1、EIA 535BAAB 87 = 3234600 0074L5b 5 ,- A c- I I 4 W - DETAIL S P E C I F I CAT I ON Fixed Tantalum Chip Capacitor Style 1 Protected - Extended Capacitance Range I-535BAAB MAY 7987 ELECTRONIC INDUSTRIES ASSOCIATION ENGINEERING DEPARTMENT EIA 535BAAB 87 3234600 0074157 7 - NOTICE EIA Engineering Standa
2、rds and Publications are designed to serve the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for his
3、 particular need. Existence of such Standards and Pub- lications shall not in any respect preclude any member or non-member of EIA from manufacturing or selling products not conforming to such Standards and Publications, nor shall the existence of such Standards and Publications preclude their volun
4、tary use by those other than IA members, whether the standard is to be used either domestically or internationally. Recommended Standards and Publications are adopted by EIA without regard to whether or not their adoption may involve patents on articles, materials, or processes. By such action, EIA
5、does not assutne any liability to any patent owner, nor does it assume any obligation whatever to parties adcipting the Recom- mended Standard or Publication. Published by EECTKONIC INDUSTRIES ASSOCIATION Engineering Department 2001 Eye Street, NW Washington, D.C. 20006 Copyright 1987 ELECTRCNIC IND
6、USTRIES ASSOCIATICN All rights reserved PRICE: $9.00 EIA 535BAAB 7 m 3234600 0074358 9 m QC300801/US0002 March 1986 (As Amended October 1986) INTERNATIONAL COMMISSION Qtralig Assessment System for Electronic Components IECQ Fixed Capacitors for use in electronic equipment: Detail Specification. Fixe
7、d Tantalum Chip Capacitor Style 1 Protected - Extended Capac it ance Range - Originator: ECCB THE ELECTRONIC COMPONENTS CERTIFICATION BOARD, INC. The U.S. National Authorized Institution for the IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS 2001 Eyc Street, N.W. Washington. D.C. 20006 LSA
8、o EIA 535BAAB 87 E 3234600 0074159 O E EIA-535BAAB FIXED TANTALUM CHIP CAPACITOR STYLE 1 PROTECTED - EXTENDED CAPACITANCE RANGE This Standard represents US adoption of International Electrotechnical Commission Quality Assessment Systems (IECQ) Detail Specification QC300801/US0002, October 1986. It i
9、s issued as an EIA document to provide a Specification in the National Electronic Components Quality Assessment System (NECQ). IEC documents referenced in this Detail Specification (e.g. QC 300000) may be obtained from the American National Standards Institute, 1430 Broadway, New York, New York 1001
10、8. EIA numbers are assigned to these IEC documents for reference purposes and to facilitate later publication of equivalent EIA documents. a i O EIA 535BAAB 87 m 3234600 0074160 7 m EIA- 5 3 5 B AA QC300801 /US0002 Page 1 ELECTRONIC INDUSTRIES ASSOCIATION Electronic Components of Assessed Quality in
11、 Accordance With: Outline Drawing: (See Table I) (Third Angle Projection) -9-9-9-*99-999 QC300000 (IEC384-1) (EIA-5350000) -999999999-999999-9-999- LN-J I 1 (Other shapes permitted within the dimensions given) QC3 008 01 (EIA-535BA00) 99-99.-9-9-n9999-9-9-999- Fixed Tantalum Chip Capacitor Style 1 P
12、rotected - Extended Capacitance Range Polar, Non-Hermetically Sealed Chip Capacitor with Solid Electrolyte and Porous Tantalum Anode 99-rlrrrrr-99r99-94-99-9-9999, -9-m9-99-9-99-9-999-9-* Information on the availability of components qualified to this detail specification are given in the Qualified
