1、 EIA STANDARD TP-1005 Environmental Test Methodology for Determining the Susceptibility of Contacts to Fretting Corrosion EIA-364-1005 July 2011 Electronic Components Industry Association EIA-364-1005 ANSI/EIA-364-1005-2011 (R2017) Approved: July 11, 2011 Reaffirmed: February 10, 2017 NOTICE EIA Eng
2、ineering Standards and Publications are designed to serve the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper
3、product for his particular need. Existence of such Specifications and Publications shall not in any respect preclude any member or nonmember of ECIA from manufacturing or selling products not conforming to such Specifications and Publications, nor shall the existence of such Specifications and Publi
4、cations preclude their voluntary use by those other than ECIA members, whether the Specification is to be used either domestically or internationally. Specifications and Publications are adopted by ECIA in accordance with the American National Standards Institute (ANSI) patent policy. By such action
5、, ECIA does not assume any liability to any patent owner, nor does it assume any obligation whatever to parties adopting the Specification or Publication. This EIA Specification is considered to have International Standardization implications, but the International Electrotechnical Commission activi
6、ty has not progressed to the point where a valid comparison between the EIA Specification and the IEC document can be made. This Specification does not purport to address all safety problems associated with its use or all applicable regulatory requirements. It is the responsibility of the user of th
7、is Specification to establish appropriate safety and health practices and to determine the applicability of regulatory limitations before its use. (From Standards Proposal No. 5382.06, formulated under the cognizance of the CE-2.0 Committee on EIA National Connector and Sockets Standards) Published
8、by Electronic Components Industry Association 2017 EIA Standards are observed) shall be examined under a minimum of 10X magnification. If any particulate matter, plating salts, organic films, metal filings/flakes, etc. the test sponsor shall be notified. Testing shall not proceed until instructions
9、are issued to the test lab by the test sponsor. 4.1.2 Final visual examination of the contact areas shall be performed under a minimum of 10X magnification. Any abnormal discoloration, blemishes, black spots or debris fields (typical of fretting corrosion) shall be noted and the test sponsor notifie
10、d. Additional surface analysis may be required if additional definition of the defects are required, see clause 5 for additional information. 4.1.3 When applicable, socket contacts which are recessed in its housing, may not be accessible for direct examination. Notation of this shall be recorded in
11、the test report. Socket contacts shall be carefully removed from its housing and examined accordingly. This may be performed by the test laboratory or the test sponsor at the discretion of the test sponsor. 4.1.4 Unless otherwise specified in the referencing document, if all requirements as specifie
12、d have been met, final visual examination may be omitted, see clause 5. 4.2 Resonance scans, Sequence 1A 4.2.1 The test specimens shall be secured within the test fixtures as agreed upon between the test sponsor and the test laboratory, see 4.4.1. EIA-364-1005 Page 5 4.2.2 Test conditions: Frequency
13、: 10 Hz to 2000 Hz Amplitude: 1 G sine sweep in each of the three axes (X, Y and Z axis) as defined in EIA-364-28. Duration: 20 minutes per axis 4.2.3 Accelerometers shall be attached to the connectors to monitor the response characteristic. The number of accelerometers and their placement on the te
14、st specimens shall be agreed upon by the test sponsor and test laboratory. Photographs and response plots shall be included in the test report. 4.3 Low-level contact resistance (LLCR) 4.3.1 Test conditions: Procedure: EIA-364-23 Test current: 100 milliamps maximum Open circuit voltage: 20 millivolts
15、 4.3.2 Pre- and post- handling of the test specimens shall be performed in a manner so the contact areas are not disturbed. 4.3.3 Variable measurement shall be organized to show the change in LLCR at each measurement period. Position identifications shall indicate the actual location being measured
16、using the identification system being used on the test samples. In the event that there is no identification system, the test laboratory or test sponsor shall establish a system for use during the measurement interval. 4.4 Vibration, Sequence 1B 4.4.1 Fixturing Test specimens shall be fixtured simul
17、ating the applicable application involved. Test samples shall not be restrained except as required by their application. It is recommended that said fixturing be agreed upon between test sponsor and the testing agency prior to testing. “Four samples shall be wired to measure LLCR. Two additional spe
