below. a EIA 45b-A 9 I 3234600 0070337 3 = . EIA-456-A Page 10 21.3 Capacitors with Characteristic
46、s E and F shall be,subjected to the following test program, 1 Test Vac in % of Ambient Life Test Characteristics Rated Voltage Test Temp. . Hours E 125% 80“ C 2000 F 125% 1 OOOC 2000 21.4 Capacitors with ChFacteristics G and H shd be subjected to the foilowing test program: (hpacitor Test Vac in Amb
47、. Test Amb. Test Life VA % of Rated Temp. Temp. Test Rating Voltage Char. G Char. H Hours O to 600 125% 80“ C 100C 2000 601 to 1500 120% 80 C loooc Over 1501 115% 80 C 1 00C 2000 2000 21.5 Capacitance and dissipation factor shall be measured according to Paragraphs 10 and 11 after life tests arecomp
48、leted. 21.6 Capacitors shall be considered to have failed the life test if they exhibit any of the following conditions: (a) Permanent short circuit between terminals or between terminals and case. (b) Continuous or intermittent open circuit between terminals. (c) A change in capacitance or more tha
49、n 3% as determined from measurements taken in Para- graphs 21.1 and 21.5. (d) Dissipation factor in excess of 0.15% for Characteristics E and F and in excess of 0.9 for Charac- teristics G and H as determined from measurements taken in Paragraphs 21.1 and 21.5. Note: These high temperature life tests are intended to indicate the relative quality of the capacitor lot tested. Service life and survival required in Paragraph 23.1 can be determined only after extemive longtime life test data accumulation. 21.7 Volt-Ampere rating is determined as follows: Vol