13、Products List. EIA 535BAAB 87 3234600 O074363 9 W EIA-535BAAB QC300801/USO002 Page 2 PART OIE - GENERAL DATA 1.0 GENERAL DATA 1.1 RECOMMENDED METHOD(S) OF MOUNTING These components can be attached to glass epoxy or alumina substrates by conventional techniques such as vapor-phase or wave soldering a
14、nd hot plate methods. In general attachment with a soldering iron is not recommended due to the difficulty of consistently controlling temperature and time at temperature. 1.2 DIMENSIONS : TABLE IA - Case 3518 3527 7227 7257 - Note 1: W2 = Termination Widths H2 = Termination Heights Note 2: The rise
15、r from the Tantalum Anode extends into the volume delineated by “SI: Note 3: There are differences in the unit configurations supplied by the various manufacturers; For optimum results the user should consult the selected component manufacturers specifications prior to doing PWB layouts: TABLE IB -
16、Case 3518 3527 7227 7257 - EIA 535BAAB 87 3234600 0074lb2 O 1 . 3 RATINGS AND CHARACTERISTICS : Capacitance Cr Tolerance on Rated Capacitance Rated Voltage Ur Category Voltage Uc Climatic Category Impedance Insulation Resistance Surge Voltage Rated Temperature Variation of Capacitance with Tempera t
17、ure Tangent of Loss Angle (Dissipation Factor ) Terminations Leakage Current EIA-535BAAB QC300801/USO002 Page 3 001 to 330 uF See Table IIA +,10 and +,-20% 4 - 50 Volts See Table IIA See Table IIA -55/125/21 Not Applicable Not Applicable See Table III 85 C See Table IIB Table IIB Solderable a) When
18、measured at 20 C at rated voltage (Ur shall not exceed O:Ol*Cr * Ur UA or 0.5 UA greater. the DC Leakage whichever is Example: 1 uF 35 WVDC 25 C DCL = .O1 x 1.0 x 35 = 0:35 UA Since 0.35 is less than 0.5 uF the limit is 0.5 UA for this rating. b) When measured at +85 C at rated voltage (Ur) the DC L
19、eakage shall not exceed 10 times the limit at 20 C. c) When measured at +125 C at upper category voltage (Uc) the DC Leakage shall not exceed 12.5 times the limit at 20 C. EIA-535BAAB QC300801/USO002 Page 4 0.33 0.47 0.68 EIA 535BAAB 87 3234600 O074363 2 = 3518 3518 3527 3518 3527 TABLE IIA 3518 351
20、8 3527 3518 3527 Extended Capacitance Solid Tantalum Chip Capacitors Values of Capacitance and of Voltage Related to Case Size 7227 7227 7227 o .,lo 0.15 0.22 7227 7227 - 7227 7257 7257 3518 3518 3527 I 3518 3527 1.0 1.5 2.2 3527 3.3 4 ;.7 6.8 7227 10 15 22 7227 7227 7257 7257 33 47 68 7227 7227 725
21、7 7257 7227 7257 7257 100 7227 150 220 7257 3518 3527 7257 7257 3527 3527 UR 1ov - -9 EIA 535BAAB 87 3234600 0074164 4 = EIA-535BM.B QC300801/USO002 Page 5 0 TABLE IIB Extended Capacitance Solid Tantalum Chip Capacitors Characteristics at Hiqh and Low Temperature Rated Max;Capacitance Change Capacit
22、ance -55 C +85 C +125 C All -12% +lo% +15% 68 UF -12% +lo% +15% =68 UF -12% +lo% +15% Al 1 -12% +lo% +15% -L-IIIIIII-IIIII- - -I i- - Voltage 4 Votge 5 Voltaqe 2.7 Votae 3.4 EIA 535BAAB 87 m 3234600 O074366 I3 m Clause Number and Test (See Note 1) GROUP A INSPECTION Sub-Group Al 4.4 Visual Examinati
23、on 4 r4 Dimensions Sub-Group A2 4 . 5 . 1 Leakage Current 4 :5.2 Capacitance 4.5.3 Tangent of Loss Angle GROUP B INSPECTION Sub-Group B1 4.7 Solderability 4.7.2 Final O EIA-535BAAB. QC300801/USO002 Page 7 D Conditions Performance or of Test IL AQL Requirements - ND (See Note 1) (See Note 2) (See Not
