ECA EIA-364-30A-2002 TP-30A Capacitance Test Procedure for Electrical Connectors and Sockets.pdf

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1、 EIA STANDARD TP-30A Capacitance Test Procedure for Electrical Connectors and Sockets EIA-364-30A (Revision of EIA-364-30) April 2002 ANSI/EIA-364-30A-2002(R2015) Approved: April 22, 2002 Reaffirmed: March 23, 2015 EIA-364-30A NOTICE EIA Engineering Standards and Publications are designed to serve t

2、he public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for his particular need. Existence of such Standard

3、s and Publications shall not in any respect preclude any member or nonmember of ECIA from manufacturing or selling products not conforming to such Standards and Publications, nor shall the existence of such Standards and Publications preclude their voluntary use by those other than ECIA members, whe

4、ther the standard is to be used either domestically or internationally. Standards and Publications are adopted by ECIA in accordance with the American National Standards Institute (ANSI) patent policy. By such action, ECIA does not assume any liability to any patent owner, nor does it assume any obl

5、igation whatever to parties adopting the Standard or Publication. This standard is based upon the major technical content of International Electrotechnical Commission standard 512-9, test 22a, capacitance, 1992-04, second edition. It conforms in all essential respects to this IEC standard. This Stan

6、dard does not purport to address all safety problems associated with its use or all applicable regulatory requirements. It is the responsibility of the user of this Standard to establish appropriate safety and health practices and to determine the applicability of regulatory limitations before its u

7、se. (From Standards Proposal No. 3988-A, formulated under the cognizance of the CE-2.0 Committee on EIA National Connector and Socket Standards, and reaffirmed per Standards Proposal No. 5345.08). Published by Electronic Components Industry Association 2015 Standards & Technology Department 2214 Roc

8、k Hill Road, Suite 265 Herndon, VA 20170 PLEASE! DONT VIOLATE THE LAW! This document is copyrighted by the ECIA and may not be reproduced without permission. Organizations may obtain permission to reproduce a limited number of copies through entering into a license agreement. For information, contac

9、t: IHS 15 Inverness Way East Englewood, CO 80112-5704 or call USA and Canada (1-877-413-5184), International (303-397-7956) i CONTENTS Clause Page 1 Introduction 1 1.1 Scope 1 1.2 Object . 1 1.3 Definitions 1 2 Test resources . 1 2.1 Equipment 1 2.2 Fixture 2 3 Test specimen . 2 3.1 Description . 2

10、4 Test procedure 2 5 Details to be specified 3 6 Test documentation 3 ii (This page left blank) EIA-364-30A Page 1 TEST PROCEDURE NO. 30A CAPACITANCE TEST PROCEDURE FOR ELECTRICAL CONNECTORS AND SOCKETS (From EIA Standards Proposal No. 3988-A, formulated under the cognizance EIA CE-2.0 Committee on

11、National Connector Standards, and previously published in EIA-364-30.) 1 Introduction 1.1 Scope This procedure applies to electrical connectors and sockets. 1.2 Object This standard describes a test method to measure capacitance from 1 kHz to 1 MHz. 1.3 Definition That property of a system of conduc

12、tors and dielectrics which permits the storage of electricity when potential differences exist between the conductors. Its value is expressed as the ratio of the electrostatic charge on a conductor to the potential difference between the conductors required to maintain that charge. 2 Test resources

13、2.1 Equipment Capacitance shall be measured with a capacitance meter or bridge that will ensure an accuracy of 0.5% of indicated value + 0.2 picofarad. The sum of the peak ac and dc voltages shall not exceed the voltage rating of the specimen. The test frequency shall be 1 kHz 1% or 1 MHz 1%, (1 kHz

14、 1% is preferred), unless otherwise specified in the referencing document. 3 Test specimen The test specimen shall consist of a connector (may be mated or unmated), or socket according to the referencing document. EIA-364-30A Page 2 4 Test procedure 4.1 Capacitance shall be measured at the specified

15、 frequency using the following configurations. 4.1.1 Between one contact and ground with the following parts connected to ground by the lowest impedance path: all other contacts, all metal parts, the mounting plate. 4.1.2 Between any two adjacent contacts, the following parts all being connected to

16、ground at a common point: all other contacts, all metal parts, the mounting plate. NOTE When measuring pin-to-pin capacitance (crosstalk capacitance) in a connector containing filter elements the shell of the connector shall be terminated to the bridge guard. 4.1.3 Any other point or operating condi

17、tion, as specified in the referencing document. 4.2 The test lead capacitance shall be subtracted from the reading. 5 Details to be specified The following details shall be specified in the referencing document: 5.1 Initial measurements and conditions, if other than standard atmospheric conditions.

18、5.2 Preparation of the specimen 5.3 Specimen description and measurement points 5.4 Value of the measuring frequency 5.5 Any special fixture requirements 5.6 Magnitude of polarizing voltage and/or magnitude of ac rms test signals EIA-364-30A Page 3 6 Documentation Documentation shall contain the det

19、ails specified in clause 5, with any exceptions, and the following: 6.1 Title of test 6.2 Test equipment used, and date of last and next calibration 6.3 Ambient temperature and humidity 6.4 Values and observations 6.5 Name of operator and date of test ECIA Document Improvement Proposal If in the rev

20、iew or use of this document, a potential change is made evident for safety, health or technical reasons, please fill in the appropriate information below and mail or FAX to: Electronic Components Industry Association EIA Standards & Technology Department 2214 Rock Hill Rd., Suite 265 Herndon, VA 201

21、70 FAX: (571-323-0245) Document No.: Document Title: Submitters Name: Telephone No.: FAX No.: e-mail: Address: Urgency of Change: Immediate: At next revision: Problem Area: a. Clause Number and /or Drawing: b. Recommended Changes: c. Reason/Rationale for Recommendation: Additional Remarks: Signature: Date: FOR ECIA USE ONLY Responsible Committee: Chairman: Date comments forwarded to Committee Chairman: Electronic Components Industry Association 2214 Rock Hill Road, Suite 265 * Herndon, VA 20170 * tel 571-323-0294 * fax 571-323-0245 www.ecianow.org

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