18、cimens shall be wired to monitor for 1.0 microsecond interruptions in accordance with EIA-364-46. EIA-364-1005 Page 6 4.4.2 Test conditions, unless otherwise specified in the referencing document Type of vibration: Random Frequency: 20 Hz to 2000 Hz. Power Spectral Density (PSD): To Be Determined Ov
19、erall Gs rms: To Be Determined Duration: 8.0 hours per axis, number of axes 4.4.2.1 The PSD and overall G level shall be supplied by the test sponsor and/or as may be established from the vibration scans generated if Sequence 1A is performed. 4.4.3 Requirements: The change in LLCR shall be measured
20、and recorded after each axis of vibration. The contact interruption shall be monitored for 1.0 microsecond interruption, see clause 5, (Data analysis) for further information. 4.5 Thermal cycling, Sequence 2 4.5.1 Test conditions, unless otherwise specified in the referencing document the test shall
21、 be performed in accordance with EIA-364-110, with the following test conditions: Temperature extremes: 0 C to 100 C Humidity: Uncontrolled Ramp rates: 10 C / minute maximum Dwell time at temperature extreme: 10 minutes minimum No. of cycles: 1000 4.5.1.1 The dwell periods shall be the steady state
22、condition. It excludes any overshoot that may be required to achieve the specified ramp rates. 4.5.2 Thermal profile: 4.5.2.1 Prior to starting the test, a pre-test shall be performed to assure that the ramp rates and dwell times falls within the specified parameters. Said profile shall be performed
23、 with additional “dummy“ specimens including any metal shells, heat sinks, cable clamps, strain relief, etc. If the specified profile cannot be met, the test sponsor shall be notified. 4.5.2.2 The thermal profile shall be monitored with a thermocouple located on the middle dummy specimen. The specif
24、ic location of the thermocouple shall be agreed upon between the test lab and the test sponsor. EIA-364-1005 Page 7 4.5.2.3 If the specified profile can not be met, the test profile may be modified upon agreement with the test sponsor. 4.5.3 Requirement 4.5.3.1 Change in LLCR shall be performed init
25、ially, after every 168 hours of exposure, and after conclusion of the test duration. 5 Data analysis 5.1 General 5.1.1 Unless otherwise specified in the referencing document, the following are two basic variable evaluation techniques which have been successful in the determination that fretting moti
26、on and, hence, fretting corrosion has occurred. Change of LLCR Visual examination 5.1.2 Requirement levels may vary contingent on the application involved or specific user or organizational proprietary levels. 5.2 Change of low-level contact resistance 5.2.1 If the requirements have not been exceede
27、d at any interval of testing, no further evaluation shall be required. 5.2.2 Once testing has been initiated, the test specimens shall remain in a mated state. Unmating of the tested specimens shall not be performed without the approval of the test sponsor. 5.2.3 When the requirements have been exce
28、eded, all failed position locations shall be noted to determine if failure patterns exist. 5.3 Visual examination 5.3.1 Unless otherwise specified in the referencing document, visual examination shall be performed when the change in LLCR has been exceeded. Typical positions that have failed the LLCR
29、 requirements shall be examined. It is recommended that a minimum of two positions at each failure extreme be so examined. EIA-364-1005 Page 8 5.3.2 Those positions that have a change in resistance exceeding 100 milliohms normally will have a ring of blackish debris at the contact area of the pin, b
30、lade, printed circuit board pad, etc. This is the basic indicator that fretting corrosion has occurred. The size and intensity of the debris field indicates the degree of severity of the corrosion process. Unless otherwise specified in the referencing document, no further examination is required. If
31、 further confirmation is required, additional surface analysis may be required, see 5.4. 5.3.3 There have been occurrences where fretting has occurred creating changes in LLCR at levels less than a 100 milliohms change. If specified in the referencing document these positions may require additional
32、examination to be performed since the blackish debris may not be present, see 5.4. 5.3.4 For some changes less than 100 milliohms, the blackish debris field may not be visible or may be hard to detect. In these circumstances, special surface analysis techniques may be required. These analysis are in
33、dicated in 5.4 and the test sponsor shall indicate which techniques(s) shall be performed. 5.4 Surface analysis procedures 5.4.1 Unless otherwise specified in the referencing document, the following surface analysis techniques are available that can confirm fretting wear, contaminate identification
34、photographic analysis, etc. The examination shall be performed within the contact area, debris fields as may exist, and typical undisturbed area adjacent to the area of interest. The techniques to be used shall be specified or approved by the test sponsor after consultation with the testing agency.
