1、T I: 1 EIA 535BAAA 87 m 3234600 0074138 3 m a a 2 ln ci) ln I a iTi I MAY 1987 DETAIL SPEC I F CAT I ON Fixed Tantalum Chip Capacitor Style 1 Protected-Standard Capacitance Range EIA-535BAAA ELECTRONIC INDUSTRIES ASSOCIATION ENGINEERING DEPARTMENT EIA Engineering Standards and Publications are desig
2、ned to serve the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for his particular need. Existence of
3、 such Standards and Pub- lications shall not in any respect preclude any member OP non-member of EIA from manufacturing or selling products not Conforming to such Standards and Publications, nor shall the existence of such Standards and Publications preclude their voluntary use by those other than E
4、IA memberss whether the standard is to be used either domestically or internationally. Recommended Standards and Publications are adopted by EIA without regard to whether or not their adoption may involve patents on articles, materiels, or processes. By such action, EIA does not assume any liability
5、 to any patent owner, nor does it assume any obligation whatever to parties adopting the Recom- mended Standard or Publication. Published by ELECTKONIC INDUSTRIES ASSOCIATION Engineering Department 2001 Eye Street, NW Washington, D.C. 20006 Copyright 1987 ELECTRCNIC INDUSTRIES ASSOCIATICN All rights
6、 reserved PRICE: $9.00 O O EIA 535BAAA 87 = 3234b00 0074140 1 QC300801/US0001 March 1986 (As Amended October INTERNATIONAL 198 6) ELECTROTECHNICAL COMMISSI0N Quality Assessment System for Electronic Componen*01 * Cr * Ur UA or 05 UA whichever is greater. Example: 1 uF 35 WVDC 25 C DCL = .O1 x 1.0 x
7、35 = 0.35 UA Since 0;35 is less than 0.5 uF the limit is 0.25 UA for this rating. b) When measured at +85 C at rated voltage (Ur) the DC Leakage shall not exceed 10 times the limit at 20 C. c) When measured at +125 C at upper category voltage (Uc) the DC Leakage shall not exceed 12.5 times the limit
8、 at 20 C. TABLE IIA 3216 3216 3216 Standard Capacitance Solid Tantalum Chip Capacitors Values of Capacitance and of Voltage Related to Case Size 3216 3216 3216 ,033 - o47 I068 3216 .10 - 15 .!22 3216 3528 3216 3528 6032 3528 6032 :33 .4 7 i 68 3216 1.00 1.5 2.2 3216 3528 6032 3528 6032 7343 3528 603
9、2 7343 3.3 4 :7 6.8 3216 3528 3528 3528 6032 7 -LLL- 6032 7343 6032 7343 7343 EIA 535BAAA 87 3234600 0074345 O EI A- 5 3 5 B AAA QC300801/USO001 Page 4 6032 6032 7343 3216 7343 7343 lo LL-L-L 10 15 22 13 - 3528 6032 LI- 25 L-L- 17 L-L- 3216 3216 3216 50 -L-LL 3216 3216 3216 EIA 535BAAA 87 3234600 00
10、74L46 2 EI A-5 3 5 BUA QC300801/USO001 Page 5 TABLE IIB Standard Capacitance Solid Tantalum Chip Capacitors Characteristics at Hiah and Low TemDerature 1 :4 RELATED DOCUMENTS : IEC Publication 384-1 (1982) Fixed Capacitors for use in (300000) (Eu-5350000) electronic equipment. Part 1 Generic Specifi
11、cation . IEC Publication 384-3 ( QC 3 0 0 8 0 0 (EIA0535A000) Part 3: Sectional Specifica- use in electronic equipment: I tion: Fixed capacitors for 1 . 5 MARKING: 1.5.1 As a minimum, marking shall consist of capacitance, capacitance value in picqfarad code, manufacturers ID and polarity designator