24、e 1) (Lot-by=Lot) ND S-4 25% As in 4.4.2 Legible Mark- ing and as Specified in li5 of this Specification ND II 1:0% Protective Resistance: 1000 Ohms Frequency: 120 Hz Frequency: 120 Hz D Method 1 S-3 2.5% Visual Mea suremen t s Examination As Specified in Table I of this Spec: 1 . 3 herein Within Sp
25、eci- fied Tolerance Table IIB As in 4.7 Good Tinning as Evidenced by Free Flow- ing of the Solder with Wetting of the Terminations EIA 535BAAB A7 3234600 0074Lb7 T W EIA-535BAAB QC300801/USO002 Page 8 PART TWO INSPECTION REQUIREMENTS 2.0 INSPECTION REQUIREMENTS: 2.1 PROCEDURES: 2.1.1 For Qualificati
26、on Approval the procedures shall be in accordance with the Sectional Specification, IEC Publication 384-3 (QC300800), Sub-clause 3.4. 2.1.2 For Quality Conformance Inspection the test schedule (Table IV) includes sampling, periodicity, severities and requirements. The formation of inspection lots is
27、 covered by Subclause3.5.1 of the Sectional Specification. TABLE IV Notes 1 - Sub-clause numbers of tests and performance requirements refer to the Sectional Specification, IEC Publication 384-3 (QC300800) and Section One of this specification. 2 - Inspection levels and AQLs are selected from IEC Pu
28、blication 410: Sampling Plans and Procedures for Inspection by Attributes. 3 - In this Table: p = periodicity (in months) n = sample size c = acceptance criterion (permitted number D = destructive of defectives ) ND = non-desctructive IL = inspection level -1 IEC AQL = acceptance quality level Publi
29、cation I 410 I EIA 535BAAB 87 3234600 0074168 1 W D Conditions Clause Number and or of Test Test (See Note 1) ND (See Note i) - GROUP C INSPECTION (Periodic) Sub-Group C1 D 4.*6 Resistance to Method 2 Soldering Heat Measurements 4.6.2 Final - Sub-Group C2 4.9 Bond Strength of End Face Sub-Group C3 4
30、.3 Mounting Sub-Group C3.1 4.8 Adhesion Visual Examinat ion Capacitance Tangent of Loss Angle Capacitance (With Board in Bent Position) EI A- 5 3 SBAAB QC300801/USO002 Page 9 Sample Size 115.1 Initial Mea sur ement 4.15.12 Final Mea sur ement D 3 41 Duration: 2000 h Ambient Temp, 85 C - Applied Volt
31、age: Ur Recovery : 1to2h Capacitance Visual Examination Leakage Current Capacitance Tangent of Loss Angle No Visible Damage Legible Marking = 2 times initial limit Change = 10% of Value Measured in 4.15.1 = 1.:5 times initial limit Sub-Group C3.4 D 6 15 1 4.13 Characteristics The capacitors at High
32、and Low shall be Measur- Temperature ed at each Temperature Step - Step 1: 20 C Leakage Current I Capacitance Ref er enc e I For Use As Tangent of Loss Angle - EIA 535BAAB 87 m 3234b00 0074172 3 m EIA-535BAAB QC300801/USO002 Page 13 D Conditions Clause Number and or of Test Test (See Note 1) ND (See
33、 Note 1) Step 2: at -55 Capacitance Sample Size SA 4.15.1 Initial 4214 Surge Measurement 4:15:12 Final Measurement Sub-Group C3.5B 4.16 Reverse voltage Sample Size & Criterion D Conditions of Perf ormance or of Test Acceptability Requirements ND (See Note 1) (See Note 3) (See Note I) pn c P D - Step
34、 6: 20 C Leakage Current Capacitance Tangent of Loss Angle - Capacitance Number of Cycles: 1000 Temp: 85 C Vo 1 tag e : Table III Protective Resistor: 33 ohms +,-5% Duration of Change: 30 s Duration of Discharge : 5 min 30 s Leakage Current Capacitance Tangent of Loss Angle Not Applicable 12 6 1 As in Step 3 13 herein Change = 10% of Value Measured in Step 6 of 4k.13 Table IIB