35、5.4.1.1 Scanning Electron Microscopy (SEM) used for: Thick film analysis Determination if microcracking exists Photographic analysis Intermetallic distribution 5.4.1.2 Scanning Auger Microscopy (SAM) used for: Corrosion analysis Thin film analysis Stain identification Identification of surface conta
36、minates 5.4.1.3 Energy Dispersive X-Ray (EDS) used for: Contaminate identification Intermetallic identification Element mapping EIA-364-1005 Page 9 5.4.1.4 Infrared spectroscopy Identification of polymers Determination of solid organics and inorganics 5.4.2 The above techniques are capable of other
37、criteria that generally do not pertain to the fretting phenomenon and are not recorded herein. 5.5 Discontinuity monitoring 5.5.1 The triggering resistance of the 1.0 microsecond event shall be recorded in the test report. 5.5.2 If during the vibration run, a 1.0 microsecond interruption is indicate
38、d, the time of occurrence shall be noted and recorded. The detector reset feature shall then be activated. If the event disappears, it shall be classified as a resettable event. If the event does not occur for the balance of the test duration, the event may be considered as an abnormality. If the ev
39、ent reoccurs, the time of occurrence shall be noted and recorded. At the discretion of the test sponsor, the process shall continue until a non-resettable event occurs. When this occurs, the test sponsor shall decide if the test is to continue or establish alternative instructions. 6 Details to be s
40、pecified The following detail shall be specified in the referencing document: 6.1 Part numbers 6.2 Contact plating and thickness 6.3 Vibration conditions (frequency, amplitude, PSD) 6.4 Any exceptions and deviations to be used 6.5 Test fixtures 6.6 Specimen size 6.7 Maximum change in resistance allo
41、wed 6.8 Cleaning procedure, if applicable EIA-364-1005 Page 10 7 Test documentation Documentation shall contain the details specified in clause 6, with any exceptions, and the following: 7.1 Test equipment used, and date of last and next calibration 7.2 Part numbers 7.3 Contact plating and thickness
42、 7.4 Temperature conditions 7.5 Ramp rate 7.6 Equipment list and date of last and next calibration 7.7 Vibration plots 7.8 Thermal cycle plots (minimum of 1 chart every 250 cycles) 7.9 Any interruptions with explanation 7.10 Results of visual examination and supporting photographs 7.11 Results of va
43、riable measurements including individual measurements of each position 7.12 Name of operator and start/finish date(s) of test 7.13 Cleaning process, if applicable EIA-364-1005 Page A-1 Annex A Fretting corrosion (informative) A.1 Fretting corrosion A.1.1 For fretting corrosion to exist, micromotion
44、has to occur (called fretting motion) which in turn creates fretting wear and over time fretting corrosion (entrapment of wear debris within the contact area). A.1.2 The test sequences as indicated in this standard have proven to be successful in determining the susceptibility of connectors relative
45、 to fretting corrosion. How fretting corrosion occurs is simple to understand. However, the predictability and variable interrelationships are complex. See bibliography for additional information. A.2 Vibration A.2.1 Vibration should be considered as an application specific test. General conclusions
46、 at different vibration severity levels, either greater or less than those used, should not be applied without additional data. A.3 Thermal cycling Thermal cycling is the most common environment which results in fretting corrosion. Fretting motion may be the result of one or a combination of four ba
47、sic conditions as follows: A.3.1 Dissimilar base metals This deals with significantly different base metal in contact. In this instance, the coefficient of thermal expansion/contraction can create micromotion particularly during ramping temperature up and/or down. A.3.2 Contact float Contacts which
48、float within a housing are less prone to fret while contacts which are “fixed” in their housings may result in micromotion. This is a result of the housing movement which causes forced motion. EIA-364-1005 Page A-2 A.3.3 Dissimilar plating systems in contact The combination of tin alloy / gold syste
49、ms as well as gold flash systems are particularly prone to fretting corrosion due to metal transfer and/or poor durability properties. A.3.4 Thermal cycle A.3.4.1 The greater the change in temperature (uni2206T), the more prone for the system to fret. This is a more predictable environmental dynamic. A.3.4.2 The relationship between T and micromotion is not a continuous function in the sense that, for example, f(T)=kT where f(T) is the amount of micromotion expected for a given change in temperature. It is not the c