12、6 orientation at manufacturers option. 1.5.2 Batch/lot/date code identification shall be marked on reel and/or tape leader, or on bulk container. Bar coding is permittedl - 1 . 6 ORDERING INFOFLVATION : Oraers for capacitors covered by this specification shall contain, in clear or coded form, the fo
13、llowing minimum information: a) Rated Capacitance b) Tolerance on Rated Capacitance c) Rated DC Voltage d) Number and Issue Reference of the Detail Specification and Style Reference QC-5 3 5BAM QC300801/USO001 Page 6 1.7 CERTIFIED RECORDS OF RELEASED LOTS: Not Required 1.8 ADDITIONAL INFORMATION (No
14、t for Inspection Purposes): 1 ,!8 , 1 Packaging : Components will be tape and reel packaged per EIA-RS-481 on plastic embossed tape in the tape width and pitch shown below, The preferred quantity per reel is given below also. These components are also available in bulk if required: Case Tape Compone
15、nt QtY. Per QtY- Per Size Width Pitch 7“ Reel 13“ Reel - 3216 8mm 4mm 2000 9000 3528 8mm 4mm 2000 8000 6032 12mm 8mm 500 3000 7343 12mm 8mm 500 2500 1.9 DEVIATIONS FROM GENERIC AND/OR SECTIONAL SPECIFICATION: 1.9.1 DC RATED AND SURGE VOLTAGES: Operating Temperature Range: These capacitors are design
16、ed to operate over the temperature range of - 55 C to +85 C with no voltage derating. These capacitors may be operated up to +125 C with derating as shown in Table III; TABLE III EIA 535BAAA 87 W 3234600 0074148 b EIA-535BAkA QC300801/USO001 Page 7 IL = inspection level - AQL = acceptance quality le
17、vel - PART TWO - INSPECTION REQUIREMENTS IEC Publication 410 a 2;O INSPECTION REQUIREMENTS: 2 . 1 PROCEDURES : 2.1.1 For Qualification Approval the procedures shall be in accordance with the Sectional Specification, IEC Publication 384-3 (QC300800), Sub-clause 3.4. 2.1.2 For Quality Conformance Insp
18、ection the test schedule (Table IV) includes sampling, periodicity, severities and requirements.# by Subclause 3.5.1 of the Sectional Specification. The formation of inspection lots is covered TABLE IV Notes 1 - Sub-clause numbers of tests and performance requirements refer to the Sectional Specific
19、ation, IEC Publication 384-13 (QC300800) and Section One of this specification: 2 - Inspection levels and AQLs are selected from IEC Publication 410: Sampling Plans and Procedures for Inspection by Attributes. EIA 535BAAA 87 3234600 00741i49 8 EIA-535BAAA AC300801/US0001 Page 8 Clause Number and Tes
20、t (See Note 1) GROUP A INSPECTION Sub-GrouD Al 4;4 Visual Examination 4Y4 Dimensions Sub-Group A2 4.5.1 Leakage Current 4.52 Capacitance 425.3 Tangent of Loss Angle GROUP B INSPECTION Sub-Group B1 4.7 Solderability 4.71.2 Final D Conditions Or of Test IL AQL ND (See Note 1) (See Note 2) - (Lot-by-Lo
21、t) ND S-4 2:5% ND II 1;0% Protective Resistance: 1000 Ohms Frequency: 120 Hz Frequency: 120 Hz ( Lot-by-Lot ) D Method 1 s-3 2.5% Visual Measurements Examination Performance Requirements (See Note 1) As in 4.4.2 Legible Mark- ing and as Specified in 1.5 of this Specification As Specified in Table I
