1、 EIA STANDARD TP-118 Thermal Shock Test Procedure for Hermetic Electrical Connectors and Sockets EIA-364-118 (Was previously published as MIL-DTL-38999, clause 3.7 and 4.5. 3) June 2016 Electronic Components Industry Association ANSI/EIA-364-118-2016 Approved: June 15, 2016 EIA-364-118 NOTICE EIA En
2、gineering Standards and Publications are designed to serve the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper
3、 product for his particular need. Existence of such Standards and Publications shall not in any respect preclude any member or nonmember of ECIA from manufacturing or selling products not conforming to such Standards and Publications, nor shall the existence of such Standards and Publications preclu
4、de their voluntary use by those other than ECIA members, whether the standard is to be used either domestically or internationally. Standards and Publications are adopted by ECIA in accordance with the American National Standards Institute (ANSI) patent policy. By such action, ECIA does not assume a
5、ny liability to any patent owner, nor does it assume any obligation whatever to parties adopting the Standard or Publication. This EIA Standard is considered to have International Standardization implications, but the International Electrotechnical Commission activity has not progressed to the point
6、 where a valid comparison between the EIA Standard and the IEC document can be made. This Standard does not purport to address all safety problems associated with its use or all applicable regulatory requirements. It is the responsibility of the user of this Standard to establish appropriate safety
7、and health practices and to determine the applicability of regulatory limitations before its use. (From Standards Proposal No. 5365, formulated under the cognizance of the CE-2.0 Committee on EIA National Connector and Sockets Standards, and previously published by the DLA Land and Maritime as Depar
8、tment of Defense Specification MIL-DTL-38999, clause 3.7 and 4.5.3.) Published by Electronic Components Industry Association 2016 EIA Standards & Technology Department 2214 Rock Hill Road, Suite 265 Herndon, VA 20170 PLEASE ! DONT VIOLATE THE LAW! This document is copyrighted by the ECIA and may not
9、 be reproduced without permission. Organizations may obtain permission to reproduce a limited number of copies through entering into a license agreement. For information, contact: IHS 15 Inverness Way East Englewood, CO 80112-5704 or call USA and Canada (1-877-413-5186), International (303-397-7956)
10、 i CONTENTS Clause Page 1 Introduction . 1 1.1 Scope . 1 2 Test resources 1 2.1 Equipment . 1 3 Test specimen 1 3.1 Description 1 3.2 Preparation 1 4 Test procedure . 2 4.1 Thermal shock exposure . 2 4.2 Pass/fail criteria . 2 5 Details to be specified . 2 6 Test documentation . 3 ii (This page left
11、 blank) EIA-364-118 Page 1 TEST PROCEDURE No.118 THERMAL SHOCK TEST PROCEDURE FOR HERMETIC ELECTRICAL CONNECTORS AND SOCKETS (From EIA Standards Proposal No. 5365, formulated under the cognizance of the EIA CE-2.0 Committee on National Connector and Socket Standards. 1 Introduction 1.1 Scope This te
12、st standard establishes a test method for conducting a thermal shock test for electrical hermetic connector and socket by exposing the connector or socket to low and high temperature water. 2 Test resources 2.1 Equipment 2.1.1 Holding device for the unmated connector 2.1.2 A suitable bath container
13、large enough to hold an minimum of 0.03 cubic meter (1 cubic foot) amount of the temperature regulated cold and hot water to completely submerge the specimen shall be utilized. No dimension of the hot and cold bath shall be less than 25.4 centimeters (10 inches) minimum. 3 Test specimen 3.1 Descript
14、ion The test specimen shall consist of a hermetic plug or receptacle connector, unless otherwise specified in the referencing document. 3.2 Preparation The test connectors shall be unmated and attached to a holding device so it can be submerged into the center of the cold and hot bath containers. EI
15、A-364-118 Page 2 4 Test procedure 4.1 Thermal shock exposure The unmated plug or receptacle shall be subjected to 10 cycles of thermal shock in the following manner: Step 1 - The plug or receptacle shall be suspended for 10 minutes +1/-0 minute in the center of a cold water bath with a minimum volum
16、e of 0.03 cubic meter (1 cubic foot). The water temperature shall not exceed 4 C (39.2 F) throughout the exposure. Step 2 - The plug or receptacle shall be suspended for 10 minutes +1/-0 minute in the center of a hot water bath with a minimum volume of 0.03 cubic meter (1 cubic foot). The water temp
17、erature shall not be less than 90 C (194 F) throughout the exposure. The transfer time from one bath to the other shall not exceed 5 seconds. At the end of the 10th cycle, the plug or receptacle shall have the excess moisture shaken off and then be dried in a forced air oven at 66 C 5 C (151 F 9 F)
18、for 15 minutes 1 minute. 4.2 Pass/fail criteria The damage detrimental to the operation of the connector shall not exceed the criteria specified in the referencing document. 5 Details to be specified The following details shall be specified in the referencing document: 5.1 Part numbers 5.2 Pass/fail
19、 criteria 5.3 If applicable, connector assemblies to be included EIA-364-118 Page 3 6 Test documentation Documentation shall contain the details specified in clause 5 (when provided), and the following: 6.1 Title of test 6.2 Specimen description 6.3 Test equipment used, and date of last and next cal
20、ibration 6.4 Test procedure 6.5 Visual observations and results 6.6 Name of operator and start/finish date(s) test ECIA Document Improvement Proposal If in the review or use of this document, a potential change is made evident for safety, health or technical reasons, please fill in the appropriate i
21、nformation below and mail or FAX to: Electronic Components Industry Association EIA Standards & Technology Department 2214 Rock Hill Rd., Suite 265 Herndon, VA 20170 FAX: (571-323-0245) Document No.: Document Title: Submitters Name: Telephone No.: FAX No.: e-mail: Address: Urgency of Change: Immedia
22、te: At next revision: Problem Area: a. Clause Number and /or Drawing: b. Recommended Changes: c.Reason/Rationale for Recomendation: Additional Remarks: Signature: Date: FOR ECIA USE ONLY Responsible Committee: Chairman: Date comments forwarded to Committee Chairman: Revision History Revision letter Project number Publication date Additions, changes and deletions - SP-5365 June 2016 Was previously contained in MIL-DTL-38999, clause 3.7 and 4.5.3 Electronic Components Industry Association 2214 Rock Hill Road, Suite 265 * Herndon, VA 20170 * tel 571-323-0294 * fax 571-323-0245 www.ecianow.org