22、of this Spec. 1.3 herein Within Speci- fied Tolerance Table IIB As in 4.7 Good Tinning as Evidenced by Free Flow- ing of the Solder with Wetting of the Terminations EIA 535BAAA 87 H 3234600 0074350 4 D Condit ions Clause Number and or of Test Test (See Note 1) ND (See Note 1) GROUP C INSPECTION (Per
23、iodic) Sub-Group C1 D 416 Resistance to Method 2 Soldering Heat 4.6.2 Final Measurements Sub-Groun C2 - L 4.9 Bond Strength of End Face Sub-Group C3 4.3 Mounting Sub-Group C3 . 1 4.8 Adhesion Visual Examination Capacitance Tangent of Loss Angle EI A-5 3 5B AAA QC300801 /USO001 Page 9 Sample Size 5 D
24、amp Heat, Cyclic, Test Db, Remaining Cycles 4.11.6 Final Measurements Sub-Group C32 4.12 Damp Heat Steady State 4212.1 Initial Measurement 4-12.2 Final Measurement D Recovery: 1to2h Visual Examination Leakage Current Capacitance Tangent of Loss Angle Recovery : 1to2h Capacitance Visual Examination L
25、eakage Current Capacitance Tangent of Loss Angle 6 91 No Visible Damage Legible Mark- ing 1: 3 herein Change = 10% of Value Measured in 4 :11.1 = 1:2 times initial limit No Visible Damage Legible Marking 123 herein Change = 10% of Value Measured in 4.012.1 = 1.2 times initial limit EIA 535BAAA 87 D
26、3234600 0074153 T E I A- 5 3 5BAAA QC300801/US0001 Page 12 Sample Size .15ii1 Initial Mea sureme nt 4 AS. 2 Final Measurement D 3 Duration: 2000 h Ambient Temp, 85 C - Applied Voltage: Ur Recovery : 1to2h Capacitance Visual Examination Leakage Current Capacitance Tangent of Loss Angle Sub-Group C3.1
27、4 D 6 4.13 Characteristics The capacitors at High and LOW Temperature ed at each shall be Measur- Temperature Step Step 1: 20 C - Leakage Current I I I Capacitance Tangent of Loss Angle - 41 15 1 No Visible Damage Legible Marking = 2 times initial limit Change = 10% of Value Measured in 4:15.1 = 1.2
28、5 times initial limit For Use As Reference Value EIA 535BAAA 87 m 3234600 0074354 i m D Conditions Clause Number and or of Test Test (See Note 1) ND (See Note i) Step 2: at -55 Capacitance EEA-535BAAA QC300801/USO001 Page 13 Sample Size Q Criterion Acceptability Requirements (See Note 3) (See Note 1
29、) of Performance nn c Tangent of Loss Angle Step 3: 20 C Leakage Current Capacitance Tangent of Loss Angle Ste? 4: 85 C Leakage Current Capacitance Tangent of Loss Angle Step 5: 125 C Leakage Current Capacitance Tangent of Loss Angle Table IIB 1.3 herein Change = +,-5% of Value Measured in Step 1 Ta
30、ble IIB 1.3 herein Table IIB Table IIB 1.3 herein Table IIB Table IIB EIA 535BAAA 87 3234600 0074355 3 = EI A-5 3 5BM QC3008Ol-USOOO1 Page 14 Clause Number and Test (See Note 1) Sub-Group C3.5A 4.15.1 Initial 4-14 Surge Measurement 4.15.2 Final Mea sur ement Sub-Grow C3 .35B 4.16 Reverse Voltage Sam
31、ple Size & Criterion D Conditions of or of Test Acceptability IJD (See Note 1) (See Note 3) pn c - Step 6: 20 C Leakage Current Capacitance Tangent of Loss Angle - 12 6 1 D Capacitance Number of Cycles: 1000 Temp: 85 C Vol tage : Table III Protect ive Resistor: 33 ohms +,5% Duration of Change: 30 s Duration of Discharge: 5 min 30 s Leakage Current Capacitance Tangent of Loss Angle Not Applicable a Performance Requirements (See Note i) As in Step 3 1.3 herein Change = 10% of Value Measured in Step 6 of 4.13 Table IIB
